JPH01190194A - Color purity measuring device - Google Patents

Abstract

PURPOSE:To measure each of luminous quantity when a current flowing to a sub deflection coil is 0 and a current flows thereto by a color purity sensor, to display a sub deflection coil current proportional to the color purity deviation and to apply monitoring by providing the sub deflection coil in addition to a pattern display deflection coil. CONSTITUTION:A sub deflection coil 21 is provided in addition to a deflection coil 6 deflecting an electron beam corresponding to a CRT mounted on a display panel 4. A magnetic force is caused when a current flows to the coil 21 to deflect the electron beam of the CRT. The peak value of the luminous quantity a part on the CRT screen is measured by the color purity sensor 22 provided corresponding to the coil 21, a luminous quantity discrimination means 24 compares the measurement when the current is 0 and a current flows and its comparison discrimination value is inputted to a sub deflection coil current arithmetic means 23 and a color purity deviation arithmetic means 25. Then the color purity deviation is measured and displayed automatically onto the display means to monitor the color adjustment.

Description

[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a color purity adjustment device for a color display monitor, and particularly to a color purity adjustment device for measuring color purity, and displaying measured values and giving work instructions as necessary. The invention relates to a color purity measuring device.

[Conventional O technology j Figure 14 is a diagram showing a cross section of a part of OR'I', and (l
b) is a blue fluorophore, (Ig) is a green fluorophore, (lr
) is a red phosphor, (3b) is a blue electron beam that collides with a blue phosphor (lb) and makes the blue phosphor (lb) glow, (3g) is a green 0 phosphor FC collision (2) is the electron beam for green that collides with the red phosphor to make the green phosphor (Ig) glow; The electron beam (3b) is connected only to the blue Q phosphor (l b), and the green Q electron beam (3g
) is a shadow mask provided with pores so that the red electron beam (3r) collides only with the green phosphor (Ig), and the red electron beam (3r) only with the red phosphor (lr), and (4) with The phosphor is coated on the inner surface, and the phosphor is applied from the outer surface, knee: a-
This is a panel made of a material that allows you to see light.

Figure 15 is a cross-sectional view of a CRT.
)* Color purification magnet that can rotate the direction of movement of (Ig) and (lr), (6) is CR'! 'The deflection coil μ for screen display, (7) is the electron beam (3b) t (3
g) Electron gun that generates s (3r), (8) is the center point of the X light when coating the phosphor (lb) s (Ig), (lr), (10) is the spring 1v (4 ) and the exposure center point (8), (17) is the electron beam (3ω) when the deflection center point coincides with the exposure center point (8)K.
This is the route.

Figure 16 is a diagram showing the conventional color purity adjustment method, (12)
is the display monitor, (11) is the pallet (pALETTE) on which the display monitor is placed, (13) is the adjuster, (14) is the color purity magnet (5) and An instructor (15) instructs the adjustment of the deflection coil (6), and a conveyor (15) that conveys the display monitor (12) placed on a pallet.

In general TC color CRT, the color image is CB)
, green (G), and red@) are reproduced in a superimposed manner. Therefore, in a CRT, as shown in Fig. 14, the electron beams (3b) y (3g) and (3r) that share each color are connected to the corresponding phosphors (lb) *
It is necessary to cause only (Ig) and (lr) to emit light at any position on the CR'l' screen.

On the other hand, CRT uses phosphors (lb), (Ig) and (l).
Exposure technology is used to apply r) to the inner surface of the spring/' (4). That is, light is generated from the center of exposure,
The CRT spring 1v (4) passes through the shadow mask (2).
) should be coated with the corresponding phosphor only on the exposed inner surface, and the process is repeated three times to coat the three colors of phosphor. Therefore, when completed as a display monitor, the center point of deflection of the electron beam must coincide with the center point of exposure.

In the actual manufacture of a display monitor, there are dimensional tolerances in the manufacture of CR'I' and dimensional tolerances in the manufacture of the deflection coil (6), so the deflection center point and the exposure center point do not coincide with each other without adjustment.

Therefore, first of all, the electron beams (3b), (3g) and (3r) when not deflected by the deflection coil 1v(6)K
) passes through each exposure center point. The color purifying magnet (5) is used to make this adjustment.
As shown in Figure 15, the magnetic force is adjusted depending on the amount of overlapping of the two pole magnets, and the electron beam (3b) 1(
By adjusting the displacement amount of 3g) and (3r) and rotating the superposed one, the direction of the magnetic field is determined, and the direction of the degree of the electron beam is determined.
+ Adjust so that (3g) and (3r) pass through the exposure center axis (lO).

