JPH01304701A - Electronic parts - Google Patents

Electronic parts

Info

Publication number
JPH01304701A
JPH01304701A JP63136333A JP13633388A JPH01304701A JP H01304701 A JPH01304701 A JP H01304701A JP 63136333 A JP63136333 A JP 63136333A JP 13633388 A JP13633388 A JP 13633388A JP H01304701 A JPH01304701 A JP H01304701A
Authority
JP
Japan
Prior art keywords
phenol resin
resin layer
resistance
silica
heat cycle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP63136333A
Other languages
Japanese (ja)
Other versions
JP2592790B2 (en
Inventor
Kiyoshi Matsuda
清 松田
Takeshi Suzuki
武志 鈴木
Takamichi Momoki
桃木 孝道
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Marcon Electronics Co Ltd
Original Assignee
Marcon Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Marcon Electronics Co Ltd filed Critical Marcon Electronics Co Ltd
Priority to JP63136333A priority Critical patent/JP2592790B2/en
Publication of JPH01304701A publication Critical patent/JPH01304701A/en
Application granted granted Critical
Publication of JP2592790B2 publication Critical patent/JP2592790B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PURPOSE:To improve heat cycle resistance and humidity resistance by blocking open pores existent in a phenol resin layer with glass formed of silica or metal alcoxide containing, silica as a chief ingredient. CONSTITUTION:The title electronic parts have a basic sheathing structure comprising a phenol resin layer 4. Open pores 6 existent in the phenol resin layer 4 are blocked with glass 7 formed of silica or metal alcoxide having silica as a chief ingredient. In other words, the pores 6 existent in the phenol resin layer 4 are blocked with glass formed of metal alcoxide. Accordingly, parts elements are completely shielded from the atmosphere without permitting water and gas to invade into the parts. Further, since the basic sheathing structure comprises phenol resin, heat cycle resistance possessed by the phenol resin can be kept intactly. Hereby, highly practical electronic parts, which are excellent in heat cycle resistance and humidity resistance and has reduced deterioration in various characteristics even under conditions in need of very severe resistance to environment, can be yielded.

Description

【発明の詳細な説明】 [発明の目的] (産業上の利用分野) 本発明は、外装構造を改良した電子部品に関する。[Detailed description of the invention] [Purpose of the invention] (Industrial application field) The present invention relates to an electronic component with an improved exterior structure.

(従来の技術) 電子部品の外装材としては、量産性9作柔性。(Conventional technology) As an exterior material for electronic components, it is highly flexible and mass-producible.

コスト的な面からエポキシ樹脂、フェノール樹脂が一般
的に使用されている。
Epoxy resins and phenolic resins are generally used from a cost standpoint.

しかし、焼結されたセラミック素子からなる電子部品の
外装材として使用される場合、エポキシ樹脂はセラミッ
ク素子に比較し、線膨張係数が約2桁大きいため、熱l
j撃により外装材にクラックが発生する。このため自動
車用の電子部品に要求される一50℃〜+150℃の冷
熱ザイクル特性を満足することは困難である。これに対
してフェノール樹脂はセラミックの線熱膨張係数に近づ
けるためS i 02 、CaCO3などの無機フィラ
ーを多聞に含有している。このため耐ヒートサイクル性
には非常に優れるが、構造が本質的に多孔質であるため
、水分やガスの侵入により使用中にセラミック素子が劣
化し故障に至る問題があった。
However, when used as an exterior material for electronic components made of sintered ceramic elements, epoxy resin has a coefficient of linear expansion approximately two orders of magnitude larger than that of ceramic elements, so
Cracks occur in the exterior material due to the impact. Therefore, it is difficult to satisfy the thermal cycle characteristics between -50° C. and +150° C. required for electronic parts for automobiles. On the other hand, phenolic resin contains a large amount of inorganic fillers such as S i 02 and CaCO3 in order to approximate the linear thermal expansion coefficient of ceramic. Therefore, it has very good heat cycle resistance, but because the structure is essentially porous, there is a problem that the ceramic element deteriorates during use due to the intrusion of moisture and gas, leading to failure.

この欠点をなくすために、従来より溶融ワックス、液状
エポキシ樹脂、液状シリコン樹脂の含浸が行われていた
In order to eliminate this drawback, impregnation with molten wax, liquid epoxy resin, or liquid silicone resin has conventionally been carried out.

