JPH01314961A - Low frequency eddy current flaw detection method - Google Patents

Low frequency eddy current flaw detection method

Info

Publication number
JPH01314961A
JPH01314961A JP14701888A JP14701888A JPH01314961A JP H01314961 A JPH01314961 A JP H01314961A JP 14701888 A JP14701888 A JP 14701888A JP 14701888 A JP14701888 A JP 14701888A JP H01314961 A JPH01314961 A JP H01314961A
Authority
JP
Japan
Prior art keywords
probe
magnetic material
magnetic
eddy current
coil
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14701888A
Other languages
Japanese (ja)
Inventor
Kenji Koketsu
纐纈 健治
Tomio Yasui
安井 富雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Heavy Industries Ltd
Original Assignee
Mitsubishi Heavy Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Heavy Industries Ltd filed Critical Mitsubishi Heavy Industries Ltd
Priority to JP14701888A priority Critical patent/JPH01314961A/en
Publication of JPH01314961A publication Critical patent/JPH01314961A/en
Pending legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

PURPOSE:To detect the flaw of a non-magnetic material through a magnetic material by inserting a magnetically permeable rod composed of a magnetic body in the piercing hole at the central part of a probe and surrounding the outer periphery of the probe by other magnet. CONSTITUTION:A magnetically permeable rod 20 composed of a magnetic body is inserted in the piercing hole 15 at the central part of a probe and the outer periphery of the probe is surrounded by a magnet 21. The lower end surface of the detection coil of the probe is brought into contact with a magnetic material 13 to generate an eddy current by the line of magnetic force of the coil 2. When a line 12 of magnetic force is generated toward the coil 2, the magnetic material 13 is magnetically saturated by the line 22 of magnetic force generated by the magnet 21 and, therefore, the presence of the material 13 effectively becomes same to the presence of a non-magnetic body. By this method, the line 12 of magnetic force of the coil 12 penetrates even in a non-magnetic material 14 being a back plate in this case. Therefore, if a flaw 14a is present, the state of an eddy current is changed from that when there is no flaw and the equilibrium state of the bridge circuit of the probe is collapsed and the flaw 14a present in the non-magnetic material 14 being the back plate can be detected.

Description

【発明の詳細な説明】 〈産業上の利用分舒〉 本発明は低周波渦流探傷方法に関し、磁性材料と非磁性
材料とを組合せた被検体の非磁性材料の非破壊探傷方法
として有用なものである。
[Detailed Description of the Invention] <Industrial Application> The present invention relates to a low-frequency eddy current flaw detection method, and is useful as a non-destructive flaw detection method for non-magnetic materials of a test object in which a magnetic material and a non-magnetic material are combined. It is.

〈従来の技術〉 従来より被検体の非破壊探傷方法として低周波渦流探傷
方法が知られている。
<Prior Art> A low frequency eddy current flaw detection method has been known as a non-destructive flaw detection method for a test object.

第3図はこの種の低周波渦流探傷方法に用いる従来の探
触子を示す縦断面図である。同図に示すように、この探
触子■は軸方向である上下方向に配設された標準コイル
1及び検出コイル2を有している。これら標準及び検出
コイル2は内筒3,4及び外m5,6で形成する空間に
収納された内コイルla、2a及び外コイルlb、2b
を有している。これら内及び外コイ7L、Ia、lb、
2a、2bの巻き始めと巻き終りの計4本はスリット7
゜8を介してキャップ9内に導かれ、このキャップ9内
でブリッジ回路を構成するよう接続しである。また、内
筒3,4及び外@5.6は各1個の結合ビス10,11
で夫々連結されており、このようにして連結された2個
のブ四ツクが一体に結合されて探触子を構成している。
FIG. 3 is a longitudinal sectional view showing a conventional probe used in this type of low frequency eddy current flaw detection method. As shown in the figure, this probe (2) has a standard coil 1 and a detection coil 2 arranged vertically, which is the axial direction. These standard and detection coils 2 are inner coils la, 2a and outer coils lb, 2b housed in a space formed by inner cylinders 3, 4 and outer cylinders m5, 6.
have. These inner and outer carp 7L, Ia, lb,
A total of 4 wires at the beginning and end of winding 2a and 2b are slit 7.
8 into a cap 9 and connected within this cap 9 to form a bridge circuit. In addition, the inner cylinders 3, 4 and the outer cylinder @5.6 each have one connecting screw 10, 11.
The two blocks thus connected are joined together to form a probe.