Next, change the position of the deflection coil (6) to the CRT spring 1v (4
), and align the center point of the deflection with the center point (8) of exposure. Now, conventionally, the work of aligning the deflection center point by the color purifying magnet (5) and the deflection coil/' (6) with the exposure center point (8) was carried out by a team of two as shown in Fig. 16. Person (14) has a CRT spring of 1v.
(4) Stand to the side and use a portable microscope to examine the screen with an electric beam (
3b) Phosphor (l) by s (3g) and (3r)K
b) + Observe the light emission status of (l g) and (lr), and use the colored wire magnet (5) and deflection carp /L/ (6)
The adjuster (13) instructed the direction and amount to be adjusted, and the adjuster (13) adjusted the colored wire magnet (5) and the deflection coil/l/(6) according to the instructions of the instructor (14).

[Problem that the invention seeks to solve]

Conventionally, color purity adjustment was performed by visual observation of deviations in color purity, and was performed based on instructions based on the observation results, resulting in variations in adjustment due to individual differences and fatigue caused by continuous visual observation. There were problems such as variations in measurement accuracy and an increase in adjustment work time due to this.

This invention was made in order to eliminate the above-mentioned problems, and it is possible to automatically measure the deviation in color purity, display the amount of deviation in color purity as necessary, and allow you to continue the adjustment work or The object is to obtain a device that can also display completion.

[Means for solving problems]

The color purity measuring device according to the first invention includes a sub-deflection coil that is provided separately from a CRT screen display deflection coil and that deflects an electron beam of the CRT by a magnetic force generated by flowing an electric current, and this sub-deflection coil. A color purity sensor is provided to measure the peak value of the light intensity of a portion on the CRT screen, and an initial light intensity value is the measured value of the color purity sensor when the current value flowing through the sub-deflection coil is 0. and a comparison light amount value that is a measured value of the color purity sensor when a current is applied to the sub-deflection coil, and compares this comparison light amount value with the initial light amount value. Each time a judgment signal '8 indicating that the comparative light quantity value is larger than the initial light quantity value or a judgment signal indicating that it is smaller is received from the light quantity value determining means, the comparative light quantity value gradually approaches the initial light quantity value. Calculate and store the current value of the sub-deflection coil so that they match, and
A sub-deflection coil current calculation means is provided for causing a current having this current value to flow through the sub-deflection coil.

The color purity measuring device according to the second invention includes a color purity deviation calculating means for calculating a color purity deviation amount based on the sub-deflection coil current value and a color purity deviation amount in the first color purity measuring device. It is characterized by adding a display means for displaying.

[Effect]

This first EUK color purity measuring device has an initial light intensity value measured by the color purity sensor when the sub-deflection coil current is 0, and an initial light intensity value measured by the color purity sensor when the sub-deflection coil current is flowing. When the comparison light amount value matches the initial light amount value, a sub-deflection coil current proportional to the color purity deviation is obtained.

In the color purity measuring device ζ according to the second invention,
A color purity deviation amount is calculated based on the sub-deflection coil current obtained in the first color purity measuring device, and this color purity deviation amount is displayed on a display means.

[Embodiments of the invention] An embodiment of the present invention will be described below with reference to the drawings.

