JPH01314957A - Method for detecting flaw of superconductor material current passage - Google Patents

Method for detecting flaw of superconductor material current passage

Info

Publication number
JPH01314957A
JPH01314957A JP14916488A JP14916488A JPH01314957A JP H01314957 A JPH01314957 A JP H01314957A JP 14916488 A JP14916488 A JP 14916488A JP 14916488 A JP14916488 A JP 14916488A JP H01314957 A JPH01314957 A JP H01314957A
Authority
JP
Japan
Prior art keywords
current
current path
temp
passage
heat
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14916488A
Other languages
Japanese (ja)
Inventor
Ichiro Wada
一郎 和田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP14916488A priority Critical patent/JPH01314957A/en
Publication of JPH01314957A publication Critical patent/JPH01314957A/en
Pending legal-status Critical Current

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  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)

Abstract

PURPOSE:To easily detect a quench part by heating a current passage constituted of a superconductor material to critical temp. or more and also allowing a current to flow through the current passage to detect the infrared rays corresponding to the temp. generated from the current passage. CONSTITUTION:A heating means 12 is used to heat a current passage 11 such as a coil constituted of a superconductor material to temp. higher than critical temp. Next, a DC power supply 13 is applied to both ends of the passage 11 and a required current is allowed to flow by a current variable part 14. As a result, a flaw part is increased in heat concn. quantity as compared with other part to increase the generation quantity of heat. Subsequently, an infrared camera 15 is used to detect the far infrared rays corresponding to the heat generation temp. of the passage 11 and said far infrared rays are converted to a electrical temp. video signal to be outputted. This temp. video signal is converted to digitial data having level gradation difference by an A/D converter circuit 16 to be stored in an image memory 17. The image data of the memory 17 is converted to appropriate data to be displayed on a CRT display part 18.

Description

【発明の詳細な説明】 [発明の目的] (産業上の利用分野) 本発明は、超電導材で構成されたコイル、電線等各種の
電流通路の欠陥部分を検出する超電導材電流通路の欠陥
検出方法に係わり、特に超電導材の臨界温度を有効に利
用して欠陥部分を検出する超電導材電流通路の欠陥検出
方法に関する。
[Detailed Description of the Invention] [Object of the Invention] (Industrial Application Field) The present invention is directed to defect detection of superconducting material current paths, which detects defective portions of various current paths such as coils and electric wires made of superconducting materials. In particular, the present invention relates to a method for detecting defects in current paths in a superconducting material, which effectively utilizes the critical temperature of the superconducting material to detect defective portions.

(従来の技術) 近年、超電導材を用いた種々の電流通路1例えばコイル
や電線等の開発が試みられている。この超電導材で構成
された電流通路はある臨界温度で抵抗零となる性質を有
することから、大電流を流す伝送路として各技術分野で
広く利用しようとする傾向が著しく、研究開発が進めら
れている。
(Prior Art) In recent years, attempts have been made to develop various current paths 1 such as coils and electric wires using superconducting materials. The current path made of this superconducting material has the property of becoming zero resistance at a certain critical temperature, so there is a remarkable tendency to use it widely in various technical fields as a transmission path for large currents, and research and development is progressing. There is.

ところで、この種の超電導材電流通路は、その製造過程
や製造環境等によりクラックや絶縁物の巻き込みによる
閉塞部が出来ることがあるが、このような場合には臨界
電流密度以上の電流が流れて超電導特性を破壊するクエ
ンチ現象が生ずる。
Incidentally, in this type of superconducting material current path, blockages may occur due to cracks or insulators being entangled due to the manufacturing process or manufacturing environment, but in such cases, a current exceeding the critical current density may flow. A quench phenomenon occurs that destroys the superconducting properties.

(発明が解決しようとする課題) 従って、以上のような超電導材電流通路のある部分に閉
塞部が生じている場合、クエンチ現象によって電流通路
の超電導機能を大きく損ねるばかりでなく、その電流通
路に大電流が流れたときにその欠陥部分、つまりクエン
チ部分が焼き切れて放電を繰り返しながら焼失し、二度
とその電流通路が使用できなくなる。
(Problem to be Solved by the Invention) Therefore, if a blockage occurs in a certain part of the current path in the superconducting material as described above, not only will the quench phenomenon greatly impair the superconducting function of the current path, but also the current path will be damaged. When a large current flows, the defective part, that is, the quench part, burns out and burns out as the discharge continues, making the current path unusable again.

