JPH01245473A - Test system for disk driving function - Google Patents

Abstract

PURPOSE:To test the various functions of the drive of a disk device in a form proper for the operation of an actual disk drive by using the test data of sequentially specified random data as test data according to respectively sequentially read index value and an execution byte count value. CONSTITUTION:A test executing means 11 processes to write the test data of the random data specified according to an index value table 15 and an executing byte count table 16 in a designated seek address set by a seek address table 13. When the written test data is read in order to execute a test, a disk head is set once at an arbitrary designated seek address position and then the test data is read. Accordingly, since the designated seek address and the test data comprise a random number, the disk drive function can be tested in a random access mode. Thereby, the drive function of the disk device can be tested in the form of high load proper for the actual operation.

Description

[Detailed Description of the Invention] [(Already required)] Regarding a test method for disk drive processing for diagnosing various functions of a drive in a disk device.

The purpose of this test execution means is to enable tests to be executed in a format that matches the actual operation of disk devices.
Writes test data to the specified seek address on the disk device and reads the written test data.

A seek address table for sequentially setting 9 designated seek addresses and a random table for setting test data in a disk drive processing test method that executes tests by checking whether write and read test data match. The data is generated in advance by a random number generating means.

An index value table for sequentially specifying the reference start position of this random data and an execution byte count table for sequentially specifying the data length from this reference start position are generated in advance by a random number generating means, and the above-mentioned test is performed. The execution means processes to write the test data set by the random data specified according to the index value table and the execution byte count table to the specified seek address set by the seek address table, and when reading the inserted data for test execution.

The disk head for reading is set once at an arbitrary designated seek address position, and then the reading process is performed.

[Industrial application field]

The present invention relates to a disk drive processing test method for diagnosing various functions of a drive in a disk device, and more particularly, to a disk drive processing test method that allows diagnosis to be executed in a format that matches the actual operation of a disk device. It is related to.

For data processing devices connected to disk devices,
It is necessary to provide a test program for diagnosing the seek processing operation and read/write processing operation of the disk device. Such a test program is
It is necessary to configure the system so that diagnosis can be executed in a format that matches the operational status of the disk device as much as possible.

[Conventional technology]

In traditional disk drive processing testing methods.

The test data is specific fixed data, the read/write disk head is set at the specified seek address position, this test data is written, and after the writing is completed, the disk head is returned to the starting position of writing the test data. By reading the test data written in this way and comparing the read test data with the written test data, it is determined whether there is any abnormality in the seek processing operation or read/write processing operation. That's what I was trying to do. The seek addresses that are sequentially set for the purpose of executing this test are set in order from the lowest five to the highest. In Figure 6,
A flowchart of this conventional disk drive processing test method is shown.

[Problem to be solved by the invention]

However, with such conventional technology, the seek addresses are set sequentially from low to high, so the direction of movement of the disk head is constant and the amount of movement of the disk head is small. (Therefore, there was a problem that the mechanical load applied to the disk device was small. In other words, since the disk device is actually used in random access mode, such conventional test methods There was a problem that it was not suitable for the operation.1 For example, even if it is determined that the disk head positioning accuracy is achieved in the test, the disk head positioning accuracy may not be sufficient in actual operation. There were some errors in the data.

Furthermore, according to the conventional technology, when writing test data does not span multiple cylinders, there is no movement of the disk head when returning the disk head to the starting position for writing test data, and the disk simply moves. The operation is simply waiting for rotation. Therefore, even if the disk head is accidentally positioned somewhere other than the trunk, this cannot be detected because the disk head does not move. That is,
There was a problem in that it was not possible to confirm whether or not the disk head was positioned on-track.

Furthermore, according to the conventional technology, even if the seek address is updated, the same test data is used, so when trying to repeatedly execute a test on the same volume, Since it is not known whether the test data is from the previous writing or the current writing, there is a problem in that initialization processing must be performed each time.

As described above, the conventional testing method for disk drive processing has the problem that it does not function adequately as a test because it does not correspond to the actual operating conditions of the disk device.

The present invention has been made in view of the above circumstances, and an object of the present invention is to provide a test method for disk drive processing that enables testing of various functions of the drive of a disk device in a format consistent with the actual operation of the disk device. It is something to do.

