JPH0121579B2 - - Google Patents
Info
- Publication number
- JPH0121579B2 JPH0121579B2 JP9495381A JP9495381A JPH0121579B2 JP H0121579 B2 JPH0121579 B2 JP H0121579B2 JP 9495381 A JP9495381 A JP 9495381A JP 9495381 A JP9495381 A JP 9495381A JP H0121579 B2 JPH0121579 B2 JP H0121579B2
- Authority
- JP
- Japan
- Prior art keywords
- anode
- cathode ray
- beam current
- grating
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000032683 aging Effects 0.000 claims description 13
- 238000000034 method Methods 0.000 claims description 8
- 230000007547 defect Effects 0.000 description 8
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 3
- NBVXSUQYWXRMNV-UHFFFAOYSA-N fluoromethane Chemical compound FC NBVXSUQYWXRMNV-UHFFFAOYSA-N 0.000 description 3
- 229920001296 polysiloxane Polymers 0.000 description 3
- 125000006850 spacer group Chemical group 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- 239000011324 bead Substances 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 235000011194 food seasoning agent Nutrition 0.000 description 1
- 230000002431 foraging effect Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000003116 impacting effect Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
- H01J9/44—Factory adjustment of completed discharge tubes or lamps to comply with desired tolerances
- H01J9/445—Aging of tubes or lamps, e.g. by "spot knocking"
Description
【発明の詳細な説明】
この発明は、耐電圧特性を改善するのに有効な
陰極線管のエージング方法に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for aging a cathode ray tube that is effective for improving voltage resistance characteristics.
第１図は、一般的な巨大デイスプレイ用の光源
用陰極線管を示す。図示するように、バルブ１の
先端部には螢光体２が塗着されており、その内面
にはアルミバツク３が蒸着されている。バルブ１
の内部には電子銃４があり、螢光体２側より陽極
５、第２格子６、第１格子７がビートガラス（図
示せず）にて適当な間隔に保持されている。第１
格子７の内部にはカソード８とヒータ９が収納さ
れている。陽極５の先端にはフランジ１０、フラ
ンジ１０の円周部にはスペーサ１１、ゲツタホル
ダ１２の先端にはゲツタ容器１３が溶接されてい
る。また、スペーサ１１の先端は内部導電膜１４
に接しており、ステム部１５に埋込まれた陽極リ
ード線１６を介しており陽極５、フランジ１０、
スペーサ１１、内部導電膜１４、アルミバツク
３、螢光体２に約10KVの高電圧が印加されてい
る。第２格子６にはリード線１７を介して約７０
Ｖの電圧が印加されており、第２格子６と陽極５
との間には約10KVの電位差ができる。一方、ゲ
ツタ１３を外部から高周波加熱などによつて加熱
して飛散させると、ゲツタのBa１８の一部は陽
極５のアパチヤ部を抜けて第２格子の先端部６１
にゲツタ膜ができ、陽極５に印加された10KVの
電圧によつてコールドエミシヨンが放出され、カ
ソード８からのビーム電流がカツトオフされてい
ても螢光面２を輝らせる、いわゆるストレーエミ
シヨン不良の原因となつていた。この対策とし
て、従来ではゲツタ１３と陽極５のアパ−チヤと
の間にシールド板を置くなどの手段が採られてい
るが、ごく微量のゲツタ膜の付着はさけることが
できなかつた。 FIG. 1 shows a cathode ray tube for a light source for a general large display. As shown in the figure, a phosphor 2 is coated on the tip of a bulb 1, and an aluminum bag 3 is vapor-deposited on its inner surface. Valve 1
There is an electron gun 4 inside, and from the phosphor 2 side, an anode 5, a second grating 6, and a first grating 7 are held at appropriate intervals by bead glass (not shown). 1st
A cathode 8 and a heater 9 are housed inside the grid 7. A flange 10 is welded to the tip of the anode 5, a spacer 11 is welded to the circumference of the flange 10, and a getter container 13 is welded to the tip of the getter holder 12. Further, the tip of the spacer 11 is connected to an internal conductive film 14.
The anode 5, the flange 10,
A high voltage of approximately 10 KV is applied to the spacer 11, the internal conductive film 14, the aluminum bag 3, and the phosphor 2. Approximately 70 wires are connected to the second grating 6 via lead wires 17.
