JPH01241771A - Connection of low surge impedance conductor - Google Patents

Connection of low surge impedance conductor

Info

Publication number
JPH01241771A
JPH01241771A JP6897688A JP6897688A JPH01241771A JP H01241771 A JPH01241771 A JP H01241771A JP 6897688 A JP6897688 A JP 6897688A JP 6897688 A JP6897688 A JP 6897688A JP H01241771 A JPH01241771 A JP H01241771A
Authority
JP
Japan
Prior art keywords
conductor
connection
sub
surge impedance
semiconductive layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6897688A
Other languages
Japanese (ja)
Other versions
JPH0470747B2 (en
Inventor
Kunio Tsurumaki
鶴巻 国夫
Ryoji Miyamoto
宮本 良治
Takahiro Minami
南 隆浩
Hitoshi Segawa
瀬川 仁之
Ryunosuke Masui
増井 龍之助
Takeshi Sakajiri
坂尻 武
Kaoru Matsui
松井 薫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
KANSAI TEC KK
NICHIDOU DENKO KK
Tatsuta Electric Wire and Cable Co Ltd
Original Assignee
KANSAI TEC KK
NICHIDOU DENKO KK
Tatsuta Electric Wire and Cable Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by KANSAI TEC KK, NICHIDOU DENKO KK, Tatsuta Electric Wire and Cable Co Ltd filed Critical KANSAI TEC KK
Priority to JP6897688A priority Critical patent/JPH01241771A/en
Publication of JPH01241771A publication Critical patent/JPH01241771A/en
Publication of JPH0470747B2 publication Critical patent/JPH0470747B2/ja
Granted legal-status Critical Current

Links

Abstract

PURPOSE:To make it possible to secure a high dielectric breakdown strength to the pulse voltage and to make the connection shorter by providing a thin semiconductive layer to contact to an auxiliary conductor exposing part and a main conductor connection of a low surge impedance conductor to connect. CONSTITUTION:The connection of a low surge impedance conductor has a semiconductive layer 22 to contact to an auxiliary conductor exposing part 21 and a main conductor connection 13 of a low surge impedance conductor to connect. As a result, even when a large potential difference is generated instantly between a main conductor 1 and an auxiliary conductor 3, the potential difference is divided evenly in the longitudinal direction by the resistance of the semiconductive layer 22, generating no large potential gradient immediately above the main conductor 1 accordingly, and the dielectric breakdown value by the impulse voltage is increased compared in the case of no semiconductive layer 22. Therefore, the connection can be made shorter. And since only a thin semiconductive layer 22 is provided, an increase of the outer diameter is very little, and the flexibility of the connection is not be lost.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、避雷器、架空地線等を接地するために用い
る低サージインピーダンス導体の接続部に関するもので
ある。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a connection section for a low surge impedance conductor used for grounding a lightning arrester, an overhead ground wire, etc.

〔従来の技術〕[Conventional technology]

従来、避雷器等の接地用導体としては、600Vビニル
絶縁電線が汎用されてきたが、近年架空送配電線路に対
する雷害対策の一貫として接地用導体の低サージインピ
ーダンス化が検討され、種々の低サージインピーダンス
導体が提案されている。
Traditionally, 600V vinyl insulated wires have been widely used as grounding conductors for lightning arresters, etc., but in recent years, lower surge impedance of grounding conductors has been studied as part of lightning damage countermeasures for overhead power transmission and distribution lines, and various low-surge impedance wires have been used. Impedance conductors have been proposed.

本願発明者等による実願昭62−77701の考案もこ
のような提案の一つであり、雷害対策に寄与している。
The invention proposed by the present inventors in Utility Model Application No. 77701/1982 is one such proposal, and contributes to countermeasures against lightning damage.

