JPH01211841A - Objective lens for transmission electron microscope - Google Patents
Objective lens for transmission electron microscopeInfo
- Publication number
- JPH01211841A JPH01211841A JP63036888A JP3688888A JPH01211841A JP H01211841 A JPH01211841 A JP H01211841A JP 63036888 A JP63036888 A JP 63036888A JP 3688888 A JP3688888 A JP 3688888A JP H01211841 A JPH01211841 A JP H01211841A
- Authority
- JP
- Japan
- Prior art keywords
- magnetic pole
- pole piece
- lower magnetic
- diameter
- objective lens
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000005540 biological transmission Effects 0.000 title claims description 4
- 230000000007 visual effect Effects 0.000 abstract 1
- 230000004075 alteration Effects 0.000 description 12
- 238000010586 diagram Methods 0.000 description 4
- 230000005284 excitation Effects 0.000 description 2
- 230000037431 insertion Effects 0.000 description 2
- 238000003780 insertion Methods 0.000 description 2
- 125000006850 spacer group Chemical group 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明は透過電子顕微鏡に用いられる対物レンズに関し
、特に高分解能と高コントラストを同時に得ることので
きる対物レンズポールピースの形状に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an objective lens used in a transmission electron microscope, and particularly to a shape of an objective lens pole piece that can simultaneously obtain high resolution and high contrast.
[従来の技術]
従来、生物切片などの低倍率像を良好なコントラストで
観測することが可能な透過電子顕微鏡の対物レンズとし
て、特開昭61−4143号公報に開示される構造のも
のが知られており、この対物レンズでは上磁極片の底面
の径及び下磁極片の頂面の径を各々DI 、 D2 、
上下磁極片の穴径を各々bl、b2、上下磁極片の間隔
をS、下磁極片のテーパー角をθ2とするときθ2く6
0°にされた電子レンズにおいて、0.88≦bl≦1
゜28、D+≧3b+ 、0.3S<b2≦0,5S及
びD2≦3b2を満足するように上下磁極片を形成する
ことが提案されている。[Prior Art] Conventionally, as an objective lens for a transmission electron microscope that is capable of observing low-magnification images of biological sections and the like with good contrast, an objective lens having a structure disclosed in Japanese Patent Application Laid-Open No. 61-4143 has been known. In this objective lens, the diameter of the bottom surface of the upper magnetic pole piece and the diameter of the top surface of the lower magnetic pole piece are respectively DI, D2,
When the hole diameters of the upper and lower magnetic pole pieces are bl and b2, the interval between the upper and lower magnetic pole pieces is S, and the taper angle of the lower magnetic pole piece is θ2, θ2 is 6.
In the electronic lens set to 0°, 0.88≦bl≦1
It has been proposed to form the upper and lower magnetic pole pieces so as to satisfy the following conditions: 0.28, D+≧3b+, 0.3S<b2≦0,5S, and D2≦3b2.
[発明が解決しようとする問題点]
ところが、上記提案された対物レンズは良好なコントラ
ストが得られるものの、分解能の面では必ずしも十分で
はなかった。[Problems to be Solved by the Invention] However, although the objective lens proposed above can provide good contrast, it is not necessarily sufficient in terms of resolution.
本発明は、このような点を考慮し、高分解能と高コント
ラストを同時に得ることのできる対物レンズを提供する
ことを目的としている。The present invention takes these points into consideration and aims to provide an objective lens that can obtain high resolution and high contrast at the same time.
[問題点を解決するための手段]
本発明は、上磁極片の底面の径及び下磁極片の頂面の径
を各々D1.D2、上下磁極片の穴径を各々b1.b2
、上下磁極片の間隔をS、下磁極片のテーパー角をθ2
とし、θ2 <60” 、0゜88≦b1≦1.23.
