JPH01176245A - Glassy thin film - Google Patents

Glassy thin film

Info

Publication number
JPH01176245A
JPH01176245A JP62334990A JP33499087A JPH01176245A JP H01176245 A JPH01176245 A JP H01176245A JP 62334990 A JP62334990 A JP 62334990A JP 33499087 A JP33499087 A JP 33499087A JP H01176245 A JPH01176245 A JP H01176245A
Authority
JP
Japan
Prior art keywords
glass
thin film
film
refractive index
glassy
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62334990A
Other languages
Japanese (ja)
Inventor
Seiichi Aragaki
新垣 誠一
Kazumi Nagao
長尾 和美
Yasuo Takahashi
靖男 高橋
Takashi Noma
敬 野間
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP62334990A priority Critical patent/JPH01176245A/en
Priority to US07/290,699 priority patent/US4946724A/en
Priority to DE8888121734T priority patent/DE3872502T2/en
Priority to EP88121734A priority patent/EP0322867B1/en
Publication of JPH01176245A publication Critical patent/JPH01176245A/en
Pending legal-status Critical Current

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  • Physical Vapour Deposition (AREA)
  • Surface Treatment Of Optical Elements (AREA)
  • Surface Treatment Of Glass (AREA)
  • Glass Compositions (AREA)

Abstract

PURPOSE:To facilitate the formation of a glassy thin film having high refractive index, by using a Pb-Sn-P-O-F glass as a film-forming material. CONSTITUTION:The objective glassy thin film is a film formed on a substrate and containing Sn, P, Pb, O and F. The composition is preferably composed of 30-90wt.% of Sn, 1-20wt.% of P, 0.1-20wt.% of Pb, 2-30wt.% of O and 5-25wt.% of F. The above glassy thin film can be easily formed into a film by vapor-phase deposition such as evaporation or sputtering and a thin film having a refractive index of >1.65 can be easily produced. The thickness of the glassy thin film is preferably <=40mu, especially <=10mu. The substrate is made of glass, metal, plastic, ceramic or their composite.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明はガラス、金属などの基板上に形成するガラス状
薄膜に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a glass-like thin film formed on a substrate such as glass or metal.

〔従来の技術〕[Conventional technology]

ガラス、金属、プラスチック、セラミックなどの各種基
板上にガラス薄膜を形成する技術は良く知られている。
Techniques for forming glass thin films on various substrates such as glass, metal, plastic, and ceramic are well known.

その第1の方法は真空蒸着法である。蒸着源として用い
られるガラスとしては、例えばショット社のNo、83
29ガラスが良く知られており、主にエレクトロンビー
ム法による蒸着で基板の化学的耐久性の向上や耐摩耗性
の向上などの効果が得られている(ショット社カタログ
;蒸着用ガラス8329)。またエレクトロンビーム法
にかわる方法としてMo、Ta、Wなどのボート上に蒸
着源を置いて通電することにより蒸着する抵抗加熱法も
よく用いられる。
The first method is vacuum evaporation. Examples of glass used as a vapor deposition source include Schott No. 83.
No. 29 glass is well known, and is mainly used for vapor deposition using the electron beam method to improve the chemical durability and abrasion resistance of the substrate (Schott Inc. Catalog; Vapor Deposition Glass 8329). As an alternative to the electron beam method, a resistance heating method is also often used, in which a vapor deposition source is placed on a boat made of Mo, Ta, W, etc., and the material is vapor-deposited by supplying electricity.

蒸着にかわる第2の方法として高周波スパッタ法がある
。この方法はArガスを高周波出力によりターゲットに
ぶつけることによりターゲットを基板上に成膜するもの
でガラスターゲットとしてはコーニング社の7059 
(ガラスコード)ガラスが良く知られている。7o59
ガラスのスパツタ膜の屈折率は1.544(λ冨0.6
328μm)であるので、基板として石英、パイレック
ス、ソーダガラスなどを用いてガラス薄膜導波路作製が
可能である。
A second method to replace vapor deposition is high frequency sputtering. This method forms a film on the substrate by bombarding the target with Ar gas using high-frequency output.The glass target used is Corning's 7059.
(Glass Code) Glass is well known. 7o59
The refractive index of the sputtered glass film is 1.544 (λ-thickness 0.6
328 μm), it is possible to fabricate a glass thin film waveguide using quartz, pyrex, soda glass, etc. as a substrate.

