JPH01234851A - Developing device for optical disk - Google Patents

Developing device for optical disk

Info

Publication number
JPH01234851A
JPH01234851A JP6260288A JP6260288A JPH01234851A JP H01234851 A JPH01234851 A JP H01234851A JP 6260288 A JP6260288 A JP 6260288A JP 6260288 A JP6260288 A JP 6260288A JP H01234851 A JPH01234851 A JP H01234851A
Authority
JP
Japan
Prior art keywords
pattern
area
glass substrate
nozzle
pattern width
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6260288A
Other languages
Japanese (ja)
Inventor
Yoshiaki Yamada
義昭 山田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP6260288A priority Critical patent/JPH01234851A/en
Publication of JPH01234851A publication Critical patent/JPH01234851A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To form a uniform pattern in the entire area of a glass substrate by comparing the pattern width of an innermost area in a pattern area on the glass substrate with that of an outermost area and dripping a liquid developer from a nozzle in the intermediate pattern area when the pattern width of the outermost area is smaller. CONSTITUTION:When the liquid developer 3 is dripped from only the nozzle inside the pattern area while the glass substrate 2 which is exposed the pattern is rotated spirally, the liquid developer 3 flows on the glass substrate 2 from inside to outside to perform development processing. While the development is advanced, laser beam is projected perpendicularly on two points in the innermost area and outermost area of the pattern area simultaneously at all the times and an arithmetic unit 10 calculates the pattern width. Then when the pattern width (x) of the innermost pattern area is larger than the pattern width (y) of the outermost area, a comparator 12 sends an indication to a solenoid valve 11 so as to drip the liquid developer from the nozzle in the intermediate pattern area, but when smaller, an instruction is sent to the solenoid valve 11 so as to drip pure water from the nozzle in the intermediate pattern area. Consequently, the uniform pattern is formed over the entire surface of the substrate.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は光ディスク用現像装置、特に、フォトレジスト
の現像のためにガラス基板−ヒ(二定ピッチで同心円状
または渦巻状にパターンが露光された光ディスク用現像
装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a developing device for optical discs, and in particular, to a developing device for optical disks, in which a pattern is exposed concentrically or spirally at two constant pitches on a glass substrate. The present invention relates to a developing device for optical discs.

〔従来の技術〕[Conventional technology]

従来の光ディスク用現像装置は、例えば松下電器技報V
OL、29 NC1,5rレーザによる光ディスクの原
盤作製」に示されているように、ガラス基板に一定ピッ
チで露光されたパターンを現像する装置としては、現像
モニタ付の自動現像装置が広く知られている。
A conventional optical disk developing device is, for example, Matsushita Electric Technical Report V.
As shown in OL, 29 "Preparation of Master Optical Disc Using NC1,5R Laser", an automatic developing device with a development monitor is widely known as a device for developing a pattern exposed at a constant pitch on a glass substrate. There is.

従来の光ディスク用現像装置では、現像中ガラス基板に
レーザ光を垂直に通過させておき、現像が進行するに伴
って現われてくるパターン構造がレーザ光に対する回折
格子として作用して回折光を生じさせる。パターン幅の
変化とともに回折光も変化するのでこれを検出してパタ
ーン幅をモニタし、必要とされるパターン幅が形成され
た時点で現像処理を終了していた。
In conventional optical disc development devices, laser light is passed perpendicularly through the glass substrate during development, and the pattern structure that appears as development progresses acts as a diffraction grating for the laser light, producing diffracted light. . Since the diffracted light also changes as the pattern width changes, this is detected and the pattern width is monitored, and the development process is terminated when the required pattern width is formed.

次に、従来の光ディスク用現像装置について、図面を参
照して説明する。
Next, a conventional optical disc developing device will be described with reference to the drawings.