D、≧3b1、D2≦3とするとき、b2を0.5Sよ
り大きくSより小さい値に設定することを特徴とする。[Means for Solving the Problems] The present invention provides that the diameter of the bottom surface of the upper magnetic pole piece and the diameter of the top surface of the lower magnetic pole piece are each D1. D2, the hole diameters of the upper and lower magnetic pole pieces are respectively b1. b2
, the spacing between the upper and lower magnetic pole pieces is S, and the taper angle of the lower magnetic pole piece is θ2.
and θ2 <60”, 0°88≦b1≦1.23.
When D≧3b1 and D2≦3, b2 is set to a value greater than 0.5S and smaller than S.
[実施例]
以下、本発明の実施例を図面に基づいて説明する。第1
図は本発明の一実施例を説明するための対物レンズの構
成図である。第1図において1は上磁極片で、blは上
磁極片1の穴径、Dlは上磁極片1の底面の径である。[Example] Hereinafter, an example of the present invention will be described based on the drawings. 1st
The figure is a configuration diagram of an objective lens for explaining one embodiment of the present invention. In FIG. 1, 1 is the upper magnetic pole piece, bl is the hole diameter of the upper magnetic pole piece 1, and Dl is the diameter of the bottom surface of the upper magnetic pole piece 1.
2は下磁極片で、b2は下磁極片2の穴径、D、は下磁
極片2頂面の径である。Sは上磁極片1と下磁極片2の
間隔であり、θ2は下磁極片2のテーパー角であり、3
゜4は磁極片を支持するためのスペーサーであり、5は
ヨークであり、6は励磁コイル、7は試料、8は対物絞
りである。2 is the lower magnetic pole piece, b2 is the hole diameter of the lower magnetic pole piece 2, and D is the diameter of the top surface of the lower magnetic pole piece 2. S is the distance between the upper magnetic pole piece 1 and the lower magnetic pole piece 2, θ2 is the taper angle of the lower magnetic pole piece 2, and 3
4 is a spacer for supporting the magnetic pole piece, 5 is a yoke, 6 is an excitation coil, 7 is a sample, and 8 is an objective aperture.
本発明者は、高コントラストを追求した上記特開昭61
−4143号公報に開示される提案対物レンズのパラメ
ータ、b1、b2.D1、D2゜S、θ2について考察
を行なった結果、他の条件(bl ’+ DI r
D2 + Sr θ2)は保ったまま、b2が分
解能を一義的に決定する球面収差係数C8,軸上色収差
係数Ccに大きく寄与していることをつきとめた。The present inventor developed the above-mentioned Japanese Patent Laid-Open No. 61
Parameters of the proposed objective lens disclosed in Publication No. 4143, b1, b2. As a result of considering D1, D2°S, and θ2, other conditions (bl '+ DI r
It was found that b2 greatly contributes to the spherical aberration coefficient C8 and the longitudinal chromatic aberration coefficient Cc, which uniquely determine resolution, while maintaining D2 + Sr θ2).
そこで、構造上の諸条件である、下磁極片2のテーパー
角θ2をθ2く60°、上磁極片1の穴径を0,8S≦
b、≦1.28、上磁極片1の底面の径をD1≧3bl
、下磁極片2の頂面の径をD2≦3b2に維持し、下磁
極片2の穴径b2を可変することを実験的に試みた。Therefore, the structural conditions are that the taper angle θ2 of the lower magnetic pole piece 2 is θ2 × 60°, and the hole diameter of the upper magnetic pole piece 1 is 0.8S≦
b, ≦1.28, the diameter of the bottom of the upper magnetic pole piece 1 is D1≧3bl
Experimentally, an attempt was made to maintain the diameter of the top surface of the lower magnetic pole piece 2 at D2≦3b2 and vary the hole diameter b2 of the lower magnetic pole piece 2.
