JPH01171374U - - Google Patents

Info

Publication number
JPH01171374U
JPH01171374U JP6883188U JP6883188U JPH01171374U JP H01171374 U JPH01171374 U JP H01171374U JP 6883188 U JP6883188 U JP 6883188U JP 6883188 U JP6883188 U JP 6883188U JP H01171374 U JPH01171374 U JP H01171374U
Authority
JP
Japan
Prior art keywords
chamber
thermal shock
test
low
test chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6883188U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0635187Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6883188U priority Critical patent/JPH0635187Y2/ja
Publication of JPH01171374U publication Critical patent/JPH01171374U/ja
Application granted granted Critical
Publication of JPH0635187Y2 publication Critical patent/JPH0635187Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP6883188U 1988-05-25 1988-05-25 冷熱衝撃試験装置 Expired - Lifetime JPH0635187Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6883188U JPH0635187Y2 (ja) 1988-05-25 1988-05-25 冷熱衝撃試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6883188U JPH0635187Y2 (ja) 1988-05-25 1988-05-25 冷熱衝撃試験装置

Publications (2)

Publication Number Publication Date
JPH01171374U true JPH01171374U (enrdf_load_html_response) 1989-12-05
JPH0635187Y2 JPH0635187Y2 (ja) 1994-09-14

Family

ID=31294128

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6883188U Expired - Lifetime JPH0635187Y2 (ja) 1988-05-25 1988-05-25 冷熱衝撃試験装置

Country Status (1)

Country Link
JP (1) JPH0635187Y2 (enrdf_load_html_response)

Also Published As

Publication number Publication date
JPH0635187Y2 (ja) 1994-09-14

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