JPH01249692A - Molecular beam epitaxy device - Google Patents

Molecular beam epitaxy device

Info

Publication number
JPH01249692A
JPH01249692A JP63077798A JP7779888A JPH01249692A JP H01249692 A JPH01249692 A JP H01249692A JP 63077798 A JP63077798 A JP 63077798A JP 7779888 A JP7779888 A JP 7779888A JP H01249692 A JPH01249692 A JP H01249692A
Authority
JP
Japan
Prior art keywords
group
evaporation
evaporation source
sources
growth chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP63077798A
Other languages
Japanese (ja)
Other versions
JPH0516399B2 (en
Inventor
Haruo Tanaka
田中 治夫
Masahito Mushigami
雅人 虫上
Yuji Ishida
祐士 石田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rohm Co Ltd
Original Assignee
Rohm Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rohm Co Ltd filed Critical Rohm Co Ltd
Priority to JP63077798A priority Critical patent/JPH01249692A/en
Priority to EP89105248A priority patent/EP0335267B1/en
Priority to DE68926577T priority patent/DE68926577T2/en
Priority to EP92117113A priority patent/EP0529687B1/en
Priority to DE68916457T priority patent/DE68916457T2/en
Priority to TW080105276A priority patent/TW202485B/zh
Priority to US07/329,313 priority patent/US4944246A/en
Priority to CA000594977A priority patent/CA1333038C/en
Priority to KR1019890004152A priority patent/KR930010750B1/en
Publication of JPH01249692A publication Critical patent/JPH01249692A/en
Publication of JPH0516399B2 publication Critical patent/JPH0516399B2/ja
Priority to CA000616594A priority patent/CA1333039C/en
Priority to KR1019930013044A priority patent/KR930010751B1/en
Granted legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)

Abstract

PURPOSE:To provide the above device with which the simplification of the device and the prolonged life of materials are simultaneously attained by disposing a group V evaporation source nearer a substrate holder than the other evaporation sources among plural pieces of the evaporation sources disposed in such a manner that the axial lines face the substrate holder and abolishing the shutter of the group V evaporation source. CONSTITUTION:Plural pieces of the evaporation sources 5a, 5b, 5c... are disposed to the bottom of a growth chamber 2 in such a manner that the axial lines (a), (b), (c)... thereof face the center of the substrate holder 3. Particularly the evaporation source 5a contg. the group V element such as As is disposed diametrically opposite to the holder 3. In addition, the evaporation source 5a is disposed nearer the holder 3 than the other evaporation sources and a shutter is abolished. On the other hand, the apertures of the other evaporation sources 5b, 5c... are so constituted as to be opened and closed by shutters 7. Since the above-mentioned group V evaporation source 5a is disposed nearer the holder 3 than the other evaporation sources, the wasteful scattering of molecular beams into the growth chamber 2 is prevented.

Description

【発明の詳細な説明】[Detailed description of the invention]

