JPH01174845U - - Google Patents
Info
- Publication number
- JPH01174845U JPH01174845U JP6995288U JP6995288U JPH01174845U JP H01174845 U JPH01174845 U JP H01174845U JP 6995288 U JP6995288 U JP 6995288U JP 6995288 U JP6995288 U JP 6995288U JP H01174845 U JPH01174845 U JP H01174845U
- Authority
- JP
- Japan
- Prior art keywords
- electron beam
- transparent plate
- mirror plate
- plate
- optical image
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 claims description 8
- 238000010894 electron beam technology Methods 0.000 claims description 6
- 230000005540 biological transmission Effects 0.000 claims 2
- 238000003384 imaging method Methods 0.000 claims 2
- 239000011248 coating agent Substances 0.000 claims 1
- 238000000576 coating method Methods 0.000 claims 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6995288U JPH062200Y2 (ja) | 1988-05-27 | 1988-05-27 | 透過電子顕微鏡 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6995288U JPH062200Y2 (ja) | 1988-05-27 | 1988-05-27 | 透過電子顕微鏡 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01174845U true JPH01174845U (US20110232667A1-20110929-C00004.png) | 1989-12-12 |
| JPH062200Y2 JPH062200Y2 (ja) | 1994-01-19 |
Family
ID=31295214
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6995288U Expired - Lifetime JPH062200Y2 (ja) | 1988-05-27 | 1988-05-27 | 透過電子顕微鏡 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH062200Y2 (US20110232667A1-20110929-C00004.png) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005203106A (ja) * | 2004-01-13 | 2005-07-28 | Jeol Ltd | 透過電子顕微鏡 |
| WO2009117077A2 (en) * | 2008-03-19 | 2009-09-24 | Fama Leo A | Method and apparatus allowing simultaneous direct observation and electron capture of scintillation images in an electron microscope |
-
1988
- 1988-05-27 JP JP6995288U patent/JPH062200Y2/ja not_active Expired - Lifetime
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005203106A (ja) * | 2004-01-13 | 2005-07-28 | Jeol Ltd | 透過電子顕微鏡 |
| WO2009117077A2 (en) * | 2008-03-19 | 2009-09-24 | Fama Leo A | Method and apparatus allowing simultaneous direct observation and electron capture of scintillation images in an electron microscope |
| WO2009117077A3 (en) * | 2008-03-19 | 2009-11-12 | Fama Leo A | Method and apparatus allowing simultaneous direct observation and electron capture of scintillation images in an electron microscope |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH062200Y2 (ja) | 1994-01-19 |