本発明は上記実情に鑑みてなされたもので、′電流通路
の欠陥部分を適確に見つけ出すことにより、その欠陥部
分を迅速、適切に修復して再使用可能とする超電導材電
流通路の欠陥検出方法を提供することを目的とする。
The present invention has been made in view of the above-mentioned circumstances, and includes: ``Detection of defects in superconducting material current paths that enables reuse by quickly and appropriately repairing defective portions by accurately finding defective portions of current paths. The purpose is to provide a method.

[発明の構成] (課題を解決するための手段および作用)本発明による
超電導材電流通路の欠陥検出方法は上記目的を達成する
ために、超電導材で構成された電流通路を超電導を示す
臨界温度よりも高い温度で加熱すると共に前記電流通路
はクエンチ状態になる。この状態において赤外線温度計
を用いて前記電流通路に生じる温度状態を検出すると共
にこの温度に応じた色等で表示することにより電流通路
の欠陥部分を検出する。
[Structure of the Invention] (Means and Effects for Solving the Problems) In order to achieve the above object, the method for detecting defects in a current path in a superconducting material according to the present invention aims to detect a current path made of a superconducting material at a critical temperature that indicates superconductivity. The current path becomes quenched upon heating to a higher temperature than the current path. In this state, an infrared thermometer is used to detect the temperature state occurring in the current path, and a defective portion of the current path is detected by displaying the temperature in a color corresponding to the temperature.

(実施例) 以下、本発明方法を適用する検査システムの一実施例に
ついて第1図を参照して説明する。同図において11は
超電導材で構成された例えばコイル等の電流通路であっ
て、この電流通路11はその欠陥検出時には図示−点鎖
線で示す恒温槽12または図示されていないが例えばバ
ーナ等(以下、これら恒温槽、バーナー等を加熱手段1
2と呼ぶ)によって加熱される様になっている。
(Example) Hereinafter, an example of an inspection system to which the method of the present invention is applied will be described with reference to FIG. In the same figure, reference numeral 11 denotes a current path such as a coil made of a superconducting material, and when detecting a defect in the current path 11, the current path 11 is used in a thermostat 12 (shown in the figure) as indicated by a dotted chain line, or in a burner (not shown), for example (hereinafter referred to as , these thermostats, burners, etc. as heating means 1
2).

また、この電流通路11の両端には直流電源12および
電流通路11に流すための電流を可変する電流可変部1
4が設けられている。
Further, at both ends of this current path 11, a DC power source 12 and a current variable section 1 that changes the current to flow through the current path 11 are provided.
4 is provided.

15は通常の物体温度と異なる温度、つまり遠赤外線領
域の波長を検出する赤外線カメラであって、この赤外線
カメラ15で撮像された電流通路11の温度映像信号は
後続のA/D変換回路16で階調差をもったデジタルデ
ータに変換される。
Reference numeral 15 is an infrared camera that detects a temperature different from the normal object temperature, that is, a wavelength in the far infrared region. It is converted to digital data with gradation differences.

17はデジタルデータを一時格納する画像メモリ、18
は画像メモリ17に記憶された画像データを適宜な画像
処理を行って表示するCRT表示部である。
17 is an image memory for temporarily storing digital data; 18
is a CRT display unit that performs appropriate image processing on the image data stored in the image memory 17 and displays it.

次に、以上のようなシステムを用いて超電導材電流通路
の欠陥を検出する例について説明する。
Next, an example of detecting defects in a superconducting material current path using the above system will be described.

先ず、本方法は、装置またはプラント等に設置する前に
加熱手段12を用いてコイル等の電流通路11を臨界温
度よりも高い温度に加熱する。その結果、電流通路11
は超電導特性を失って一種の電気抵抗体の状態となる。
First, in this method, a current path 11 such as a coil is heated to a temperature higher than a critical temperature using a heating means 12 before installing it in an apparatus or a plant. As a result, current path 11
loses its superconducting properties and becomes a kind of electrical resistor.

しかる後、電流通路11の両端に所定の直流電源13を
印加すると共に電流可変部14にて電流可変を行って所
要とする電流を流す。その結果、欠陥部分は他の部分よ
りも熱集中量が増大して発熱量が多くなる。なお、先に
加熱手段12を用いて電流通路11を加熱したが、逆に
電流通路11に所要とする電流を流した後、加熱手段1
2を用いて加熱する方法であってもよい。この場合、検
査したい部分のみを加熱してクエンチさせ、このクエン
チ後は流れている電流加熱により検査できるので、外部
加熱をオフにしてもよい。
Thereafter, a predetermined DC power source 13 is applied to both ends of the current path 11, and the current is varied by the current variable section 14 to flow a required current. As a result, the amount of heat concentrated in the defective portion is greater than in other portions, resulting in a greater amount of heat generation. Note that although the heating means 12 was used to heat the current path 11, conversely, after passing the required current through the current path 11, the heating means 1
2 may be used for heating. In this case, only the part to be inspected is heated and quenched, and after this quenching, the inspection can be performed by heating the current, so the external heating may be turned off.

