JPH01233383A - Laser distance measuring apparatus - Google Patents

Laser distance measuring apparatus

Info

Publication number
JPH01233383A
JPH01233383A JP6087588A JP6087588A JPH01233383A JP H01233383 A JPH01233383 A JP H01233383A JP 6087588 A JP6087588 A JP 6087588A JP 6087588 A JP6087588 A JP 6087588A JP H01233383 A JPH01233383 A JP H01233383A
Authority
JP
Japan
Prior art keywords
interference optical
semiconductor laser
laser
wavelength
monitoring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6087588A
Other languages
Japanese (ja)
Inventor
Hiroyasu Otani
大谷 博康
Sho Yasuda
升 安田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP6087588A priority Critical patent/JPH01233383A/en
Publication of JPH01233383A publication Critical patent/JPH01233383A/en
Pending legal-status Critical Current

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  • Semiconductor Lasers (AREA)
  • Optical Radar Systems And Details Thereof (AREA)

Abstract

PURPOSE:To use an interference optical fiber with a narrow band width for the removal of a background light, by controlling an oscillation wavelength of a semiconductor laser with the regulation of the length of a resonator based on a quantity difference in the transmission light monitoring the quantity of transmission light of the filter. CONSTITUTION:A part of laser light outputted from a semiconductor laser 1 is taken out with a beam splitter 14 and divided in two with a partial mirror 15 and a mirror 16. The laser light is introduced to narrow band interference optical filters 17 and 18 for monitoring with a different center wavelength. An interference optical filter whose center wavelength is at an intermediate area of the center wavelength of the filters is used as reception one 4. As an oscillation wavelength of the semiconductor laser 1 varies in level from the center wavelength lambda of the reception interference optical filter 4, outputs of two detectors 19 and 20 change and a variation of a transmission wavelength is discriminated with a monitoring section 21 according to the level and direction thereof to output a drive signal to a PTZ controller 22 corresponding to the variation.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明はレーザ測距装置に関し、特に半導体レーザを用
いたレーザ測距装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to a laser range finder, and more particularly to a laser range finder using a semiconductor laser.

〔従来の技術〕[Conventional technology]

従来の半導体レーザを用いたレーザ測距装置の構成を第
2図に示す。
FIG. 2 shows the configuration of a conventional laser distance measuring device using a semiconductor laser.

半導体レーザ1は、タイミングコントローラ7から出力
されるトリガ信号に同期して駆動される。
The semiconductor laser 1 is driven in synchronization with a trigger signal output from the timing controller 7.

半導体レーザ1により出力されたレーザ光は送信光学系
2を通じて目標物に向かって出射される。
Laser light output from the semiconductor laser 1 is emitted toward a target through a transmission optical system 2.

目標より反射されたレーザ光は受信光学系3により集め
られ、背景光除去用の干渉光学フィルタ4を通して検知
器5に送られる。検知器5により電気信号に変換された
受信信号は増幅器6によりタイミングコントローラ7に
導かれる。タイミングコントローラ7内において半導体
レーザ光を送出した時から、受信信号が入射した時まで
の時間を計測して、この時間を距離に換算して表示器8
に距離を表示する。
The laser beam reflected from the target is collected by a receiving optical system 3 and sent to a detector 5 through an interference optical filter 4 for removing background light. The received signal converted into an electrical signal by the detector 5 is guided to the timing controller 7 by the amplifier 6. The time from when the semiconductor laser beam is sent out to when the received signal enters the timing controller 7 is measured, and this time is converted into distance and displayed on the display 8.
Display the distance.

〔考案が解決しようとする課題〕[The problem that the idea aims to solve]

上述した従来のレーザ測距装置は、半導体レーザの発信
波長が半導体レーザの温度により変化し、その波長変化
範囲は例えば500人にもなり広いため、受信における
背景光除去用の干渉光学フィルタとしては、上述した波
長変化範囲を含んだ透過帯域を有する干渉光学フィルタ
を用いる必要がある。
In the conventional laser distance measuring device described above, the emission wavelength of the semiconductor laser changes depending on the temperature of the semiconductor laser, and the wavelength change range is wide, for example, 500 people, so it is not suitable as an interference optical filter for removing background light during reception. , it is necessary to use an interference optical filter having a transmission band that includes the wavelength change range described above.

