JPH0123551B2 - - Google Patents
Info
- Publication number
- JPH0123551B2 JPH0123551B2 JP17011180A JP17011180A JPH0123551B2 JP H0123551 B2 JPH0123551 B2 JP H0123551B2 JP 17011180 A JP17011180 A JP 17011180A JP 17011180 A JP17011180 A JP 17011180A JP H0123551 B2 JPH0123551 B2 JP H0123551B2
- Authority
- JP
- Japan
- Prior art keywords
- water
- plating
- solution
- substrate
- immersing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000000758 substrate Substances 0.000 claims description 27
- 238000007747 plating Methods 0.000 claims description 20
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 16
- 238000007772 electroless plating Methods 0.000 claims description 14
- 239000012212 insulator Substances 0.000 claims description 11
- 239000007864 aqueous solution Substances 0.000 claims description 10
- 238000000034 method Methods 0.000 claims description 10
- 239000000243 solution Substances 0.000 claims description 9
- 238000005406 washing Methods 0.000 claims description 7
- 101150003085 Pdcl gene Proteins 0.000 claims description 6
- 238000001035 drying Methods 0.000 claims description 5
- 239000004065 semiconductor Substances 0.000 claims description 5
- 239000003929 acidic solution Substances 0.000 claims 1
- 239000012670 alkaline solution Substances 0.000 claims 1
- 230000001678 irradiating effect Effects 0.000 claims 1
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 18
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 16
- 229910052763 palladium Inorganic materials 0.000 description 9
- 229910052759 nickel Inorganic materials 0.000 description 8
- 238000007654 immersion Methods 0.000 description 5
- 229910006404 SnO 2 Inorganic materials 0.000 description 4
- 239000003054 catalyst Substances 0.000 description 3
- 239000004973 liquid crystal related substance Substances 0.000 description 3
- 229910001432 tin ion Inorganic materials 0.000 description 3
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 2
- 229910010413 TiO 2 Inorganic materials 0.000 description 2
- 239000002253 acid Substances 0.000 description 2
- 230000002378 acidificating effect Effects 0.000 description 2
- 238000007664 blowing Methods 0.000 description 2
- 239000005388 borosilicate glass Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 230000001235 sensitizing effect Effects 0.000 description 2
- 238000004506 ultrasonic cleaning Methods 0.000 description 2
- TXUICONDJPYNPY-UHFFFAOYSA-N (1,10,13-trimethyl-3-oxo-4,5,6,7,8,9,11,12,14,15,16,17-dodecahydrocyclopenta[a]phenanthren-17-yl) heptanoate Chemical compound C1CC2CC(=O)C=C(C)C2(C)C2C1C1CCC(OC(=O)CCCCCC)C1(C)CC2 TXUICONDJPYNPY-UHFFFAOYSA-N 0.000 description 1
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 229910021626 Tin(II) chloride Inorganic materials 0.000 description 1
- 230000003213 activating effect Effects 0.000 description 1
- 239000003513 alkali Substances 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 230000003197 catalytic effect Effects 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000011651 chromium Substances 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- 239000000084 colloidal system Substances 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000005034 decoration Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 239000002932 luster Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- -1 palladium ions Chemical class 0.000 description 1
- PIBWKRNGBLPSSY-UHFFFAOYSA-L palladium(II) chloride Chemical compound Cl[Pd]Cl PIBWKRNGBLPSSY-UHFFFAOYSA-L 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 239000002244 precipitate Substances 0.000 description 1
- 239000000565 sealant Substances 0.000 description 1
- 239000003566 sealing material Substances 0.000 description 1
- 238000002791 soaking Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 235000011150 stannous chloride Nutrition 0.000 description 1
- 239000001119 stannous chloride Substances 0.000 description 1
- 238000009210 therapy by ultrasound Methods 0.000 description 1
- 238000011282 treatment Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Description
【発明の詳細な説明】
本発明は、ガラス、セラミツク、プラスチツ
ク、及び結晶体等の絶縁体基板上にSnO2,
In2O3,TiO2等のn型半導体層を形成した基板上
への無電解メツキ方法に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention provides SnO 2 ,
The present invention relates to an electroless plating method on a substrate on which an n-type semiconductor layer such as In 2 O 3 or TiO 2 is formed.