上記実用新案登録願の考案の要旨は、金属板からなる内
部導体の周りにほぼ矩形状に絶縁体を被■し、上記絶縁
体の少なくとも片面上に金属板からなる外部導体を前記
内部導体と平行に相対向して添設し、さらにその周りに
外被を施したことを特徴とする低サージインピーダンス
導体である。
The gist of the invention of the above utility model registration application is to cover an insulator in a substantially rectangular shape around an inner conductor made of a metal plate, and to place an outer conductor made of a metal plate on at least one side of the insulator as the inner conductor. This is a low surge impedance conductor characterized by being attached in parallel and facing each other, and further having an outer covering provided around it.

なお、この発明における主導体及び副導体は上記実用新
案登録願の考案における低サージインピーダンス導体の
内部導体、外部導体と同意義のものである。
Note that the main conductor and sub-conductor in this invention have the same meaning as the inner conductor and outer conductor of the low surge impedance conductor in the invention of the above-mentioned utility model registration application.

ところで、上記考案の低サージインピーダンス導体は種
々の架空送配電線路や避雷針など雷害の危険性のあるす
べての施設に適用し得るものであり、所要長が100m
にも及ぶものがある。従って、導体サイズが例えば10
0mm2のものでは、この低サージインピーダンス導体
だけで160kgもの重さになり、使用場所が山間地な
どに多いという条件も加わって、運搬に多大な労力を要
するという問題があった。
By the way, the low surge impedance conductor devised above can be applied to all facilities that are at risk of lightning damage, such as various overhead power transmission and distribution lines and lightning rods, and the required length is 100 m.
There are things that extend to Therefore, if the conductor size is, for example, 10
In the case of a 0 mm2 conductor, this low surge impedance conductor alone weighs as much as 160 kg, and with the added requirement that it is often used in mountainous areas, it requires a great deal of effort to transport.

そのため、低サージインピーダンス導体そのものは短(
し、使用現場で接続するための確実で簡易な方法が求め
られていた。
Therefore, the low surge impedance conductor itself is short (
However, there was a need for a reliable and simple method for connecting at the site of use.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

しかしながら、低サージインピーダンス導体自体が新規
な技術的概念であり、そのための接続方法や接続部の構
造は未だ開発されていない。
However, the low surge impedance conductor itself is a new technical concept, and the connection method and structure of the connection part therefor have not yet been developed.

一般に複数の導体または導体と遮蔽体を有する電線、ケ
ーブル等の接続部は、導体の接続部間または導体の接続
部と遮蔽体接続部との間を絶縁するために絶縁テープを
巻くか熱融着テープを巻いた後加熱モールドして接続部
における絶縁体を形成しているが、非接続部と違って電
界が不均一になることや絶縁体の形成が手作業になるこ
とを考慮して非接続部よりも厚くし、かつ電界分布をな
るべく均一にするため導体接続部周辺の絶縁体上にも補
強絶縁を施し、導体接続部から非接続部への絶縁体外径
の減少傾向を滑らかにしており、そのため接続部全体の
長さが長(なる。
Generally, the connection parts of electric wires, cables, etc. that have multiple conductors or conductors and shields are wrapped with insulating tape or heat-fused to insulate between the conductor connections or between the conductor connection and the shield connection. The insulator is formed at the connection part by wrapping adhesive tape and then heat molding. However, unlike in the non-connection area, the electric field is uneven and the insulator formation must be done manually. Reinforcement insulation is also applied on the insulator around the conductor connection area to make it thicker than the non-connection area and to make the electric field distribution as uniform as possible, smoothing out the tendency for the outer diameter of the insulator to decrease from the conductor connection area to the non-connection area. Therefore, the length of the entire connection part becomes long.

従って、接続部の形成に手間が掛かるだけでなく、接続
部の可撓性が悪くなるため、配線工事における作業性も
低下するという問題がある。このような手作業を簡略化
するため、熱収縮チューブを用いて接続部を絶縁する方
法も考えられるが、この方法で形成された接続部はイン
パルス破壊電圧特性が不十分であるという問題があった
Therefore, there is a problem in that not only is it time-consuming to form the connection part, but also the flexibility of the connection part is deteriorated, resulting in a reduction in workability in wiring work. In order to simplify such manual work, it is possible to insulate the connections using heat shrink tubing, but connections formed using this method have the problem of insufficient impulse breakdown voltage characteristics. Ta.