しかしながら、車載用電子部品としては、非常にきびし
い耐y:J境性が要求される傾向にあり、耐ヒートサイ
クル性だけでなく、優れた耐湿特性が要求されている。
However, in-vehicle electronic components tend to require very strict Y:J resistance, and are required to have not only heat cycle resistance but also excellent moisture resistance.

例えば、121℃、2気圧、湿度95%RH下でのブレ
ツシ1rクツカ−試験における電気、構造及び外観特性
の保障が必要である。
For example, it is necessary to ensure the electrical, structural, and appearance characteristics in a brake test at 121°C, 2 atmospheres, and 95% RH.

このような高い耐ヒートサイクル性と、高い耐湿特性を
兼ね備えた外装材料に対する要求に対して、エポキシ樹
脂では高ヒートサイクル性を保障することが困難であり
、フェノール樹脂では高温高湿下に83 Gノる耐湿性
を保V5することが困難である。
In response to the demand for exterior materials that have both high heat cycle resistance and high moisture resistance, it is difficult to guarantee high heat cycle resistance with epoxy resins, and with phenolic resins, it is difficult to guarantee high heat cycle resistance under high temperature and high humidity conditions. It is difficult to maintain moisture resistance at V5.

なぜならば、ワックス、シリコンは高温になると軟化、
溶融するため完全な含浸材料の充填構造を保持できなく
なる。また、液状エポキシを含浸する場合、含浸を完全
に行うとエポキシ樹脂とフェノール樹脂との膨張係数の
差によりヒートサイクルでマイクロクランクが発生する
危険性があり、耐湿性がかえって保障できなくなるなど
の問題をかかえていた。
This is because wax and silicone soften when exposed to high temperatures.
As it melts, it is no longer possible to maintain a completely filled structure of impregnated material. Additionally, when impregnating with liquid epoxy, if the impregnation is complete, there is a risk of micro-cranking occurring during the heat cycle due to the difference in expansion coefficient between the epoxy resin and the phenol resin, and there are other problems such as not being able to guarantee moisture resistance. I was holding on to something.

(発明が解決しようとする課題) 以上のように、従来−膜化している外装構造を有づる電
子部品は、耐ヒートサイクル性及び耐湿性の両特性を同
時に満足するものとはならず、有効な対策が望ま1れて
いた。
(Problems to be Solved by the Invention) As described above, conventional electronic components having a film exterior structure cannot simultaneously satisfy both heat cycle resistance and moisture resistance, and are therefore not effective. Countermeasures were desired.

本発明は、上記の点に鑑みてなされたもので、耐ヒート
サイクル性及び耐湿性に優れ、使用中の特性劣化要因を
解消できる外装構造を有する電子部品を提供することを
目的とするものである。
The present invention has been made in view of the above points, and an object of the present invention is to provide an electronic component that has excellent heat cycle resistance and moisture resistance, and has an exterior structure that eliminates the causes of characteristic deterioration during use. be.

[発明の構成] (課題を解決するための手段) 本発明による電子部品は、基本外装構造がフェノール樹
脂層からなり、このフェノール樹脂層中に存在する連続
した気孔内をシリカ又はシリカを主成分とする金属アル
コキシドより生成されたガラスで閉塞したことを特徴と
するものである。
[Structure of the Invention] (Means for Solving the Problems) The electronic component according to the present invention has a basic exterior structure consisting of a phenolic resin layer, and the continuous pores present in the phenolic resin layer are filled with silica or silica as a main component. It is characterized by being closed with glass produced from a metal alkoxide.

(作 用) 以上の構成によれば、金属アルコキシドより生成された
ガラス質によってフェノール樹脂層中に存在する気孔内
がふさがれるため、部品素体と外気とは完全に遮断され
、内部への水分やガスの侵入が皆無となり、また、基本
外装がフェノール樹脂であるため、フェノール樹脂のも
つ耐ヒートサイクル性がそのまま維持でき、さらに、ガ
ラス質がシリカを主成分としたものであるため、耐薬品
性に優れたものとなる。
(Function) According to the above configuration, the pores existing in the phenolic resin layer are blocked by the glassy substance produced from the metal alkoxide, so the component body and the outside air are completely cut off, and moisture is not allowed to enter the inside. In addition, since the basic exterior is made of phenolic resin, the heat cycle resistance of phenolic resin can be maintained, and since the glass material is mainly composed of silica, it has excellent chemical resistance. Becomes excellent in sex.

