JPH01250874A - Test data originating device for integrated circuit testing device - Google Patents

Abstract

PURPOSE:To reduce the labor for data converting operation between testing devices by converting test data and producing a test data file which contains terminal information, etc., and originating test data for various testing devices by using the file. CONSTITUTION:The test data file 1 is described in test data description language or language for testing devices, and a test data base generating device 2 generates the test data base file from the file 1. Here, the file 3 contains terminal information 31 on terminal names, etc., timing information 32 on input and output signals where waveforms of terminals are described, and test pattern information 33 where test patterns, etc., are described. Then test data 5A and 5B for integrated circuit testing devices A and B are originated by using test data originating devices 4A and 4B. A file 6 wherein limit items of various testing devices are entered is used and a comparing device 7 compares the test data base with the various limit items to judge whether or not the data can be converted into data for the various testing devices.

Description

DETAILED DESCRIPTION OF THE INVENTION [Object of the Invention (Field of Industrial Application) The present invention relates to a test data creation device for an integrated circuit testing device.

(Prior Art) In recent years, with the progress of semiconductor technology, the degree of integration of integrated circuits has become remarkable. The large-scale integration of integrated circuits has brought advantages such as improved functionality and weight reduction of various devices using the integrated circuits, but on the other hand, it has made testing of the integrated circuits themselves extremely difficult. For this reason, the development of integrated circuit testing equipment is active, and a variety of testing equipment that is superior in terms of accuracy and functionality has been produced.

Incidentally, integrated circuit testing equipment is generally used differently in the integrated circuit development stage and the mass production stage. Strict testing is required at the development stage when manufacturing technology has not yet been established, so expensive testing equipment with extremely high accuracy and functionality is required.

Testing when shipping mass-produced products is simpler than testing at the development stage, so inexpensive mass-production test equipment is used. In such a case, it is necessary to create test data for each test device. In order to perform data conversion from test data of one test device to test data of another test device without creating test data for each test device, it is necessary to create a conversion tool. The same situation applies when a new integrated circuit testing device is introduced in addition to the integrated circuit testing device that has been used up until now.

FIG. 3 shows an example of data conversion between four test devices. In order to perform data conversion between each test device as shown in the figure, as many as 12 types of data conversion work are required. Therefore, each time the number of test equipment increases, it is necessary to create many conversion tools, which makes the work complicated.
Managing conversion tools also becomes difficult.

(Problems to be Solved by the Invention) As described above, when handling a plurality of different integrated circuit testing devices, there is a problem in that the creation of test data and data conversion work for each becomes complicated.

SUMMARY OF THE INVENTION An object of the present invention is to provide a test data creation device for an integrated circuit testing device that solves these problems.

[Structure of the Invention] (Means for Solving the Problems) The present invention provides terminal information, input/output signal timing information, and information obtained by converting test data written in a test data description language or a test device language. A method for creating test data for various types of integrated circuit testing equipment using a test database file containing test patterns, and a method for determining whether the data in the test database file can actually be used for an existing integrated circuit testing equipment. The present invention is characterized by comprising means for comparing and outputting the data in the test database file with the limitations.

(Function) According to the present invention, it is sufficient to create one test data creation device for one integrated circuit testing device from a test database file, and there is no need to perform test data conversion work for other testing devices. In the case of computer control, the test data creation device is a conversion program for matching data to the format of each test device.

Also, it is possible to automatically check whether the test data in the test database file is compatible with the test equipment.

(Example) The present invention will be explained in detail below.

FIG. 1 shows the basic configuration of a test data creation device for an integrated circuit testing device according to an embodiment of the present invention.

Corresponding to FIG. 3, a case in which there are four test devices is shown. A test database file 3 is created by a test database creation device 2 from a test data file 1 written in a test data description language or a language for test equipment.
is created. The test database contains terminal names and attributes as its contents.

Terminal information 31 that describes test equipment terminal numbers, input/output signal timing information 32 that describes waveforms and delay widths for each terminal, test patterns, timing correspondence numbers,
It has test pattern information 33 in which repetition information and DC test terminal information are described.

For the integrated circuit testing device A, test data 5A is created using the test data creation device 4^.

For test device B, test data 5B is created using test data creation device 4B. Similarly, test data is created for each test device using one test data creation device.

On the other hand, by preparing a file 6 that describes the limitations of each test device, and comparing the test database with various limitations such as the number of input/output terminals and the number of test patterns, it is possible to A comparison device 7 is provided for determining whether or not the data can be converted as data. The comparison result of the comparator 7 is output to the CRT 8.

Thus, according to this embodiment, there are four test data creation devices between the test database file and each test device, and five including the test database creation device for creating the test database file. No need for multiple conversion tools as in the past. Therefore, the task of creating test data becomes easier and file management becomes easier.

FIG. 2 is a flowchart in the case where test data for a test device is automatically created by a computer using a test database. In step (a), it is determined whether there is a test database, and if there is a test database, a test device to be used is selected in step (e). If there is no test database, it is determined in step (b) whether there is test data for the test device, and if there is, it is converted into a test database in step (C), and a test device is selected. . If not, in step (d), test data is manually written, the test data is compiled into a test database, and then a test device is selected.

Next, in step (e), the restrictions of the selected test device are checked, and if a violation is found, an error message is output (g) and the execution is stopped.

If the restrictions are checked and there are no violations, test data is created for the test device selected in step (i) and the process ends.

In this way, computer control using the test database file simplifies the creation of test data for various test devices and the task of converting test data between a wide variety of test devices.

[Effects of the Invention] As described above, according to the test data creation device for an integrated circuit testing device of the present invention, a test database file obtained by converting a test data description language or a test device language is prepared, Using this, it is possible to easily create test data for various types of integrated circuit testing equipment, and to save labor in data conversion work between testing equipment. It is also possible to automatically check whether the test database is compatible with the test equipment.

[Brief explanation of the drawing]

FIG. 1 is a diagram showing the principle configuration of a test data creation device for an integrated circuit testing device according to an embodiment of the present invention, and FIG. 2 is a flowchart for explaining the operation when the device is configured using a computer. , FIG. 3 is a diagram for explaining the state of data conversion work in a conventional test device. 1...Test data,...Test database creation device, 3...Test database file +4A~4
D...Test data creation device for integrated circuit testing. 5A to 5D...Test data for test device, 6...Restrictions file, 7...Comparison device, 8...CRT0
Applicant's agent Patent attorney Takehiko Suzue

Claims (1)

[Claims] Create test data for integrated circuit test equipment using a test database file obtained by converting a test data description language or test equipment language that contains integrated circuit terminal information, input/output signal timing information, and test pattern information. and means for comparing the constraints of the integrated circuit testing device with each piece of information in the test database file and outputting the comparison results. .