FIG. 1 shows the entire IR diagram of an embodiment of the present invention, and (4), (5), (6), and (12) are exactly the same as the conventional device. (21) is a sub-deflection coil that is provided separately from the CRT screen display deflection coil, and deflects the CRT's electron beam by the magnetic force generated by flowing current; (22) is the sub-deflection coil (21); A color purity sensor is provided correspondingly and measures the peak value of the light intensity of a portion on the CHI' screen, and (24) is the measured value of the color purity sensor when the current value flowing through the sub-deflection coil is 0. A certain initial light amount value is memorized, and a comparison light amount value that is a measurement value of the color purity sensor when a current is applied to the sub-deflection coil is stored, and this comparison light amount value is compared with the above-mentioned initial light amount value. When the light amount value determining means (23) receives a determination signal that the comparative light amount value is large or small from the light amount value determining means (24), the comparative light amount value gradually approaches the initial light amount value and finally sub-deflection coil current calculating means (25) for calculating the current value of the sub-deflection coil so as to match the current value and passing a current having this current value to the sub-deflection coil A/ (21); and (25) for determining the light amount value (24). (28) is a color purity deviation calculation means for calculating a color purity deviation amount based on the current value of the sub-deflection coil at that time when receiving a signal that the comparison light amount value matches the initial light amount value; An input means (27) for inputting a setting value having a predetermined value to be compared with the color purity deviation amount, compares the color purity deviation amount with the setting value, determines the magnitude of the color purity deviation, and If the amount of deviation in purity is larger than the set value, a work instruction means for instructing whether or not to correct the deviation in color purity, (26) indicates the amount of deviation in color purity and/or whether or not correction of the deviation in color purity is necessary. This is a display means for displaying both images.

Figure 2 shows a configuration diagram of a system embodiment of the present invention, in which (31) is a central processing unit using a microprocessor, (32) is an IIJ blog for controlling this system, and a system for processing data. A storage device that stores processing programs, and in this embodiment, RAM (RAND
AM Accgss uggoRr) is used.

(50) is a 7cx tsupi disk device, which controls F, D, D, controller (33) and processing device (3).
1) Read the floppy disk containing the program that runs this system under the control of the RAM
Write to (32). (51) is OR'I' and is one of the display means (26). (34) is the central processing unit (31
) is used to control the transfer of data displayed on the CRT (51), and (52) is used to input various data to the RAM (32) using a keyboard (hereinafter abbreviated as /B). . (35) and the central processing unit (31) input data from the VB to RAM.
(32) Keyboard controller (JJ,
(41) is a peak hold circuit (hereinafter abbreviated as p/n circuit) that stores only the peak value of the amount of light measured by the color purity sensor (21);
A (36) converts the peak value of the light amount stored in the P/H circuit (41) into a guide, and writes the data to the RAM (32) in cooperation with the central processing unit (31).
/D converter, (37) converts the hard digit p amount into the analog amount KX
D/A converter to be converted, (42) a above D/A converter (3
7) is a power amplifier that amplifies the analog quantity converted and sends a current to the sub-sieve coil A/ (22), (38) is a D/A converter that converts the digital quantity into an analog quantity, (
53) is a meter that displays the amount converted by the D/A converter (38)K, and in this embodiment, displays the current value of the sub-deflection coil. In (39), when a multi-operation period is specified by the initial processing program in program step i03, which will be described later, a large alternating current is first applied, and then the current is gradually reduced to 4, and finally it is considered to be almost 0. An automatic demagnetizing circuit (54) generates an alternating current as small as possible, which generates a magnetic field when the current generated by the automatic demagnetizing circuit (39) is passed through it, and removes the magnetization of the shadow mask (2). (60) is a start switch P for starting this system; (55) is an operation unit that houses switches including the start switch;
(40) cooperates with the central processing unit (31) to operate the operation unit (5).
5) It is an input/output controller that writes the input data to the RAM (32).

I will explain the next KwJ work.

First, we will explain the measurement principle of this system.
This will be explained using Figure 3.

In the figure, (lr), (Ig)t (lb)t(2
L(3g)+(4) is exactly the same as the conventional device.

Of the three electron beams in the color tube, we will focus on the electron beam (abbreviated as l! lower edge beam) that makes the green phosphor glow. CR? The light output emitted by the green phosphor at a certain point on the panel is determined when the center of the green beam and the center of the green phosphor coincide, as shown in Figure 11, that is, when the center of the light and the deflection The maximum output Lmax is when the green beam is on the line connecting the center of the hole in the shadow mask and the center of the phosphor, and the center of the green beam and the center of the green phosphor are When the angle shifts by K as shown in FIG. 1θ or FIG. 12, the optical output decreases in accordance with the shift.

If the green beam is symmetrical and the luminous efficiency of the phosphor is uniform, the light output of the green phosphor will be symmetrical about the light output point as shown by the curve (400) in Figure 13. Now, a shift in the electron beam, that is, a shift in color purity occurs, and the light output corresponding to the shift is reduced. At this time, the light output is Low.
Pm (402) of the electron beam so that it becomes Lmax from
If the light is deflected by 1, Pi (402) is the amount of color purity shift.