【産業上の利用分!l!i′] この発明は、分子綿エピク・1−シ一装置に関し、詳し
くは、装置の簡略化、および■族成長H才1の効率的使
用を達成したものに関する。 【従来の技術】 m −−v族化合物半導体の製造過程におい″C単結晶
基板上にl1l−V族元素をエピクー1−シャル成長さ
せる手法としで、分子線エビター1−シー法が?l r
lされ°(いる。これは、真空蒸ri法の一種であり、
ガリウノ、G+i、アルミュウノ、Δ1、インジウノ、
In、などo)n+族元素、および、ひ素As、すip
などのV族元素を成長月料として、IQ  torrの
超高真空の中でこれらを原子または分子線の形で照射し
てG、lAsあるいは■nPなどの単結晶載板1−にG
a As 、At G、】八s、lnr’あるいはIn
 G:i l’なとのTl1−V族化合物主導イ木4i
!j品をエピクー1ンヤル)戊1..さ−Uる力l去C
ある。このよう41′分子#+l!エピクー1−シー法
に、1、ろと、0)超高真空中ごの茄7□ごあるため、
残留カスからの不純物の混入がJI゛當に少7.(<−
基(1(表面をil’i’浄に保つことができる、■大
面Ji’iにわたり、均 ごかつ原子し・・・ル゛(平
坦なj模を4(する、二とかできる、■茶若速度を11
常に遅くすることかごさ、しかも正4′n]に制御でき
るため、厚j1りを数人というii’lj;i ”i’
−ルjのオーダて高精度に制御することかできる、■多
成分系の混晶膜も)゛に発源を噌や−JだGノ゛(容易
に1ijられる、■結晶成長、1N中に成Jj: IN
表jTij、あ?、いは分子線から成長条件についての
さ:1、ざまな11′饅μを11するごとかてき、そl
′1.を直4)に成]5.−制御にソイードハノクする
ことかできる、なとの利点をコニ5受することができる
。 後jホする本願発明のI!I! f44’を容易にする
ため、1:記のような分子11fエピター1−シー法を
行う分子線上ビター)−シ一装置の概要を第2図に示−
4概111:i J11!成図によって説明する。 超、1′、(空ポンプIにつなかろ成jこ?;・2の中
央にε、1、!、(扱ボルタ3か配置され、これは、〕
、(板トの結晶;氏上Qを一1毛)、5′L)ノとJ−
4タメニ1!、”回’j: −(: 3 Zr A、う
になっ−(いる。El、た、この占(板ボルダ3に保J
1されろ!、(板を所望の1M1度にy11温するため
のヒータがイ・1設されている。そして、成J1.1.
室2の一側には、−1−記基板ポルク(3に向υ″(開
[−」するルツボ4に各成長祠t′−1を充填してなる
蝮数個の蓄光d+、t t)・・・か配置される。ごの
蒸発源5 ・もまた、温度センリによる検出温風にコ、
(づいて制御されるヒータにより、所望の温度にy昌1
11.されろようになっζいる。なお各蒸発源5は、名
Y発源が互いに執)影響やンク染の影響を受iJんいよ
・うに、液体窒素シュラウF [iて囲71これどいる
。結晶成長の開始および(’r’ 1m II、各Jl
パンポ4の開1−1の前面に配置されたシャック7・を
開閉ずろことに3F′、り行われる。 たとえば、Ga As Ii’4;を晶j、L’ t&
 、、l−にGa八へ IN〕を成長さ−けるにし、1
、Gaか充填された蒸発源およびAsか充1i(された
プに発源5を所定の温度に力11熱するとともに)、(
板ボルダ3の’/に!4度を適当な温度に設定しつ・′
、)、−1−記の各赤光/J!、’t 5のシャ、り7
を所定II冒;jl lj4状態とする。な衿、Δ1を
−titに蒸発さ一已るとG+ly:AI、−%Δ5I
F7が成長−づる。ごのときGaと八1の蒸発j、l 
o)比を制J:Ill t’れば、A11l成Xが制御
できる。:I、た、成長層をr)形にするには、Sl、
Snなどを同It;、に裁発さ−1.p形に−jる乙こ
は、])(・、M I: i、(とをし胃発さ一已る必
要がある。
[Industrial use! l! i'] This invention relates to a molecular cotton epic 1-silicon device, and more particularly to one that achieves the simplification of the device and the efficient use of the group-grown H-silicon. [Prior Art] In the manufacturing process of m--v group compound semiconductors, the molecular beam evictor 1-c method is used as a method for epitaxially growing l1l-V group elements on a C single-crystal substrate.
This is a type of vacuum evaporation method,
Gariuno, G+i, Almuuno, Δ1, Injiuno,
o) n+ group elements such as In, and arsenic As, sip
Group V elements, such as
a As , At G, ]8s, lnr' or In
G: i l' Tl1-V group compound led tree 4i
! 1. .. Sa-Uru force l left C
be. Like this 41′ molecule #+l! Since the Epicu 1-C method includes 1, 0) 7□ in an ultra-high vacuum container,
7. Contamination of impurities from residual residue is very low. (<-
Group (1) The surface can be kept clean, ■ A large surface Ji'i can be uniformly and atomically... Chawaka speed 11
Since it is possible to always slow down the height and control it to a positive 4'n], the thickness j1 can be controlled to several people ii'lj;i ``i'
- Multi-component mixed crystal films that can be controlled with high precision on the order of -J and G (can be easily controlled in 1N) Ninari Jj: IN
Table jTij, ah? , or about the growth conditions from the molecular beam: 1.
'1. directly into 4)]5. - You can take advantage of the advantages of being able to control Soyidhanok. The I of the present invention that follows! I! In order to facilitate f44', an outline of the molecular beam epitaxial apparatus for carrying out the molecular 11f epitaxial method as described above is shown in Figure 2.
4 General 111: i J11! This will be explained using a diagram. Super, 1', (Connect it to the empty pump I?; ε, 1,!, (The handling voltage 3 is placed in the center of 2, which is,)
, (Crystal of plate; Ujigami Q 11 hair), 5'L)ノ and J-
4 tameni 1! ,"times'j: -(: 3 Zr A, sea urchin - (there.
Become 1! , (A heater is installed to heat the board to the desired temperature of 1M1 degree.
On one side of the chamber 2, there are several phosphorescence d+,t ) ... is placed.The evaporation source 5 ・is also connected to the hot air detected by the temperature sensor.
(The heater controlled by
11. It's like it's going to be done. In addition, each evaporation source 5 has a liquid nitrogen filtration source 71, so that the evaporation sources 5 are not influenced by each other or dyed with liquid nitrogen. Start of crystal growth and ('r' 1m II, each Jl
The opening and closing of the shack 7 disposed in front of the opening 1-1 of the pump 4, especially 3F', is performed. For example, Ga As Ii'4;
,,In order to grow Ga8 IN], 1
, an evaporation source filled with Ga and an evaporation source filled with As (while heating the source 5 to a predetermined temperature), (
Board boulder 3'/! Set the appropriate temperature to 4 degrees.
, ), -1- each red light/J! ,'t 5's Sha, Ri7
is set to a predetermined II effect; jl lj4 state. When Δ1 is evaporated to -tit, G+ly:AI, -%Δ5I
F7 is growing. When Ga and 81 evaporate j, l
o) By controlling the ratio J:Ill t', the A11l component X can be controlled. :I, T, To make the growth layer r)-shaped, Sl,
Sn, etc. were adjudicated by the same It;, -1. This is the p-form, ]) (・, M I: i, ().