(実施例) 以下本発明の一実施例につき、バリスタを例示して説明
する。すなわち、第1図に示すように例えば酸化亜鉛を
主成分とし、他に数種類の金属酸化物を添加混合してな
るセラミック粉末を直径20am、厚さ1.0履に成形
焼結した円板状のバリスタ素体1の人害両面に外周辺を
残して直径18#の電極2を形成し、この電極2にリー
ド線3を取着した後、S!02を主成分とする無機フィ
ラーを60〜70wt%、樹脂分を5〜10wt%、溶
剤を20〜30wt%。
(Example) An example of the present invention will be described below by exemplifying a varistor. That is, as shown in Fig. 1, a ceramic powder made of zinc oxide as a main component and mixed with several other metal oxides is molded and sintered into a disc shape with a diameter of 20 am and a thickness of 1.0 mm. After forming an electrode 2 with a diameter of 18#, leaving the outer periphery on both sides of the varistor body 1, and attaching a lead wire 3 to this electrode 2, S! 60 to 70 wt% of inorganic filler whose main component is 02, 5 to 10 wt% of resin, and 20 to 30 wt% of solvent.

顔料その他を10〜20wt%を含み、粘度を10〜1
5ボイズに調整したフェノール樹脂液に前記バリスタ素
体1をデツプし外装としてのフェノール樹脂層4を形成
する。
Contains 10 to 20 wt% of pigment and other components, and has a viscosity of 10 to 1
The varistor body 1 is placed in a phenol resin liquid adjusted to 5 voids to form a phenol resin layer 4 as an exterior.

なお、フェノール樹脂層4形成過程のコーテング条件は
、1回目のデツプ引き上げ後、2分間室温乾燥を行い、
溶剤成分を乾燥させた後、2回目のデツプを行い所定の
厚さにコーテングする。その後16時間の室温放置乾燥
を行い、最後に150℃30分で加熱硬化を行い、フェ
ノール樹脂F?14が完成される。
The coating conditions in the process of forming the phenolic resin layer 4 were as follows: After the first depth raising, room temperature drying was performed for 2 minutes;
After drying the solvent component, a second coating is performed to obtain a predetermined thickness. After that, it was left to dry at room temperature for 16 hours, and finally it was heated and cured at 150°C for 30 minutes, and the phenolic resin F? 14 will be completed.

次に、粘度70センチボイスに調整したシリカ又はシリ
カを主成分としてアルミ、鉄、シリコンなどを添加した
金属アルコキシドガラス溶液中に5分間前記フェノール
樹脂層4をデツプした後、引き上げ、室温中で30分間
乾燥を行った後、150℃30分の加熱を行い、前記フ
ェノール樹脂層4上にガラス膜5を形成させてなるもの
である。
Next, the phenolic resin layer 4 was immersed for 5 minutes in silica or a metal alkoxide glass solution containing silica as a main component and aluminum, iron, silicon, etc. adjusted to a viscosity of 70 centimeters, and then pulled out and left at room temperature for 30 minutes. After drying for a minute, heating was performed at 150° C. for 30 minutes to form a glass film 5 on the phenol resin layer 4.

以上の構成になる外装構造を備えたバリスタによれば、
第2図に示すようにフェノール樹脂層4に存在する連続
した気孔6内にガラス膜5が形成され、このガラス膜5
によって気孔6がふさがれ、バリスタ素体1が外気と完
全に遮断され、バリスタ素体1への水分やガスの侵入が
皆無となり優れた耐湿特性を得ることができる。
According to the varistor with the exterior structure configured as above,
As shown in FIG. 2, a glass film 5 is formed in continuous pores 6 existing in the phenolic resin layer 4.
The pores 6 are closed, the varistor element 1 is completely isolated from the outside air, and no moisture or gas can enter the varistor element 1, resulting in excellent moisture resistance.

また上記バリスタは、基本外装構造がフェノール樹脂層
4であり、フェノール樹脂のもつ耐ヒートサイクル性に
優れた内容と相まって、車載用など非常にきびしい耐環
境性が要求される条件下の使用においても開時性劣化の
ない利点を有する。
In addition, the basic exterior structure of the above varistor is a phenolic resin layer 4, which, combined with the excellent heat cycle resistance of phenolic resin, allows it to be used under conditions that require very severe environmental resistance, such as in automobiles. It has the advantage of no deterioration in opening performance.

