JPH01176245A - Glassy thin film - Google Patents
Glassy thin filmInfo
- Publication number
- JPH01176245A JPH01176245A JP62334990A JP33499087A JPH01176245A JP H01176245 A JPH01176245 A JP H01176245A JP 62334990 A JP62334990 A JP 62334990A JP 33499087 A JP33499087 A JP 33499087A JP H01176245 A JPH01176245 A JP H01176245A
- Authority
- JP
- Japan
- Prior art keywords
- glass
- thin film
- film
- refractive index
- glassy
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000010409 thin film Substances 0.000 title claims abstract description 29
- 239000000758 substrate Substances 0.000 claims abstract description 12
- 229910052745 lead Inorganic materials 0.000 claims abstract description 5
- 229910052698 phosphorus Inorganic materials 0.000 claims abstract description 5
- 229910052718 tin Inorganic materials 0.000 claims abstract description 5
- 229910052731 fluorine Inorganic materials 0.000 claims abstract description 3
- 229910052760 oxygen Inorganic materials 0.000 claims abstract description 3
- 238000007740 vapor deposition Methods 0.000 claims description 15
- 238000000034 method Methods 0.000 claims description 10
- 239000011521 glass Substances 0.000 abstract description 35
- 239000010408 film Substances 0.000 abstract description 27
- 239000002184 metal Substances 0.000 abstract description 5
- 229910052751 metal Inorganic materials 0.000 abstract description 5
- 238000004544 sputter deposition Methods 0.000 abstract description 5
- 239000000203 mixture Substances 0.000 abstract description 4
- 230000015572 biosynthetic process Effects 0.000 abstract description 3
- 239000000919 ceramic Substances 0.000 abstract description 3
- 239000000463 material Substances 0.000 abstract description 3
- 239000004033 plastic Substances 0.000 abstract description 3
- 239000002131 composite material Substances 0.000 abstract description 2
- 230000008020 evaporation Effects 0.000 abstract 1
- 238000001704 evaporation Methods 0.000 abstract 1
- 238000001947 vapour-phase growth Methods 0.000 abstract 1
- 238000010438 heat treatment Methods 0.000 description 6
- 238000000151 deposition Methods 0.000 description 5
- 230000008021 deposition Effects 0.000 description 5
- 238000010894 electron beam technology Methods 0.000 description 5
- 239000000126 substance Substances 0.000 description 4
- 238000004458 analytical method Methods 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- 239000013078 crystal Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 238000007738 vacuum evaporation Methods 0.000 description 2
- RZVAJINKPMORJF-UHFFFAOYSA-N Acetaminophen Chemical compound CC(=O)NC1=CC=C(O)C=C1 RZVAJINKPMORJF-UHFFFAOYSA-N 0.000 description 1
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 description 1
- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 description 1
- 102220534965 Trafficking regulator of GLUT4 1_F20S_mutation Human genes 0.000 description 1
- 238000002441 X-ray diffraction Methods 0.000 description 1
- 238000005299 abrasion Methods 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 238000005266 casting Methods 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000000313 electron-beam-induced deposition Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000001747 exhibiting effect Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000013081 microcrystal Substances 0.000 description 1
- 239000012778 molding material Substances 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 239000005297 pyrex Substances 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- 230000000930 thermomechanical effect Effects 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Physical Vapour Deposition (AREA)
- Surface Treatment Of Optical Elements (AREA)
- Surface Treatment Of Glass (AREA)
- Glass Compositions (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明はガラス、金属などの基板上に形成するガラス状
薄膜に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a glass-like thin film formed on a substrate such as glass or metal.
ガラス、金属、プラスチック、セラミックなどの各種基
板上にガラス薄膜を形成する技術は良く知られている。Techniques for forming glass thin films on various substrates such as glass, metal, plastic, and ceramic are well known.
その第1の方法は真空蒸着法である。蒸着源として用い
られるガラスとしては、例えばショット社のNo、83
29ガラスが良く知られており、主にエレクトロンビー
ム法による蒸着で基板の化学的耐久性の向上や耐摩耗性
の向上などの効果が得られている(ショット社カタログ
;蒸着用ガラス8329)。またエレクトロンビーム法
にかわる方法としてMo、Ta、Wなどのボート上に蒸
着源を置いて通電することにより蒸着する抵抗加熱法も
よく用いられる。The first method is vacuum evaporation. Examples of glass used as a vapor deposition source include Schott No. 83.