この為に背景光除去の効果があまり期待できず、従って
有効な測距が行なえるのは、背景光の少ない夜間の測定
か、もしくは信号光が背景光よりも十分大きくなる近距
離の測定に限られるという欠点がある。
For this reason, the effect of background light removal cannot be expected to be very effective, and therefore effective distance measurement can only be performed at night when there is little background light, or at short distances where the signal light is sufficiently larger than the background light. The disadvantage is that it is limited.

本発明の目的は、上述した欠点を除去し、透過帯域幅の
狭い干渉光学フィルタを用いて背景光除去の効果を大幅
に向上することのできるレーザー測距装置を提供するこ
とにある。
SUMMARY OF THE INVENTION An object of the present invention is to provide a laser distance measuring device that can eliminate the above-mentioned drawbacks and can significantly improve the effect of background light removal using an interference optical filter with a narrow transmission bandwidth.

〔課題を解決するための手段〕[Means to solve the problem]

本発明の装置は、半導体レーザを用いたレーザ測距装置
において、半導体レーザの発生するレーザ光の一部を取
り出したうえこれをそれぞえ中心波長の異なる狭透過帯
域幅を有する少なくとも2個の干渉光学フィルタに通し
てその透過光量をモニタする手段と、前記少なくとも2
個の干渉光学フィルタの透過光量差にもとづき前記半導
体レーザの共振器長を制御して前記半導体レーザの発信
波長を所定の範囲に保持せしめる手段とを備えて構成さ
れる。
The device of the present invention is a laser ranging device using a semiconductor laser, in which a part of the laser light generated by the semiconductor laser is taken out, and this is transmitted to at least two laser beams each having a different center wavelength and a narrow transmission bandwidth. means for monitoring the amount of transmitted light through an interference optical filter; and at least two
and means for controlling the resonator length of the semiconductor laser based on the difference in the amount of light transmitted through the interference optical filters to maintain the emission wavelength of the semiconductor laser within a predetermined range.

〔実施例〕〔Example〕

次に、本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.

第1図は本発明の一実施例の構成図である。第1図の実
施例において、記号1〜10は第2図に記載の同番号の
ものと同じである。
FIG. 1 is a block diagram of an embodiment of the present invention. In the embodiment of FIG. 1, symbols 1 to 10 are the same as those of the same number in FIG.

第1図の11は半導体レーザ1の共振器を構成する共振
器出力ミラー、12は共振器全反射ミラー、13は共振
器長を変化させるためのPZT、14は半導体レーザ1
の出力光の1部を取り出すためのビームスプリッタ、1
5は前記ビームスプリッタ14で取り出されたレーザー
光、以下の残り半分を反射させるパーシャルミラー、1
6は反射ミラー、17及び18は中心波長が若干具なる
狭帯域幅のモニタ用干渉光学フィルタ、1つ、2Oは干
渉光学フィルタ17.18を透過した光量をモニタする
ためのモニタ用光検知器、21はモニタ用光検知器19
.20からの信号差をモニタし、半導体レーザ1の発振
波長の変動を検出するモニタ部、22は半導体レーザー
1の共振器長を制御するための例えばPZTコントロー
ラである。
In FIG. 1, 11 is a resonator output mirror that constitutes the resonator of the semiconductor laser 1, 12 is a resonator total reflection mirror, 13 is PZT for changing the resonator length, and 14 is the resonator output mirror of the semiconductor laser 1.
a beam splitter for extracting a part of the output light of the
5 is a partial mirror that reflects the laser beam extracted by the beam splitter 14 and the remaining half; 1;
6 is a reflecting mirror, 17 and 18 are narrow bandwidth monitoring interference optical filters with slightly different center wavelengths, and 2O is a monitoring photodetector for monitoring the amount of light transmitted through the interference optical filters 17 and 18. , 21 is a monitor photodetector 19
.. A monitor section 22 monitors the signal difference from 20 and detects a variation in the oscillation wavelength of the semiconductor laser 1, and 22 is, for example, a PZT controller for controlling the resonator length of the semiconductor laser 1.