【発明か循″決し、1、・)とjる課題】従来のこの神
の分子−線エビター1シ一装置において番」、第2図に
も示されている。J、うに、あるいは、特開昭62−6
2512υ−公(ドお、1、Q・勃開昭61−−−53
7 ] 6号公+旧こ示されζいろ3Jうに、Ill族
元素とV族元素とにかかわらず、ず・\ての元素を成長
4,1石とAる蒸発源5・・・がノ1(机ボルク3から
ム5[ぼ等距離のイ装置に配置され、か・′−〕、4へ
−この蒸発源5につき、分子線を)ゲb蔽および開放す
るシャッタ7が設6ノられ゛(いる。このような41M
成に、]、イ)と、回転ツヤ、夕をず・\ての苅発源に
対して4N]設させる都合ト、最も消費量の多いしj/
、; A 、Hなどの■族元素のための茎発諒の大きさ
に限界かあり、+411ノj命が短くなり、ぞのれ11
果として装置の&fryti11転回間か短くな転回−
う問題かある。 とごろで、II族元素に夕、1する族元素の仁]箔係数
は、基板1−のIll族元兎の存在に、」、っ−(決定
されることが知られい−(る。たとえば、〔;J1ΔS
基板−1へ0)Asのイ・J’ ”s’i 4i数ε」
、Gaあるいは八1が存在すれば1てあり、存在しなり
ればOである。従来の装置において■族元素用の茶発源
がII族元素用の蒸発源と同様に基板ホルダから所定距
離躍れた位置に配置され−Cいるのは、基板面・\の■
族元素のイ;j着の均一性を慮ったものであると考えら
れるが、これG、j、上記のようなV族元素の?−1着
係数を考えた場合妥当とはいいデI(い。■族元素の基
板への41.iYlは、llt族元素の(=J着によっ
て決定されるのであり、III族元素が基41M+に均
一に(=19ずれは、V族元素もそれにしたがっ゛(均
一にイス1着するからである。 また、liホの。l、うに■族元素は基板十にIll族
元素か存在するごとによってはしめてイ(1着すること
、お、l、び、装置運転中のV族元素の温度ε;I: 
300゜0程度と他の苛発源の温度に比して低1M、で
あり、この温度制御に、Lろ薄光の開始および停止トが
比較的容易であること、なとから、従来の装置に4ンい
て■族元素の蒸発源にも設りられているシートツクは絶
対必須のものであるとはいえない。 この発明ε:l、−1−述の知見のもとで従来の分子線
エピタキシ一装置に、1′iJる問題を一ノドに解消し
、装置の簡略化および材料ツJ命の延長を同l、冒こ達
成するごとをその日r自とする。
[Problem to be solved by the present invention, 1, .] In this conventional molecule-ray evitor device, the present invention is also shown in FIG. J, sea urchin, or JP-A-62-6
2512υ-Ko (Do, 1, Q, Ekikai 61--53
7 ] No. 6 public + old ζ color 3J, regardless of group Ill elements and group V elements, evaporation source 5, which grows all elements with 4,1 stones, is no. A shutter 7 for shielding and opening the molecular beam from the evaporation source 5 to the evaporation source 5 is provided at 6. 41M like this
Conveniently, ], A) and rotating gloss, 4N] are the most consumed in the evening and evening.
, ; There is a limit to the size of the stem growth for group ■ elements such as A and H, and the life is shortened by +411 noj, and the number of times is 11.
As a result, the device has 11 turns or a short turn.
There is a problem. It is known that the foil coefficient of a group element that is 1 to a group II element is determined by the presence of a group Ill element on the substrate 1. For example, , [;J1ΔS
To board-1 0) As i J'``s'i 4i number ε''
, Ga, or 81 is present, it is 1, and if not, it is O. In the conventional device, the tea source for Group II elements is placed at a predetermined distance from the substrate holder, similar to the evaporation source for Group II elements.
It is thought that this was done in consideration of the uniformity of the a and j groups of the group elements, but this is not the case for the group group elements G, j, and the group V elements mentioned above. This is reasonable when considering the −1 adhesion coefficient. The 41.iYl of the group ■ element to the substrate is determined by the (=J adhesion of the llt group element, and the group III element is the group 41M+ (= 19 deviation is because group V elements also follow it (=19). The temperature of the group V element during operation of the device is ε; I:
The temperature is about 300°0, which is 1 M, which is lower than that of other caustic sources.In addition to this temperature control, it is relatively easy to start and stop the light, so it is difficult to use conventional methods. It cannot be said that the sheet, which is installed in the equipment and also as an evaporation source for group (I) elements, is absolutely essential. This invention ε:l, -1- Based on the knowledge mentioned above, the problems of conventional molecular beam epitaxy equipment can be solved in one go, and the equipment can be simplified and the life of materials can be extended at the same time. Every time I accomplish something, I count it as myself on that day.

【課題を解決するための手段】[Means to solve the problem]