[Means to solve the problem]

FIG. 1 is a diagram showing the basic structure of the present invention.

In the figure, 10 is a disk drive test device implementing the test method of the present invention, and 20 is a disk device. Reference numeral 11 denotes a test execution means, which writes test data to a designated seek address on the disk device 20, reads the written test data, and executes the test by checking whether the written and read test data match. do. 12
is a random number generation means, which generates random numbers. A seek address table 13 stores a plurality of specified seek addresses generated in advance by the random number generating means 12.

This designated seek address is sequentially read out and becomes the designated seek address for writing test data. 14 is random data, and stores a plurality of test data generated in advance by the random number generating means 12. 15 is an index value table.

A plurality of index values generated in advance by the random number generation means 12 are stored. This index value is.

It represents the reference start position of the random data 14. 16 is an execution byte count table.

A plurality of execution byte count values generated in advance by the random number generation means 12 are stored. This execution byte count value represents the data length from the index value using a byte count number. Index value table 15
The test data of the random data 14 is used as the test data, which is sequentially specified according to the index value sequentially read from the execution byte count table 16 and the execution byte count value sequentially output from the execution byte count table 16.

[For production]

In the present invention, the test execution means 11 writes the test data of the random data I4 specified according to the index value table 15 and the execution byte count table 16 to the specified seek address set by the seek address table 13. When reading the written test data for test execution, the disk head is once placed at an arbitrary designated seek address position and then read.

Therefore, since the designated seek address and test data are random numbers, it becomes possible to test the disk drive function in random access mode. Moreover, since the test data is read after the disk head is moved to another designated seek address when reading the test data, the positioning accuracy of the disk head can be accurately confirmed.

As described above, according to the present invention, it becomes possible to test the drive function of a disk device under a high load format suitable for actual operation.

〔Example〕

Hereinafter, the present invention will be explained in detail according to examples.

In the disk drive processing test method of the present invention, seek addresses (hereinafter referred to as designated seek addresses) on the disk device 20 to which test data will be written are set sequentially from low to high as in the past. In order to set the seek address randomly instead of randomly, the random number generation means 1 is used to set the specified seek address for the number of tests in advance.
2, and the generated specified seek addresses are arranged in the order in which they will be used and made into a table. FIG. 2 shows the seek address table 13 generated in this way.

Here, the designated seek address i in Figure 1 represents a random value.

Furthermore, in the disk drive processing test method of the present invention,
The test data to be written to the designated seek address is not fixed as in the conventional method, but different data is used for each test sequence. To achieve this.

In the present invention, a large amount of random data 14 serving as test data is generated in advance by the random number generating means 12, and an index value indicating the reference start position of the random data 14 and an execution byte count value indicating the data length from this reference start position are generated. This designates which of the random data 14 is to be used as test data.

In order to set this index value at random, the index values for the number of tests are generated in advance by the random number generating means 12, and the generated index values are arranged in the order in which they will be used and made into a table. At the same time, in order to randomly set this execution byte count value, the execution byte count value for the number of tests is generated in advance by the random number generating means 12, and the generated execution byte count values are arranged in the order in which they will be used and stored in a table. It is structured so that it is kept as follows. FIG. 3 shows the index value table 15 and executed byte count table 16 generated in this manner in association with the random data 14.

Here, the index value i and the executed byte count value i in FIG. 2 represent random values.

In this way, the seek address table 13. Random data 14. The reason why data generation using random numbers in the index value table 15 and execution byte count table 16 is performed before entering the test sequence is because if random number generation is performed sequentially during the test sequence, the generation time will cause problems with the disk device 20. This is because the time interval between accesses becomes long, resulting in a discrepancy from the actual operational status. Since the random data 14 is specified using an index value, it is not necessary to prepare the random data 14 for the number of times of testing. Note that this random data 14 is used cyclically so that data is not exhausted.

Furthermore, since the execution byte count table 16 is provided, the data length of the test data also changes for each test.

Next, according to the flowchart shown in FIG.

The present invention uses the seek address table 13, random data 14 . A description will be given of how the drive function of the disk device 20 is tested using the index value table 15 and the executed byte count table 16.