さらに、以上のような状態に設定した後、赤外線カメラ
15を用いて前記電流通路11の発熱温度に応じた遠赤
外線を検出し電気的な温度ビデオ信号に変換して出力す
る。この温度ビデオ信号はA/D変換回路16でレベル
階調差を持ったデジタルデータに変換された後、画像メ
モリ17に所定の順序で順次記憶していく。そして、画
像メモリ17の画像データを適宜なデータに変換した後
、CRT表示部18に表示するようにすれば、その電流
通路11の形状に等しい形状の温度分布画像をCRT表
示部18に表示でき、かつ、電流通路11の中でも特に
熱束中部の大きい部分を含んでその温度に対応する色で
表示できる。
Further, after setting the above state, the infrared camera 15 is used to detect far-infrared rays corresponding to the heat generation temperature of the current path 11, convert it into an electrical temperature video signal, and output it. This temperature video signal is converted into digital data having a level gradation difference in an A/D conversion circuit 16, and then sequentially stored in an image memory 17 in a predetermined order. Then, by converting the image data in the image memory 17 into appropriate data and displaying it on the CRT display section 18, a temperature distribution image having the same shape as the current path 11 can be displayed on the CRT display section 18. , and the current path 11 can be displayed in a color corresponding to its temperature, including a particularly large central portion of the heat flux.

従って、以上のような実施例の方法によれば、超電導材
で構成された電流通路11を必要とする装置またはプラ
ント等に設置する前に、その電流通路11を臨界温度以
上となるように加熱して通常の電気的抵抗体とし、かつ
、この抵抗体に必要な電流を流すことにより、特にクエ
ンチ相当部分において他の部分と異なる高温部分を作り
出す。
Therefore, according to the method of the embodiment described above, the current path 11 made of a superconducting material is heated to a temperature higher than the critical temperature before it is installed in a device or plant that requires the current path 11. By making it a normal electrical resistor and passing the necessary current through this resistor, a high temperature part different from other parts is created, especially in the part corresponding to the quench.

そして、その電流通路11から発生する温度に応じた遠
赤外線を赤外線カメラ15で撮像し、その撮像結果をC
RT等に表示するようにしたので、超電導材で構成され
た電流通路11の欠陥部分を間接的に検出できる。しか
も、CRT表示部18に電流通路11の各温度に応じた
色で表示すれば、その色状態から電流通路11全体の超
電導特性の状態を知ることができ、勿論、欠陥部分に至
っては確実にその欠陥箇所を映像により認識できる。
Then, the far infrared rays generated from the current path 11 according to the temperature are imaged by the infrared camera 15, and the imaged result is
Since the information is displayed on the RT or the like, defective portions of the current path 11 made of superconducting material can be indirectly detected. Furthermore, by displaying colors on the CRT display section 18 in accordance with the respective temperatures of the current path 11, it is possible to know the state of the superconducting properties of the entire current path 11 from the color state, and of course, it is possible to accurately identify defective parts. The defect location can be recognized from the image.

因みに、実験的に上記方法を用いて電流通路11から発
見した欠陥部分と、臨界温度以下で超電導状態にある電
流通路11に過電流を流したときのクエンチ部分とが一
致するか否かについて、種々欠陥部分の異なるものにつ
いて繰り返し調べたところ、その部分はほぼ一致するこ
とが実証された。しかも、上記欠陥検出方法は装置等に
組込む前に適用すれば、ローコストで欠陥を確実に検出
できるので非常に有効なものとなる。
Incidentally, regarding whether the defective portion experimentally found in the current path 11 using the above method matches the quenched portion when an overcurrent is passed through the current path 11 which is in a superconducting state below the critical temperature, Repeated examinations of various defective parts revealed that the parts were almost identical. Moreover, if the defect detection method described above is applied before being incorporated into a device or the like, defects can be reliably detected at low cost, making it very effective.

