JPH01260878A - Semiconductor laser for emitting light beams at multiple points - Google Patents

Semiconductor laser for emitting light beams at multiple points

Info

Publication number
JPH01260878A
JPH01260878A JP8941788A JP8941788A JPH01260878A JP H01260878 A JPH01260878 A JP H01260878A JP 8941788 A JP8941788 A JP 8941788A JP 8941788 A JP8941788 A JP 8941788A JP H01260878 A JPH01260878 A JP H01260878A
Authority
JP
Japan
Prior art keywords
type
light emitting
insulating substrate
layers
point
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8941788A
Other languages
Japanese (ja)
Inventor
Akira Hattori
亮 服部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP8941788A priority Critical patent/JPH01260878A/en
Publication of JPH01260878A publication Critical patent/JPH01260878A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To decrease electric interference among light emitting points, by forming a multiple point light emitting laser diode by growing a crystal on an insulating substrate, and forming an isolating groove which isolates the light emitting points so as to reach the insulating substrate. CONSTITUTION:On an insulating substrate 8, e.g., on a Cr doped GaAs substrate, p-type GaAS contact layers 7a and 7b and n-type GaAs current blocking layers 6a and 6b are grown in a liquid phase or a vapor phase. Current injecting grooves 10a and 10b are formed by etching. Then, p-type AlyGa1-yAs second clad layers 5a and 5b, p-type AlxGa1-xAs active layers 4a and 4b, n-type AlyGa1-yAs first clad layers 3a and 3b and n-type GaAs contact layers 2a and 2b are sequentially grown as crystals. Furthermore, an isolating groove 9 is formed by etching so as to reach the insulating substrate 8. Thus, light emitting points 1a and 1b are completely isolated electrically. Electrode parts 11a and 11b are formed so as to form electrodes by etching so that parts of the electrode parts are exposed on the surfaces of the p-type GaAs contact layers 7a and 7b.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、複数の発光点からレーザ光を独立に出力する
多点発光型半導体レーザに関し、さらに詳しくは、単一
の基板上に形成されてなる、いわゆるモノリシック型の
多点発光型半導体レーザに関する。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a multi-point emitting semiconductor laser that independently outputs laser light from a plurality of light emitting points, and more specifically, relates to a multi-point emitting semiconductor laser that is formed on a single substrate. This invention relates to a so-called monolithic multi-point emitting semiconductor laser.

[従来の技術] 従来、この種の半導体レーザ、いわゆる、独立駆動型の
半導体レーザとして第3図に示されるものがある。この
第3図の半導体レーザは、2つの発光点1a 、lbを
有しており、各発光点1a 、1bに対してn型コンタ
クト層2a 、2b 、n型第!クラッド層3a 、3
b 、活性層4a 、4b 1p型第2クラッド層5a
 、5b 、p型電流ブロック層6a 、6bがそれぞ
れ対応している。また、p型基板12は自発光点1a 
、lbに共通となっており、13は自発光点1a 、l
bを電気的に分離するための分離溝である。
[Prior Art] Conventionally, there is a semiconductor laser of this type, a so-called independently driven semiconductor laser, as shown in FIG. The semiconductor laser shown in FIG. 3 has two light-emitting points 1a, lb, and for each light-emitting point 1a, 1b, an n-type contact layer 2a, 2b, an n-type contact layer 2a, 2b, and an n-type contact layer 2a, 2b. Cladding layer 3a, 3
b, active layer 4a, 4b 1p type second cladding layer 5a
, 5b, and p-type current blocking layers 6a, 6b, respectively. Furthermore, the p-type substrate 12 has a self-luminous point 1a.
, lb, and 13 is the self-luminous point 1a, l
This is a separation groove for electrically isolating b.

この2ビームレーザアレイダイオードにおいて、例えば
、発光点1aを駆動するときには、n型コンタクト層2
aとp型基板12との間に順方向バイアスを印加して活
性層4aに電流を注入する。
In this two-beam laser array diode, for example, when driving the light emitting point 1a, the n-type contact layer 2
A forward bias is applied between a and the p-type substrate 12 to inject a current into the active layer 4a.

また、発光点1bを駆動するときには、同様にn型コン
タクト層2bとp型基板12との間に順方向バイアスを
印加する。
Further, when driving the light emitting point 1b, a forward bias is similarly applied between the n-type contact layer 2b and the p-type substrate 12.