従来、絶縁体基板上に無電解メツキをする際、
メツキ被膜の密着性向上のために種々の処理が施
されてきた。例えば、絶縁体基板を表面を機械的
研磨すること、あるいはフツ酸、クロム混酸を使
用して化学的研磨をすること、更にはその両方の
処理をしその後、SnCl2溶液浸漬、水洗、PdCl2
溶液浸漬、水洗、無電解メツキ溶液浸漬というプ
ロセスでメツキ被膜を形成するものであつた。し
かし密着性の向上は絶縁体基板上への無電解メツ
キの問題点であつた。 Conventionally, when performing electroless plating on an insulator substrate,
Various treatments have been applied to improve the adhesion of plating films. For example, the surface of an insulator substrate may be mechanically polished, or chemically polished using hydrofluoric acid and chromium mixed acid, or both may be treated, followed by immersion in SnCl 2 solution, water washing, and PdCl 2
The plating film was formed through a process of immersion in a solution, washing with water, and immersion in an electroless plating solution. However, improving adhesion has been a problem with electroless plating on insulating substrates.
しかし、絶縁体基板上にn型半導体層を形成す
ることによつてメツキ被膜の密着性は大幅に改善
されるようになつた。この場合のメツキプロセス
も前述と同様であつた。ところがメツキ被膜の密
着性は向上したものの絶縁体上へ無電解メツキす
る場合のもう1つの問題点メツキ表面が白く曇る
という問題は解決されずに残つた。白く曇る部分
はメツキ被膜がムラになつて付いた部分であり、
またその部分は肉視では見えないものの、透過型
顕微鏡ではピンホールが多数観察された。 However, by forming an n-type semiconductor layer on an insulating substrate, the adhesion of the plating film has been significantly improved. The plating process in this case was also the same as described above. However, although the adhesion of the plating film has improved, another problem in electroless plating on an insulator, that the plating surface becomes cloudy, remains unsolved. The white cloudy areas are areas where the plating film is unevenly applied.
In addition, although these parts were not visible to the naked eye, many pinholes were observed under a transmission microscope.
このメツキムラは、絶縁体基板表面のパラジウ
ム層の厚さに関係しているようであり、水で濡れ
たままの絶縁体基板表面はパラジウム層が均一で
ないように思われた。そのためPdCl2浸漬、水洗
後、回転によつて吹き飛ばし力を加えて、強制的
に余分なパラジウムを吹き飛ばし、出来るだけ均
一なパラジウム面を得ようと試みた。本発明の無
電解メツキ法によつて、得られたメツキ体は、ピ
ンホールが非常に少なくメツキムラもなく、極め
て光沢のある均一なメツキ面を持つたものとな
る。 This unevenness seems to be related to the thickness of the palladium layer on the surface of the insulator substrate, and it appeared that the palladium layer was not uniform on the surface of the insulator substrate that was still wet with water. Therefore, after soaking in PdCl 2 and rinsing with water, a blowing force was applied by rotation to forcibly blow away the excess palladium in an attempt to obtain a palladium surface as uniform as possible. The plated body obtained by the electroless plating method of the present invention has very few pinholes, no plating unevenness, and has an extremely glossy and uniform plated surface.
外装部分、装飾用にメツキを使用するためには
均一な光沢のあることが必要不可欠であり、また
ピンホールがないことが、光シヤツターの部品や
フオトマスク等の光遮断部品に無電解メツキ体を
使用するための条件となる。 In order to use plating for exterior parts and decoration, it is essential that it has a uniform luster, and that there are no pinholes makes it possible to use electroless plating for light-shielding parts such as optical shutter parts and photomasks. This is a condition for use.
本発明の無電解メツキ工程は次の通りである。 The electroless plating process of the present invention is as follows.