次に、本発明の具体的な効果について実験結果に基づき
説明する。
Next, specific effects of the present invention will be explained based on experimental results.

すなわち、前述の実施例にて述べた本発明(A)、粉末
エポキシ樹脂外装を施した従来例(B)、エポキシ樹脂
含浸フェノール樹脂外装を施した従来例(C)、ワック
ス含浸フェノール樹脂外装を施した従来例(D)それぞ
れのバリスタについて耐ヒートサイクル試験(ヒートサ
イクル回数に対する外装剥離不良)及びプレッシャクツ
カー試験(時間に対する電圧変化率)を行った結果、第
4図及び第5図に示すとJ3りであった。
That is, the present invention (A) described in the above embodiment, the conventional example (B) with a powdered epoxy resin exterior, the conventional example (C) with an epoxy resin-impregnated phenolic resin exterior, and the conventional example with a wax-impregnated phenolic resin exterior. The heat cycle resistance test (exterior peeling failure vs. number of heat cycles) and pressure traction test (voltage change rate vs. time) were conducted on each conventional example (D) varistor, and the results are shown in Figures 4 and 5. It was J3ri.

なお、ヒートサイクル試験は、−50℃。Note that the heat cycle test was conducted at -50°C.

+150℃各50分を1サイクルとして行い、プレッシ
ャクツカー試験は、123℃、2気圧。
One cycle was performed at +150°C for 50 minutes each, and the pressure test was performed at 123°C and 2 atm.

95%RHの条件下で行った。The test was carried out under conditions of 95% RH.

第4図及び第5図から明らかなように、従来例(B)は
、優れた耐湿特性を有するものの、耐ヒートサイクル性
がI4i端に悪い。従来例(C)はヒートサイクル回数
200回を越えた時点からクラック発生が多くなり、か
つ時間の経過とともに電圧変化率が大きくなる。
As is clear from FIGS. 4 and 5, although the conventional example (B) has excellent moisture resistance, its heat cycle resistance is poor at the I4i end. In the conventional example (C), more cracks occur after the number of heat cycles exceeds 200, and the voltage change rate increases as time passes.

また、従来例(D)は優れた耐ヒートサイクル性を有す
るものの耐湿特性が悪い。
Further, although the conventional example (D) has excellent heat cycle resistance, it has poor moisture resistance.

これに対して本発明(A)は、優れた耐ヒートサイクル
性と耐湿特性を1にね備えた効果が得られることがわか
る。
On the other hand, it can be seen that the present invention (A) has the effect of combining excellent heat cycle resistance and moisture resistance.

なお、上記実施例では、フェノール樹脂層4に存在する
連続した気孔6内にガラス膜5を形成したものを例示し
て説明したが、前述した金属アルコキシドガラス溶液へ
の含浸−乾燥の操作を数回繰返し、第3図に示すように
フェノール樹脂層4に存在する気孔6内にガラス7を完
全に充填した構造としてもよい。
In the above embodiment, the glass film 5 was formed in the continuous pores 6 existing in the phenol resin layer 4. A structure may be obtained in which the pores 6 existing in the phenol resin layer 4 are completely filled with glass 7 by repeating the process several times, as shown in FIG.

また、上記実施例では、バリスタを例示して説明したが
、他の電子部品、例えばセラミックコンデンサ、焼結素
体格成となる固体電解コンデンナ及びアルミナ基板など
に適用できることは言うまでもない。
Further, in the above embodiments, a varistor has been described as an example, but it goes without saying that the present invention can be applied to other electronic components, such as ceramic capacitors, solid electrolytic capacitors made of sintered elements, and alumina substrates.

