JPH01253917A - Designing method for circuit pattern of integrated circuit - Google Patents

Designing method for circuit pattern of integrated circuit

Info

Publication number
JPH01253917A
JPH01253917A JP63081500A JP8150088A JPH01253917A JP H01253917 A JPH01253917 A JP H01253917A JP 63081500 A JP63081500 A JP 63081500A JP 8150088 A JP8150088 A JP 8150088A JP H01253917 A JPH01253917 A JP H01253917A
Authority
JP
Japan
Prior art keywords
pattern
integrated circuit
circuit
area
chip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63081500A
Other languages
Japanese (ja)
Inventor
Kunio Mori
邦雄 森
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP63081500A priority Critical patent/JPH01253917A/en
Publication of JPH01253917A publication Critical patent/JPH01253917A/en
Pending legal-status Critical Current

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  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Dicing (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)

Abstract

PURPOSE:To reduce chip area of the same pattern by designing a pattern required only for forming an integrated circuit at a scribe area. CONSTITUTION:A wafer 2 consists of a scribe area 4 where a pattern (IC circuit pattern) 3 needed for operating an integrated circuit and a pattern (IC producing pattern) 5 needed only for creating an integrated circuit are formed it two directions at the outer periphery and it is cut at a vertical and horizontal cutting part 1 to form each chip. In this case, a row of pattern group 5 needed only when forming an integrated circuit is arranged on a scribe area 4 of a wafer 2 and the function this pattern is over when cutting is made. It allows an integrated circuit to be designed easily, made compact, and area to be utilized efficiently.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は集積回路の回路パタン設計方法に関し、特に集
積回路製作上にのみ必要であり、集積回路の動作上必要
でないパタンに着目した集積回路の回路パタン設計方法
に関する。
[Detailed Description of the Invention] [Field of Industrial Application] The present invention relates to a method of designing circuit patterns for integrated circuits, and in particular, an integrated circuit that focuses on patterns that are necessary only for the production of the integrated circuit and are not necessary for the operation of the integrated circuit. This invention relates to a circuit pattern design method.

〔従来の技術〕[Conventional technology]

従来、集積回路の回路パタンには、大別して集積回路の
動作に必要な素子及び配線のパタンと、集積回路製作に
のみ必要な位置合せ、寸法精度測定用等のパタンかあり
、これらは互いに独立している。
Conventionally, circuit patterns for integrated circuits can be roughly divided into patterns for elements and wiring necessary for integrated circuit operation, and patterns for alignment and dimensional accuracy measurement required only for integrated circuit production, and these are independent of each other. are doing.

第3図は従来の一例を説明するためのウェーハの平面図
である。
FIG. 3 is a plan view of a wafer for explaining a conventional example.

第3図に示すように1かかるウェーハ12のスクライブ
領域14を通う縦横の切断部11で切断される個々の集
積回路のパタン部13は集積回路の動作上必要なパタン
と作成上必要なパタン15とが混在して存在している5 第4図は第3図に示す1チップ分の回路パタン図である
As shown in FIG. 3, the pattern portion 13 of each integrated circuit cut by the vertical and horizontal cutting portions 11 passing through the scribe area 14 of the wafer 12 is a pattern 13 necessary for the operation of the integrated circuit and a pattern 15 necessary for production. FIG. 4 is a circuit pattern diagram for one chip shown in FIG. 3.

第4図に示すように、集積回路はウェーハ12と呼ばれ
る基板上に同時に腹数個のICを形成し、それらを切断
してチップとして作製するが、1チップ分としてのパタ
ーン混在部13内罠は集積回路の作製上のみのパターン
15と素子16および配417に代表される回路パタン
とが共に形成されている。このチップ単位の切断の精度
のためにつェーハ12上での各チップ間を区3!!+7
?スクライブ領域14といわれる空白部分がある。
As shown in FIG. 4, integrated circuits are produced by simultaneously forming several ICs on a substrate called a wafer 12 and cutting them into chips. A pattern 15 only for manufacturing an integrated circuit and a circuit pattern typified by an element 16 and a wiring 417 are formed together. In order to achieve the precision of cutting on a chip-by-chip basis, there are 3 sections between each chip on the wafer 12! ! +7
? There is a blank area called a scribe area 14.