一般に、自発光点1a 、lb間の距離は、光学系のレ
ンズの収差や集光効率等の問題から100、μm程度に
設定される場合が多く、この場合には、2つの発光点1
a 、lbからの光出力を共通の光学系で集光して独立
に活用することが可能となる。
Generally, the distance between the two light-emitting points 1a and 1b is often set to about 100 μm due to problems such as aberrations of lenses in the optical system and light collection efficiency.
It becomes possible to condense the optical outputs from a and lb using a common optical system and utilize them independently.

したがって、かかる半導体レーザを光デイスクメモリや
レーザプリンタ等に適用することにより、同時に2本以
上のレーザビームをそれぞれ独立に動作させて高速性、
高機能性を実現できろことになる。
Therefore, by applying such semiconductor lasers to optical disk memories, laser printers, etc., two or more laser beams can be operated simultaneously and at high speed.
This means that high functionality can be achieved.

[発明が解決しようとする課題] しかしながら、従来の多点発光型半導体レーザでは、上
述のように一方の電極側のp型基板12が両発光点1a
 、lbに共通となっているために、分離溝13による
分離だけでは、各発光点1a。
[Problems to be Solved by the Invention] However, in the conventional multi-point emitting semiconductor laser, as described above, the p-type substrate 12 on one electrode side has both light emitting points 1a.
, lb, the light emitting points 1a cannot be separated only by the separation groove 13.

lbが電気的に完全に分離されているとはいえず、この
ため、相互に電気的干渉が生じることになる。
It cannot be said that lb is completely electrically isolated, and therefore mutual electrical interference occurs.

例えば、一方の発光点1aを一定の光出力で駆動してい
るときに、他方の発光点1bの駆動を開始すると、それ
に伴って前記一方の発光点1aの先出力が変動すること
になり、したがって、例えば、上述の光デイスクメモリ
等に使用した場合には、この光出力の変動によってエラ
ーを起こすことになる。
For example, if one light emitting point 1a is being driven with a constant light output and the other light emitting point 1b starts to be driven, the previous output of the one light emitting point 1a will change accordingly. Therefore, for example, when used in the above-mentioned optical disk memory, etc., errors will occur due to fluctuations in optical output.

本発明は、上述の点に鑑みて為されたものであって、モ
ノリシック型の多点発光型半導体レーザにおける各発光
点間の電気的干渉を低減することを目的とする。
The present invention has been made in view of the above points, and an object of the present invention is to reduce electrical interference between light emitting points in a monolithic multi-point light emitting semiconductor laser.

[課題を解決するための手段] 本発明の多点発光型半導体レーザでは、上述の目的を達
成するために、複数の発光点からレーザ光を出力する多
点発光型のレーザダイオードを、絶縁性基板上に結晶成
長により形成し、前記レーザダイオードの各発光点を互
いに分離する分離溝を前記絶縁性基板に達するよう形成
している。
[Means for Solving the Problems] In order to achieve the above-mentioned object, in the multi-point emitting semiconductor laser of the present invention, a multi-point emitting laser diode that outputs laser light from a plurality of light emitting points is Separation grooves are formed on the substrate by crystal growth, and reach the insulating substrate to separate the light emitting points of the laser diodes from each other.

[作用] 上記構成によれば、絶縁性基板に至る分離溝によってp
型およびn型の画電極も完全に分離されることになり、
さらに、絶縁性基板の高抵抗化により電気的干渉は殆ど
無視できることになる。しかも、単一の絶縁性基板上に
多点発光型のレーザダイオードが形成された、いわゆる
モノリシック型のものであるために、個別の基板に構成
される、いわゆるハイブリッド型のものに比べて光出力
のバラツキがなく、量産性に優れている。
[Function] According to the above configuration, the separation groove reaching the insulating substrate allows the p
The type and n-type picture electrodes are also completely separated,
Furthermore, due to the high resistance of the insulating substrate, electrical interference can be almost ignored. Moreover, because it is a so-called monolithic type laser diode with multi-point emitting laser diodes formed on a single insulating substrate, the optical output is higher than that of a so-called hybrid type laser diode that is configured on separate substrates. There is no variation, and it is suitable for mass production.