従来の課題を解決するため、この発明’C3ll、次の
技術的手段を514シている。 ずなわら、本願の請求項1に記載した発明に1、超高真
空ポンプにつながる成長室と、この成JJ6室の内部に
配置した基板ホルダと、成Jコ室の一側におい−(軸線
が一上記基板ホルダを向< (1゛つに配置された複数
個の蒸発源とを倫える分子線エピク・1−シ一装置にお
いて、−1−記蒸発源のうり、■族元J、を成長)A料
とする蒸発源(以下、■族茎発i1j;iという。 )を他の蒸発1g(に比し゛(2□(板ボルダにi!L
接し2だイ装置に配置するとともに、このV族蓄光源以
夕+の各ブに発i14:(の開I」の遮蔽および開放を
行うシャッタを設りたごとを’IJl徴とする。 そして、本願の請求項2に記載した発明番、」、−1−
記請求x(i 2に記載した分子線エピクー1−シ一装
置において、■族仄発Δ≦(を、成長室におLJ2+基
板ホルダと正面対向ずろ位:?、’j’、に配置itす
るとともに、他の蒸発源を、はぼ、1−記■族蒸発源の
軸線を中心とする環状に配置したごとを4.1.徴とす
る。
In order to solve the conventional problems, the present invention has the following technical means. However, the invention described in claim 1 of the present application has the following features: 1. A growth chamber connected to an ultra-high vacuum pump, a substrate holder disposed inside this growth JJ6 chamber, and a (axis line) located on one side of the growth JJ6 chamber. In a molecular beam Epic 1-Shi device that can accommodate a plurality of evaporation sources arranged in one direction, the substrate holder is directed to the substrate holder. The evaporation source (hereinafter referred to as ■ group stem origin i1j; i) used as the material for growth) A is compared to 1g of other evaporation ゛(2□(i!L
In addition to placing the V-group phosphorescent source in a two-way device, a shutter for shielding and opening the emission is installed on each block of the V group phosphorescent source. , invention number stated in claim 2 of the present application,'', -1-
In the molecular beam epitaxy device described in i2, the group Δ≦() is placed in the growth chamber at a position facing the LJ2+ substrate holder at a position: ?, 'j'. At the same time, the other evaporation sources are arranged in an annular shape centered on the axis of the Group 1-C evaporation source as 4.1.