絶縁体基板上に、蒸着あるいはスパツタ、
CVD、溶液浸漬法等を用いて、SnO2、TiO2,
In2O3等のn型半導体層を形成後、アルカリ性水
溶液例えばKOH3%水溶液にて超音波洗浄して表
面をよりきれいとした。その後水洗、酸性水溶
液、例えばH2SO43%水溶液にて中和し、水洗を
行つた。次に無電解メツキにおける通常の前処理
を行つた。 Vapor deposition or sputtering on an insulating substrate
SnO 2 , TiO 2 ,
After forming an n-type semiconductor layer such as In 2 O 3 , the surface was cleaned by ultrasonic cleaning with an alkaline aqueous solution, for example, a 3% KOH aqueous solution. Thereafter, it was washed with water, neutralized with an acidic aqueous solution, for example, a 3% aqueous H 2 SO 4 solution, and washed with water. Next, the usual pretreatment for electroless plating was performed.
即ち、塩化第一スズの酸性水溶液に絶縁体基板
を浸漬し水洗を行つた。これをセンシタイジング
といい、基板表面に2価のスズイオンを吸着させ
るものである。次に、塩化パラジウム水溶液に絶
縁体基板を浸漬し水洗を行つた。これをアクテイ
ベテイングといい、先のセンシタイジングにおけ
る2価のスズイオンが電子を2価のパラジウムイ
オンに放出することにより価のスズイオンにな
り、2価のパラジウムイオンは金属パラジウムと
して絶縁体基板表面に析出する。 That is, the insulating substrate was immersed in an acidic aqueous solution of stannous chloride and washed with water. This is called sensitizing, and divalent tin ions are adsorbed onto the substrate surface. Next, the insulating substrate was immersed in an aqueous palladium chloride solution and washed with water. This is called activating, and the divalent tin ions in the previous sensitizing release electrons to divalent palladium ions to become valent tin ions, and the divalent palladium ions form metal palladium on the surface of the insulator substrate. It precipitates out.
Sn2+Pd2+→Sn4+Pd0 ……(1)
この金属パラジウムが以後のメツキの触媒核と
して作用するといわれている。しかし、最近の研
究報告によれば上記(1)式のような単純な反応でな
く、スズとパラジウムの組み合つたコロイド等が
触媒核となるともいわれている。 Sn 2 + Pd 2+ →Sn 4+ Pd 0 ...(1) This metal palladium is said to act as a catalyst nucleus for subsequent plating. However, according to recent research reports, it is said that the reaction is not as simple as the one shown in equation (1) above, but that a colloid of tin and palladium serves as the catalytic core.
このようにして得られた絶縁体基板を、スピン
ナーで余分な触媒核を吹きとばして乾燥した後、
適当な温度に保たれた所定の無電解メツキ浴に浸
漬した。無電解メツキ浴としては、ニツケルメツ
キ浴、コバルトメツキ浴、銅メツキ浴等がある。
このようにして得られたメツキ被膜は白く曇るこ
となく、ピンホールも極めて少なかつた。 After drying the insulating substrate thus obtained by blowing off excess catalyst nuclei with a spinner,
It was immersed in a predetermined electroless plating bath maintained at an appropriate temperature. Examples of electroless plating baths include nickel plating baths, cobalt plating baths, copper plating baths, and the like.
The plating film thus obtained did not become cloudy and had extremely few pinholes.
以下実施例を用いて詳細に説明する。 This will be explained in detail below using examples.
実施例
ホウケイ酸ガラス(80×120mm)にCVDを使用
してSnO2膜を形成した。KOH3%、65℃の水溶
液にこのガラス基板を入れ超音波洗浄を行つた。
その後水洗し、H2SO43%水溶液にて中和し水洗
を行つた。継いでSnCl2水溶液(SnCl21g/,
HCl1c.c./)にガラス基板を5分間浸漬し、水
洗後PdCl2水溶液(カニゼン社製レツドシユーマ
ー)に5分間浸漬し、水洗後スピンドライヤーに
て乾燥した。そして45℃に保たれた無電解メツケ
ル浴(カニゼン社製シユーマーS680)に10分間
浸漬したところ曇りのない美しい鏡面のニツケル
メツキ被膜が得られた。Example A SnO 2 film was formed on borosilicate glass (80×120 mm) using CVD. This glass substrate was placed in an aqueous solution of 3% KOH at 65°C and subjected to ultrasonic cleaning.