[実施例] 以下、図面によって本発明の実施例について説明する。[Example] Embodiments of the present invention will be described below with reference to the drawings.

第1図は、本発明の一実施例に係る多点発光型半導体レ
ーザの構造を示す斜視図であり、この実施例は、2ビー
ムの半導体レーザを示しており、第3図の従来例に対応
する部分には、同一の参照符を付す。
FIG. 1 is a perspective view showing the structure of a multi-point emitting semiconductor laser according to an embodiment of the present invention. This embodiment shows a two-beam semiconductor laser, and is similar to the conventional example of FIG. Corresponding parts are given the same reference numerals.

同図において、Ia、lbは2つの発光点であり、各発
光点1a、lbに対してn型コンタクト112a、2b
Sn型第1クラツド層3a 、3b 、活性層4a 、
Jb Sp型第2クラッド層5a 、5b 1p型電流
ブロック層6a 、6bがそれぞれ対応しており、かか
る構成は、第3図の従来例と基本的に同様である。
In the same figure, Ia and lb are two light emitting points, and n-type contacts 112a and 2b are connected to each light emitting point 1a and lb.
Sn-type first cladding layer 3a, 3b, active layer 4a,
Jb Sp type second cladding layers 5a, 5b and 1p type current blocking layers 6a and 6b correspond to each other, and this structure is basically the same as the conventional example shown in FIG.

7a 、7bはp型コンタクト層、8は絶縁性基板、9
は各発光点1a 、lbを分離する分#l溝である。
7a, 7b are p-type contact layers, 8 is an insulating substrate, 9
is a #l groove separating each light emitting point 1a and lb.

この実施例では、上述のn型コンタクト層2a。In this embodiment, the above-mentioned n-type contact layer 2a.

2b、n型第1クラッド層3a 、3b 、活性層4a
、4b、p型第2クラッド層5a 、5b 、p型電流
ブロック層6a 、6bおよびp型コンタクト層7 a
、 7 bより構成されるレーザダイオードを絶縁性基
板8上に形成し、さらに、分離溝9を絶縁性基板8の内
部に至るように形成しており、これによって、p型コン
タクト層7a 、7bが互いに電気的に分離されて各発
光点1a 、lbに個別的に対応するようにしている。
2b, n-type first cladding layer 3a, 3b, active layer 4a
, 4b, p-type second cladding layer 5a, 5b, p-type current blocking layer 6a, 6b and p-type contact layer 7a
, 7b is formed on an insulating substrate 8, and furthermore, a separation groove 9 is formed to reach the inside of the insulating substrate 8, whereby p-type contact layers 7a, 7b are formed. are electrically isolated from each other so as to individually correspond to each light emitting point 1a, lb.

次に、上記構成の半導体レーザの製造手順を第2図に基
づいて説明する。
Next, the manufacturing procedure of the semiconductor laser having the above structure will be explained based on FIG. 2.

先ず、第2図(A)に示される絶縁性基板8、例えば、
C「をドープしたGa As基板上に、第2図(B)に
示されるように、p型のGa Asコンタクト層7a 
、7bおよびn型Ga As電流ブロック層6a 、6
bを、液相または気相成長させ、電流注入溝10a 、
10bをエツチングにより形成する。
First, the insulating substrate 8 shown in FIG. 2(A), for example,
As shown in FIG. 2(B), a p-type GaAs contact layer 7a is formed on a GaAs substrate doped with C.
, 7b and n-type GaAs current blocking layers 6a, 6
b is grown in liquid phase or vapor phase to form current injection groove 10a,
10b is formed by etching.

次に、第2図(C)に示されるように、液相成長法によ
り、p型Al yGa l YAS第2クラッド層5a
 、5b 、p型Al xGa 、−xAs活性層4a
 、4b 、 n型AI YGa 1−YAS第1クラ
ッド層3a 、3b 、n型Ga Asコンタクト層2
a 、2bを順次結晶成長させる。
Next, as shown in FIG. 2(C), a p-type Al yGa l YAS second cladding layer 5a is formed by liquid phase growth.
, 5b, p-type AlxGa, -xAs active layer 4a
, 4b, n-type AI YGa 1-YAS first cladding layer 3a, 3b, n-type GaAs contact layer 2
Crystals a and 2b are grown sequentially.