However, when Lmax is difficult to grasp, the position is symmetrical to Lo with Lmax as the axis, and the optical output is the same value as Lo.
In this embodiment, the amount of shift in color purity is measured by deflecting the electron beam by Pa (401) until it has Pm=7Ps.

Next, the operation of the embodiment of this invention will be explained.

FIG. 3 shows the general flow t yards of this color purity measuring device, and describes the general procedure for determining the above-mentioned Pm = T Pa. In step 101, input the start switch fil! L. In step 102, the color purity measuring apparatus is brought to an initial state by performing initial processing, that is, zeroing out the remainder of the previous calculation data and demagnetizing the shadow mask (2) by the degaussing coil (54).

In step 103, the color purity sensor (22) measures the light intensity value when no TI/(21)K current is flowing through the sub-deflection coil, and stores it in the RAM (32). This light amount value is hereinafter referred to as an initial light jl value. In step 104, a minute current for direction confirmation is passed through the sub-deflection coil p to measure a light amount value, and this light amount value is referred to as a direction confirmation light amount value. Further step 1
In 04, this light amount value for direction confirmation is compared with the above-mentioned initial light amount value, and if the above-mentioned light amount value for direction confirmation is larger than the above-mentioned initial light amount value, the current flowing through the sub-deflection coil is caused to flow in the direction of the above-mentioned minute current for direction confirmation. If it is determined that the color purity deviation is small and the above direction @ required light amount value is smaller than the above initial light amount value, the color purity deviation will be smaller if the current to be passed through the sub-deflection coil μ is in the opposite direction to the above microcurrent for direction confirmation. It is determined that Based on the direction of the color purity deviation determined in step 4, in step 105, a predetermined fixed current is applied to the sub-deflection coil (21) in a direction that reduces the color purity deviation. In step 106, the amount of light produced by the electron beam deflected by the magnetic field corresponding to the sub-deflection coil current applied in step 105 is measured. This light amount value is hereinafter referred to as a comparative light amount value. In step 107, the comparison light amount value and the initial light amount value are compared to determine whether they match. If they are not equal,
Step 105 (K return), the sub-deflection coil current is increased in a direction that further reduces the color purity. The method of this calculation will be described later in a detailed flowchart.

When the comparative light amount value and the initial light amount value become equal, in step 108, the sub-deflection coil current at that time is multiplied by the conversion coefficient of the sub-deflection coil current and the color purity difference, and the value is further calculated as i.
K, the amount of color purity deviation is obtained. The obtained color purity deviation amount is determined by the setting 'preset in step 109.
If the color purity deviation amount is smaller than the set value, the measurement of the color purity deviation amount is completed, and if the color purity deviation amount is larger than the set value, the measurement starts again from step 102.

The measurement point for the amount of color purity deviation mentioned above can be used as an indicator for adjustment to some extent at the 1st place, but in general, the sub-deflection coil Iv (
21) and the color purity sensor (22), and when the amount of measured data increases, it takes longer time to read the data. In this example, when the shadow mask and phosphor are dot type, measurements are taken at the top, bottom, left, and right, and when the shadow mask and phosphor are stop type, the measurement is performed at the left and right. I asked him to measure in two places.

The detailed approach yard described below is assumed to have the measurement stations described above, and Figures 4 to 6 are detailed flowcharts that focus on one of them (on the right). 7 to 9 are detailed flowcharts including four measurement points.

Hereinafter, the operation will be explained in detail starting from FIG. 4.

In step 201, the start switch input is confirmed, and if the start switch input has been made, the process proceeds to step 202.
The same initial processing as described in step 102 for % yards is performed. In the next step 203, the sub-deflection coil current 1r is set to 0, and in step 204, the sub-deflection coil current 1r is set to 0.
The initial light amount value Psr at =00 is detected by the color purity sensor (22)
) Measure and memorize it. In step 205, the sub-deflection coil current 1r is set in the direction @necessary minute current io. In step 206, the direction confirmation light amount value Pdr when the sub-deflection coil current 1r is ir=io is measured. Step 20
In step 7, the direction confirmation light amount value Pdr and the initial light amount value Psr are compared, and if Pdr is larger than Psr, it is determined in step 208 that the sub-deflection coil current is to be increased in the positive direction, and from now on, the sign symbol S is changed to s=i. If Pdr is not greater than Psr, the sub-deflection coil current is decreased in the negative direction in step 209, and hereafter the sign 56s=
−i.