Thereafter, it was washed with water, neutralized with a 3% H 2 SO 4 aqueous solution, and washed with water. Then add SnCl 2 aqueous solution (SnCl 2 1g/,
The glass substrate was immersed in HCl1c.c./) for 5 minutes, washed with water, and then immersed in a PdCl 2 aqueous solution (Redshumer, manufactured by Kanigen Co., Ltd.) for 5 minutes, and dried with a spin dryer after washing with water. When it was immersed for 10 minutes in an electroless Metzkel bath (Schumer S680, manufactured by Kanigen Co., Ltd.) kept at 45°C, a beautiful mirror-like nickel plating film with no clouding was obtained.
比較例
上記実施例と同様の絶縁体基板を同様の工程で
PdCl2水溶液浸漬まで行つた。その絶縁基板を水
洗後直ちに同様の無電解ニツケル浴に10分間浸漬
したところ、メツキ面は薄く白く曇つた。Comparative example The same insulator substrate as in the above example was prepared in the same process.
Immersion in PdCl 2 aqueous solution was performed. Immediately after washing the insulating substrate with water, it was immersed in a similar electroless nickel bath for 10 minutes, resulting in a thin white cloudy appearance on the plated surface.
以上からわかるように、ニツケル浴に浸漬前絶
縁体基板を乾燥すると光沢のある美しいメツキ被
膜が得られることがわかつた。ピンホールは本発
明によるプロセスで得られたメツキ体にはほとん
どなかつたが、従来通り乾燥工程のないプロセス
ではかなり多く観察された。 As can be seen from the above, it was found that a beautiful glossy plating film could be obtained by drying the insulating substrate before being immersed in a nickel bath. There were almost no pinholes in the plated body obtained by the process according to the present invention, but quite a lot were observed in the conventional process without a drying step.
応用例
上記実施例と同様の方法で形成された無電解ニ
ツケルメツキ体を使用してカメラの日付け写し込
み用のパネルを作つた。第1図がその概略であ
る。1,2はそれぞれホウケイ酸ガラスによつて
なる厚さ0.4mmの前面及び背面基板である。3,
4はCVDによつて所定のパターンに形成された
透明電極(SnO2)である。5は実施例と同様な
方法で形成されたニツケルメツキ被膜であり、
2000Åの厚さがある。6は10μのギヤツプ剤を含
んだエポキシ樹脂からなるシール剤であり、7は
通常表示体に使用される液晶である。Application Example A panel for imprinting the date on a camera was made using an electroless nickel plating body formed in the same manner as in the above example. Figure 1 shows its outline. Reference numerals 1 and 2 are front and rear substrates each made of borosilicate glass and having a thickness of 0.4 mm. 3,
4 is a transparent electrode (SnO 2 ) formed into a predetermined pattern by CVD. 5 is a nickel plating film formed by the same method as in the example,
It has a thickness of 2000 Å. 6 is a sealant made of epoxy resin containing a gapping agent of 10μ, and 7 is a liquid crystal usually used for display bodies.
このパネルは第2図のように使用されるもので
あり、ニツケルメツキは図中の破線で示される光
を遮断する目的を持つ。 This panel is used as shown in Fig. 2, and the nickel plating has the purpose of blocking light as indicated by the broken line in the figure.
以上のとおり、本発明によれば、n型半導体層
が形成された絶縁体基板を、アルカリ超音波処
理、酸浸漬を行つたのち、SnCl2溶液、PdCl2溶
液に浸漬し、さらにスピンナーを用いて水分とと
もに余分な触媒核を除去乾燥させることにより、
表面が均一且鏡面であり、何等密着性に影響のな
い無電解メツキ被膜を得ることができる。 As described above, according to the present invention, an insulator substrate on which an n-type semiconductor layer is formed is subjected to alkali ultrasonic treatment and acid immersion, and then immersed in a SnCl 2 solution and a PdCl 2 solution, and further processed using a spinner. By drying and removing excess catalyst nuclei along with moisture,
It is possible to obtain an electroless plating film that has a uniform and mirror-like surface and does not affect adhesion in any way.