さらに、第2図(D)に示されるように、エツチングに
より分離溝9を絶縁性基板8に達するように形成して発
光点1a、lbを電気的に完全に分離し、さらに、電極
形成ができるように、エツチングによりp型Ga As
コンタクト層7a、7bの表面を一部露出させて電極部
11a 、l lbを形成し、これによって、第1図の
半導体レーザを得ることになる。
Furthermore, as shown in FIG. 2(D), a separation groove 9 is formed by etching to reach the insulating substrate 8 to completely isolate the light emitting points 1a and lb, and furthermore, electrode formation is performed. By etching, p-type GaAs
The surfaces of contact layers 7a and 7b are partially exposed to form electrode portions 11a and 11b, thereby obtaining the semiconductor laser shown in FIG.

この実施例の多点発光型半導体レーザにおいて、発光点
1aを駆動する場合には、n型コンタクト層2aとp型
コンタクト層7aとの間に、順方向のバイアスを印加し
て作動させる。また、同様に、発光点1bを駆動する場
合には、n型コンタクト層3bとp型コンタクト層7b
との間に順方向バイアスを印加して駆動する。
In the multi-point emitting semiconductor laser of this embodiment, when driving the light emitting point 1a, a forward bias is applied between the n-type contact layer 2a and the p-type contact layer 7a. Similarly, when driving the light emitting point 1b, the n-type contact layer 3b and the p-type contact layer 7b
It is driven by applying a forward bias between the two.

このように絶縁性基板8の上に、多点発光型のレーザダ
イオードを結晶成長により形成し、各発光点1a 、I
bを完全に分離する分離溝9を絶縁性基板8に達するよ
うに、すなわち、p型のコンタクト層7a 、7bが互
いに分離されるように形成したので、各発光点1a 、
lbの電気的干渉は生じなくなる。なお、絶縁性基板8
の電気抵抗率は、例えば、一般に用いられているCrド
ープGaΔS基板で、約108Ωcmであり、基板によ
る漏れ電流は、事実上無視し得るものである。また、本
発明の半導体レーザは、モノリシック型であるので、個
別の基板に構成されるハイブリッド型の半導体レーザに
比べて各先出力の特性のバラツキが極めて少なく、量産
性等において優れている。
In this way, a multi-point emitting type laser diode is formed on the insulating substrate 8 by crystal growth, and each light emitting point 1a, I
Since the isolation groove 9 that completely separates the light emitting points 1a and 1b is formed to reach the insulating substrate 8, that is, to separate the p-type contact layers 7a and 7b from each other, each light emitting point 1a,
lb electrical interference will no longer occur. Note that the insulating substrate 8
For example, the electrical resistivity of a commonly used Cr-doped GaΔS substrate is about 10 8 Ωcm, and the leakage current due to the substrate can be virtually ignored. Furthermore, since the semiconductor laser of the present invention is of a monolithic type, there is extremely little variation in the characteristics of each end output compared to a hybrid type semiconductor laser configured on separate substrates, and it is superior in terms of mass productivity.

上述の実施例では、At Ga Asレーザについて説
明したけれども、本発明は、これに限るものではなく、
In Ga As レーザ等の他のレーザにも同様に適
用できるのは勿論である。
Although the At Ga As laser was described in the above embodiment, the present invention is not limited to this.
Of course, the present invention can also be applied to other lasers such as InGaAs lasers.

[発明の効果] 以上のように本発明によれば、絶縁性基板上に、多点発
光型のレーザダイオードを形成し、前記レーザダイオー
ドの各発光点を互いに分離するための分MWIIを前記
絶縁性基板に達するよう形成しているので、各発光点を
電気的に完全に分離することができ、各発光点の電気的
干渉がほとんどなくなり、完全に独立に駆動できること
になる。
[Effects of the Invention] As described above, according to the present invention, a multi-point emitting type laser diode is formed on an insulating substrate, and a portion MWII for separating each light emitting point of the laser diode from the insulating substrate is formed on the insulating substrate. Since the light-emitting points are formed so as to reach the transparent substrate, each light-emitting point can be completely electrically isolated, and there is almost no electrical interference between the light-emitting points, so that each light-emitting point can be driven completely independently.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例の多点発光型半導体レーザの
構造を示す斜視図、第2図は第1図の実施例の製造手順
を示す図、第3図は従来例の構造を示す斜視図である。 la 、lb・・・発光点、8・・・絶縁性基板、9・
・・分離溝。
FIG. 1 is a perspective view showing the structure of a multi-point emitting semiconductor laser according to an embodiment of the present invention, FIG. 2 is a diagram showing the manufacturing procedure of the embodiment of FIG. 1, and FIG. 3 is a diagram showing the structure of a conventional example. FIG. la, lb... Light emitting point, 8... Insulating substrate, 9...
... Separation groove.