第2図は、第1図のレンズにより下磁極片2の穴径b2
を可変させた場合のb2と球面収差係数Cs、軸上色収
差係数Cc、試料と後焦点の間隔Zcとの関係を示した
図であり、このとき上磁極片の穴径す、は10mm、底
面の径D1は36mm1頂面の径D1は20mm、上磁
極片1と下磁極片2の間隔Sは11mm、下磁極片2の
テーパー角θ2は45’、試料位置Zoは下磁極片の=
頂面から6mm上方に配置しである。Figure 2 shows the hole diameter b2 of the lower pole piece 2 using the lens in Figure 1.
It is a diagram showing the relationship between b2, spherical aberration coefficient Cs, axial chromatic aberration coefficient Cc, and distance Zc between the sample and the back focal point when changing the diameter of the upper magnetic pole piece. The diameter D1 of the top surface is 20 mm, the distance S between the upper magnetic pole piece 1 and the lower magnetic pole piece 2 is 11 mm, the taper angle θ2 of the lower magnetic pole piece 2 is 45', and the sample position Zo is = of the lower magnetic pole piece.
It is placed 6mm above the top surface.
ところで、加速電圧80KV乃至120KVの電子顕微
鏡において、軸上照射で3.4人の魚骨解能(グラファ
イトの結晶格子像を確認する)と比較的強いコントラス
トを得るため、通常、球面収差係数Cs及び軸上収差係
数Ccは次のような条件に設定されている。By the way, in an electron microscope with an accelerating voltage of 80KV to 120KV, in order to obtain a fishbone resolution of 3.4 people (to confirm the graphite crystal lattice image) and relatively strong contrast with on-axis irradiation, the spherical aberration coefficient Cs is usually used. and the axial aberration coefficient Cc are set under the following conditions.
Cs Cc 3.5mm
一方、高いコントラストを得るためには対物レンズポー
ルピースの下極頂面と試料7との間に対物絞り8が挿入
される。この対物絞りの挿入位置は試料ホルダーの形状
によっても条件が変化するが、例えば厚さ3mmの試料
ホルダーで±40゜の試料傾斜を行なうことを前提とし
た場合、該試料傾斜等を妨げることのない対物絞り挿入
位置、即ち試料と絞りの間隔Z の最適値は4.5mm
(試料位置から4.51下方)程度となる。従って、こ
の位置に後焦点fを形成するような対物レンズであれば
、穴径数μmの絞りを用いた場合でも、蛍光板に投影さ
れる試料像は全く視野カットを受けずに理想的な高いコ
ントラストで得られる。Cs Cc 3.5 mm On the other hand, in order to obtain high contrast, an objective aperture 8 is inserted between the lower top surface of the objective lens pole piece and the sample 7. The insertion position of the objective diaphragm varies depending on the shape of the sample holder, but for example, if the sample holder is 3 mm thick and the sample is tilted by ±40°, The optimal value for the objective aperture insertion position, that is, the distance Z between the sample and the aperture, is 4.5 mm.
(4.51 points below the sample position). Therefore, if the objective lens forms the back focal point f at this position, even when using an aperture with a hole diameter of several micrometers, the sample image projected onto the fluorescent screen will not be cut off at all, and the ideal high Obtained by contrast.
ところが、この様に試料7と後焦点fとの距離即ち、後
焦点距離Zcが4.5mmと長いと球面収差係数Cs及
び軸上収差係数Ccが増大し、分解能は逆に悪化してし
まう。However, if the distance between the sample 7 and the back focal point f, that is, the back focal length Zc is as long as 4.5 mm, the spherical aberration coefficient Cs and the axial aberration coefficient Cc increase, and the resolution deteriorates.