半導体レーザー1から出力されたレーザ光の一部は、ビ
ームスプリッタ14により取り出され、パーシャルミラ
ー15およびミラー16により2分割にされる。2分割
されたレーザ光は中心波長が若干具なる狭帯のモニタ用
干渉光学フィルタ17.18に導かれる。モニタ用干渉
光学フィルタ17.18の中心波長の中間の波長に中心
波長がある干渉光学フィルタを受信用の干渉光学フィル
タ4として用いる。この間係を第3図に示す、第3図に
おいて、23,24.25はそれぞれ受信用の干渉光学
フィルタ4として用いる。この関係を第3図に示す、第
3図において、23,24゜25は受信用の干渉光学フ
ィルタの透過特性、モニタ用の干渉光学フィルタ17の
透過特性、及びモニタ用干渉光学フィルタ18の透過特
性である。
A portion of the laser light output from the semiconductor laser 1 is extracted by the beam splitter 14 and divided into two parts by the partial mirror 15 and the mirror 16. The two-split laser beam is guided to narrow-band monitoring interference optical filters 17 and 18 whose center wavelengths are slightly different. An interference optical filter whose center wavelength is between the center wavelengths of the monitoring interference optical filters 17 and 18 is used as the reception interference optical filter 4. This relationship is shown in FIG. 3. In FIG. 3, 23, 24, and 25 are respectively used as interference optical filters 4 for reception. This relationship is shown in FIG. 3. In FIG. 3, 23, 24° 25 are the transmission characteristics of the interference optical filter for reception, the transmission characteristics of the interference optical filter 17 for monitoring, and the transmission characteristics of the interference optical filter 18 for monitoring. It is a characteristic.

半導体レーザ1の発振波長が受信用干渉光学フィルタ4
の中心波長入より長波長側に変化したとする。この時、
モニタ用光検知器19.20の出力は長波長側に大きな
透過率を有するモニタ用干渉光学フィルタ17に配置さ
れている。モニタ用光検知器19の出力が大きくなり、
一方、モニタ用光検知器20の出力が小くなる。
The oscillation wavelength of the semiconductor laser 1 is detected by the receiving interference optical filter 4.
Suppose that the wavelength changes from the center wavelength to the longer wavelength side. At this time,
The outputs of the monitoring photodetectors 19 and 20 are arranged in a monitoring interference optical filter 17 having a large transmittance on the long wavelength side. The output of the monitoring photodetector 19 increases,
On the other hand, the output of the monitoring photodetector 20 becomes smaller.

反対に、発振波長が短波長側に変化すると、モニタ用光
検知器20の出力が大きくなり、モニタ用光検知器19
の出力が小さくなる。このように、2つの光検知器の出
力の大小及びその方向により発信波長の変化量をモニタ
部21で判別し、その変化量に応じた駆動信号をPTZ
コントローラ22に出力する。
On the other hand, when the oscillation wavelength changes to the shorter wavelength side, the output of the monitoring photodetector 20 increases, and the output of the monitoring photodetector 19 increases.
output becomes smaller. In this way, the amount of change in the emission wavelength is determined by the monitor unit 21 based on the magnitude and direction of the outputs of the two photodetectors, and the drive signal corresponding to the amount of change is transmitted to the PTZ.
Output to the controller 22.