Next, in step 211, the number of main operations n is IKed. Next, in step 212, the sub-deflection coil current ir is changed to the product of the fixed current 18, the number of main operations n, and the sign S, that is, 1r=s・18・
Let's say ko. Next, in step 213, the color purity sensor (
22), the sub-deflection coil current ir is 1r=s・1s−
A comparative light amount value Pxr at the time of n is measured. Step 214
It is determined whether Pxr = Psr, and if they do not match, it is determined in step 217 whether execution of correction calculation processing (instructed in step 220, which will be described later) has been instructed. If execution of the correction calculation process is not instructed, the process advances to step 219, where Pxr and Psr are compared, and Pxr
When is larger than Psr, the process advances to step 222 and the main operation number nKl is added. That is, let B+4 be the new n. Next, in step 212, the sub-deflection coil current 1r=s.multidot.18.n is calculated again, and in step 213, the comparison light amount value Pxr is measured. This step 219,
Step 222. Steps 212, 213, 214, and 217 are repeated until Pxr is Ps
It can be continued for a long time. Next, in step 219, Px
If r < Psr, the process proceeds to step 220, and the process proceeds to step 22, where execution of correction calculation processing is instructed.
1 and set the number of correction calculations m to 1.

Next, the process advances to step 231, in which the code 9S is I.
It is determined whether K is defined or −l is defined. If it is determined that S is defined as 1, the process proceeds to step 232, where the comparison light amount value Pxr and the initial light amount value Par
are compared. In this step 232, Pxr ′Pa
If it is determined that Pxr≦Psr, then in step 233, the current value of −(F-i s 2) is added to the current sub-deflection coil current 1r, and the new sub-deflection coil current 1r is determined. Then, the current sub-deflection coil current bK<A-door.1 day is added to the sub-deflection coil current.The process returns to step 213 as the sub-deflection coil current.

If S is defined in step 231, 'l
'lJ constant and initial light amount value Par are compared. If it is determined that Pxr > Psr in this step 235, (T)In・1 is set to the current sub-deflection coil ammeter in step 236.
8 current value is added to the new sub-deflection coil μ current ir
If it is determined that Rxr≦Psr, step 237
Then, the current sub-deflection coil current 1r is added with the current of -(7/18) as the new sub-deflection coil current ir, and the process returns to the step 213 coil.In step 213, the sub-section 1C current flow (corresponding to Measure the comparative light amount value Pxr.Next, step 2
14, it is determined whether the comparative light amount value Pxr is equal to the initial light amount value PBr, and if Pxr→Psr, the process proceeds to step 217. In step 217, it is determined whether execution of correction calculation processing is instructed. Now step 2
Since execution of the correction calculation process was instructed in step 20, the process advances to step 218. In step 218, the number of correction calculations mKl
is added and the process proceeds to step 231. From step 231,
Step 232, go to step 233, or step 23
1 to step 232 and step 234, or from step 231 to step 235 and step 236, or from step 231 to step 235 and step 237, and then returns to step 213, followed by step 214, step T, The loop of steps 218 continues until it is determined in step 44 that Pxr=Par. Note that the calculation in step 212 and the determination of Pxr = Par in step 214 are performed using approximately 4 significant digits, so as the mouth becomes larger, the state of Pxr = Psr will eventually come to be.

When it is determined in step 214 that Pxr = Psr, the process proceeds to step 215, where all instructions to execute the correction calculation process are canceled, and the process proceeds to step 225, where the sub-deflection coil current value is displayed on the meter (53) K:.

Next, the sub-deflection coil current value 1r is multiplied by a conversion coefficient K between the sub-deflection coil current and the color purity deviation amount to calculate the color purity deviation amount mr. Furthermore, the color purity deviation amount is measured by CRT.
(51).

Next, the process proceeds to step 241 in FIG. 7, where it is determined whether the phosphor and shadow mask are stripe type or dot type. Information for this determination is inputted to YJB (52) to indicate that it is a dot type only when it is a dot type, and is stored in RAM (32)K.