第1図は日付け写し込み用液晶パネルを示す
図。
1,2…前面背面基板、3,4…透明電極、5
…ニツケルメツキ部、6…シール材、7…液晶。
第2図はカメラの日付け写し込み機構を示す
図。
8…ランプ(光源)、9…第1のパネル、10
…パネル支持体、11…写真フイルム。
FIG. 1 is a diagram showing a liquid crystal panel for imprinting the date. 1, 2...Front and back substrate, 3, 4...Transparent electrode, 5
...Nickel plated part, 6...Sealing material, 7...Liquid crystal. FIG. 2 is a diagram showing the date imprinting mechanism of the camera. 8... Lamp (light source), 9... First panel, 10
... Panel support, 11... Photographic film.
Claims (1)
をアルカリ性溶液に浸漬、超音波照射したのち、
水洗する工程と、 前記工程を経た絶縁体基板を酸性溶液に浸漬し
たのち、水洗する工程と、 前記工程を経た絶縁体基板をSnCl2水溶液に浸
漬したのち、水洗する工程と、 前記工程を経た絶縁体基板をPdCl2水溶液に浸
漬したのち、水洗する工程と、 前記工程を経た絶縁体基板をスピンナーを用い
て乾燥する工程と、 前記工程を経た絶縁体基板を無電解メツキ液に
浸漬して、メツキをする工程とからなることを特
徴とする無電解メツキ法。[Claims] 1. After immersing an insulating substrate on which an n-type semiconductor layer is formed in an alkaline solution and irradiating it with ultrasonic waves,
a step of immersing the insulating substrate that has gone through the above step in an acidic solution and then washing it with water; a step of immersing the insulating substrate that has gone through the above step in an aqueous SnCl 2 solution and then washing it with water; A step of immersing the insulator substrate in a PdCl 2 aqueous solution and then washing it with water, a step of drying the insulator substrate that has undergone the above step using a spinner, and a step of immersing the insulator substrate that has gone through the above step in an electroless plating solution. An electroless plating method characterized by comprising the steps of plating.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17011180A JPS5794563A (en) | 1980-12-02 | 1980-12-02 | Electroless plating method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17011180A JPS5794563A (en) | 1980-12-02 | 1980-12-02 | Electroless plating method |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5794563A JPS5794563A (en) | 1982-06-12 |
JPH0123551B2 true JPH0123551B2 (en) | 1989-05-02 |
Family
ID=15898838
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17011180A Granted JPS5794563A (en) | 1980-12-02 | 1980-12-02 | Electroless plating method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5794563A (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60141874A (en) * | 1983-12-28 | 1985-07-26 | Seiko Epson Corp | Electroless plating method |
US4910049A (en) * | 1986-12-15 | 1990-03-20 | International Business Machines Corporation | Conditioning a dielectric substrate for plating thereon |
-
1980
- 1980-12-02 JP JP17011180A patent/JPS5794563A/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5794563A (en) | 1982-06-12 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US6127052A (en) | Substrate and method for producing it | |
JP3117386B2 (en) | Method for selective metallization of substrates | |
US3212918A (en) | Electroless plating process | |
US2278722A (en) | Metallic coating | |
US4091172A (en) | Uniform gold films | |
US3963841A (en) | Catalytic surface preparation for electroless plating | |
US3639143A (en) | Electroless nickel plating on nonconductive substrates | |
US3340164A (en) | Method of copper plating anodized aluminum | |
JPH0123551B2 (en) | ||
JPH026833B2 (en) | ||
CA1104699A (en) | Method of forming matt display electrode | |
US4154869A (en) | Electroless plating method with inspection for an unbroken layer of water prior to plating | |
JPS6133905B2 (en) | ||
US3963528A (en) | Oxidation of chromium surfaces | |
US4400436A (en) | Direct electroless deposition of cuprous oxide films | |
JP3275476B2 (en) | Substrate for magnetic disk | |
CA1045909A (en) | Processes and products of sensitizing substrates | |
JP2774105B2 (en) | Light shielding film and manufacturing method thereof | |
JPS6021225B2 (en) | Electroless plating body | |
US4315055A (en) | Direct electroless deposition of cuprous oxide films | |
JPH0230385B2 (en) | MUDENKAIMETSUKIHO | |
JPS63259082A (en) | Plating method | |
JP2000096431A (en) | Electroless plating of fiber and textile product | |
SU1123999A1 (en) | Method for treating surface of insulating materials before chemical metallization | |
JPH0232616B2 (en) |