【作用] 本願の発明においては、基本的に、軸”KtJ!が成長
イユ内部の基板、jクルダを向くように配j?l:され
る複数個の蒸発源の・)も、V族茎発源を他の蒸発汎1
に比してより基板ボルダに近接するように配置すると3
ともに、ごの■族衆発源のシャ、夕を廃止L7でいる。 V族元素番、11..11(板I−(ごIII族元素か
イ・l’2iシ“(Iffシめζ、これに(・1着する
から、■族元素の(−1着は、III族元素の茂発源に
、1、る成」この開始および停止にしたがう。、−札に
より、族24<発源のツヤツクを省I昭し7ても、Il
l族元本の奈発源からの分子線照fl・Iがそれらに(
=1設されるツヤツクによって制御されるかぎり、ノ1
11:(S、1−に/jlll171′A′ノ、I、1
体を成]Qさ−lる1−ご仝く不111;合はない。 ま人云さらに、二の発明’(1;l、\th5、プi(
発i++:jが他の蒸発源に比U7て〕、(44,’v
ボルダに、l!L1’i< (−zて配jj:’j’、
され“Cいるので、多くの剰余の分子綿か成f< ”ニ
ーにjll旧交9るごとか4f<、J、ダかはふiJる
。 【発明の効果] I−述のように本ト)jlの発明(L;l:、 V h
’>鳶”k発源のツヤツクを廃止しでいるから、J、(
木的に消費bjがilQも多いV族蒸発源を、シャッタ
の+、l、li成を考J、(δすることなく大型化して
その容量を増大さ−Lるごとができ、(Aλ″−1ノj
命の延長と、に置の連続運転11ノ団11の延Jミを図
ることかできる。そしζ、V族ノ丸発源を基(反ボルダ
に近1妄して、没しノ′ているごと力・ら、C4Flの
1、ダかはふLJ、ごのごとも祠1′1ノJ命の延]こ
C1二人き(富−1jする。また、■hムノi、′:発
i11;jのシャッタを省略したことから、装置ξの構
造を[:r1略化′4ろごとかてき、メインテナンスの
頻度および1夕障の発/LIJi瓜かともに低下づろ。 そして、本願の請求項2に記載し7に発明に、;iいて
++、とくに■族75発源を基板ホルダと正面対向する
中心に配置し、他の蒸発源をその周囲に環状に配置する
ことにlfるから、■族蒸発源の大きさを他の7′に発
源の配置が構成する原の中央にいっぽいに拡げることが
でき、成長室の一側内面を有効に利用することができる
。 【実施例の説明] 以下、本願発明の実施例を図面を参照して尺体的に説明
する。 本例の分子線コーピタ4=シ一装置は、縦形の成長室2
をもっているが、分子線エビクキシ一装置としての基本
的構成は第2図の従来例と同等である。 成長室2は、全体として縦形の円筒形をしており、天ノ
1板8にLTi通支1.++された支軸9にG3I、水
平状の!15板ボルダ3を下端にもつ回転ゲージ10の
ボス部11が可回転に支1、)されている。この回転ケ
ージ10は、ボス部11に固定されたギA・12に外部
モータ13の出力軸のピュオン14を噛合させろことに
より、回転制御される。支軸の先ORjには、基板ボル
ダ3の11Nr後に位置するヒータ10か設りられてお
り、これに、1、って基+反ボルグ3にイ呆持された基
板13を加<ノ(シうろ。なお、成IL ′f:・の側
壁内周に1、液体窒素シア。ソウ]15で囲:Vれて“
1.′す、脱ガス時での不純物を吸;i”i−L−て超
高真空をs−++: +、y 4るようにしである。な
お、成長’M2は、しI示U2ない超1[6真空ポンプ
につなげられ(いる。 成長室2の底部は、中央が最4)γ1”んだ略′Jりば
ち状をしており、この部にいくつか0ルア発源5.1゜
5b、5cmが、その軸Xrk zJ 、  b 、 
 cが1−記基扱ポルダ3の中心を向くようにして配置
されている。 本願発明においてはとくに、ヒ素Asなとの■族元素を
成長材料とする蒸発源5aを、上記基板ホルダ3に対し
てiL’、 iri目こ対向”jる。1、・)Qに、ず
わなら、本例−(厨1、この蒸発源53Iの軸線、」か
縦形用↑、りj形の成長室2の鉛直中心4jl!と 一
致するように配置するとともに、その他の蒸発i1+;
j5b、  5 Fを、1−記V族蒸発源5aの軸線、
」を中心とする円周十に配置する。第1図において6.
1、図の煩賄化を′AUりるため、■族a5QAGl 
5 a ヲliン−(7+’J4:z反3Lfj!ll
ニ(H’+置する二つの蓄光源tl 1.’) 、5c
のめを示しであるが、実際C真、1、大小5〜7個の蒸
発源が、各軸4:l!か)1(板ボルタ3の中心を向く
ようにして環状に設しjられている。 さて、上記各蒸発源5 a 、  5 b 、  5 
c・・・は、成長室2の底pa+’に1−5:;iを固
定され)こイj底円筒状の容器内に、各成長材オ′、1
が充1色されたルツボ4・・をそれぞれ装置Qi’(L
 −(+t7i成される。そして、本願発明Cは、−1
−記■族蒸発源5,1を他の蒸発illより基板ボルダ
3に近づジノ°(配置するのであるが、本例でIIごれ
を、各容器に装置1「1されるルツボ4の輔力向長さを
所定のように設定することで対しa、しζいる。 ずなわら、第1図に人、1″1、ζいろ、)、うに、■
放入発源53」のルツボ4(,1、直径および長さが他
の蒸発源より大きく、とくにルツボ4 (7) 、、、
l一端は、成長室2の底壁からさらC,、:基板ボルダ
3に向りで突出さ−lられ”(いろ。なお、各ルツボ4
 ・は、ごれか収容される各容器のM部に配置した図に
表れないヒータによって所望のIJA度に加え))され
ろようになっ″(いる。また、各ルツボ4を囲む上記容
器には、液体窒素)Lラウ16・・が一体構成されて打
り、各蒸発源5a、5b、5c・・・か互いに熱影古や
汚染の彫金を受iJないようにしである。 成長室2を超高真空1大態とし、占I、板13お3J、
び各蒸発源5 a、  5 b、  5 c・−・を所
定の/l!!r度”−(5y ’/!!させると、仄発
源5 a、  51)、  5 に・・の成1((A利
が原子あるいは分子線の形で基板表部にあたり、基板十
に結晶が成長するのであるが、この成長の開始および停
止し1、本願発明ごG31、■族ブに発源5・1以外の
蒸発&I5b、5t−・・の開I]をシ中、り7で開閉
することにより行われろ。 シャッタ7は、上記V族プに発源以外の環状配置された
各ノ?発源51)、5(:・・にjバ接ずろ成に室の内
壁において外部からそれぞれ回11・i)可能にλり大
麦1、)された輔7.】の31i過:1.;に、閉位置
において1−記聞に1を渭いうるシャック板7bを固定
し2′(+、、、+7成される。 本例において(,1、上記軸7.」の輔Xr)< pを
、当該シャッタ7が開閉j゛るブI(発jJ+j 5 
b、  5ζ、・の軸N)i)匠 Cに対し、蒸発源の
開11からノ□(扱ボルダ3:1:。 ての間におい゛C交;(するよ・)にiQ’iJノ、(
桑1]:すると、] 2 その蒸発源5b、5c・・・側に大きく傾りている。 そ・)シて、この、1、・)6.二軸線βを11.l’
i illた軸7aに対し、閉(j冨市1においで蒸発
源5の開1]を平行に覆いうるように円形のシ、1−ツ
タ板71)を固定するのである。したかっ゛(、輔7,
1に対するンヤノタ板7bの取イ=Jジノ角度は、蒸発
源51)、5Cの軸線1)。 Cと輔7aの軸線pの交差角を直角から差し引いた角度
となる。このようにすると、軸7aを中心とするシャツ
タ板7 t、+の回転1luL跡におい゛(、シャツタ
板7bが第1図に実線で示ず閉位置にあるときが最も茂
発源5J5cないし成J、4室2の内壁に近接し、イれ
以外の回動位置のず・\てにおいて、ンヤソタ板7bが
Y発源の開L1ないし成1(室2の内壁から離れること
となる。 な才?、木イ列にオンいC+Jさらに、シャッタ7のΦ
山7.1を二二分i’l′ll +’ili成とすると
ともに、ごの輔7aを通ず士−タブうゲット16の筒部
をもフランジ17a、+7bどうしの接続によって連結
し・)る分i’ii l’l’j成とし、上記軸7aの
モータ側の第一部分721′とシャツタ板側の第二部分
7 、 TIとを上記フランク17a、I7bを分1i
i11 した状態で成IJ室の外部におい′ζ接続あろ
いG11分1111 L、うる、L)にU7゛(ある。 従来装置にJ、りる凹Φjシ、t・ツタ゛(υ、■、4
11−の回転軸を成長室内に貫通導入し、ご・うして成
1辷室内にλり人された軸の先O:1.jにシャ、り(
jiを取(−1(Jる構造が−・船釣であっノこため、
ソートツタ板のつ51桑n、’、 h、’lにおいては
成JQ室内にヒユーボートから]を入れ、ねし止め作業
等の煩雑なイ1業をする必要があったが、本例で(11
、−1−記の、1、)に軸7.]の接続を実質的に成長
室の外部で行なえるようにU7kから、シャンク板7の
取合1りがJ1常に簡j1′1か一つ友全となる。 第1図から明らかな、j、゛)に、本願発明((,1、
V族74発源5.」のツヤツクを省略したから、シャッ
タの77、i成につい−(”’; 1.51jすること
)C<、それだりこのV族XIS発諒5aの容)l(を
増Jすることが(き、成長+、I !Jlの寿命を延長
することができる。また、■族〕に発#、J iJを他
の蒸発源に比・\て、1、リノ、V +1jボルダ3に
近づりて配置し7ているから、l、ダな分子線が成1【
室内に放11り這ることか’l; < 、効・セカ月Z
(なる。また、ブ、曇11例では、■族基発源5aのま
わりに他の茎発?ll:iを環状に間道1するという4
1へ成をとっているため、成長室2の内壁を有効に利用
し、装置庁一体を」」ンパクトCごまとめることができ
る。 なお、図示例の、4うに縦形の成長室をも・−)装置に
おいて■族藤発i1+;i 5 aを成長室の底部中央
Qこ配置すると、シ1(板同転部等からの塵が直下の■
族蕨発汎(にン客下しCごれをンク召とするという!腎
、念があるが、実際−1x、■放入発源は低温で機能す
るため、たとえ他の元素が入り込んでもほとんと問題む
、1ないのごある。 もらろん、この発明の範囲し、1上iホの実施例に限定
されることシ31ない。たとえば、シ、トノタのJ、−
1体的(I11成等、装置の細部は種々設旧変更iiJ
能である。 ン1:た、実施例(,1、縦形の成長室をもっているが
、成長室を47<、形に構成し7ても差支え41′い。 4、図1f11の節ii’H7,<説明第1図は本願発
明の一実施例を示す縦断面図、第2図は従来例を示す概
略構成図である。 2 成長室、3 ・基板ボルダ、5HI V族元素を成
J’L+A料とする蒸発源、5b、5(・・・(その他
の)蒸発源、7・・シャッタ、
[Operation] In the invention of the present application, basically, the multiple evaporation sources arranged so that the axis "KtJ!" faces the substrate inside the growth tube, Other evaporation sources
3 when placed closer to the board boulder than in
Both of them are in L7, where Sha and Yu, which originate from Gono ■ Tribes, are abolished. Group V element number, 11. .. 11 (Plate I-(Is it a group III element? I'2i)" According to this start and stop, the - tag allows the family 24<
The molecular beam fl・I from the raw source of the l group principal is applied to them (
=1 as long as it is controlled by the gloss set
11: (S, 1-ni/jllll171'A'ノ, I, 1
[form the body] In addition, the second invention'(1; l, \th5, pui (
emission i++:j is compared to other evaporation sources U7], (44,'v
To Bolda, l! L1'i< (-z and arrangement jj:'j',
Since there is "C", many surplus molecules are formed into f<"knee to jll old friendship 9rgoto 4f<, J, Daka is fiJ. [Effect of the invention] I-As mentioned above, the invention of jl (L; l:, V h
'>Tobi" Since we have abolished the luster of the k source, J, (
Considering the V-group evaporation source, which has a large consumption bj and ilQ, considering +, l, and li configurations of the shutter, it is possible to increase the size and increase the capacity without (δ), and (Aλ″ -1 noj
It is possible to prolong life and extend the continuous operation of 11 groups. And ζ, based on the source of the V-group nomaru (nearly anti-Boulder, the power of the dead, C4Fl's 1, Dakahafu LJ, Gonogoto Motoki 1'1ノJ life extension] This C1 two people (wealth - 1j. Also, ■hmunoi, ′: release i11; Since the shutter of j was omitted, the structure of the device ξ is [: r1 abbreviation ′4 In addition, the frequency of maintenance and the frequency of maintenance and the occurrence of troubles/LIJi melons will decrease. Since it is placed at the center facing the substrate holder and the other evaporation sources are arranged in a ring around it, the size of the group Ⅰ evaporation source is determined by the size of the other 7' sources. The growth chamber can be expanded to the center, and the inner surface of one side of the growth chamber can be effectively utilized. The molecular beam copier 4 in this example has a vertical growth chamber 2.
