JPH0132288Y2 - - Google Patents
Info
- Publication number
- JPH0132288Y2 JPH0132288Y2 JP1982129522U JP12952282U JPH0132288Y2 JP H0132288 Y2 JPH0132288 Y2 JP H0132288Y2 JP 1982129522 U JP1982129522 U JP 1982129522U JP 12952282 U JP12952282 U JP 12952282U JP H0132288 Y2 JPH0132288 Y2 JP H0132288Y2
- Authority
- JP
- Japan
- Prior art keywords
- stage
- sample
- worm wheel
- goniometer
- outer periphery
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12952282U JPS5933660U (ja) | 1982-08-27 | 1982-08-27 | ゴニオメ−タの試料位置制御装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12952282U JPS5933660U (ja) | 1982-08-27 | 1982-08-27 | ゴニオメ−タの試料位置制御装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5933660U JPS5933660U (ja) | 1984-03-01 |
JPH0132288Y2 true JPH0132288Y2 (enrdf_load_stackoverflow) | 1989-10-03 |
Family
ID=30293447
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12952282U Granted JPS5933660U (ja) | 1982-08-27 | 1982-08-27 | ゴニオメ−タの試料位置制御装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5933660U (enrdf_load_stackoverflow) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6211664A (ja) * | 1985-07-10 | 1987-01-20 | Ishida Scales Mfg Co Ltd | ラベルプリンタにおける印字位置調整装置 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55100639A (en) * | 1979-01-26 | 1980-07-31 | Hitachi Ltd | Sample exchanger for electron microscope |
-
1982
- 1982-08-27 JP JP12952282U patent/JPS5933660U/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5933660U (ja) | 1984-03-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5157251A (en) | Scanning force microscope having aligning and adjusting means | |
US5280178A (en) | Specimen holder for use in a charged particle beam device | |
US5004307A (en) | Near field and solid immersion optical microscope | |
JP5048596B2 (ja) | 試料台,試料回転ホルダ,試料台作製方法,及び試料分析方法 | |
US6980360B2 (en) | Focus stabilizing apparatus | |
JPS60205412A (ja) | 望遠鏡付き照準装置 | |
JP2009514028A (ja) | エバネッセント場の照明のための光学システム | |
JPH0132288Y2 (enrdf_load_stackoverflow) | ||
JPH0719555B2 (ja) | ゴニオメ−タテ−ブル | |
US3702399A (en) | Specimen stage for an electron microscope | |
US5726454A (en) | Tripod for polishing a sample and for viewing the sample under a microscope | |
JPH0659172A (ja) | 対物レンズ、および対物レンズの傾き調整方法、および対物レンズ製造装置 | |
JP2001338599A (ja) | 荷電粒子線装置 | |
US6762415B1 (en) | Vacuum chamber with recessed viewing tube and imaging device situated therein | |
US3230365A (en) | Tiltable specimen holding device for electron beam apparatus | |
Williams et al. | The instrument | |
US3476936A (en) | Apparatus for positioning specimens in electron microscopes or electron diffraction cameras | |
JPH0451415Y2 (enrdf_load_stackoverflow) | ||
CN214666665U (zh) | 一种自准直仪 | |
Bursill et al. | A goniometer for electron microscopy at 1.6 Å point-to-point resolution | |
US3535514A (en) | Positionable aperture for electron microscope | |
JPS60230345A (ja) | 走査型電子顕微鏡に於ける試料台装置 | |
US3166629A (en) | Mounting mechanism for zoom optical system of microscopes | |
US2897366A (en) | Externally adjustable electron microscope focusing aid | |
JPH02215034A (ja) | 電子ビーム装置 |