この発明は、上記の現状に鑑み、低サージインピーダン
ス導体の機能を低下させることなく、確実かつ容易に形
成し得る低サージインピーダンス導体の接続部を提供す
ることを目的とする。
In view of the above-mentioned current situation, it is an object of the present invention to provide a connection portion for a low-surge impedance conductor that can be formed reliably and easily without degrading the function of the low-surge impedance conductor.

〔課題を解決するための手段〕[Means to solve the problem]

上記の課題を解決するため、この発明は、平板状の主導
体の外周に矩形状に絶縁体を被覆し、上記絶縁体の少な
(とも片面上に主導体と平行に平板状の副導体を添設し
、その外周に外被を被覆してなる低サージインピーダン
ス導体の接続部において、2本の低サージインピーダン
ス導体の端末部の外被、副導体及び絶縁体を順次段状に
剥ぎ取って露出させた主導体を互いに接続してなる主導
体接続部と、両側の副導体露出部及び主導体接続部に当
接するように設けた半導電性層と、上記半導電性層を覆
うようにその外周に設けた絶縁体層と、さらにその外周
に両側の副導体露出部及び副導体露出部と接続して設け
た導電体からなる副導体接続部と、上記副導体接続部の
外周に設けた外被接続部と、を具備した構成としたもの
である。
In order to solve the above problems, the present invention covers the outer periphery of a flat main conductor with an insulator in a rectangular shape, and a flat sub-conductor is coated on one side of the main conductor in parallel with the main conductor. At the connection part of the low-surge impedance conductor attached and the outer periphery of which is covered with an outer sheath, the outer sheath, sub-conductor and insulator of the terminal parts of the two low-surge impedance conductors are sequentially peeled off in steps. A main conductor connecting portion formed by connecting the exposed main conductors to each other, a semiconductive layer provided so as to come into contact with the exposed subconductor portions and the main conductor connecting portion on both sides, and a semiconductive layer covering the semiconductive layer. An insulator layer provided on the outer periphery, a sub-conductor connection portion made of a conductor provided on the outer periphery to connect with the sub-conductor exposed portions on both sides and the sub-conductor exposed portions, and a sub-conductor connection portion provided on the outer periphery of the sub-conductor connection portion. The structure includes an outer sheath connection part.

〔作用〕[Effect]

上記の構成を有するこの発明の低サージインピーダンス
導体の接続部は、接続すべき低サージインピーダンス導
体の副導体露出部と主導体接続部とに当接するように半
導電性層を設けであるので、雷サージの侵入によって主
導体と副導体との間に瞬間的に大きな電位差が発生した
場合でもその電位差が半導電性層の抵抗によって長さ方
向にほぼ均等に分圧され、従って、主導体部直上に大き
な電位傾度を生ずることがなく、この半導電性層がない
場合に比べてインパルス電圧による絶縁破壊値が高くな
る。換言すれば、接続部を短くすることができる。
The connecting portion of the low-surge impedance conductor of the present invention having the above-mentioned configuration is provided with a semiconductive layer so as to come into contact with the exposed sub-conductor portion and the main conductor connecting portion of the low-surge impedance conductor to be connected. Even if a large potential difference momentarily occurs between the main conductor and the sub-conductor due to the invasion of lightning surge, the potential difference is divided almost equally in the length direction by the resistance of the semiconductive layer, and therefore the main conductor A large potential gradient is not generated immediately above, and the dielectric breakdown value due to impulse voltage is higher than in the case without this semiconductive layer. In other words, the connecting portion can be shortened.