However, the basic configuration of the molecular beam apparatus is the same as the conventional example shown in FIG. The growth chamber 2 has a vertical cylindrical shape as a whole, and has an LTi shaft 1 on a top plate 8. G3I on the ++ supported shaft 9, horizontal! A boss portion 11 of a rotary gauge 10 having a 15-plate boulder 3 at its lower end is rotatably supported. The rotation of the rotation cage 10 is controlled by meshing the gear A 12 fixed to the boss portion 11 with the pyon 14 of the output shaft of the external motor 13. A heater 10 located 11 Nr behind the substrate boulder 3 is installed at the tip of the spindle ORj, and the substrate 13 held in place by the base 1 + anti-boulder 3 is applied to this heater 10. In addition, there is 1 on the inner periphery of the side wall of the liquid nitrogen sear.
1. 4, absorbs impurities during degassing; The bottom of the growth chamber 2 is shaped like a dome with γ1" at the center, and there are several 0 Lua sources in this part. 1°5b, 5cm is its axis Xrk zJ, b,
c is arranged so as to face the center of the 1-base handling polder 3. In the present invention, in particular, an evaporation source 5a whose growth material is a Group I element such as arsenic As is placed opposite to the substrate holder 3. In this example, the axis of the evaporation source 53I is arranged so that it coincides with the vertical center 4jl of the growth chamber 2, and the other evaporation sources i1+;
j5b, 5F is 1-the axis of the group V evaporation source 5a,
” are placed around the circumference of the circle. In Figure 1, 6.
1. In order to avoid ``AU'' in the figure, group a5QAGl
5 a Wolin-(7+'J4:z anti-3Lfj!ll
D (H'+ two luminescent sources tl 1.'), 5c
In fact, there are 5 to 7 evaporation sources of various sizes, each axis 4:l! ) 1 (They are arranged in an annular shape so as to face the center of the plate volta 3. Now, each of the above-mentioned evaporation sources 5 a , 5 b , 5
c... is 1-5:;i fixed to the bottom pa+' of the growth chamber 2).
Each crucible 4 filled with one color is placed in a device Qi' (L
-(+t7i. Then, the present invention C is -1
- The Group II evaporation sources 5 and 1 are placed closer to the substrate boulder 3 than other evaporation ills, but in this example, II dirt is removed from the crucible 4 that is placed in each container. By setting the length in the direction of the force as specified, it is possible to do this against a and ζ.
The crucible 4 (, 1) of the evaporation source 53 is larger in diameter and length than other evaporation sources, especially the crucible 4 (7) , ,
One end of the crucible 4 protrudes from the bottom wall of the growth chamber 2 toward the substrate boulder 3.
・In addition to the desired degree of IJA, a heater (not shown in the figure) placed in the M section of each container containing the crucible 4 is added to the desired degree of IJA. (liquid nitrogen) Lau 16... is formed integrally to prevent each evaporation source 5a, 5b, 5c... from being exposed to heat shadow or contamination from each other.Growth chamber 2 Assuming that ultra-high vacuum is one major condition, Zara I, board 13 and 3J,
and each evaporation source 5 a, 5 b, 5 c... to a predetermined /l! ! r degree''-(5y'/!!), the formation of a foreign source 5a, 51), 5...1 ((A) hits the surface of the substrate in the form of atoms or molecular beams, and crystals are formed on the substrate 10. , but the start and stop of this growth 1, the present invention G31, the evaporation of sources other than 5. This is done by opening and closing the shutter 7. The shutter 7 is connected to each of the emission sources 51), 5(... 31 i) of the barley 1,) which was placed in position 11 and i) respectively, fix the shack plate 7b which can hold 1 in the closed position and 2'( +, , , +7 is formed. In this example, (,1, the axis 7) < p, the shutter 7 opens and closes the shutter 7.
b, 5ζ, · axis N) i) Takumi For C, from the opening 11 of the evaporation source to the no □ (handling boulder 3:1:. ,(
Mulberry 1]: Then, ] 2 The evaporation sources 5b, 5c... are tilted greatly to the side. So・)shi, this, 1,・)6. Biaxial line β is 11. l'
A circular ivy plate 71 is fixed to the shaft 7a so that it can cover the opening 1 of the evaporation source 5 in parallel with the shaft 7a. I wanted to (, 輼7,
The angle of the angle of the Nyanota plate 7b with respect to 1) is the axis 1) of the evaporation source 51) and 5C. This is the angle obtained by subtracting the intersection angle between C and the axis p of the support 7a from the right angle. In this way, when the shirt flap plate 7b is in the closed position (not shown by the solid line in FIG. J, 4 In the case of being close to the inner wall of the chamber 2, and at any rotational position other than the tilted position, the rotation plate 7b will move away from the inner wall of the chamber 2. C+J on the wood row, and shutter 7 Φ
The mountain 7.1 is divided into two parts i'l'll +'ili, and the cylindrical part of the tab ridge 16 is also connected by connecting the flanges 17a and +7b through the support 7a. ), and the first part 721' on the motor side of the shaft 7a and the second part 7 on the shirt plate side, TI, and the flanks 17a and I7b as a part 1i.
i11 In the state where the outside of the IJ room is connected, there is a
The rotating shaft of 11- is introduced through the growth chamber, and the tip of the shaft is inserted into the growth chamber. j ni sha, ri (
ji (-1
In the case of the sorting ivy board 51 mulberry n, ', h, 'l, it was necessary to put the board from the boat into the JQ room and do complicated work such as tightening the screws, but in this example, (11
, -1-, 1, ) axis 7. ] From U7k onwards, one connection of the shank plate 7 is always simple or one-sided, so that the connections can be made substantially outside the growth chamber. It is clear from FIG. 1 that the present invention ((,1,
V group 74 sources 5. '' has been omitted, so for the shutter's 77, i formation - (''; to do 1.51j) It is possible to extend the lifetime of Jl, growth +, I!In addition, compared to other evaporation sources, growth +, I!Jl can be extended. Since the molecular beam is arranged as
Is it possible to crawl indoors?
(Also, in case 11 of clouds, other stem sources ?ll:i are arranged in a circular manner around the group ■ group source 5a.
1, the inner wall of the growth chamber 2 can be used effectively and the equipment can be integrated into a compact C. In addition, in the illustrated example of the four vertical growth chamber, if the i1+; is directly below■
It is said that the origin of the family's origin is considered to be a nku summon!There is a thought, but in fact -1x, ■The emission source functions at low temperature, so even if other elements enter Of course, the scope of the present invention is not limited to the above embodiments. For example, Tonota's J, -
One unit (I11 configuration, etc., various details of the device have been changed iiJ
It is Noh. Example 1: Although the embodiment has a vertical growth chamber, it is also possible to configure the growth chamber in the shape of 47. Figure 1 is a vertical cross-sectional view showing an embodiment of the present invention, and Figure 2 is a schematic configuration diagram showing a conventional example. 2 Growth chamber, 3 - Substrate boulder, 5HI V group element is used as a growth J'L+A material. Evaporation source, 5b, 5 (... (other) evaporation source, 7... shutter,