(発明が解決しようとしている問題点)しかしながら、
上記従来例では蒸着源或いはターゲットに用いるガラス
には次のような欠点があった。
(The problem that the invention is trying to solve) However,
In the conventional example described above, the glass used for the vapor deposition source or target had the following drawbacks.

(1)ガラスの軟化温度が高く蒸着に要するエネルギー
が大きい(軟化温度 8329;980℃、7059;
844℃)。例えば、エレクトロンビームによる蒸着の
場合には成膜速度を上げるためにはビームのパワーアッ
プとポンプの容量増大が必要になる。また抵抗加熱法に
よる蒸着ではより大きな電流・電圧による加熱温度の上
昇、さらに同じくポンプ容量の増大が必要となる0以上
のような問題は一般的に軟化温度が高いほど顕著になる
(1) The softening temperature of glass is high and the energy required for vapor deposition is large (softening temperature 8329; 980°C, 7059;
844°C). For example, in the case of electron beam deposition, in order to increase the deposition rate, it is necessary to increase the power of the beam and the capacity of the pump. Furthermore, in vapor deposition by resistance heating, the problem of 0 or more, which requires an increase in heating temperature due to a larger current and voltage, and also an increase in pump capacity, generally becomes more pronounced as the softening temperature becomes higher.

(2)成膜可能なガラスが限られており、高い屈折率の
ガラス薄膜が得られていない(ガラス膜の屈折率832
9 ; nd−1,47,7059; no、asza
= 1 、 544) 。ショット8329やコーニン
グ7059ガラスはその主成分が5i02.820sな
どの屈折率上昇に寄与しない成分で構成されているので
、その屈折率は上記のように低いものしか得られていな
い、またこれら2種のガラスの他は実際には全んど成膜
に用いられていないため、膜の屈折率の選択の余地が殆
んど無いという状態であった。
(2) Glass that can be formed into a film is limited, and a glass thin film with a high refractive index cannot be obtained (refractive index of glass film is 832
9; nd-1,47,7059; no, asza
= 1, 544). Schott 8329 and Corning 7059 glass are mainly composed of components such as 5i02.820s that do not contribute to increasing the refractive index, so their refractive index can only be as low as described above, and these two types Since none of the glasses other than the above are actually used for film formation, there is almost no room for selection of the refractive index of the film.

(問題点を解決するための手段) 本発明は上記の如き欠点を解決し、製膜が容易で、また
高い屈折率を有するガラス状薄膜を提供することを主た
る目的とする。
(Means for Solving the Problems) The main object of the present invention is to solve the above-mentioned drawbacks and provide a glassy thin film that is easy to form and has a high refractive index.

本発明は基板上に形成された薄膜であって、Sn、P、
Pb、OおよびFの各元素を含むことを特徴とするガラ
ス状薄膜である。
The present invention relates to a thin film formed on a substrate, comprising Sn, P,
This is a glass-like thin film characterized by containing the elements Pb, O, and F.

本発明のガラス状薄膜に用いるガラスは蒸着。The glass used for the glassy thin film of the present invention is vapor deposited.

スパッター等の気相堆積法による製膜が容易にできるも
のである。また、製膜後の屈折率が高く、1.65より
大きいガラス状薄膜が容易に形成できるものである。
The film can be easily formed by a vapor deposition method such as sputtering. In addition, the refractive index after film formation is high, and a glassy thin film having a refractive index greater than 1.65 can be easily formed.