かかる探触子■を用いて探傷を行なう場合には、探触子
Iの検出コイル2側の端面である下端面を被検体に当接
させて検出コイル2から発生する磁力線により渦電流を
発生させ、この渦電流から逆に検出コイル2に向けて磁
力線を発生させる。このとき被検体に傷等の欠陥がない
状態で標準コイル1と検出コイル2とで構成するブリッ
ジ回路を平衡させておく。このため被検体に欠陥がある
と渦電流に変化を生じ、これにより検出コイル2に作用
する渦電流による磁力線の強さも変化する。
When performing flaw detection using such a probe (2), the lower end surface of the probe (I) on the detection coil 2 side is brought into contact with the object to be inspected, and eddy currents are generated by magnetic lines of force generated from the detection coil 2. Then, lines of magnetic force are generated from this eddy current toward the detection coil 2. At this time, the bridge circuit constituted by the standard coil 1 and the detection coil 2 is kept in equilibrium with no defects such as scratches on the subject. Therefore, if there is a defect in the object to be inspected, the eddy current changes, and as a result, the strength of the magnetic lines of force due to the eddy current acting on the detection coil 2 also changes.

この結果前記ブリッジ回路の平衡条件がくずれ欠陥が検
出できる。
As a result, the equilibrium condition of the bridge circuit is disrupted and defects can be detected.

〈発明が解決しようとする課題〉 上記従来技術においては、磁性材料と非磁性材料とが積
層されている被検体の非磁性材料の欠陥を、磁性材料に
当接する探触子Iにより検出する事、即ち磁性材料が表
板、非磁性材料が裏板となっている場合の非磁性材料の
探傷は不可能であった。
<Problems to be Solved by the Invention> In the above-mentioned prior art, defects in the non-magnetic material of a test object in which a magnetic material and a non-magnetic material are laminated are detected by a probe I that comes into contact with the magnetic material. In other words, it has been impossible to detect flaws in a non-magnetic material when a magnetic material is used as a top plate and a non-magnetic material is used as a back plate.

更に評言すると、上述のような場合、第4図に示すよう
に、検出コイル2が発生する磁力線12は磁性材料13
のみを通り、被磁性材料14にはいることができず、非
磁性材料14の状態に影響されることがないからである
To further comment, in the above case, as shown in FIG. 4, the lines of magnetic force 12 generated by the detection coil 2 are
This is because it cannot enter the magnetic material 14 and is not affected by the state of the non-magnetic material 14.

本発明は、上記従来技術に鑑み、磁性材料を通して非磁
性材料の欠陥を検出し得る低周波渦電流探傷方法を提供
することを目的とする。
SUMMARY OF THE INVENTION In view of the above-mentioned prior art, an object of the present invention is to provide a low frequency eddy current flaw detection method capable of detecting defects in a non-magnetic material through a magnetic material.

く課題を解決するための手段〉 上記目的を達成する本発明の構成は、軸方向である上下
方向に配設されて電気的なブリッジ回路を構成するよう
接続されている標準コイル及び検出コイルを有する探触
子を用い、検出コイルから発生する磁力線により被検体
に渦電流を発生させるとともに、この渦電流により発生
する磁力線の状態により被検体の傷等の欠陥を検出する
低周波渦流探傷方法において、 磁性材料と非磁性材料とが積層されている被検体の非磁
性材料の傷等を磁性材料に当接する探触子により検出す
る場合、探触子の中央部の貫通孔に磁性体の導磁棒を挿
入するとともに探触子の外周を他の磁石で囲撓し、この
磁石が発生する磁力線により磁性材料を磁気的に飽和さ
せ探触子の検出コイルが発生する磁力線が非磁性材料化
透過するようにしたことを特徴とする。
Means for Solving the Problems> The configuration of the present invention that achieves the above object includes standard coils and detection coils that are arranged in the axial direction, that is, the vertical direction, and are connected to form an electrical bridge circuit. In a low-frequency eddy current flaw detection method, in which eddy currents are generated in a test object by magnetic lines of force generated from a detection coil, and defects such as scratches on the test object are detected based on the state of the lines of magnetic force generated by the eddy currents. , When detecting scratches in the non-magnetic material of a test object in which a magnetic material and a non-magnetic material are laminated using a probe that comes into contact with the magnetic material, it is necessary to insert a magnetic material into the through hole in the center of the probe. Inserting a magnetic bar and surrounding the outer periphery of the probe with other magnets, the lines of magnetic force generated by these magnets magnetically saturate the magnetic material, and the lines of magnetic force generated by the detection coil of the probe turn into non-magnetic material. It is characterized by being transparent.