[発明の効果1 本発明によれば、耐ヒートサイクル性及び耐湿特性にゆ
れ、非常にきびしい耐環境性が要求される条件下の使用
においても、開時性劣化のない実用的価値の高い電子部
品を得ることができる。
[Effect of the invention 1] According to the present invention, an electronic device with high practical value that does not deteriorate in opening performance even when used under conditions that require very severe environmental resistance due to fluctuations in heat cycle resistance and moisture resistance. parts can be obtained.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図及び第2図は本発明の一実施例に係り、第1図は
バリスタを示す一部切欠断面正面図、第2図は第1図イ
部拡大図、第3図は第1図イ部に該当する他の実施例に
係る拡大図、第4図はヒートサイクル回数−累積不良率
曲線図、第5図は時間−電圧変化率特性曲線図である。 1・・・・・・バリスタ索体 2・・・・・・電極 3・・・・・・リード線 4・・・・・・フェノール樹脂層 5・・・・・・ガラス膜 6・・・・・・気孔 7・・・・・・ガラス 特  許  出  願  人 マル]ン電子株式会社 バリスタの一部切欠断面正面図 他の実施例のイ部拡大図 第3図 ヒートサイクル回数 (回) 第  4  図 R間(il) 第  5  図
1 and 2 relate to an embodiment of the present invention, in which FIG. 1 is a partially cutaway front view showing a varistor, FIG. 2 is an enlarged view of part A in FIG. 1, and FIG. FIG. 4 is an enlarged view of another embodiment corresponding to part A, FIG. 4 is a heat cycle number-cumulative failure rate curve diagram, and FIG. 5 is a time-voltage change rate characteristic curve diagram. 1... Varistor cord body 2... Electrode 3... Lead wire 4... Phenol resin layer 5... Glass membrane 6... ...Pore 7...Glass patent application Hitomarun Electronics Co., Ltd. Partially cutaway cross-sectional front view of varistor Enlarged view of part A of other embodiments Figure 3 Number of heat cycles (times) 4 Figure R (il) Figure 5

Claims (1)

【特許請求の範囲】[Claims] 基本外装構造がフェノール樹脂層からなり、このフェノ
ール樹脂層中に存在する連続した気孔内をシリカ又はシ
リカを主成分とする金属アルコキシドより生成されたガ
ラスで閉塞したことを特徴とする電子部品。
An electronic component characterized in that its basic exterior structure consists of a phenolic resin layer, and continuous pores existing in the phenolic resin layer are closed with glass produced from silica or a metal alkoxide containing silica as a main component.
JP63136333A 1988-06-01 1988-06-01 Electronic components Expired - Fee Related JP2592790B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63136333A JP2592790B2 (en) 1988-06-01 1988-06-01 Electronic components

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63136333A JP2592790B2 (en) 1988-06-01 1988-06-01 Electronic components

Publications (2)

Publication Number Publication Date
JPH01304701A true JPH01304701A (en) 1989-12-08
JP2592790B2 JP2592790B2 (en) 1997-03-19

Family

ID=15172766

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63136333A Expired - Fee Related JP2592790B2 (en) 1988-06-01 1988-06-01 Electronic components

Country Status (1)

Country Link
JP (1) JP2592790B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04113405U (en) * 1991-03-23 1992-10-05 テイーデイーケイ株式会社 Glass sealed thermistor
JP2002093602A (en) * 2000-09-18 2002-03-29 Marcon Electronics Co Ltd Electronic component
WO2018123491A1 (en) * 2016-12-28 2018-07-05 パナソニックIpマネジメント株式会社 Electrolytic capacitor and method for producing same

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60110755A (en) * 1983-11-21 1985-06-17 Matsushita Electric Works Ltd Resin composition for casting
JPS6287402U (en) * 1985-11-19 1987-06-04

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60110755A (en) * 1983-11-21 1985-06-17 Matsushita Electric Works Ltd Resin composition for casting
JPS6287402U (en) * 1985-11-19 1987-06-04

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04113405U (en) * 1991-03-23 1992-10-05 テイーデイーケイ株式会社 Glass sealed thermistor
JP2002093602A (en) * 2000-09-18 2002-03-29 Marcon Electronics Co Ltd Electronic component
WO2018123491A1 (en) * 2016-12-28 2018-07-05 パナソニックIpマネジメント株式会社 Electrolytic capacitor and method for producing same
CN110140188A (en) * 2016-12-28 2019-08-16 松下知识产权经营株式会社 Electrolytic capacitor and its manufacturing method
JPWO2018123491A1 (en) * 2016-12-28 2019-10-31 パナソニックIpマネジメント株式会社 Electrolytic capacitor and manufacturing method thereof
US11087929B2 (en) 2016-12-28 2021-08-10 Panasonic Intellectual Property Management Co., Ltd. Electrolytic capacitor and method for producing same
CN110140188B (en) * 2016-12-28 2021-09-10 松下知识产权经营株式会社 Electrolytic capacitor and method for manufacturing the same

Also Published As

Publication number Publication date
JP2592790B2 (en) 1997-03-19

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