なお、Pb−3n−P−0−F系のガラスが低融点であ
り、非球面レンズ用ダイレクトモールド材料として検討
されたことは良く知られている(例えば、Physic
s  and  Chantstry  of  Gl
asses  Vol、25No、8  Decemb
er  1984)、しかしながら、この系のガラスの
蒸着或いはスパッターにより比較的屈折率が高く化学的
耐久性も良好な光学用薄膜が得られること及びその広範
な応用、展開の可能性についてはこれまで研究がなされ
ておらず、本発明はこのようなPb−5n−P−0−F
系ガラスが製膜材料としても適しており、また製膜され
たガラス状薄膜の光学特性も屈折率について十分に高い
ものであることを見い出したものである。
It is well known that Pb-3n-P-0-F glass has a low melting point and has been studied as a direct molding material for aspherical lenses (for example, Physic
s and chantstry of Gl
asses Vol, 25 No. 8 December
er 1984), however, there has been no research to date on the fact that optical thin films with a relatively high refractive index and good chemical durability can be obtained by vapor deposition or sputtering of this type of glass, and on the possibility of its wide range of applications and development. However, the present invention is directed to such Pb-5n-P-0-F.
It has been discovered that the glass-like glass is suitable as a film-forming material, and that the optical properties of the formed glass-like thin film are sufficiently high in terms of refractive index.

ガラス状薄膜としての厚さは40μ以下、特には10μ
以下が好ましい。
The thickness as a glassy thin film is 40μ or less, especially 10μ
The following are preferred.

また、ガラス状薄膜を構成する各元素の含有量はSnが
30〜90wt%、Pが1〜2owt%、pbが0.1
〜20wt%、0が2〜3owt%およびFが5〜25
wt%の範囲が好適である。
In addition, the content of each element constituting the glassy thin film is 30 to 90 wt% Sn, 1 to 2 wt% P, and 0.1 wt% Pb.
~20 wt%, 2-3 wt% 0 and 5-25 F
A range of wt% is preferred.

ガラス状薄膜を形成する基板としてはガラス。Glass is used as a substrate for forming a glassy thin film.

金属、プラスチック、セラミックあるいはこれらの複合
体などが用いられる。
Metal, plastic, ceramic, or a composite thereof can be used.

(実施例) 以下実施例に基づいて本発明の特徴を述べる。(Example) The features of the present invention will be described below based on Examples.

[実施例1] 第1表のaのような組成比になるように原料(S n 
F2 、 P b Fx 、 F20S )約300g
を調製し、雰囲気調整のためさらに10wt%のNH4
F−HFを加えてバッチを調合した。用意したパッチ3
30gを約300mftのシリカガラス製ルツボに入れ
、460tに保った電気炉中で1.5時間溶融した後、
水冷したステンレス製バット上に薄くキャストして透明
なガラスを得た。キャストしたガラスを化学分析した結
果、第1表のbのような組成になっていることがわかっ
た。また、TMA (熱機械分析)による測定で軟化温
度を測定したら105℃であった。
[Example 1] Raw materials (S n
F2, P b Fx, F20S) approx. 300g
and further added 10 wt% NH4 to adjust the atmosphere.
The batch was prepared by adding F-HF. Prepared patch 3
After putting 30g into a silica glass crucible of about 300mft and melting it in an electric furnace maintained at 460t for 1.5 hours,
A transparent glass was obtained by thinly casting on a water-cooled stainless steel vat. As a result of chemical analysis of the cast glass, it was found that it had a composition as shown in b in Table 1. Further, the softening temperature was determined to be 105°C by TMA (thermomechanical analysis).

