JPH0131137B2 - - Google Patents
Info
- Publication number
- JPH0131137B2 JPH0131137B2 JP55106943A JP10694380A JPH0131137B2 JP H0131137 B2 JPH0131137 B2 JP H0131137B2 JP 55106943 A JP55106943 A JP 55106943A JP 10694380 A JP10694380 A JP 10694380A JP H0131137 B2 JPH0131137 B2 JP H0131137B2
- Authority
- JP
- Japan
- Prior art keywords
- core wire
- void
- resistance
- void meter
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000011800 void material Substances 0.000 claims description 29
- 238000010586 diagram Methods 0.000 description 6
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 5
- 239000012530 fluid Substances 0.000 description 5
- 229910052708 sodium Inorganic materials 0.000 description 5
- 239000011734 sodium Substances 0.000 description 5
- 229910001338 liquidmetal Inorganic materials 0.000 description 4
- 238000005259 measurement Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 2
- 239000007791 liquid phase Substances 0.000 description 2
- 239000012071 phase Substances 0.000 description 2
- 238000009835 boiling Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000002826 coolant Substances 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
- G01N27/045—Circuits
- G01N27/046—Circuits provided with temperature compensation
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Monitoring And Testing Of Nuclear Reactors (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10694380A JPS5730934A (en) | 1980-08-04 | 1980-08-04 | Temperature compensation type void meter |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10694380A JPS5730934A (en) | 1980-08-04 | 1980-08-04 | Temperature compensation type void meter |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5730934A JPS5730934A (en) | 1982-02-19 |
JPH0131137B2 true JPH0131137B2 (enrdf_load_html_response) | 1989-06-23 |
Family
ID=14446451
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10694380A Granted JPS5730934A (en) | 1980-08-04 | 1980-08-04 | Temperature compensation type void meter |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5730934A (enrdf_load_html_response) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007033062A (ja) * | 2005-07-22 | 2007-02-08 | Japan Atomic Energy Agency | 高温高圧で複雑な流路内のボイド率を瞬時計測する電気式ボイド率計及びボイド率計測法 |
JP5215750B2 (ja) * | 2008-06-20 | 2013-06-19 | 三菱重工業株式会社 | センサ、液膜測定装置 |
-
1980
- 1980-08-04 JP JP10694380A patent/JPS5730934A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5730934A (en) | 1982-02-19 |
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