JPH0170175U - - Google Patents

Info

Publication number
JPH0170175U
JPH0170175U JP1987166045U JP16604587U JPH0170175U JP H0170175 U JPH0170175 U JP H0170175U JP 1987166045 U JP1987166045 U JP 1987166045U JP 16604587 U JP16604587 U JP 16604587U JP H0170175 U JPH0170175 U JP H0170175U
Authority
JP
Japan
Prior art keywords
input
output
comparator
driver
integrator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1987166045U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0650787Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP16604587U priority Critical patent/JPH0650787Y2/ja
Publication of JPH0170175U publication Critical patent/JPH0170175U/ja
Application granted granted Critical
Publication of JPH0650787Y2 publication Critical patent/JPH0650787Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
JP16604587U 1987-10-28 1987-10-28 Ic試験用入出力回路 Expired - Lifetime JPH0650787Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16604587U JPH0650787Y2 (ja) 1987-10-28 1987-10-28 Ic試験用入出力回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16604587U JPH0650787Y2 (ja) 1987-10-28 1987-10-28 Ic試験用入出力回路

Publications (2)

Publication Number Publication Date
JPH0170175U true JPH0170175U (US07655746-20100202-C00011.png) 1989-05-10
JPH0650787Y2 JPH0650787Y2 (ja) 1994-12-21

Family

ID=31453079

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16604587U Expired - Lifetime JPH0650787Y2 (ja) 1987-10-28 1987-10-28 Ic試験用入出力回路

Country Status (1)

Country Link
JP (1) JPH0650787Y2 (US07655746-20100202-C00011.png)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001183431A (ja) * 1999-04-06 2001-07-06 Advantest Corp 試験装置および試験方法
JP2008525803A (ja) * 2004-12-23 2008-07-17 テラダイン・インコーポレーテッド 高電圧機能を備えたピンエレクトロニクス

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001183431A (ja) * 1999-04-06 2001-07-06 Advantest Corp 試験装置および試験方法
JP2008525803A (ja) * 2004-12-23 2008-07-17 テラダイン・インコーポレーテッド 高電圧機能を備えたピンエレクトロニクス
JP4698680B2 (ja) * 2004-12-23 2011-06-08 テラダイン・インコーポレーテッド 高電圧機能を備えたピンエレクトロニクス

Also Published As

Publication number Publication date
JPH0650787Y2 (ja) 1994-12-21

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