No. 29 glass is well known, and is mainly used for vapor deposition using the electron beam method to improve the chemical durability and abrasion resistance of the substrate (Schott Inc. Catalog; Vapor Deposition Glass 8329). As an alternative to the electron beam method, a resistance heating method is also often used, in which a vapor deposition source is placed on a boat made of Mo, Ta, W, etc., and the material is vapor-deposited by supplying electricity.
蒸着にかわる第2の方法として高周波スパッタ法がある
。この方法はArガスを高周波出力によりターゲットに
ぶつけることによりターゲットを基板上に成膜するもの
でガラスターゲットとしてはコーニング社の7059
(ガラスコード)ガラスが良く知られている。7o59
ガラスのスパツタ膜の屈折率は1.544(λ冨0.6
328μm)であるので、基板として石英、パイレック
ス、ソーダガラスなどを用いてガラス薄膜導波路作製が
可能である。A second method to replace vapor deposition is high frequency sputtering. This method forms a film on the substrate by bombarding the target with Ar gas using high-frequency output.The glass target used is Corning's 7059.
(Glass Code) Glass is well known. 7o59
The refractive index of the sputtered glass film is 1.544 (λ-thickness 0.6
328 μm), it is possible to fabricate a glass thin film waveguide using quartz, pyrex, soda glass, etc. as a substrate.
(発明が解決しようとしている問題点)しかしながら、
上記従来例では蒸着源或いはターゲットに用いるガラス
には次のような欠点があった。(The problem that the invention is trying to solve) However,
In the conventional example described above, the glass used for the vapor deposition source or target had the following drawbacks.
(1)ガラスの軟化温度が高く蒸着に要するエネルギー
が大きい(軟化温度 8329;980℃、7059;
844℃)。例えば、エレクトロンビームによる蒸着の
場合には成膜速度を上げるためにはビームのパワーアッ
プとポンプの容量増大が必要になる。また抵抗加熱法に
よる蒸着ではより大きな電流・電圧による加熱温度の上
昇、さらに同じくポンプ容量の増大が必要となる0以上
のような問題は一般的に軟化温度が高いほど顕著になる
。(1) The softening temperature of glass is high and the energy required for vapor deposition is large (softening temperature 8329; 980°C, 7059;
844°C). For example, in the case of electron beam deposition, in order to increase the deposition rate, it is necessary to increase the power of the beam and the capacity of the pump. Furthermore, in vapor deposition by resistance heating, the problem of 0 or more, which requires an increase in heating temperature due to a larger current and voltage, and also an increase in pump capacity, generally becomes more pronounced as the softening temperature becomes higher.
(2)成膜可能なガラスが限られており、高い屈折率の
ガラス薄膜が得られていない(ガラス膜の屈折率832
9 ; nd−1,47,7059; no、asza
= 1 、 544) 。ショット8329やコーニン
グ7059ガラスはその主成分が5i02.820sな
どの屈折率上昇に寄与しない成分で構成されているので
、その屈折率は上記のように低いものしか得られていな
い、またこれら2種のガラスの他は実際には全んど成膜
に用いられていないため、膜の屈折率の選択の余地が殆
んど無いという状態であった。(2) Glass that can be formed into a film is limited, and a glass thin film with a high refractive index cannot be obtained (refractive index of glass film is 832
9; nd-1,47,7059; no, asza
= 1, 544). Schott 8329 and Corning 7059 glass are mainly composed of components such as 5i02.820s that do not contribute to increasing the refractive index, so their refractive index can only be as low as described above, and these two types Since none of the glasses other than the above are actually used for film formation, there is almost no room for selection of the refractive index of the film.
(問題点を解決するための手段)
本発明は上記の如き欠点を解決し、製膜が容易で、また
高い屈折率を有するガラス状薄膜を提供することを主た
る目的とする。(Means for Solving the Problems) The main object of the present invention is to solve the above-mentioned drawbacks and provide a glassy thin film that is easy to form and has a high refractive index.