しかも、薄い半導電性層を設けるだけであるから、これ
による外径増はごく僅かであり、可撓性を損ねることも
ない。
Moreover, since only a thin semiconductive layer is provided, the increase in the outer diameter is very small and does not impair flexibility.

〔実施例〕〔Example〕

第1図はこの発明による低サージインピーダンス導体の
接続部の一実施例を示し、第1図(掲は、縦断面図、第
1図(ト)は第1図(3)のX−X断面矢視図、第1図
(C)は同Y−Y断面矢視図である。
FIG. 1 shows an embodiment of the connecting part of a low surge impedance conductor according to the present invention. The arrow view and FIG. 1(C) are the same YY cross-sectional view as the arrow view.

図示実施例において、接続すべき低サージインピーダン
ス導体は、銅条からなる主導体1の外周にビニル絶縁体
2を被覆し、そのビニル絶縁体2の片面上に銅テープか
らなる副導体3を主導体1と平行に添設し、その外周に
ビニル外被4を被覆したものである。
In the illustrated embodiment, the low surge impedance conductor to be connected consists of a main conductor 1 made of a copper strip, covered with a vinyl insulator 2, and a sub-conductor 3 made of a copper tape on one side of the vinyl insulator 2. It is attached parallel to the body 1, and its outer periphery is covered with a vinyl jacket 4.

接続部は以下に述べるようにして形成される。The connections are formed as described below.

即ち、主導体露出部11.11を所定長重ね合わせた上
に平形圧縮接続管12を圧縮して主導体接続部13とし
、両側の副導体3の露出部、即ち副導体露出部21,2
1は外被4,4の剥ぎ取り端41.41のところで折り
返して置く。この折り返された副導体露出部21.21
上、絶縁体2゜2上、主導体接続部13上に半導電性テ
ープを巻き付けて半導電性層22を形成する。
That is, the main conductor exposed portions 11.11 are overlapped by a predetermined length and the flat compression connecting pipe 12 is compressed to form the main conductor connecting portion 13, and the exposed portions of the sub conductors 3 on both sides, that is, the sub conductor exposed portions 21, 2 are
1 is folded back and placed at the peeled ends 41 and 41 of the outer sheaths 4 and 4. This folded back sub-conductor exposed portion 21.21
A semiconductive tape is wound on top, on the insulator 2°2, and on the main conductor connecting portion 13 to form a semiconductive layer 22.

次に、半導電性層22を覆うようにその外周にエチレン
プロピレンゴム製の熱収縮チューブを用いて絶縁体層5
1を形成する。副導体露出部21゜21の端部は、上記
絶縁体層51の片面上に添設した銅テープ21aとクラ
ンプ23.23によって接続し、副導体接続部24を形
成する。
Next, a heat shrinkable tube made of ethylene propylene rubber is used around the outer periphery of the semiconductive layer 22 to cover the insulating layer 22.
form 1. The end portion of the sub-conductor exposed portion 21.degree. 21 is connected to the copper tape 21a attached on one side of the insulating layer 51 by a clamp 23, 23 to form a sub-conductor connecting portion 24.

さらに、その外周をエチレンプロピレンゴム製の熱収縮
チューブ42を用いて被覆し、その両端部をシーリング
テープ43,43、粘着性テープ44.44によって封
止し、外被接続部45を形成する。
Further, the outer periphery of the tube is covered with a heat-shrinkable tube 42 made of ethylene propylene rubber, and both ends thereof are sealed with sealing tapes 43, 43 and adhesive tapes 44, 44 to form a jacket connection portion 45.

以上のように形成された低サージインピーダンス導体の
接続部について、インパルス破壊電圧試験を行った。こ
の試験において、試料は第1図((至)における界面長
りを変えた実施例3種類について各3試料ずつを用意し
、比較のため、これらの実施例と半導電性層を有しない
点だけが異なる試料をそれぞれ同様に作製した。
An impulse breakdown voltage test was conducted on the connection portion of the low surge impedance conductor formed as described above. In this test, three samples were prepared for each of the three types of examples with different interface lengths in Figure 1 ((to)), and for comparison, these examples and the point without a semiconductive layer were prepared. Samples differing only in the following were prepared in the same way.