Step 241 is to determine whether the phosphor and shadow mask are dot type or stripe type based on this stored information. If the phosphor and shadow mask are determined to be stripe type in step 241, the process proceeds to step 242, and the direction of color purity deviation on the left side and the direction of color purity deviation on the right side are determined from the center position of the 011 screen. If they are in the same direction and in the direction specified by the VB (52) input, proceed to step 243, but if not, proceed to step 247.)
1 color purity magnet adjustment failure 1 is displayed on the CRT (51) and the process returns to step 202.

In step 243, the left color purity deviation tray and the right color purity deviation amount go to step 251, where the left side is the setting value diagram input in VB (52), and the left side color purity deviation amount and the right color purity deviation amount are shown. The difference in amount is the set value g2 input at VB (52)
If it is not smaller than the above, proceed to step 247 and display the message "color purity magnet mt! defective" on the CRT and step 202K.
return.

If the phosphor and the shadow mask are determined to be dot type in step 241, the process proceeds to step 245, and the direction of the upper color purity deviation and the lower color purity deviation direction are ORed.
'L' Look at the center position of the screen and move in the same direction/B
(52) If the direction is specified by the input, step 246
However, if it is interrupted, the process proceeds to step 247 and the message "9-color purity magnet adjustment failure" is displayed OR? (si)K is displayed and step 2θ
Return to 2. In step 246, if the difference between the amount of color purity deviation on the upper side and the color purity deviation on the lower side is smaller than the set value g1 inputted at vB (52), the process advances to step 247, where 1 color purity defect 1 is detected. Display this on the CRT and step 202
If the difference between the amount of color purity deviation on the upper side and the amount of color purity deviation on the lower side is smaller than the setting value g2 input at VB (52), the process proceeds to step 242. After proceeding to step 242, The operation is the same as when the phosphor and shadow mask are of the stripe type, so the explanation will be omitted. Step 251 After proceeding to step 251, it is determined whether the phosphor and shadow mask are stripe type or dot type.
If it is a stripe type, the process advances to step 252, and if it is a dot type, the process advances to step 253.

In step 252, it is determined whether or not the left and right side color purity deviations are smaller than the set value MYN2 input at VB (52). If they are smaller, the process proceeds to step 255, where "CRT screen display deflection coil" is used. Good adjustment 1 C
RT (si)K is displayed to complete the color purity measuring operation, and if the color purity is larger, the process advances to step 254, where the message "adjustment failure of deflection coil for CRT screen display" is displayed on the CRT (51), and the process returns to step 202.

In step 253, it is determined whether the amount of deviation in color purity on the upper side, lower side, left side, and right side is smaller than the MINI input in /B(52)K. If it is smaller, the process advances to step 255 and the 'CRT A message indicating that the screen display deflection coil has been properly adjusted is displayed on OR'L' (51) to complete the color purity measurement operation.
"Improper adjustment of the deflection coil for screen display"CR'l'
(51) and returns to step 202.

FIG. 9 is a program that inputs the fixed number L/B K.

In step 261, a minute current for checking the direction of color purity deviation @
Input the value of io, in step 262 input the value of the fixed current value used for sub-deflection coil current calculation, in step 263 input the conversion coefficient value K of the sub-deflection coil current and color purity deviation, and in step In step 264, information specifying whether the public party and shadow mask is a dot type or a stripe is input, and in step 265, the tolerance gl between the amount of deviation in color purity on the upper side and the amount of deviation in color purity on the lower side is input.
In step 266, the tolerance g2 between the amount of color purity deviation on the left side and the amount of color purity deviation on the right side is input, and in step 267, the direction of the color purity deviation on the upper side and the direction of the color purity deviation on the lower side are input. In step 268, input the direction of color purity deviation on the left side and the direction of color purity deviation on the right side, and in step 269, input the allowable value of the color purity deviation amount for phosphor, Jadomanuk, or dot type. The V engineering Nl is input, and in step 270, the allowable color purity shift amount M engineering N2 when the phosphor and shadow mask are of stripe type is input.

The conversion coefficient used to convert the sub-deflection coil current to the amount of color purity deviation is rarely changed once the color purity measurement device is in operation, so it can be kept as a fixed value and does not necessarily have to be entered from the beginning. It's fine without it.

In the above embodiment, the color purity deviation is measured at two locations on the left and right when the phosphor and shadow mask are of the stiff type, and at four locations on the top, bottom, left, and right when the phosphor and shadow mask are of the dot type.
In order to know the details of the color purity shift amount, the number of measurement points may be increased.