得られたガラスbの一部を用いて抵抗加熱法による真空
蒸着実験を行った。なお蒸着基板には1インチ角、厚さ
inmの石英ガラス板を用い、加熱ボートには箱型に加
工したTaボートを用いて、この中にガラスbを約0.
5g秤り取ってのせた。蒸着は条件を3種類変えて行い
、蒸着条件1では製膜速度を速く(約50人/ s e
 c ) L/、同2では中間の速度(約15人/ s
 e c ) 、同3では比較的遅く(約2人/ s 
e c )するように加熱ボートに印加する電圧を調整
した。蒸着時間はそれぞれ5分とし、蒸着条件1では約
1.4μm、同じく2と3ではそれぞれ約0.4μm。
A vacuum evaporation experiment using a resistance heating method was conducted using a part of the obtained glass b. A quartz glass plate of 1 inch square and 1 inch thick was used as the deposition substrate, and a Ta boat machined into a box shape was used as the heating boat, and about 0.0 mm of glass B was placed in it.
Weighed out 5g and placed it on top. Vapor deposition was carried out under three different conditions, and in vapor deposition condition 1, the film forming rate was high (approximately 50 people/sec).
c) Medium speed for L/, 2 (approximately 15 people/s
e c ), relatively slow in the same 3 (about 2 people/s
The voltage applied to the heating boat was adjusted so that ec). The deposition time was 5 minutes for each, and the thickness was about 1.4 μm under deposition condition 1, and about 0.4 μm under conditions 2 and 3.

約0.05μmの蒸着膜を得た(蒸着膜1,2゜3)。A deposited film of approximately 0.05 μm was obtained (deposited film 1, 2°3).

得られた蒸着膜1.2.3はいずれも透明で、それぞれ
灰褐色、茶褐色、淡黄色を呈しており、屈折率(n、)
はそれぞれ1.83゜1.81,1.79であった。
The vapor deposited films 1, 2, and 3 obtained were all transparent, exhibiting grayish brown, brownish brown, and pale yellow colors, respectively, and had a refractive index (n,)
were 1.83°1.81 and 1.79, respectively.

また得られた薄膜を化学分析した結果、蒸着膜1.2.
3の組成はそれぞれ第2表に示す通りであることがわか
った。製膜条件の違いにより膜組成は変化するが、蒸着
源のガラス中に含まれる成分は不純物のStを除いて全
て蒸着膜中に含まれていることがわかる。
Moreover, as a result of chemical analysis of the obtained thin film, the deposited film 1.2.
It was found that the compositions of No. 3 were as shown in Table 2. Although the film composition varies depending on the film forming conditions, it can be seen that all components contained in the glass of the vapor deposition source are contained in the vapor deposited film except for the impurity St.

また蒸着lit、2.3のX線回折を行ったところ、蒸
着膜1.2ではSn2 P2otやpbHzPzOsの
微結晶を含むことがわかったが、Sn、Pbなどの金属
相は検出されなかフた。蒸着膜3は薄いために結晶の有
無は同定できなかった。
Furthermore, when we performed X-ray diffraction on the deposited film 1.2, it was found that the deposited film 1.2 contained microcrystals of Sn2P2ot and pbHzPzOs, but metal phases such as Sn and Pb were not detected. . Since the deposited film 3 was thin, it was not possible to identify the presence or absence of crystals.

以上の結果から蒸着膜1,2はFを多量に含むにもかか
わらず、弗化物の結晶が存在しないことがらFはガラス
構造内に取り込まれていることが第1表 第2表 [実施例2] 実施例1で作製した蒸着膜1に電子線マイクロアナライ
ザーによる電子線照射を行った。実験条件は加速電圧1
5KV、試料電流0.02μAとし、電子線径は約2μ
mに絞った。照射時間2秒で蒸着膜は容易に変形し、は
ぼ2μmφのピットが形成されていることが確認できた
From the above results, even though the deposited films 1 and 2 contain a large amount of F, since there are no fluoride crystals, F is incorporated into the glass structure as shown in Table 1 and Table 2 [Example 2] The deposited film 1 produced in Example 1 was irradiated with an electron beam using an electron beam microanalyzer. Experimental conditions were acceleration voltage 1
5KV, sample current 0.02μA, electron beam diameter approximately 2μ
I narrowed it down to m. It was confirmed that the deposited film was easily deformed after irradiation time of 2 seconds, and pits of about 2 μmφ were formed.