試験方法は、主導体と副導体との間に20KVツインパ
ルス電圧(インパルス波形はJIS  C3005によ
る)を印加後、l0KVずつ昇圧し、各3回印加した。
The test method was to apply a 20 KV twin pulse voltage (impulse waveform is based on JIS C3005) between the main conductor and the sub conductor, then increase the voltage by 10 KV, and apply each three times.

その結果を下表に示す。The results are shown in the table below.

この表の試験結果において、界面閃絡とは、実施例の場
合は絶縁体2と半導電性層22との界面、比較例の場合
は絶縁体2と絶縁体層51との界面を経路として、主導
体接続部13と副導体露出部21との間に閃絡が生じた
ものであり、絶縁破壊とはこのような界面を通らずに絶
縁体2自体に絶縁破壊が生じたものである。
In the test results in this table, interfacial flashing refers to the interface between the insulator 2 and the semiconductive layer 22 in the case of the example, and the interface between the insulator 2 and the insulator layer 51 in the case of the comparative example. , a flash short has occurred between the main conductor connection part 13 and the sub-conductor exposed part 21, and dielectric breakdown is the occurrence of dielectric breakdown in the insulator 2 itself without passing through such an interface. .

上表の結果からも明らかなように、半導電性層22を設
けない場合は、界面長りを300mmにしてもなお80
KV以下で界面閃絡を生じるが、半導電性層22を設け
たものは界面長りを250mm以上にすることにより絶
縁破壊値より低い電圧で界面閃絡を生じることはなくな
る。
As is clear from the results in the above table, when the semiconductive layer 22 is not provided, even if the interface length is set to 300 mm, it is still 80 mm.
Although interfacial flashing occurs at voltages below KV, interface flashing does not occur at voltages lower than the dielectric breakdown value by setting the interface length to 250 mm or more in those provided with the semiconductive layer 22.

なお、上記実施例では、半導電性層22は半導電性テー
プを用いて形成したが、半導電性熱収縮チューブを用い
たものや導電性塗料を塗布することによって形成したも
の等も当然この発明に含まれる。また、主導体接続部1
3、副導体接続部24、外被接続部45、絶縁体層51
等の構造も上記実施例に限定されるものではない。
In the above embodiment, the semiconductive layer 22 was formed using a semiconductive tape, but it can also be formed using a semiconductive heat shrink tube or by applying a conductive paint. Included in invention. In addition, the main conductor connection part 1
3. Sub-conductor connection portion 24, jacket connection portion 45, insulator layer 51
These structures are not limited to the above embodiments.

〔発明の効果〕〔Effect of the invention〕

以上説明したように、この発明による低サージインピー
ダンス導体の接続部は、接続すべき低サージインピーダ
ンス導体の副導体露出部と主導体接枝部とに当接させて
薄い半導電性層を設けたため、主導体と副導体との間に
インパルス電圧が加わっても、その電位差が半導電性層
の抵抗によって長さ方向にほぼ均等に分圧される結果、
インパルス電圧に対して高い絶縁破壊強度を確保するこ
とができ、従って、接続部を短くすることができる。
As explained above, the connection part of the low surge impedance conductor according to the present invention is provided by providing a thin semiconductive layer in contact with the exposed sub-conductor part and the main conductor contact part of the low-surge impedance conductor to be connected. , even if an impulse voltage is applied between the main conductor and the sub-conductor, the potential difference is divided almost equally in the length direction by the resistance of the semiconductive layer.
It is possible to ensure high dielectric breakdown strength against impulse voltage, and therefore the connection portion can be shortened.

