JPH0159880U - - Google Patents
Info
- Publication number
- JPH0159880U JPH0159880U JP15640887U JP15640887U JPH0159880U JP H0159880 U JPH0159880 U JP H0159880U JP 15640887 U JP15640887 U JP 15640887U JP 15640887 U JP15640887 U JP 15640887U JP H0159880 U JPH0159880 U JP H0159880U
- Authority
- JP
- Japan
- Prior art keywords
- positional
- terminals
- power supply
- whose
- bias power
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15640887U JPH0159880U (tr) | 1987-10-12 | 1987-10-12 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15640887U JPH0159880U (tr) | 1987-10-12 | 1987-10-12 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0159880U true JPH0159880U (tr) | 1989-04-14 |
Family
ID=31434920
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15640887U Pending JPH0159880U (tr) | 1987-10-12 | 1987-10-12 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0159880U (tr) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013148538A (ja) * | 2012-01-23 | 2013-08-01 | Shindengen Electric Mfg Co Ltd | 半導体試験装置、半導体試験方法及び半導体デバイス |
-
1987
- 1987-10-12 JP JP15640887U patent/JPH0159880U/ja active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013148538A (ja) * | 2012-01-23 | 2013-08-01 | Shindengen Electric Mfg Co Ltd | 半導体試験装置、半導体試験方法及び半導体デバイス |
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