く作   用〉 上記構成の本発明によれば磁性材料は磁石により磁気的
に飽和されるので、磁性材料の存在は実効的に非磁性体
の存在と同様なこととなり、このため磁性材料と積層さ
れた裏板である非磁性材料に迄検出コイルの磁力線が浸
透し、この非磁性材料に欠陥がある場合には探触子にお
けるブリッジ回路の平衡状態がくずれる。このため、前
記非磁性材料中の欠陥の存在を検出し得る。
Effect> According to the present invention having the above configuration, the magnetic material is magnetically saturated by the magnet, so the presence of the magnetic material is effectively the same as the presence of a non-magnetic material, and therefore, the magnetic material and the laminated layer are The magnetic field lines of the detection coil penetrate into the non-magnetic material that is the back plate, and if there is a defect in this non-magnetic material, the equilibrium state of the bridge circuit in the probe will be disrupted. Therefore, the presence of defects in the non-magnetic material can be detected.

く実 施 例〉 以下本発明の実施例を図面に基づき詳細に説明する。な
お、従来技術と同一部分には同一番号を付し重複する説
明は省略する。
Embodiments Hereinafter, embodiments of the present invention will be described in detail based on the drawings. Note that parts that are the same as those in the prior art are given the same numbers and redundant explanations will be omitted.

第1図(al 、 (bl +よ本発明の実施例方法に
使用する探触子を示す縦断面図及びそのA−A!s断面
図である。両図に示すように探触子■はその中央部を上
下方向に貫通する貫通孔17を有しており、内筒3,4
及び外筒5,6が貫通孔17の周囲で夫々複数個の結合
ビス16゜17.18,19により連結されている点を
除き、他は第3図に示す探触子■と同構成である。
FIG. 1 (al, (bl +) is a vertical cross-sectional view showing a probe used in the embodiment method of the present invention and its A-A!s cross-sectional view. As shown in both figures, the probe ■ is It has a through hole 17 that passes through the center part in the vertical direction, and the inner cylinders 3, 4
The structure is the same as that of the probe (2) shown in FIG. be.

かかる探触子■を用いて磁性材料と非磁性材料とが積層
されている被検体における非磁性材料の深鍋を磁性材料
側から行なう場合には、第2図に示すように、接触子■
の検出コイル2側の端面である下端面を磁性材料13に
当接させて検出コイル2から発生する磁力線により渦電
流を発生させ、この渦電流から逆に検出コイル2に向け
て磁力線を発生させろ。このとき、同時に貫通孔15に
磁性体の導磁棒20を挿入するとともに探触子■の外周
を他の磁石21で囲撓し、この磁石21が発生する磁力
線22に磁性材料13を磁気的に飽和させる。このため
磁性材料13の存在は実効的に非磁性体の存在と同様な
こととなる。この結果、この場合の裏板である非磁性材
料14に迄検出コイル2の磁力線12が浸透する。かく
て、非磁性材料14に欠陥14aが存在すればそうでな
いときに対し渦電流の状態が変化するので探触子■のブ
リッジ回路の平衡状態がくずれ、このことにより裏板で
ある非磁性材料14に存在する欠陥14aを検出するこ
とができろ。
When using such a probe (2) to deep-pot a non-magnetic material in a test object in which a magnetic material and a non-magnetic material are laminated from the magnetic material side, as shown in FIG.
The lower end surface, which is the end surface on the detection coil 2 side, is brought into contact with the magnetic material 13 to generate an eddy current by the magnetic lines of force generated from the detection coil 2, and from this eddy current, lines of magnetic force are generated in the opposite direction toward the detection coil 2. . At this time, at the same time, a magnetic conductive rod 20 is inserted into the through hole 15, and the outer periphery of the probe (2) is surrounded by another magnet 21. saturate to. Therefore, the presence of the magnetic material 13 is effectively the same as the presence of a non-magnetic material. As a result, the magnetic lines of force 12 of the detection coil 2 penetrate into the non-magnetic material 14, which is the back plate in this case. Thus, if the defect 14a exists in the non-magnetic material 14, the state of the eddy current changes compared to when there is no defect 14, and the equilibrium state of the bridge circuit of the probe (2) is disrupted, which causes the non-magnetic material that is the back plate to 14 can be detected.