第2図は従来の光ディスク用現像装置の一例を示す構成
図である。現像方法は、ガラス基板2をスピンチャック
lに真空吸着し、ガラス基板2を回転しながら現像液供
給ノズル4で供給される現像液3をガラス基板1の上に
滴下することにより現像を行う、いわゆるスピン現像方
式を採っている。
FIG. 2 is a block diagram showing an example of a conventional optical disk developing device. The developing method involves vacuum suctioning the glass substrate 2 to a spin chuck L, and developing by dropping the developer 3 supplied by the developer supply nozzle 4 onto the glass substrate 1 while rotating the glass substrate 2. It uses a so-called spin development method.

He −N eレーザ5をガラス基板1の裏面より垂直
に照射し、ガラス基板lを透過した回折光をた後演算ユ
ニット10でパターン幅を算出する。
A He-Ne laser 5 is irradiated perpendicularly from the back surface of the glass substrate 1, and after the diffracted light transmitted through the glass substrate 1 is emitted, a pattern width is calculated by an arithmetic unit 10.

そして必要とされるパターン幅が形成された時点で現像
処理を終了する。
The development process ends when the required pattern width is formed.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

しかしながらこのような上述した従来の光ディスク用現
像装置は、ガラス基板の上へ1ケ所にレーザ光を照射し
パターン幅をモニタする構成となっているので、ガラス
基板上の他の部分のパターン幅はまったく判らず、現像
条件に影響を与える現像工程以前の要因としてはフォト
レジストの膜厚と単位面積当たりの露光量があるが、フ
ォトレジスト塗布工程ではスピンコードが一般的に用い
られており、膜厚の変動は円周方向より半径方向に対し
て大きくなり、露光工程では例えば光ディスクの場合中
心付近から外縁部へ向けて露光パワーを増加することに
より単位面積当たりの露光量が一定になるように制御し
ても時間の経過とともにレーザの状態は変化しやはり半
径方向の差として表われ、さらに現像工程もスピン現像
でありガラス基板中心付近に固定されたノズルから現像
液を供給することが一般的であり外縁部へ供給される現
像液はすでに中心付近での現像処理に用いられたため、
ガラス基板の中心付近と外縁部とでは現像の進行に大き
な差が生じ、ノズルを中心付近より外縁方向へ、あるい
は外縁方向から中心付近へと駆動する構成も知られてい
るが、基板上1ケ所でのモニタでは基板全面でパターン
幅を制御することは極めて難しいという欠点があった。
However, the above-mentioned conventional optical disc development device is configured to irradiate a laser beam onto one spot on the glass substrate and monitor the pattern width, so the pattern width on other parts of the glass substrate is Factors that are completely unknown and affect the development conditions before the development process include the photoresist film thickness and the amount of exposure per unit area, but spin codes are generally used in the photoresist coating process, and the The variation in thickness is greater in the radial direction than in the circumferential direction, and in the exposure process, for example, in the case of an optical disk, the exposure power is increased from near the center toward the outer edge so that the amount of exposure per unit area becomes constant. Even if controlled, the state of the laser changes over time, which still appears as a difference in the radial direction.Furthermore, the development process is spin development, and the developer is generally supplied from a nozzle fixed near the center of the glass substrate. Since the developer supplied to the outer edge has already been used for development near the center,
There is a large difference in the progress of development between near the center and the outer edge of the glass substrate, and there are also known configurations in which the nozzle is driven from near the center towards the outer edge, or from the outer edge towards the center. The disadvantage of this monitor is that it is extremely difficult to control the pattern width over the entire surface of the substrate.

〔課題を解決するための手段〕[Means to solve the problem]