本発明は基板上に形成された薄膜であって、Sn、P、
Pb、OおよびFの各元素を含むことを特徴とするガラ
ス状薄膜である。The present invention relates to a thin film formed on a substrate, comprising Sn, P,
This is a glass-like thin film characterized by containing the elements Pb, O, and F.
本発明のガラス状薄膜に用いるガラスは蒸着。The glass used for the glassy thin film of the present invention is vapor deposited.
スパッター等の気相堆積法による製膜が容易にできるも
のである。また、製膜後の屈折率が高く、1.65より
大きいガラス状薄膜が容易に形成できるものである。The film can be easily formed by a vapor deposition method such as sputtering. In addition, the refractive index after film formation is high, and a glassy thin film having a refractive index greater than 1.65 can be easily formed.
なお、Pb−3n−P−0−F系のガラスが低融点であ
り、非球面レンズ用ダイレクトモールド材料として検討
されたことは良く知られている(例えば、Physic
s and Chantstry of Gl
asses Vol、25No、8 Decemb
er 1984)、しかしながら、この系のガラスの
蒸着或いはスパッターにより比較的屈折率が高く化学的
耐久性も良好な光学用薄膜が得られること及びその広範
な応用、展開の可能性についてはこれまで研究がなされ
ておらず、本発明はこのようなPb−5n−P−0−F
系ガラスが製膜材料としても適しており、また製膜され
たガラス状薄膜の光学特性も屈折率について十分に高い
ものであることを見い出したものである。It is well known that Pb-3n-P-0-F glass has a low melting point and has been studied as a direct molding material for aspherical lenses (for example, Physic
s and chantstry of Gl
asses Vol, 25 No. 8 December
er 1984), however, there has been no research to date on the fact that optical thin films with a relatively high refractive index and good chemical durability can be obtained by vapor deposition or sputtering of this type of glass, and on the possibility of its wide range of applications and development. However, the present invention is directed to such Pb-5n-P-0-F.
It has been discovered that the glass-like glass is suitable as a film-forming material, and that the optical properties of the formed glass-like thin film are sufficiently high in terms of refractive index.
ガラス状薄膜としての厚さは40μ以下、特には10μ
以下が好ましい。The thickness as a glassy thin film is 40μ or less, especially 10μ
The following are preferred.
また、ガラス状薄膜を構成する各元素の含有量はSnが
30〜90wt%、Pが1〜2owt%、pbが0.1
〜20wt%、0が2〜3owt%およびFが5〜25
wt%の範囲が好適である。In addition, the content of each element constituting the glassy thin film is 30 to 90 wt% Sn, 1 to 2 wt% P, and 0.1 wt% Pb.
~20 wt%, 2-3 wt% 0 and 5-25 F
A range of wt% is preferred.
ガラス状薄膜を形成する基板としてはガラス。Glass is used as a substrate for forming a glassy thin film.
金属、プラスチック、セラミックあるいはこれらの複合
体などが用いられる。Metal, plastic, ceramic, or a composite thereof can be used.
(実施例) 以下実施例に基づいて本発明の特徴を述べる。(Example) The features of the present invention will be described below based on Examples.
[実施例1]
第1表のaのような組成比になるように原料(S n
F2 、 P b Fx 、 F20S )約300g
を調製し、雰囲気調整のためさらに10wt%のNH4
F−HFを加えてバッチを調合した。用意したパッチ3
30gを約300mftのシリカガラス製ルツボに入れ
、460tに保った電気炉中で1.5時間溶融した後、
水冷したステンレス製バット上に薄くキャストして透明
なガラスを得た。キャストしたガラスを化学分析した結
果、第1表のbのような組成になっていることがわかっ
た。また、TMA (熱機械分析)による測定で軟化温
度を測定したら105℃であった。[Example 1] Raw materials (S n
F2, P b Fx, F20S) approx. 300g
and further added 10 wt% NH4 to adjust the atmosphere.
The batch was prepared by adding F-HF. Prepared patch 3
After putting 30g into a silica glass crucible of about 300mft and melting it in an electric furnace maintained at 460t for 1.5 hours,
A transparent glass was obtained by thinly casting on a water-cooled stainless steel vat. As a result of chemical analysis of the cast glass, it was found that it had a composition as shown in b in Table 1. Further, the softening temperature was determined to be 105°C by TMA (thermomechanical analysis).