〈発明の効果〉 以上実施例とともに具体的に説明したように、本発明に
よれば、磁性材料の裏側にある非磁性材料に存在する欠
陥を容易に検出することができる。
<Effects of the Invention> As described above in detail with the embodiments, according to the present invention, defects existing in the non-magnetic material on the back side of the magnetic material can be easily detected.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図(alは本発明の実施例を実現する探触子を示す
縦断面図、第1図fb)はそのA−A線断面図、第2図
は本発明の実施例により探傷方法を示す説明図、第3図
は従来技術に係る探触子を示す縦断面図、第4図は従来
技術に係る探傷方法を示す説明図である。 図  面  中、 ■は探触子、 1は標準コイル、 2は検出コイル、 12.22は磁力線、 13は磁性材料、 14は非磁性材料、 15は貫通孔、 20は導磁棒、 21は磁石である。
Fig. 1 (al is a longitudinal sectional view showing a probe implementing an embodiment of the present invention, Fig. 1 fb) is a sectional view taken along the line A-A, and Fig. 2 shows a flaw detection method according to an embodiment of the present invention. FIG. 3 is a longitudinal sectional view showing a probe according to the prior art, and FIG. 4 is an explanatory diagram showing a flaw detection method according to the prior art. In the drawing, ■ is a probe, 1 is a standard coil, 2 is a detection coil, 12.22 is a line of magnetic force, 13 is a magnetic material, 14 is a non-magnetic material, 15 is a through hole, 20 is a magnetic guide bar, 21 is It's a magnet.

Claims (1)

【特許請求の範囲】[Claims] 軸方向である上下方向に配設されて電気的なブリッジ回
路を構成するよう接続されている標準コイル及び検出コ
イルを有する探触子を用い、検出コイルから発生する磁
力線により被検体に渦電流を発生させるとともに、この
渦電流により発生する磁力線の状態により被検体の傷等
の欠陥を検出する低周波渦流探傷方法において、磁性材
料と非磁性材料とが積層されている被検体の非磁性材料
の傷等を磁性材料に当接する探触子により検出する場合
、探触子の中央部の貫通孔に磁性体の導磁棒を挿入する
とともに探触子の外周を他の磁石で囲撓し、この磁石が
発生する磁力線により磁性材料を磁気的に飽和させ探触
子の検出コイルが発生する磁力線が非磁性材料迄透過す
るようにしたことを特徴とする低周波渦流探傷方法。
Using a probe that has a standard coil and a detection coil that are arranged in the axial direction (vertical direction) and connected to form an electrical bridge circuit, eddy currents are applied to the subject by magnetic lines of force generated from the detection coil. In the low-frequency eddy current flaw detection method, which detects defects such as scratches on the specimen based on the state of magnetic lines of force generated by this eddy current, When detecting scratches, etc. with a probe that comes into contact with a magnetic material, insert a magnetic conductive rod into the through hole in the center of the probe, and surround the outer periphery of the probe with other magnets. A low frequency eddy current flaw detection method characterized in that the magnetic material is magnetically saturated by the magnetic lines of force generated by the magnet, and the lines of magnetic force generated by the detection coil of the probe are transmitted to the non-magnetic material.
JP14701888A 1988-06-16 1988-06-16 Low frequency eddy current flaw detection method Pending JPH01314961A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14701888A JPH01314961A (en) 1988-06-16 1988-06-16 Low frequency eddy current flaw detection method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14701888A JPH01314961A (en) 1988-06-16 1988-06-16 Low frequency eddy current flaw detection method

Publications (1)

Publication Number Publication Date
JPH01314961A true JPH01314961A (en) 1989-12-20

Family

ID=15420684

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14701888A Pending JPH01314961A (en) 1988-06-16 1988-06-16 Low frequency eddy current flaw detection method

Country Status (1)

Country Link
JP (1) JPH01314961A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011025049A1 (en) * 2009-08-26 2011-03-03 Sumitomo Chemical Company, Limited Method for inspecting an austenitic stainless steel weld
JP2014077764A (en) * 2012-10-12 2014-05-01 Tokyo Rigaku Kensa Kk Eddy current flaw detection device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011025049A1 (en) * 2009-08-26 2011-03-03 Sumitomo Chemical Company, Limited Method for inspecting an austenitic stainless steel weld
JP2011047736A (en) * 2009-08-26 2011-03-10 Sumitomo Chemical Co Ltd Method of inspecting austenite-based stainless steel welding section
CN102483391A (en) * 2009-08-26 2012-05-30 住友化学株式会社 Method for inspecting an austenitic stainless steel weld
JP2014077764A (en) * 2012-10-12 2014-05-01 Tokyo Rigaku Kensa Kk Eddy current flaw detection device

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