〔発明が解決しようとする禰題〕[Problem that the invention seeks to solve]

上・ホl−た従来の集積回路の回路パタン設計方法は集
積回路製作上にのみ必要なパタンと回路動作上必要なパ
タ/とを混在して設計しているので、製作上にのみ必要
なパタンそ設計するための領域を確株した上で動作上必
要なパタンの設計を行わねばならず、回路パタン設計を
複雑にするとい゛う欠点がある。また、製作−ヒにのみ
必要なパタンはチップVCなった彼は動作に関係がない
ため不必要であり、この領域はICとして無駄になると
いう欠点がある。
The conventional circuit pattern design method for integrated circuits described above mixes patterns necessary only for integrated circuit fabrication and patterns necessary for circuit operation, so patterns necessary only for fabrication are mixed. This method has the drawback that it is necessary to design a pattern necessary for operation after securing an area for designing the pattern, which complicates the circuit pattern design. Further, the pattern required only for manufacturing is unnecessary because it has no relation to the operation of the chip VC, and this area has the drawback of being wasted as an IC.

本発明の目的は、かかる集積回路の設計を容易にすると
ともに小形にし、亘つ面積の有効利用を実現する集積回
路パタン設計方法を提供することにある。
An object of the present invention is to provide an integrated circuit pattern design method that facilitates the design of such an integrated circuit, reduces the size of the integrated circuit, and realizes effective use of area.

〔課題を解決するための手段〕[Means to solve the problem]

本発明の集積回路の回路パタン設計方法は、集積回路の
動作上必要な素子等のパタン全回路パタン部に形成し、
且つ集積回路の製作上にのみ必要なパタンを前記回路パ
タンの外周部のスクライブ領域く形成した後、このスク
ライブ領域で各チップに切断するように構成される。
The method for designing a circuit pattern of an integrated circuit according to the present invention includes forming patterns of elements, etc. necessary for the operation of an integrated circuit in all circuit pattern portions,
In addition, after a pattern necessary only for manufacturing an integrated circuit is formed in a scribe area on the outer periphery of the circuit pattern, each chip is cut in this scribe area.

〔実施例〕〔Example〕

次に、本発明の実施例について図面を参照して説明する
Next, embodiments of the present invention will be described with reference to the drawings.

第1図は本発明の一実施例を説明するためのウェーハの
平面図である。
FIG. 1 is a plan view of a wafer for explaining one embodiment of the present invention.

第1図に示すように、かかるウェーハ2は集積回路動作
上必要なパタン(IC回路パタン)3と!Ik積回路作
製にのみ必要なパタン(ICC作製メタ各チップを製造
している。この場合、ウェーハ2のスクライブ領域4上
では集積回路作製にのみ必要なパタン5群が一列に並び
切断されるときにはかかるパタンの機能は丁でに終了し
ている。
As shown in FIG. 1, the wafer 2 has a pattern (IC circuit pattern) 3 necessary for integrated circuit operation. Patterns necessary only for Ik integrated circuit production (ICC production meta) Each chip is manufactured. In this case, on the scribe area 4 of the wafer 2, a group of 5 patterns necessary only for integrated circuit production are lined up in a row and when cut. The functionality of such a pattern has ended.

第2図は第1図に示す1チップ分の回路パタン図である
FIG. 2 is a circuit pattern diagram for one chip shown in FIG. 1.