Assuming that this is the nth test sequence, in step 1, the specified seek address n stored at the nth position in the seek address table 13 is read out, and the disk head is positioned at the position of this specified seek address n. Next, in step 2, the index value n stored in the nth position of the index value table 15 and the execution byte count value n stored in the nth position of the execution byte count table 16 are read, and this index value n and the execution byte count value n are read out. Random data 14 specified according to count value n
The test data is obtained and the test data is written to the specified seek address n position.

Next, in step 3, the disk head is moved to (n-) of the seek address table I3 corresponding to the previous test sequence.
Place it in the position of the designated Norquatles (n-1), and put it in the dog's Suni, Pu 4.

The data written at this specified soak address (n-1>!) is processed so as to read only one sector. In this way, after the processing in step 2, the disk head moves to a completely different specified seek address position. The reason for this move was to eliminate the drawbacks of conventional technology.

This is to make it possible to confirm whether the test data written in step 2 has been correctly written on the on-track. The reason why only l sectors are read is to make it possible to confirm that the disk head has indeed moved to another specified seek address position.

From now on, instead of just one sector, all of the data may be read, or no data may be read at all.

In the following step 5, in order to return the disk head to the starting position of the test data written in step 2,
Set at the specified seek address n of . Then, in the next step 6, the test data written in step 2 is read out, and in step 7, the written test data and the read test data are compared to determine whether the drive function of the disk device 20 is normal. It is to determine whether it exists or not. Then, the process of steps 1 to 7 is repeated for the number of times of testing to complete the test.

The processing contents of the disk drive processing test method of the present invention explained above are schematically shown in FIG. Here, the numbers in FIG. 3 represent the step numbers in FIG. 4.

As described above, according to the present invention, it becomes possible to test the disk drive function of a disk device in random access mode. Moreover, since the data is generated in advance using random numbers, the test can be executed under high load conditions.

Although the eight illustrated embodiments have been described above, the present invention is not limited thereto. For example, step 3 in FIG.
The process of moving the disk head to another specified seek address position described in 1. is not limited to returning to the specified seek address position of the previous test sequence.

〔Effect of the invention〕

As described above, according to the present invention, the disk drive function can be tested in a high-load format that corresponds to the actual operating conditions, so that the credibility of the test can be increased. In addition, it becomes possible to repeat tests on the same volume many times without performing initialization processing, and random data can be used as test data randomly over and over again using the index value table. There is no need to prepare test data for the number of times, and the test device becomes extremely practical.

[Brief explanation of the drawing]

Figure 1 is a diagram of the principle configuration. FIG. 2 is an explanatory diagram of the seek address table. FIG. 3 is an explanatory diagram of an index value table and an executed byte count table. FIG. 4 is a flowchart for implementing the present invention. FIG. 5 is an explanatory diagram of the processing contents of the present invention. FIG. 6 is a flowchart of a conventional test method. In the figure, 11 is a test execution means, and 12 is a random number generation means. 13 is a seek address table, 14 is random data, 15 is an index value table, 16 is an execution byte count table, and 20 is a disk device. Patent applicant Pfn Co., Ltd. Agent Patent attorney Hiroshi Mori (2 others) Explanatory diagram of seek address table Figure 2 Explanatory diagram of index value table and execution byte count table Figure 3 Flowchart of conventional test method Figure 6 Fixed length/fixed data chart

Claims (1)

[Claims] A test execution means (11) is provided for executing a test of disk drive processing, and the test execution means (11) writes test data to a specified seek address on a disk device (20). In the disk drive processing test method, the disk drive processing is tested by reading the written test data and checking whether the written test data matches the read test data. , A seek address table (13) for sequentially setting designated seek addresses and random data (14) for setting test data are generated in advance by a random number generating means (12).
This random data (14) is generated by
An index value table (15) for sequentially specifying the reference start position of , and an execution byte count table (16) for sequentially specifying the data length from this reference start position.
) is generated in advance by the random number generating means (12),
The test execution means (11) includes the index value table (15) and the execution byte count table (
The above random data (14) specified according to 16)
In addition to writing the test data set by the above seek address table (13) to the specified seek address set by the seek address table (13), when reading this written test data for test execution, any specified A disk drive processing test method characterized by setting the disk head for reading at the seek address position and then performing the reading process.