A voltage of V is applied, and the second grid 6 and the anode 5
There is a potential difference of about 10KV between the two. On the other hand, when the getter 13 is heated from the outside by high frequency heating or the like and scattered, a part of the getter Ba18 passes through the aperture part of the anode 5 and reaches the tip 61 of the second lattice.
A getter film is formed on the anode 5, and cold emission is emitted by the 10KV voltage applied to the anode 5, causing the fluorescent surface 2 to shine even when the beam current from the cathode 8 is cut off, resulting in so-called stray emission. This was the cause of the defect. Conventionally, measures such as placing a shield plate between the getter 13 and the aperture of the anode 5 have been taken as a countermeasure against this problem, but it has not been possible to avoid the adhesion of a very small amount of getter film.
一方、陰極線管の製造工程で行われている耐電
圧特性向上のためのスポツトノツキング処理を行
なうと、第２格子６の先端部６１に飛散したゲツ
タ膜の一部はスポツトノツキング中に起こる管内
放電のために破壊され、他の一部はこの管内放電
により発生したガスによつて酸化されて、ストレ
ーエミシヨン不良はほとんどみられなくなるが、
その後に行なわれるカソードのエージング工程に
おいて、つぎのような理由によるストレーエミシ
ヨン不良が発生する。 On the other hand, when a spot-knocking process is performed to improve withstand voltage characteristics in the manufacturing process of cathode ray tubes, part of the getter film scattered on the tip 61 of the second grating 6 occurs during the spot-knocking process. It is destroyed due to the discharge inside the tube, and the other part is oxidized by the gas generated by the discharge inside the tube, and stray emission defects are almost never seen.
In the subsequent cathode aging process, stray emission defects occur for the following reasons.
第２図は上記光源用陰極線管の電子銃部４を拡
大したもので、エージング工程でのカーソド８か
らのビーム電流１９の第２格子６と陽極５への流
入状態を示す。このエージング工程では、陽極５
には第２格子６に印加された電圧と同程度の電圧
が印加されているので、ビーム電流１９は第２格
子６の内部または第２格子６の先端部６１に流入
し、シーズニング工程で酸化された第２格子先端
部６１に付着したゲツタ膜が電子衝撃によつて活
生化され、再び前記ストレーエミシヨン不良が発
生する。 FIG. 2 is an enlarged view of the electron gun section 4 of the cathode ray tube for light source, and shows the state in which the beam current 19 from the cursor 8 flows into the second grating 6 and the anode 5 during the aging process. In this aging process, the anode 5
Since a voltage comparable to that applied to the second grating 6 is applied to the beam current 19, the beam current 19 flows into the inside of the second grating 6 or into the tip 61 of the second grating 6, and is oxidized in the seasoning process. The getter film attached to the second grating tip 61 is activated by the electron impact, and the stray emission defect occurs again.
この発明は、上記欠点を除くためになされたも
ので、エージング工程において陽極に−800〜−
3000Vの負電圧を印加し、第２格子の先端部への
カーソドからのビーム電流を阻止しようとするも
のである。 This invention was made in order to eliminate the above-mentioned drawbacks.
The purpose is to apply a negative voltage of 3000V to block the beam current from the cursor to the tip of the second grid.
以下、この発明の一実施例について第３図を用
いて説明する。 An embodiment of the present invention will be described below with reference to FIG.
第３図は、この発明の方法にしたがつてエージ
ング工程中に陽極５に−800〜−3000Vの負電圧
を印加し、第２格子６には70Vの電圧を印加した
ときのカソード８からのビーム電流１９の流線を
示す。陽極５に負の高い電圧が印加され、第２格
子６の陽極５側のアパチヤが大きいため、陽極５
からの電界が第２格子６の内部まで入り込み、ビ
ーム電流１９を偏向させ、第２格子６の先端部６
１に流入するビーム電流１９を皆無にさせる。し
たがつて、第２格子６の先端部６１に付着した酸
化されたゲツタ膜が活性化されることがなく、エ
ージング工程で発生するストレーエミシヨン不良
の発生を完全に防止することができる。 FIG. 3 shows the output from the cathode 8 when a negative voltage of -800 to -3000V is applied to the anode 5 and a voltage of 70V is applied to the second grid 6 during the aging process according to the method of the present invention. Streamlines of beam current 19 are shown. Since a high negative voltage is applied to the anode 5 and the aperture on the anode 5 side of the second grid 6 is large, the anode 5
The electric field penetrates into the second grating 6, deflects the beam current 19, and causes the tip 6 of the second grating 6 to deflect.