本発明の光ディスク用現像装置レマ、スピンチャックと
、前記スビンチ・ヤックに保持して回転され一定のピッ
チで同心円状または渦巻状にパターンが露光されたガラ
ス基板のパターン域より内側とパターン域の中域の2ケ
所に設けられ少なくともパターン域の中域に現像液と純
水の滴下が制御可能な2組の現像液供給ノズルと、前記
ガラス基板のパターン域の最内域と最外域との2点にレ
ーザ光を垂直に照射する光学系と、前記レーザ光の基板
上のパターンによる0次光、±1次光の回折光量を検出
する2組の回折光量検出部と、検出光量よりパターン幅
を算出する演算ユニットと、パターン幅を比較し最外域
パターン幅が小さい時にはパターン中域のノズルより現
像液を滴下し最外域パターン幅が大きい時にはパターン
中域のノズルより純水を滴下する比較回路とを含んで構
成される。
The developing device for optical discs of the present invention includes a rema, a spin chuck, and inside and inside the pattern area of a glass substrate that is held and rotated by the subinci yak and exposed with a concentric or spiral pattern at a constant pitch. two sets of developer supply nozzles that are provided at two locations in the pattern area and can control the dropping of developer and pure water in at least the middle area of the pattern area; An optical system that vertically irradiates a laser beam onto a point, two sets of diffracted light amount detectors that detect the amount of diffracted light of the 0th order light and ±1st order light due to the pattern on the substrate of the laser beam, and a pattern width that is determined based on the detected light amount. and a comparison circuit that compares the pattern widths, and when the outermost pattern width is small, the developer is dripped from the nozzle in the middle of the pattern, and when the outermost pattern width is large, pure water is dripped from the nozzle in the middle of the pattern. It consists of:

〔実施例〕〔Example〕

次に、本発明の実施例について、図面を参照して詳細に
説明する。
Next, embodiments of the present invention will be described in detail with reference to the drawings.

第1図は本発明の一実施例を示す模式図である。FIG. 1 is a schematic diagram showing an embodiment of the present invention.

第・1図に示す光ディスク用現像装置は、スピンチャッ
ク1と、このスピンチャックに保持して回転され一定の
ピッチで同心円状または渦巻状にパターンが露光された
ガラス基板2のパターン域より内側とパターン域の中域
の2ケ所に設けられ少な(ともパターン域の中域に現像
液3と純水の滴下が制御可能な2組の現像液供給ノズル
4と、このガラス基板のパターン域の最内域と最外域と
の2点にレーザ光を垂直に照射するためのHe −N 
eレーザ5と、ハーフミラ−6と、全反射ミラー7と、
このレーザ光のパターンによる0次光、±1次光の回折
光量を検出する2組の回折光量検出部8およびアンプ9
と、検出光量よりパターン幅を算出する演算ユニット1
0と、前記演算ユニット10により算出された最内域パ
ターン幅と最外域パターン幅を比較し最外域パターン幅
が小さい時が大きい時にはパターン中域のノズルより純
水を滴下するように電磁弁11へ指示を出す比較回路】
2とを含んで構成される。
The optical disk developing device shown in FIG. 1 consists of a spin chuck 1 and a glass substrate 2 held by the spin chuck and rotated to expose a concentric or spiral pattern at a constant pitch. Two sets of developer supply nozzles 4 are provided at two locations in the middle of the pattern area (both are two sets of developer supply nozzles 4 that can control the dropping of developer 3 and pure water in the middle of the pattern area, and one at the top of the pattern area of this glass substrate. He-N for perpendicularly irradiating laser light to two points, the inner region and the outermost region.
e laser 5, half mirror 6, total reflection mirror 7,
Two sets of diffracted light amount detection unit 8 and amplifier 9 detect the amount of diffracted light of 0th order light and ±1st order light by this laser light pattern.
and a calculation unit 1 that calculates the pattern width from the detected light amount.
0, the innermost area pattern width and the outermost area pattern width calculated by the arithmetic unit 10 are compared, and when the outermost area pattern width is small and the outermost area pattern width is large, the solenoid valve 11 is configured to drop pure water from the nozzle in the middle area of the pattern. Comparison circuit that issues instructions to
2.

次に、第1図に示した光ディスク用現像装置の動作の一
例を説明する。
Next, an example of the operation of the optical disk developing device shown in FIG. 1 will be described.