しかも外径増はごく僅かであり、可撓性が損われること
もない。即ちこの発明による低サージインピーダンス導
体の接続部は、低サージインピーダンス導体の機能を低
下させることなく確実かつ容易に形成することができる
Moreover, the increase in outer diameter is very small, and flexibility is not impaired. That is, the connection portion of the low-surge impedance conductor according to the present invention can be formed reliably and easily without deteriorating the function of the low-surge impedance conductor.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの発明による低サージインピーダンス導体の
一実施例を示し、第1図(a)は縦断面図、第1図(ハ
)は第1図(a)のX−X断面矢視図、第1図(C)は
第1図(ωのY−Y断面矢視図である。 1・・・主導体、   2・・・絶縁体、3・・・副導
体、   4・・・外被、13・・主導体接続部、22
・・半導電性層、24・・副導体接続部、45・・外被
接続部。
Fig. 1 shows an embodiment of the low surge impedance conductor according to the present invention, Fig. 1(a) is a longitudinal sectional view, and Fig. 1(c) is a cross-sectional view taken along line X-X in Fig. 1(a). , FIG. 1(C) is a Y-Y cross-sectional view of FIG. Covered, 13... Main conductor connection part, 22
...Semiconductive layer, 24.. Sub-conductor connection portion, 45.. Sheath connection portion.

Claims (1)

【特許請求の範囲】[Claims] (1)平板状の主導体の外周に矩形状に絶縁体を被覆し
、上記絶縁体の少なくとも片面上に主導体と平行に平板
状の副導体を添設し、その外周に外被を被覆してなる低
サージインピーダンス導体の接続部において: 2本の低サージインピーダンス導体の端末部の外被、副
導体及び絶縁体を順次段状に剥ぎ取って露出させた主導
体を互いに接続してなる主導体接続部と; 両側の副導体露出部及び主導体接続部に当接するように
設けた半導電性層と; 上記の半導電性層を覆うようにその外周に設けた絶縁体
層と; さらにその外周に両側の副導体露出部及び副導体露出部
と接続して設けた導電体からなる副導体接続部と; 上記の副導体接続部の外周に設けた外被接続部と; を具備したことを特徴とする低サージインピーダンス導
体の接続部。
(1) Cover the outer periphery of a flat main conductor with a rectangular insulator, attach a flat sub-conductor on at least one side of the insulator in parallel with the main conductor, and cover the outer periphery with an outer sheath. In the connecting part of low surge impedance conductors made of: The outer cover, sub conductor and insulator of the terminal parts of two low surge impedance conductors are sequentially stripped off in steps and the exposed main conductors are connected to each other. a main conductor connection part; a semiconductive layer provided so as to be in contact with the sub-conductor exposed parts on both sides and the main conductor connection part; an insulator layer provided on the outer periphery of the semiconductive layer so as to cover it; Furthermore, a sub-conductor connection part made of a conductor provided on the outer periphery of the sub-conductor exposed part on both sides and connected to the sub-conductor exposed part; and an outer sheath connection part provided on the outer periphery of the above-mentioned sub-conductor connection part; A low-surge impedance conductor connection section characterized by:
JP6897688A 1988-03-22 1988-03-22 Connection of low surge impedance conductor Granted JPH01241771A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6897688A JPH01241771A (en) 1988-03-22 1988-03-22 Connection of low surge impedance conductor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6897688A JPH01241771A (en) 1988-03-22 1988-03-22 Connection of low surge impedance conductor

Publications (2)

Publication Number Publication Date
JPH01241771A true JPH01241771A (en) 1989-09-26
JPH0470747B2 JPH0470747B2 (en) 1992-11-11

Family

ID=13389212

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6897688A Granted JPH01241771A (en) 1988-03-22 1988-03-22 Connection of low surge impedance conductor

Country Status (1)

Country Link
JP (1) JPH01241771A (en)

Also Published As

Publication number Publication date
JPH0470747B2 (en) 1992-11-11

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