[実施例3] 実施例1で作製した蒸着膜1.2.3の1インチ基板を
50℃、98%相対湿度の雰囲気中で1週間放置したが
、膜表面の浸食は認められず、重量減少もそれぞれ0.
01%以下で、測定誤差内の値を示した。
[Example 3] A 1-inch substrate with vapor-deposited film 1.2.3 produced in Example 1 was left for one week in an atmosphere of 50°C and 98% relative humidity, but no corrosion was observed on the film surface and the weight The decrease is also 0.
01% or less, which was within the measurement error.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明による新規な薄膜は以下のよ
うな長所を有している。
As explained above, the novel thin film according to the present invention has the following advantages.

(1)比較的低温かつ低エネルギーでの蒸着・スパッタ
が可能であり、低コストである。
(1) Vapor deposition and sputtering can be performed at relatively low temperatures and low energy, and the cost is low.

(2)従来知られているガラス薄膜よりかなり屈折率の
高いものが得られる。この為ガラス導波路への応用の可
能性がある。
(2) A glass thin film with a considerably higher refractive index than conventionally known glass thin films can be obtained. Therefore, there is a possibility of application to glass waveguides.

(3)従来になく低エネルギーで書き込みの可能な薄膜
である。これはPb−3n−P−0−F系のガラスを蒸
着源とした特徴のある効果といえる。
(3) It is a thin film that can be written with lower energy than ever before. This can be said to be a characteristic effect of using Pb-3n-P-0-F glass as a deposition source.

(4)耐水性も優れているので表面保護膜としても使え
る。
(4) Since it has excellent water resistance, it can also be used as a surface protective film.

Claims (4)

【特許請求の範囲】[Claims] (1)基板上に形成された薄膜であってSn、P、Pb
、OおよびFの各元素を含むことを特徴とするガラス状
薄膜。
(1) A thin film formed on a substrate of Sn, P, and Pb
, O, and F.
(2)Snが30〜90wt%、Pが1〜20wt%、
Pbが0.1〜20wt%、Oが2〜30wt%および
Fが5〜25wt%含まれる特許請求の範囲第1項記載
のガラス状薄膜。
(2) Sn is 30 to 90 wt%, P is 1 to 20 wt%,
The glassy thin film according to claim 1, containing 0.1 to 20 wt% of Pb, 2 to 30 wt% of O, and 5 to 25 wt% of F.
(3)屈折率が1.65より大きい特許請求の範囲第1
項記載のガラス状薄膜。
(3) Claim 1 where the refractive index is greater than 1.65
The glassy thin film described in Section 1.
(4)気相堆積法によって形成された特許請求の範囲第
1項記載のガラス状薄膜。
(4) The glassy thin film according to claim 1, which is formed by a vapor deposition method.
JP62334990A 1987-12-28 1987-12-28 Glassy thin film Pending JPH01176245A (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP62334990A JPH01176245A (en) 1987-12-28 1987-12-28 Glassy thin film
US07/290,699 US4946724A (en) 1987-12-28 1988-12-27 Vitreous film and heat-mode optical recording medium using same
DE8888121734T DE3872502T2 (en) 1987-12-28 1988-12-27 GLASS-LIKE FILM AND THIS OPTICAL RECORDING MEDIA WORKING IN THE HEAT PROCESS.
EP88121734A EP0322867B1 (en) 1987-12-28 1988-12-27 Vitreous film and heat-mode optical recording medium using same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62334990A JPH01176245A (en) 1987-12-28 1987-12-28 Glassy thin film

Publications (1)

Publication Number Publication Date
JPH01176245A true JPH01176245A (en) 1989-07-12

Family

ID=18283493

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62334990A Pending JPH01176245A (en) 1987-12-28 1987-12-28 Glassy thin film

Country Status (1)

Country Link
JP (1) JPH01176245A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010505727A (en) * 2006-10-06 2010-02-25 コーニング インコーポレイテッド Durable tungsten-doped tin-fluorophosphate glass
JP2016108164A (en) * 2014-12-03 2016-06-20 日本電気硝子株式会社 Sealing glass and sealing material

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010505727A (en) * 2006-10-06 2010-02-25 コーニング インコーポレイテッド Durable tungsten-doped tin-fluorophosphate glass
JP2016108164A (en) * 2014-12-03 2016-06-20 日本電気硝子株式会社 Sealing glass and sealing material

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