例えばシブレイ社製フォトレジスト商品名MP1350
Jを膜厚1200人に塗布し、1.6μmのピッチで渦
巻状にパターンが露光されたガラス基板2を30 Or
pmで回転しながらパターン域より内側のノズルのみか
らシブレイ社製MPデベロッパ濃度20%の現像液3を
ガラス基板2上に滴下する。現像液3はガラス基板2上
を内側から外側へ流れ現像処理を行う。現像進行中、常
にパターン域の最内域と最外域との2点に同時にレーザ
光を垂直に照射し、パターン幅を演算ユニット10にて
算出する。
For example, photoresist product name MP1350 manufactured by Sibley
The glass substrate 2, on which a spiral pattern was exposed with a pitch of 1.6 μm, was coated with J to a film thickness of 1200 μm.
While rotating at pm, a developer 3 of MP Developer manufactured by Sibley Co., Ltd. with a concentration of 20% is dripped onto the glass substrate 2 from only the nozzle inside the pattern area. The developer 3 flows over the glass substrate 2 from the inside to the outside to perform a development process. During development, laser light is always perpendicularly irradiated to two points, the innermost area and the outermost area, of the pattern area at the same time, and the pattern width is calculated by the calculation unit 10.

仮に、パターン最内域のパターン幅ヲX 、パターン最
外域のパターン幅をyとすると、現像の進行にともない
x>yの関係が成立すると、このとき比較回路12はパ
ターン中域のノズルより現像液を滴下するように電磁弁
11へ指示を出す。
Assuming that the pattern width of the innermost area of the pattern is x and the pattern width of the outermost area of the pattern is y, if the relationship x>y is established as development progresses, then the comparison circuit 12 will cause the nozzle in the middle area of the pattern to develop the pattern. An instruction is issued to the solenoid valve 11 to drip the liquid.

さらに、現像が進行すると今度はx=yの関係が成立す
るので、このとき比較回路12はパターン中域のノズル
より現像液の滴下を止めるように電磁弁11へ指示を出
す。
Further, as the development progresses, the relationship x=y is established, so at this time the comparator circuit 12 issues an instruction to the electromagnetic valve 11 to stop dropping the developer from the nozzle in the middle area of the pattern.

また、逆にx<yの関係が成立すると、このとき比較回
路12はパターン中域のノズルより純水を滴下するよう
に電磁弁11へ指示を出す。
Conversely, if the relationship x<y holds true, then the comparison circuit 12 issues an instruction to the electromagnetic valve 11 to drip pure water from the nozzle in the middle area of the pattern.

さらに現像が進行すると今度はx=yの関係が成立する
ので、このとき比較回路12はパターン中域のノズルよ
り純水の滴下を止めるように電磁弁11へ指示を出す。
As the development progresses further, the relationship x=y is established, so at this time the comparator circuit 12 issues an instruction to the electromagnetic valve 11 to stop dripping pure water from the nozzle in the middle area of the pattern.

以上のくり返しにより基板全面に均一なパターンを形成
する。
By repeating the above steps, a uniform pattern is formed over the entire surface of the substrate.

上述の実施例では、パターン中域へ現像液と純水との供
給を三方弁を用い1個のノズルで行ったが、現像液専用
ノズルと純水専用ノズルというように2個のノズルで行
っても良い。
In the above embodiment, a three-way valve was used to supply the developer and pure water to the middle area of the pattern with one nozzle, but two nozzles were used, one for the developer and one for the pure water. It's okay.