The beam current 19 flowing into the beam current 19 is completely eliminated. Therefore, the oxidized getter film attached to the tip portion 61 of the second grating 6 is not activated, and the stray emission defect that occurs during the aging process can be completely prevented.
なお、光源用陰極線管は、陽極５に印加する高
電圧ステム部１５から印加するために、スポツト
ノツキング中で印加する45〜55KVの高電圧は空
気中ではステム部１５の表面で放電してしまい、
電子銃４に高電圧を印加することができない。こ
のため、従来よりステム部１５をフロンなどの誘
電性液体中に浸漬させることにより、ステム部１
５の表面での放電を起させないようにしている
が、エージング工程では第４図で示すようにステ
ム部１５とベース２０とをシリコン２１にて接着
しているので、このエージング工程で新たに発生
するストレーエミシヨン不良を再スポツトノツキ
ングすることが困難となる。この理由は、ベース
２０をシリコン２１で接着したステム部１５を上
記フロン液に浸漬して再スポツトノツキングする
とき、シリコン２１がフロン液で害されるためで
ある。したがつて、とくに光源用陰極線管のよう
にステム部１５から高電圧を印加する形状の陰極
線管については、この発明のエージング方法が有
効である。 In addition, in the light source cathode ray tube, since the high voltage applied to the anode 5 is applied from the stem section 15, the high voltage of 45 to 55 KV applied during spot knotting is discharged on the surface of the stem section 15 in the air. Sisters,
High voltage cannot be applied to the electron gun 4. For this reason, conventionally, the stem portion 15 is immersed in a dielectric liquid such as fluorocarbon.
However, in the aging process, as shown in Figure 4, the stem part 15 and the base 20 are bonded with silicone 21, so new discharges may occur in this aging process. This makes it difficult to respot stray emission defects. The reason for this is that when the stem portion 15 to which the base 20 is bonded with the silicone 21 is immersed in the fluorocarbon solution and re-spot-knocked, the silicone 21 is damaged by the fluorocarbon solution. Therefore, the aging method of the present invention is particularly effective for cathode ray tubes having a shape in which a high voltage is applied from the stem portion 15, such as cathode ray tubes for light sources.
エージング工程中で印加する陽極電圧は、−
3000Vを越えると内部導電膜１４にも−3000Vの
負電圧が印加されるので、内部導電膜１４のステ
ム部１５側端部と第２格子６との間で管内放電が
起こる。また、−800Vより低い場合は、ビーム電
流１９を第２格子６の先端部６１に衝撃させない
ようにすることが困難となる。 The anode voltage applied during the aging process is -
If the voltage exceeds 3000V, a negative voltage of -3000V is also applied to the internal conductive film 14, so that an intratubular discharge occurs between the end of the internal conductive film 14 on the stem portion 15 side and the second lattice 6. Further, when the voltage is lower than -800V, it becomes difficult to prevent the beam current 19 from impacting the tip portion 61 of the second grating 6.
一方、光源用陰極線管の動作中においては、陽
極５に約10KVの電圧が印加されるので、第５図
で示すようにビーム電流１９は第２格子６の先端
部６１へは流入しない。したがつて、第２格子６
の先端部６１に付着した酸化されたゲツタ膜は活
性化されことがなく、ストレーエミシヨン不良の
再発生は起こらない。 On the other hand, during operation of the light source cathode ray tube, a voltage of approximately 10 KV is applied to the anode 5, so that the beam current 19 does not flow into the tip 61 of the second grating 6, as shown in FIG. Therefore, the second lattice 6
The oxidized getter film attached to the tip 61 is not activated, and the stray emission defect does not occur again.
以上の説明は、光源用陰極線管について述べた
が、この発明は陽極部からゲツタが直接見通せる
ところにある種々の陰極線管に適用できる。ま
た、陽極部のアパチヤが比較的大きな陰極線管で
は、陽極部に隣接して比較的低い電圧が印加され
る電極部にゲツタ膜が蒸着されやすく、ストレー
エミシヨン不良が発生しやすいので、この発明は
このような陰極線管についても好適に適用でき
る。 Although the above description has been made regarding a cathode ray tube for a light source, the present invention can be applied to various cathode ray tubes in which the getter can be seen directly from the anode portion. In addition, in a cathode ray tube with a relatively large aperture in the anode section, a getter film is likely to be deposited on the electrode section adjacent to the anode section to which a relatively low voltage is applied, and stray emission defects are likely to occur. can also be suitably applied to such cathode ray tubes.