第2図に示すように、−かかるチップは前述のようにI
C回路パタン3とスクライブ領域4とからなり、回路パ
タン3には各種の素子6やこれら素子6間を接続するた
めの配縁7が形成され、一方スクライブ領域4にはIC
作製パタン5が形成されている。このように、回路パタ
ン3と作製パタン5とを分離し作製パタン5をスクライ
ブ領域4に形成することにより、回路パタン3の設計は
容易となり、小形化されるだけでなくICC回路7ノ7
30 〔発明の効果〕 以上説明したように、本発明はスクライブ領域に集積回
路作製にのみ必要なパタンを設計することにより、同パ
タン分のチップ面積を小さくすることができるという効
果がある。また、同パタン金気にせずに回路パタンを設
計できるので、設計期間の短縮配線の迂回が無くなり、
チップ面積を有効利用することができるという効果があ
る。
As shown in FIG. 2, - such a chip is
It consists of a C circuit pattern 3 and a scribe area 4, and the circuit pattern 3 is formed with various elements 6 and a wiring 7 for connecting these elements 6, while the scribe area 4 is formed with an IC.
A manufacturing pattern 5 has been formed. In this way, by separating the circuit pattern 3 and the manufacturing pattern 5 and forming the manufacturing pattern 5 in the scribe area 4, the design of the circuit pattern 3 is not only facilitated and miniaturized, but also the ICC circuit 7 no.
30 [Effects of the Invention] As explained above, the present invention has the effect that by designing a pattern necessary only for integrated circuit fabrication in the scribe region, the chip area for the same pattern can be reduced. In addition, since you can design a circuit pattern without worrying about the cost of the same pattern, you can shorten the design period and eliminate wiring detours.
This has the effect that the chip area can be used effectively.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例を説明するためのウェーハの
平面図、第2図は第1図に示すlチク1分の回路パタン
図、第3図は従来の一例を説明するためのウェーハの平
面図、第4図は第3図に示す1チップ分の回路パタン図
である。 l・・・・・・切断部、2・・・・・・ウェーハ、3・
・・・・・IC回路パタン部、4・・・・・・スクライ
ブ領域、5・・・・・・IC作製バタlン、6・・・・
・・素子、7・・・・・・配線。 代理人 弁理士  内 原   晋
FIG. 1 is a plan view of a wafer for explaining an embodiment of the present invention, FIG. 2 is a circuit pattern diagram for one inch shown in FIG. 1, and FIG. 3 is a diagram for explaining a conventional example. The plan view of the wafer, FIG. 4, is a circuit pattern diagram for one chip shown in FIG. 3. l... Cutting section, 2... Wafer, 3.
...IC circuit pattern section, 4...Scribe area, 5...IC fabrication pattern, 6...
...Element, 7...Wiring. Agent Patent Attorney Susumu Uchihara

Claims (1)

【特許請求の範囲】[Claims]  集積回路の動作上必要な素子等のパタンを回路パタン
部に形成し、且つ集積回路の製作上にのみ必要なパタン
をスクライブ領域に形成した後、このスクライブ領域で
各チップに切断することを特徴とする集積回路の回路パ
タン設計方法。
A feature of this method is that the pattern of elements necessary for the operation of the integrated circuit is formed in the circuit pattern part, and the pattern necessary only for manufacturing the integrated circuit is formed in the scribe area, and then each chip is cut in this scribe area. A circuit pattern design method for integrated circuits.
JP63081500A 1988-04-01 1988-04-01 Designing method for circuit pattern of integrated circuit Pending JPH01253917A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63081500A JPH01253917A (en) 1988-04-01 1988-04-01 Designing method for circuit pattern of integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63081500A JPH01253917A (en) 1988-04-01 1988-04-01 Designing method for circuit pattern of integrated circuit

Publications (1)

Publication Number Publication Date
JPH01253917A true JPH01253917A (en) 1989-10-11

Family

ID=13748091

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63081500A Pending JPH01253917A (en) 1988-04-01 1988-04-01 Designing method for circuit pattern of integrated circuit

Country Status (1)

Country Link
JP (1) JPH01253917A (en)

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