〔発明の効果〕〔Effect of the invention〕

本発明の光ディスク用現像装置は、2組00次光、±1
次光の回折光量検出部を設け、現像中インプロセスでパ
ターン域の最内域と最外域との2ケ所でパターン幅をモ
ニタし最内域と最外域とのパターン幅を比較し、最外域
のパターン幅が小さくなった場合にパターン域の中域の
ノズルから現像液を滴下し、また、最外域のパターン幅
が大きくなった場合にパターン域の中域のノズルから純
水を滴下することにより、基板全域に均一なパターンを
形成できるという効果がある。
The optical disk developing device of the present invention includes two sets of 00th order light, ±1
A diffraction light amount detection unit for the secondary light is installed, and the pattern width is monitored in two places, the innermost area and the outermost area, of the pattern area in-process during development, and the pattern widths in the innermost area and the outermost area are compared, and the pattern width is compared in the outermost area. When the pattern width becomes small, developer is dropped from the nozzle in the middle area of the pattern area, and when the pattern width in the outermost area becomes large, pure water is dropped from the nozzle in the middle area of the pattern area. This has the effect of forming a uniform pattern over the entire substrate.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の実施例を示す模式図、第2図は従来の
一例を示す模式図である。 1・・・・・・スピンチャック、2・・・・・・ガラス
基板、3・・・・・・現像液、4・・・・・・現像液供
給ノズル、5・・・・・・He−Neレーザ、6・・・
・・・ハーフミラ−17・・・・・・全反射ミラー、訃
・・・・・光量検出部、9・・・・・・アンプ、10・
・・・・・演算ユニット、11・・・・・・電磁弁、1
2・・・・・・比較回路。 代理人 弁理士  内 原   音 第 1 菌 $ 2 図
FIG. 1 is a schematic diagram showing an embodiment of the present invention, and FIG. 2 is a schematic diagram showing a conventional example. 1... Spin chuck, 2... Glass substrate, 3... Developer, 4... Developer supply nozzle, 5... He -Ne laser, 6...
... Half mirror 17 ... Total reflection mirror, ... Light amount detection section, 9 ... Amplifier, 10.
...Calculation unit, 11...Solenoid valve, 1
2... Comparison circuit. Agent Patent Attorney Uchihara Ondai 1 Bacteria $ 2 Diagram

Claims (1)

【特許請求の範囲】[Claims] スピンチャックと、前記スピンチャックに保持して回転
され一定のピッチで同心円状または渦巻状にパターンが
露光されたガラス基板のパターン域より内側とパターン
域の中域の2ケ所に設けられ少なくともパターン域の中
域に現像液と純水の滴下が制御可能な2組の現像液供給
ノズルと、前記ガラス基板のパターン域の最内域と最外
域との2点にレーザ光を垂直に照射する光学系と、前記
レーザ光の基板上のパターンによる0次光、±1次光の
回折光量を検出する2組の回折光量検出部と、検出光量
よりパターン幅を算出する演算ユニットと、前記パター
ン幅を比較し最外域パターン幅が小さい時にはパターン
中域のノズルより現像液を滴下し最外域パターン幅が大
きい時にはパターン中域のノズルより純水を滴下する比
較回路とを含むことを特徴とする光ディスク用現像装置
A spin chuck and a glass substrate which is rotated while being held by the spin chuck and is exposed with a concentric or spiral pattern at a constant pitch. Two sets of developer supply nozzles that can control the dropping of developer and pure water in the middle area, and optics that vertically irradiate laser light to two points, the innermost area and the outermost area of the pattern area of the glass substrate. a system, two sets of diffracted light amount detection units that detect the amount of diffracted light of the 0th order light and ±1st order light due to the pattern on the substrate of the laser beam, an arithmetic unit that calculates the pattern width from the detected light amount, and the pattern width. an optical disc characterized in that it includes a comparison circuit that compares the pattern width of the outermost area and drops a developer from a nozzle in the middle area of the pattern when the pattern width of the outermost area is small, and drops pure water from the nozzle of the middle area of the pattern when the pattern width of the outermost area is large. development equipment.
JP6260288A 1988-03-15 1988-03-15 Developing device for optical disk Pending JPH01234851A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6260288A JPH01234851A (en) 1988-03-15 1988-03-15 Developing device for optical disk

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6260288A JPH01234851A (en) 1988-03-15 1988-03-15 Developing device for optical disk

Publications (1)

Publication Number Publication Date
JPH01234851A true JPH01234851A (en) 1989-09-20

Family

ID=13205041

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6260288A Pending JPH01234851A (en) 1988-03-15 1988-03-15 Developing device for optical disk

Country Status (1)

Country Link
JP (1) JPH01234851A (en)

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