Claims (2)

【特許請求の範囲】[Claims] (1)超高真空ポンプにつながる成長室と、この成長室
の内部に配置した基板ホルダと、成長室の一側において
軸線が上記基板ホルダを向くように配置された複数個の
蒸発源とを備える分子線エピタキシ一装置において、 上記蒸発源のうち、V族元素を成長材料と する蒸発源を他の蒸発源に比して基板ホルダに近接した
位置に配置するどともに、このV族元素を成長材料とす
る蒸発源以外の各蒸発源の開口の遮蔽および開放を行う
シャッタを設けたことを特徴とする、分子線エピタキシ
ー装置。
(1) A growth chamber connected to an ultra-high vacuum pump, a substrate holder placed inside this growth chamber, and a plurality of evaporation sources placed on one side of the growth chamber so that their axes face the substrate holder. Among the evaporation sources, an evaporation source that uses a group V element as a growth material is placed closer to the substrate holder than other evaporation sources; A molecular beam epitaxy apparatus characterized in that a shutter is provided for shielding and opening an opening of each evaporation source other than the evaporation source used as a growth material.
(2)上記請求項2に記載した分子線エピタキシー装置
において、上記V族元素を成長材料とする蒸発源を、成
長室における基板ホルダと正面対向する位置に配置する
とともに、他の蒸発源を、ほぼ、上記V族元素を成長材
料とする蒸発源の軸線を中心とする環状に配置したこと
を特徴とする、分子線エピタキシー装置。
(2) In the molecular beam epitaxy apparatus according to claim 2, an evaporation source using the Group V element as a growth material is disposed at a position facing the substrate holder in the growth chamber, and another evaporation source is provided. A molecular beam epitaxy apparatus characterized in that the apparatus is arranged approximately in a ring shape centered on the axis of an evaporation source that uses the Group V element as a growth material.
JP63077798A 1988-03-30 1988-03-30 Molecular beam epitaxy device Granted JPH01249692A (en)