[Effect of the invention J As described above, the color purity measuring device according to the first invention is provided separately from the deflection coil y for CRT screen display,
A sub-deflection coil that deflects the CRT's electron beam by the magnetic force generated when a current is applied, is installed corresponding to this sub-deflection coil /l/, and measures the peak value of the light intensity on a portion of the CRT screen. A color purity sensor that stores the initial light amount value, which is the measured value of the color purity sensor when the current value flowing through the sub-deflection coil is O, and a light amount value determining means that stores a comparative light amount value that is a measured value of the color purity sensor and compares this comparative light amount value with the above-mentioned initial light amount value; Each time a judgment signal indicating that the light intensity is larger or smaller is received, the current value of the sub-deflection coil is calculated so that the comparative light intensity value gradually approaches the initial light intensity value and eventually matches, and the current having this current value is calculated. It is equipped with a sub-deflection coil current calculating means to flow into the above-mentioned sub-deflection coil, and it is possible to obtain a sub-deflection coil current proportional to the amount of deviation in color purity. This has the effect of eliminating fluctuations in measurement accuracy caused by fatigue caused by continuous measurement.

The color purity measuring device according to the second invention calculates a color purity deviation amount based on the sub-deflection coil current obtained by the first color purity measuring device, and displays this color purity deviation amount. Since it is displayed on the means, viewing the display has the effect of making it easier to correct the deviation of K and υ color linearity.

[Brief explanation of the drawing]

FIG. 1 shows the color purity measurement according to an embodiment of the present invention. A detailed flowchart explaining the flowchart in detail, FIGS. 10 to 13 are supplementary explanatory diagrams for explaining the principle of measuring the amount of deviation in color purity of a color purity measuring device according to an embodiment of the present invention, and FIG. 15 is an explanatory supplementary diagram for explaining a conventional device, and FIG. 16 is a conventional device. In the figure, 21 is a sub-deflection coil μ, 22 is a color purity sensor, and 23 is a sub-deflection coil current. Calculating means, 24 light amount value determining means, 25 color purity deviation rendering means, 26 display means,
27 is a work instruction means, and 28 is a one-man power means. Note that the same reference numerals in the figures indicate the same or equivalent parts.

Claims (2)

[Claims] (1) A sub-deflection coil that is provided separately from the CRT screen display deflection coil and deflects the CRT's electron beam by the magnetic force generated by flowing current; a color purity sensor that measures the peak value of the light amount of a portion of the sub-deflection coil; a color purity sensor that stores an initial light amount value that is the measurement value of the color purity sensor when the current value flowing through the sub-deflection coil is 0; A light amount value determining means stores a comparative light amount value which is a measured value of the color purity sensor when a current is applied, and compares this comparative light amount value with the above initial light amount value, and from this light amount value determining means, the above-mentioned Each time a judgment signal indicating that the comparison light intensity value is larger than or smaller than the initial light intensity value is received, the current value of the sub-deflection coil is calculated so that the comparison light intensity value gradually approaches the initial light intensity value and eventually matches. ,
A color purity measuring device comprising sub-deflection coil current calculation means for causing a current having this current value to flow through the sub-deflection coil. (2) A sub-deflection coil that is provided separately from the CRT screen display deflection coil and that deflects the CRT's electron beam by the magnetic force generated when a current is applied; a color purity sensor that measures the peak value of the light amount of a portion of the sub-deflection coil; a color purity sensor that stores an initial light amount value that is the measurement value of the color purity sensor when the current value flowing through the sub-deflection coil is 0; A light amount value determining means stores a comparative light amount value which is a measured value of the color purity sensor when a current is applied, and compares this comparative light amount value with the above initial light amount value. Each time a judgment signal indicating that the light intensity value is large or small is received, the current value of the sub-deflection coil is calculated so that the comparative light intensity value gradually approaches the initial light intensity value and eventually matches, and the current value is maintained. sub-deflection coil current calculation means for flowing current to the sub-deflection coil;
color purity deviation calculating means for calculating a color purity deviation amount based on the current value of the sub-deflection coil at that time when receiving a signal indicating that the comparative light quantity value matches the initial light quantity value from the light quantity value determining means; and a color purity measuring device comprising a display means for displaying the amount of color purity deviation.