JPH0155425B2 - - Google Patents

Info

Publication number
JPH0155425B2
JPH0155425B2 JP56214080A JP21408081A JPH0155425B2 JP H0155425 B2 JPH0155425 B2 JP H0155425B2 JP 56214080 A JP56214080 A JP 56214080A JP 21408081 A JP21408081 A JP 21408081A JP H0155425 B2 JPH0155425 B2 JP H0155425B2
Authority
JP
Japan
Prior art keywords
circuit
fault
line
low
failure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56214080A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58109861A (ja
Inventor
Tooru Koyama
Hishiichi Komya
Masaharu Shimada
Masaaki Sasagawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp, Nippon Electric Co Ltd filed Critical Nippon Telegraph and Telephone Corp
Priority to JP56214080A priority Critical patent/JPS58109861A/ja
Publication of JPS58109861A publication Critical patent/JPS58109861A/ja
Publication of JPH0155425B2 publication Critical patent/JPH0155425B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP56214080A 1981-12-24 1981-12-24 対ケ−ブル障害検出回路 Granted JPS58109861A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56214080A JPS58109861A (ja) 1981-12-24 1981-12-24 対ケ−ブル障害検出回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56214080A JPS58109861A (ja) 1981-12-24 1981-12-24 対ケ−ブル障害検出回路

Publications (2)

Publication Number Publication Date
JPS58109861A JPS58109861A (ja) 1983-06-30
JPH0155425B2 true JPH0155425B2 (enrdf_load_stackoverflow) 1989-11-24

Family

ID=16649905

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56214080A Granted JPS58109861A (ja) 1981-12-24 1981-12-24 対ケ−ブル障害検出回路

Country Status (1)

Country Link
JP (1) JPS58109861A (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1994000771A1 (en) * 1992-06-24 1994-01-06 Tutankhamon Electronics, Inc. Network monitor and test apparatus
JP5096871B2 (ja) * 2007-10-29 2012-12-12 株式会社アイ・オー・データ機器 ケーブル断線検出装置およびケーブル断線検出方法
JP5096884B2 (ja) * 2007-11-19 2012-12-12 株式会社アイ・オー・データ機器 ケーブル断線検出装置

Also Published As

Publication number Publication date
JPS58109861A (ja) 1983-06-30

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