第１図は光源用陰極線管の断面図、第２図は従
来の陰極線管のエージング工程におけるカソード
からのビーム電流の流れを示す要部断面図、第３
図はこの発明に係る一実施例のエージング方法に
おけるカソードからのビーム電流の流れを示す要
部断面図、第４図はベースを取付けた陰極線管の
ステム部付近を示す部分断面図、第５図は陰極線
管の動作状態でのカソードからのビーム電流の流
れを示す部分断面図である。
５……陽極、８……カソード、１９……ビーム
電流。なお、図中の同一符号は同一もしくは相当
部分を示す。
Figure 1 is a sectional view of a cathode ray tube for a light source, Figure 2 is a sectional view of main parts showing the flow of beam current from the cathode during the aging process of a conventional cathode ray tube, and Figure 3
The figure is a cross-sectional view of a main part showing the flow of beam current from the cathode in an aging method according to an embodiment of the present invention, FIG. 4 is a partial cross-sectional view showing the vicinity of the stem of a cathode ray tube with a base attached, and FIG. 2 is a partial cross-sectional view showing the flow of beam current from the cathode when the cathode ray tube is in operation; FIG. 5... Anode, 8... Cathode, 19... Beam current. Note that the same reference numerals in the figures indicate the same or equivalent parts.
Claims (1)
陰極線管のエージングにおいて、陽極に−800〜
−3000Vの負電圧を印加することを特徴とする陰
極線管のエージング方法。1 When aging a cathode ray tube by emitting a beam current from the cathode, the anode is
A cathode ray tube aging method characterized by applying a negative voltage of -3000V.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9495381A JPS57208037A (en) | 1981-06-18 | 1981-06-18 | Ageing of cathode-ray tube |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9495381A JPS57208037A (en) | 1981-06-18 | 1981-06-18 | Ageing of cathode-ray tube |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57208037A JPS57208037A (en) | 1982-12-21 |
| JPH0121579B2 true JPH0121579B2 (en) | 1989-04-21 |
Family
ID=14124299
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9495381A Granted JPS57208037A (en) | 1981-06-18 | 1981-06-18 | Ageing of cathode-ray tube |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57208037A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0564078A (en) * | 1991-08-30 | 1993-03-12 | Victor Co Of Japan Ltd | Video signal processing circuit |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2583919B1 (en) * | 1985-06-21 | 1988-11-10 | Videocolor | METHOD AND APPARATUS FOR HEATING ELECTRODES OF AN ELECTRON CANON DURING ITS MANUFACTURE |
-
1981
- 1981-06-18 JP JP9495381A patent/JPS57208037A/en active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0564078A (en) * | 1991-08-30 | 1993-03-12 | Victor Co Of Japan Ltd | Video signal processing circuit |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57208037A (en) | 1982-12-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| EP0473164A2 (en) | Low pressure mercury vapor discharge lamp having cold cathode | |
| JPH0121579B2 (en) | ||
| US6548958B2 (en) | Hollow cathode lamp | |
| JPH023262B2 (en) | ||
| JPH0146991B2 (en) | ||
| JPH07288106A (en) | Heavy hydrogen electric discharge tube | |
| US3549931A (en) | X-ray transmissive window assembly | |
| JPS6322010B2 (en) | ||
| US2213558A (en) | Emission suppression means | |
| US5025190A (en) | Glow discharge lamp | |
| KR100325055B1 (en) | Field emission display device | |
| JP2002334674A (en) | Fluorescent display tube and its drive method and drive circuit | |
| JPS61218055A (en) | Image display device | |
| JPS6326921Y2 (en) | ||
| JPS6323873Y2 (en) | ||
| JPS63304546A (en) | Manufacture of cathode ray tube | |
| JPH027139B2 (en) | ||
| JPS63114022A (en) | Spot knocking method for cathode-ray tube | |
| JP3442552B2 (en) | Aging method of electron tube | |
| KR0166014B1 (en) | Electron-gun for cathode ray tube | |
| JPH0757653A (en) | Cathode-ray tube and manufacture thereof | |
| JPS645739B2 (en) | ||
| JPS60218746A (en) | Cathode-ray tube | |
| JPS58152345A (en) | Aging method of cathode-ray tube | |
| JPH041985B2 (en) |