なお、に記実施例では比較的コンパクトな電流通路11
の欠陥検出ノブ法について述べたが、例えば第2図に示
すように予め電流通路11と平行または必要な箇所ある
いは電流通路を囲むように加熱用線21を配置すると共
に欠陥検出時のみその加熱用線21にヒータ電源22を
通電すれば、電流通路11の大きさに拘らず臨界温度以
上に加熱することができる。また、CRT表示部18に
は電流通路11の温度に応じた色で表示したが、既に階
調差に応じたデジタルデータとなっているので該当箇所
に文字による温度表示を行うこともできる。その他、本
発明はその要旨を逸脱しない範囲で種々変形して実施で
きる。
In addition, in the embodiment described in 2, the current path 11 is relatively compact.
For example, as shown in FIG. 2, the heating wire 21 is placed in advance in parallel with the current path 11 or in necessary locations or surrounding the current path, and the heating wire 21 is placed only when a defect is detected. By energizing the wire 21 with the heater power source 22, it is possible to heat the wire 21 to a temperature higher than the critical temperature regardless of the size of the current path 11. Furthermore, although the CRT display section 18 displays the temperature in a color corresponding to the temperature of the current path 11, since the temperature is already digital data corresponding to the gradation difference, the temperature can also be displayed in text at the corresponding location. In addition, the present invention can be implemented with various modifications without departing from the gist thereof.

[発明の効果1 以上詳記したように本発明によれば、超電導材で構成さ
れた電流通路を臨界温度以上に加熱すると共にその電流
通路に電流を流し、このとき電流通路から発生する温度
に応じた赤外線を検出するようにしたので、電流通路の
クエンチ部分を容易に検出でき、その箇所を迅速、確実
に修復して装置等に設置することが可能な超電導材電流
通路の欠陥検出方法を提供できる。
[Advantageous Effects of the Invention 1] As detailed above, according to the present invention, a current path made of a superconducting material is heated to a temperature higher than the critical temperature and a current is passed through the current path, and at this time, the temperature generated from the current path is We developed a method for detecting defects in superconducting material current paths that can easily detect quenched portions of current paths, quickly and reliably repair the quenched portions, and install them in equipment, etc. Can be provided.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明による超電導材電流通路の欠陥検出方法
を適用する検査システムの構成図、第2図は本発明方法
の他の実施例を説明する構成図である。 11・・・電流通路、12・・・加熱手段、13・・・
直流電源、14・・・電流可変部、15・・・赤外線カ
メラ、16・・・A/D変換回路、17・・・画像メモ
リ、18・・・CRT表示部、21・・・加熱用線。 出願人代理人 弁理士 鈴江武彦
FIG. 1 is a block diagram of an inspection system to which the method for detecting defects in superconducting material current paths according to the present invention is applied, and FIG. 2 is a block diagram illustrating another embodiment of the method of the present invention. 11... Current path, 12... Heating means, 13...
DC power supply, 14... Current variable section, 15... Infrared camera, 16... A/D conversion circuit, 17... Image memory, 18... CRT display section, 21... Heating line . Applicant's agent Patent attorney Takehiko Suzue

Claims (1)

【特許請求の範囲】[Claims] 超電導材で構成されたコイル、電線等を含む電流通路の
少なくとも検査する部分を、超電導を示す臨界温度より
も高い温度で加熱すると共に前記電流通路に電流を流し
てクエンチ状態を作り出し、このとき前記電流通路から
発生する温度を赤外線カメラで撮像し前記電流通路の欠
陥部分を検出することを特徴とする超電導材電流通路の
欠陥検出方法。
At least the part of the current path to be inspected, including coils, wires, etc. made of superconducting material, is heated to a temperature higher than the critical temperature that indicates superconductivity, and a current is passed through the current path to create a quench state, and at this time, the 1. A method for detecting defects in a superconducting material current path, comprising: detecting a defective portion of the current path by imaging the temperature generated from the current path with an infrared camera.
JP14916488A 1988-06-16 1988-06-16 Method for detecting flaw of superconductor material current passage Pending JPH01314957A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14916488A JPH01314957A (en) 1988-06-16 1988-06-16 Method for detecting flaw of superconductor material current passage

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14916488A JPH01314957A (en) 1988-06-16 1988-06-16 Method for detecting flaw of superconductor material current passage

Publications (1)

Publication Number Publication Date
JPH01314957A true JPH01314957A (en) 1989-12-20

Family

ID=15469196

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14916488A Pending JPH01314957A (en) 1988-06-16 1988-06-16 Method for detecting flaw of superconductor material current passage

Country Status (1)

Country Link
JP (1) JPH01314957A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7025499B2 (en) * 2000-10-24 2006-04-11 Robert Bosch Gmbh Device for testing a material that changes shape when an electric and/or magnetic field is applied

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7025499B2 (en) * 2000-10-24 2006-04-11 Robert Bosch Gmbh Device for testing a material that changes shape when an electric and/or magnetic field is applied

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