一般にレーザの発、振波長は、共振器長が長くなると短
波長側へ、また共振器長が短かくなると長波長側に移る
ことが知られている。それ故、モニタ21により長波長
側にシフトしている判断すれば、共振器長が長くなるよ
うにPZT13に対する印加電圧を上げに、反対に短波
長側ヘシフトする時は、PZT13に対する印加電圧を
下げるようにする。
It is generally known that the oscillation wavelength of a laser shifts to the shorter wavelength side as the resonator length becomes longer, and to the longer wavelength side as the resonator length becomes shorter. Therefore, if the monitor 21 determines that the wavelength has shifted to the longer wavelength side, the voltage applied to the PZT 13 is increased to increase the resonator length, and on the other hand, when the wavelength is shifted to the shorter wavelength side, the voltage applied to the PZT 13 is lowered. Do it like this.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明は、半導体レーザを用いたレ
ーザ測距装置において、狭い透過帯域幅を有する干渉光
学フィルタの透過光量をモニタしつつ、透過光量差にも
とづいて半導体レーザーの発振波長を半導体レーザの共
振器長をコントロールして制御することにより、受信に
おける背景光除去用の干渉光学フィルタに狭帯域幅のフ
ィルタを使用することができ、著しく背景光除去の効果
をあげることができるという効果がある。
As explained above, in a laser distance measuring device using a semiconductor laser, the oscillation wavelength of the semiconductor laser is adjusted based on the difference in the amount of transmitted light while monitoring the amount of transmitted light of an interference optical filter having a narrow transmission bandwidth. By controlling the laser cavity length, it is possible to use a narrow-bandwidth filter as an interference optical filter for background light removal during reception, which has the effect of significantly increasing the effect of background light removal. There is.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明のレーザ測距装置の一実施例のブロック
図、第2図は従来のレーザー測距装置のブロック図、第
3図は第1図の実施例に用いな干渉光学フィルタの透過
特性の説明図である。 1・・・半導体レーザ、2・・・送信光学系、3・・・
受信光学系、4・・・受信用干渉光学フィルタ、5・・
・検知器、6・・・増幅器、7・・・タイミングコント
ローラ、8・・・表示器、9・・・送信ビーム、10・
・・受信ビーム、11・・・共振器出力ミラー、12・
・・共振器全反射ミラー、13・・・PZT、14・・
・ビームスプリッタ−115・・・パーシャルミラー、
16・・・ミラー、17゜18・・・モニタ用干渉光学
フィルタ、19.20・・・モニタ用光検知器、21・
・・モニタ部、22・・・PTZコントローラ、23・
・・受信用干渉光学フィルタの透過特性、24.25・
・・モニタ用干渉光学フィルタの透過特性。
FIG. 1 is a block diagram of an embodiment of the laser distance measuring device of the present invention, FIG. 2 is a block diagram of a conventional laser distance measuring device, and FIG. 3 is a block diagram of an interference optical filter used in the embodiment of FIG. FIG. 3 is an explanatory diagram of transmission characteristics. 1... Semiconductor laser, 2... Transmission optical system, 3...
Reception optical system, 4... interference optical filter for reception, 5...
・Detector, 6... Amplifier, 7... Timing controller, 8... Display device, 9... Transmission beam, 10.
... Reception beam, 11... Resonator output mirror, 12.
...Resonator total reflection mirror, 13...PZT, 14...
・Beam splitter 115...partial mirror,
16...Mirror, 17° 18...Interference optical filter for monitor, 19.20...Photodetector for monitor, 21.
...Monitor section, 22...PTZ controller, 23.
・Transmission characteristics of interference optical filter for reception, 24.25・
...Transmission characteristics of interference optical filters for monitors.

Claims (1)

【特許請求の範囲】[Claims] 半導体レーザを用いたレーザ測距装置において、半導体
レーザの発生するレーザ光の一部を取り出したうえこれ
をそれぞれ中心波長の異なる狭透過帯域幅を有する少な
くとも2個の干渉光学フィルタに通してその透過光量を
モニタする手段と、前記少なくとも2個の干渉光学フィ
ルタの透過光量差にもとづき前記半導体レーザの共振器
長を制御して前記半導体レーザの発信波長を所定の範囲
に保持せしめる手段とを備えて成ることを特徴とするレ
ーザ測距装置。
In a laser ranging device using a semiconductor laser, a part of the laser light generated by the semiconductor laser is extracted and passed through at least two interference optical filters each having a narrow transmission bandwidth with a different center wavelength. means for monitoring the amount of light; and means for controlling the resonator length of the semiconductor laser based on the difference in the amount of transmitted light between the at least two interference optical filters to maintain the emission wavelength of the semiconductor laser within a predetermined range. A laser distance measuring device characterized by:
JP6087588A 1988-03-14 1988-03-14 Laser distance measuring apparatus Pending JPH01233383A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6087588A JPH01233383A (en) 1988-03-14 1988-03-14 Laser distance measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6087588A JPH01233383A (en) 1988-03-14 1988-03-14 Laser distance measuring apparatus

Publications (1)

Publication Number Publication Date
JPH01233383A true JPH01233383A (en) 1989-09-19

Family

ID=13154991

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6087588A Pending JPH01233383A (en) 1988-03-14 1988-03-14 Laser distance measuring apparatus

Country Status (1)

Country Link
JP (1) JPH01233383A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006322917A (en) * 2006-02-01 2006-11-30 Yamatake Corp Laser device
JP2007232371A (en) * 2006-02-27 2007-09-13 Fuji Heavy Ind Ltd Damage detection system

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006322917A (en) * 2006-02-01 2006-11-30 Yamatake Corp Laser device
JP2007232371A (en) * 2006-02-27 2007-09-13 Fuji Heavy Ind Ltd Damage detection system

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