得られたガラスbの一部を用いて抵抗加熱法による真空
蒸着実験を行った。なお蒸着基板には1インチ角、厚さ
inmの石英ガラス板を用い、加熱ボートには箱型に加
工したTaボートを用いて、この中にガラスbを約0.
5g秤り取ってのせた。蒸着は条件を3種類変えて行い
、蒸着条件1では製膜速度を速く(約50人/ s e
c ) L/、同2では中間の速度(約15人/ s
e c ) 、同3では比較的遅く(約2人/ s
e c )するように加熱ボートに印加する電圧を調整
した。蒸着時間はそれぞれ5分とし、蒸着条件1では約
1.4μm、同じく2と3ではそれぞれ約0.4μm。A vacuum evaporation experiment using a resistance heating method was conducted using a part of the obtained glass b. A quartz glass plate of 1 inch square and 1 inch thick was used as the deposition substrate, and a Ta boat machined into a box shape was used as the heating boat, and about 0.0 mm of glass B was placed in it.
Weighed out 5g and placed it on top. Vapor deposition was carried out under three different conditions, and in vapor deposition condition 1, the film forming rate was high (approximately 50 people/sec).
c) Medium speed for L/, 2 (approximately 15 people/s
e c ), relatively slow in the same 3 (about 2 people/s
The voltage applied to the heating boat was adjusted so that ec). The deposition time was 5 minutes for each, and the thickness was about 1.4 μm under deposition condition 1, and about 0.4 μm under conditions 2 and 3.
約0.05μmの蒸着膜を得た(蒸着膜1,2゜3)。A deposited film of approximately 0.05 μm was obtained (deposited film 1, 2°3).
得られた蒸着膜1.2.3はいずれも透明で、それぞれ
灰褐色、茶褐色、淡黄色を呈しており、屈折率(n、)
はそれぞれ1.83゜1.81,1.79であった。The vapor deposited films 1, 2, and 3 obtained were all transparent, exhibiting grayish brown, brownish brown, and pale yellow colors, respectively, and had a refractive index (n,)
were 1.83°1.81 and 1.79, respectively.
また得られた薄膜を化学分析した結果、蒸着膜1.2.
3の組成はそれぞれ第2表に示す通りであることがわか
った。製膜条件の違いにより膜組成は変化するが、蒸着
源のガラス中に含まれる成分は不純物のStを除いて全
て蒸着膜中に含まれていることがわかる。Moreover, as a result of chemical analysis of the obtained thin film, the deposited film 1.2.
It was found that the compositions of No. 3 were as shown in Table 2. Although the film composition varies depending on the film forming conditions, it can be seen that all components contained in the glass of the vapor deposition source are contained in the vapor deposited film except for the impurity St.
また蒸着lit、2.3のX線回折を行ったところ、蒸
着膜1.2ではSn2 P2otやpbHzPzOsの
微結晶を含むことがわかったが、Sn、Pbなどの金属
相は検出されなかフた。蒸着膜3は薄いために結晶の有
無は同定できなかった。Furthermore, when we performed X-ray diffraction on the deposited film 1.2, it was found that the deposited film 1.2 contained microcrystals of Sn2P2ot and pbHzPzOs, but metal phases such as Sn and Pb were not detected. . Since the deposited film 3 was thin, it was not possible to identify the presence or absence of crystals.
以上の結果から蒸着膜1,2はFを多量に含むにもかか
わらず、弗化物の結晶が存在しないことがらFはガラス
構造内に取り込まれていることが第1表
第2表
[実施例2]
実施例1で作製した蒸着膜1に電子線マイクロアナライ
ザーによる電子線照射を行った。実験条件は加速電圧1
5KV、試料電流0.02μAとし、電子線径は約2μ
mに絞った。照射時間2秒で蒸着膜は容易に変形し、は
ぼ2μmφのピットが形成されていることが確認できた
。From the above results, even though the deposited films 1 and 2 contain a large amount of F, since there are no fluoride crystals, F is incorporated into the glass structure as shown in Table 1 and Table 2 [Example 2] The deposited film 1 produced in Example 1 was irradiated with an electron beam using an electron beam microanalyzer. Experimental conditions were acceleration voltage 1
5KV, sample current 0.02μA, electron beam diameter approximately 2μ
I narrowed it down to m. It was confirmed that the deposited film was easily deformed after irradiation time of 2 seconds, and pits of about 2 μmφ were formed.