しかし、実用的には穴径数十μm程度の絞りを用いるこ
とが多いため、例えば20μm程度の絞りを用いた場合
に、数千倍から数万倍の倍率で直径150mm程度の蛍
光板上に100mm乃至150mmの試料像が投影され
れば良いので、試料と対物絞りとの間隔Z は2mm程
度まで短くして分解能を上げることが可能である。しか
し、Z、をこのように短くすることは前記試料傾斜等に
よる機械的な制約から不可能である。However, in practice, a diaphragm with a hole diameter of several tens of micrometers is often used, so if a diaphragm with a hole diameter of about 20 micrometers is used, for example, a 100 mm aperture on a fluorescent screen with a diameter of about 150 mm at a magnification of several thousand to tens of thousands of times is used. Since it is sufficient to project a sample image of 150 mm to 150 mm, it is possible to increase the resolution by reducing the distance Z between the sample and the objective aperture to about 2 mm. However, it is impossible to shorten Z in this manner due to mechanical constraints such as the sample inclination.
そこで、本発明者は20μmの絞りを試料位置から4.
5mm下方に設定したままの状態で、10000倍の倍
率で直径150mm程度の蛍光板上に100mm乃至1
50 m mの試料像が投影されることを条件として、
下磁極片2の穴径b2を実験的に可変させて第2図を得
た。その結果、第2図からもわかるように後焦点距離Z
cが変化し、穴径b2が8.4mm付近でZcは最少値
(Zc2mm)を示すと共に、球面収差係数Csが最少
値(Cs 2.8mm)となった。Therefore, the present inventor placed a 20 μm aperture at 4.5 mm from the sample position.
With the setting still set at 5 mm downwards, 100 mm to 1.
On the condition that a 50 mm sample image is projected,
FIG. 2 was obtained by experimentally varying the hole diameter b2 of the lower pole piece 2. As a result, as can be seen from Figure 2, the back focal length Z
c changed, and when the hole diameter b2 was around 8.4 mm, Zc showed the minimum value (Zc 2 mm), and the spherical aberration coefficient Cs became the minimum value (Cs 2.8 mm).
そこで、これらの条件からCs≦3.5mm。Therefore, based on these conditions, Cs≦3.5mm.
Cc≦3.5mmを満たすような下磁極片の穴径b2を
第2図から求めると、5.7mm≦b2≦11mmとな
る。これをS=11mmでノーマライズするとb2は0
.5SからSまでの範囲になる。If the hole diameter b2 of the lower magnetic pole piece that satisfies Cc≦3.5 mm is determined from FIG. 2, it becomes 5.7 mm≦b2≦11 mm. When this is normalized with S=11mm, b2 is 0
.. It ranges from 5S to S.
下磁極片の穴径b2をこれより小さな値にすると、試料
7と後焦点fとの間隔Zeが急激に大きくなり、コント
ラストは向上するものの球面収差係数Csが急激に増大
し、高分解能の条件が損われる。If the hole diameter b2 of the lower magnetic pole piece is made smaller than this value, the distance Ze between the sample 7 and the back focal point f will suddenly increase, and although the contrast will improve, the spherical aberration coefficient Cs will increase rapidly, which will not meet the requirements for high resolution. is damaged.
従って、実用的な20μm程度の絞りを試料位置から4
.5mm下方に配置し、−万倍程度の倍率で試料像が蛍
光板に実用的な視野と高いコントラストで投影されると
共に、高分解能を高く保つための条件は、下磁極片の穴
径b2を上磁極片1と下磁極片2の間隔Sの略1/2か
らSまでの範囲に設定すれば良いことがわかる。この時
、後焦点は試料位置から2mm程度下方のf゛に形成さ
れる。Therefore, a practical aperture of about 20 μm should be set at 4 pm from the sample position.
.. The sample image is projected on the fluorescent screen with a practical field of view and high contrast at a magnification of approximately 5 mm below, and the conditions for maintaining high resolution are as follows: It can be seen that the distance between the magnetic pole piece 1 and the lower magnetic pole piece 2 may be set within a range from approximately 1/2 to S. At this time, the back focal point is formed at f' about 2 mm below the sample position.