Claims (1)

【特許請求の範囲】[Claims] 複数の発光点からレーザ光を出力する多点発光型のレー
ザダイオードを、絶縁性基板上に結晶成長により形成し
、前記レーザダイオードの各発光点を互いに分離する分
離溝を前記絶縁性基板に達するよう形成してなる多点発
光型半導体レーザ。
A multi-point emitting laser diode that outputs laser light from a plurality of light emitting points is formed on an insulating substrate by crystal growth, and separation grooves that separate the light emitting points of the laser diode from each other reach the insulating substrate. A multi-point emitting semiconductor laser formed as follows.
JP8941788A 1988-04-12 1988-04-12 Semiconductor laser for emitting light beams at multiple points Pending JPH01260878A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8941788A JPH01260878A (en) 1988-04-12 1988-04-12 Semiconductor laser for emitting light beams at multiple points

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8941788A JPH01260878A (en) 1988-04-12 1988-04-12 Semiconductor laser for emitting light beams at multiple points

Publications (1)

Publication Number Publication Date
JPH01260878A true JPH01260878A (en) 1989-10-18

Family

ID=13970077

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8941788A Pending JPH01260878A (en) 1988-04-12 1988-04-12 Semiconductor laser for emitting light beams at multiple points

Country Status (1)

Country Link
JP (1) JPH01260878A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09167878A (en) * 1995-12-14 1997-06-24 Nec Corp Semiconductor laser array
US5805630A (en) * 1993-07-12 1998-09-08 U.S. Philips Corporation Optoelectronic semiconductor device with an array of semiconductor diode lasers and method of manufacturing such a device
JPH11274634A (en) * 1998-03-19 1999-10-08 Hitachi Ltd Semiconductor laser array element and semiconductor laser array device
EP1513234A4 (en) * 2002-06-10 2005-10-19 Sony Corp Multibeam semiconductor laser, semiconductor light- emitting device and semiconductor device
JP2011003627A (en) * 2009-06-17 2011-01-06 Nippon Telegr & Teleph Corp <Ntt> Differential signal driving laser array
JPWO2020084858A1 (en) * 2018-10-23 2021-02-15 三菱電機株式会社 Semiconductor optical integrated device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS546789A (en) * 1977-06-17 1979-01-19 Nec Corp Semiconductor light emitting device
JPS62128586A (en) * 1985-11-29 1987-06-10 Matsushita Electric Ind Co Ltd Manufacture of optoelectronic integrated circuit

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS546789A (en) * 1977-06-17 1979-01-19 Nec Corp Semiconductor light emitting device
JPS62128586A (en) * 1985-11-29 1987-06-10 Matsushita Electric Ind Co Ltd Manufacture of optoelectronic integrated circuit

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5805630A (en) * 1993-07-12 1998-09-08 U.S. Philips Corporation Optoelectronic semiconductor device with an array of semiconductor diode lasers and method of manufacturing such a device
JPH09167878A (en) * 1995-12-14 1997-06-24 Nec Corp Semiconductor laser array
JPH11274634A (en) * 1998-03-19 1999-10-08 Hitachi Ltd Semiconductor laser array element and semiconductor laser array device
EP1513234A4 (en) * 2002-06-10 2005-10-19 Sony Corp Multibeam semiconductor laser, semiconductor light- emitting device and semiconductor device
US6995406B2 (en) 2002-06-10 2006-02-07 Tsuyoshi Tojo Multibeam semiconductor laser, semiconductor light-emitting device and semiconductor device
JP2011003627A (en) * 2009-06-17 2011-01-06 Nippon Telegr & Teleph Corp <Ntt> Differential signal driving laser array
JPWO2020084858A1 (en) * 2018-10-23 2021-02-15 三菱電機株式会社 Semiconductor optical integrated device

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