[実施例3]
実施例1で作製した蒸着膜1.2.3の1インチ基板を
50℃、98%相対湿度の雰囲気中で1週間放置したが
、膜表面の浸食は認められず、重量減少もそれぞれ0.
01%以下で、測定誤差内の値を示した。[Example 3] A 1-inch substrate with vapor-deposited film 1.2.3 produced in Example 1 was left for one week in an atmosphere of 50°C and 98% relative humidity, but no corrosion was observed on the film surface and the weight The decrease is also 0.
01% or less, which was within the measurement error.
以上説明したように本発明による新規な薄膜は以下のよ
うな長所を有している。As explained above, the novel thin film according to the present invention has the following advantages.
(1)比較的低温かつ低エネルギーでの蒸着・スパッタ
が可能であり、低コストである。(1) Vapor deposition and sputtering can be performed at relatively low temperatures and low energy, and the cost is low.
(2)従来知られているガラス薄膜よりかなり屈折率の
高いものが得られる。この為ガラス導波路への応用の可
能性がある。(2) A glass thin film with a considerably higher refractive index than conventionally known glass thin films can be obtained. Therefore, there is a possibility of application to glass waveguides.
(3)従来になく低エネルギーで書き込みの可能な薄膜
である。これはPb−3n−P−0−F系のガラスを蒸
着源とした特徴のある効果といえる。(3) It is a thin film that can be written with lower energy than ever before. This can be said to be a characteristic effect of using Pb-3n-P-0-F glass as a deposition source.
(4)耐水性も優れているので表面保護膜としても使え
る。(4) Since it has excellent water resistance, it can also be used as a surface protective film.
Claims (4)
、OおよびFの各元素を含むことを特徴とするガラス状
薄膜。(1) A thin film formed on a substrate of Sn, P, and Pb
, O, and F.
Pbが0.1〜20wt%、Oが2〜30wt%および
Fが5〜25wt%含まれる特許請求の範囲第1項記載
のガラス状薄膜。(2) Sn is 30 to 90 wt%, P is 1 to 20 wt%,
The glassy thin film according to claim 1, containing 0.1 to 20 wt% of Pb, 2 to 30 wt% of O, and 5 to 25 wt% of F.
項記載のガラス状薄膜。(3) Claim 1 where the refractive index is greater than 1.65
The glassy thin film described in Section 1.
1項記載のガラス状薄膜。(4) The glassy thin film according to claim 1, which is formed by a vapor deposition method.
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62334990A JPH01176245A (en) | 1987-12-28 | 1987-12-28 | Glassy thin film |
US07/290,699 US4946724A (en) | 1987-12-28 | 1988-12-27 | Vitreous film and heat-mode optical recording medium using same |
DE8888121734T DE3872502T2 (en) | 1987-12-28 | 1988-12-27 | GLASS-LIKE FILM AND THIS OPTICAL RECORDING MEDIA WORKING IN THE HEAT PROCESS. |
EP88121734A EP0322867B1 (en) | 1987-12-28 | 1988-12-27 | Vitreous film and heat-mode optical recording medium using same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62334990A JPH01176245A (en) | 1987-12-28 | 1987-12-28 | Glassy thin film |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01176245A true JPH01176245A (en) | 1989-07-12 |
Family
ID=18283493
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62334990A Pending JPH01176245A (en) | 1987-12-28 | 1987-12-28 | Glassy thin film |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01176245A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010505727A (en) * | 2006-10-06 | 2010-02-25 | コーニング インコーポレイテッド | Durable tungsten-doped tin-fluorophosphate glass |
JP2016108164A (en) * | 2014-12-03 | 2016-06-20 | 日本電気硝子株式会社 | Sealing glass and sealing material |
-
1987
- 1987-12-28 JP JP62334990A patent/JPH01176245A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010505727A (en) * | 2006-10-06 | 2010-02-25 | コーニング インコーポレイテッド | Durable tungsten-doped tin-fluorophosphate glass |
JP2016108164A (en) * | 2014-12-03 | 2016-06-20 | 日本電気硝子株式会社 | Sealing glass and sealing material |
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