[発明の効果]
上述した説明から明らかなように、本発明は、θ2 <
60@、0.8S≦bl≦1.2S、Dl≧3 b 1
r D 2≦3b2を満たす対物レンズにおいて、下磁
極片の穴径b2を0.5SからSの間に設定するように
形成することにより、対物絞りを挿入しても蛍光板上に
投影される試料像が視野カットを受けることはなくなり
、高分解能特性(軸上照射で3.4人の格子分解能)を
維持したまま、高コントラストを得ることができる。[Effects of the Invention] As is clear from the above explanation, the present invention has the advantage that θ2 <
60@, 0.8S≦bl≦1.2S, Dl≧3 b 1
In the objective lens that satisfies r D 2≦3b2, by setting the hole diameter b2 of the lower pole piece between 0.5S and S, the sample is projected onto the fluorescent screen even if the objective aperture is inserted. The image is no longer subject to field cuts, and high contrast can be obtained while maintaining high resolution characteristics (grid resolution of 3.4 people with on-axis illumination).
第1図は本発明の一実施例を示すための図、第2図は下
磁極片の穴径を種々変化させた際の球面収差係数Cs、
軸上収差係数Ce、試料と対物絞りとの間隔Zcの関係
を示すための図である。
l:上磁極片 2:下磁極片
3.4ニスペーサ−5=ヨーク
6:励磁コイル 7:試料
8:対物絞りFIG. 1 is a diagram showing an embodiment of the present invention, and FIG. 2 shows the spherical aberration coefficient Cs when the hole diameter of the lower pole piece is varied.
FIG. 3 is a diagram showing the relationship between the axial aberration coefficient Ce and the distance Zc between the sample and the objective aperture. l: Upper magnetic pole piece 2: Lower magnetic pole piece 3.4 Ni spacer - 5 = Yoke 6: Excitation coil 7: Sample 8: Objective aperture
Claims (1)
1、D_2、上下磁極片の穴径を各々b_1、b_2、
上下磁極片の間隔をS、下磁極片のテーパー角をθ_2
とし、θ_2<60°、0.8S≦b_1≦1.2S、
D_1≧3b_1、D_2≦3b_2とするとき、b_
2を0.5Sより大きくSより小さい値に設定すること
を特徴とする透過電子顕微鏡における対物レンズ。The diameter of the bottom surface of the upper magnetic pole piece and the diameter of the top surface of the lower magnetic pole piece are each D_
1, D_2, the hole diameters of the upper and lower magnetic pole pieces are b_1, b_2, respectively.
The spacing between the upper and lower magnetic pole pieces is S, and the taper angle of the lower magnetic pole piece is θ_2.
and θ_2<60°, 0.8S≦b_1≦1.2S,
When D_1≧3b_1, D_2≦3b_2, b_
An objective lens for a transmission electron microscope, characterized in that 2 is set to a value greater than 0.5S and smaller than S.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63036888A JPH0654646B2 (en) | 1988-02-19 | 1988-02-19 | Objective lens in transmission electron microscope |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63036888A JPH0654646B2 (en) | 1988-02-19 | 1988-02-19 | Objective lens in transmission electron microscope |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH01211841A true JPH01211841A (en) | 1989-08-25 |
JPH0654646B2 JPH0654646B2 (en) | 1994-07-20 |
Family
ID=12482317
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP63036888A Expired - Fee Related JPH0654646B2 (en) | 1988-02-19 | 1988-02-19 | Objective lens in transmission electron microscope |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0654646B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102376515A (en) * | 2011-11-08 | 2012-03-14 | 北京航空航天大学 | Objective pole shoe of transmission electron microscope |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6177817B2 (en) * | 2015-01-30 | 2017-08-09 | 松定プレシジョン株式会社 | Charged particle beam apparatus and scanning electron microscope |
-
1988
- 1988-02-19 JP JP63036888A patent/JPH0654646B2/en not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102376515A (en) * | 2011-11-08 | 2012-03-14 | 北京航空航天大学 | Objective pole shoe of transmission electron microscope |
Also Published As
Publication number | Publication date |
---|---|
JPH0654646B2 (en) | 1994-07-20 |
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