Priority Applications (11)

Application Number Priority Date Filing Date Title
JP63077798A JPH01249692A (en) 1988-03-30 1988-03-30 Molecular beam epitaxy device
EP89105248A EP0335267B1 (en) 1988-03-30 1989-03-23 Molecular beam epitaxy apparatus
DE68926577T DE68926577T2 (en) 1988-03-30 1989-03-23 Device for molecular beam epitaxy
EP92117113A EP0529687B1 (en) 1988-03-30 1989-03-23 Molecular beam epitaxy apparatus
DE68916457T DE68916457T2 (en) 1988-03-30 1989-03-23 Device for molecular beam epitaxy.
TW080105276A TW202485B (en) 1988-03-30 1989-03-24
US07/329,313 US4944246A (en) 1988-03-30 1989-03-27 Molecular beam epitaxy apparatus
CA000594977A CA1333038C (en) 1988-03-30 1989-03-29 Molecular beam epitaxy apparatus
KR1019890004152A KR930010750B1 (en) 1988-03-30 1989-03-30 Molecular beam epitaxy apparatus
CA000616594A CA1333039C (en) 1988-03-30 1993-03-30 Molecular beam epitaxy apparatus
KR1019930013044A KR930010751B1 (en) 1988-03-30 1993-07-09 Molecular beam epitaxy apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63077798A JPH01249692A (en) 1988-03-30 1988-03-30 Molecular beam epitaxy device

Publications (2)

Publication Number Publication Date
JPH01249692A true JPH01249692A (en) 1989-10-04
JPH0516399B2 JPH0516399B2 (en) 1993-03-04

Family

ID=13644020

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63077798A Granted JPH01249692A (en) 1988-03-30 1988-03-30 Molecular beam epitaxy device

Country Status (1)

Country Link
JP (1) JPH01249692A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2323209A (en) * 1997-03-13 1998-09-16 Sharp Kk Molecular beam epitaxy apparatus and method
CN116288286A (en) * 2020-07-08 2023-06-23 应用材料公司 Substrate processing module and method for moving workpiece

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111304623B (en) * 2020-02-24 2021-01-19 西安交通大学 Ultrahigh vacuum sample introduction and sample treatment dual-purpose system and method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2323209A (en) * 1997-03-13 1998-09-16 Sharp Kk Molecular beam epitaxy apparatus and method
US6146458A (en) * 1997-03-13 2000-11-14 Sharp Kabushiki Kaisha Molecular beam epitaxy method
CN116288286A (en) * 2020-07-08 2023-06-23 应用材料公司 Substrate processing module and method for moving workpiece

Also Published As

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