JPH01171374U - - Google Patents
Info
- Publication number
- JPH01171374U JPH01171374U JP6883188U JP6883188U JPH01171374U JP H01171374 U JPH01171374 U JP H01171374U JP 6883188 U JP6883188 U JP 6883188U JP 6883188 U JP6883188 U JP 6883188U JP H01171374 U JPH01171374 U JP H01171374U
- Authority
- JP
- Japan
- Prior art keywords
- chamber
- thermal shock
- test
- low
- test chamber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6883188U JPH0635187Y2 (ja) | 1988-05-25 | 1988-05-25 | 冷熱衝撃試験装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6883188U JPH0635187Y2 (ja) | 1988-05-25 | 1988-05-25 | 冷熱衝撃試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01171374U true JPH01171374U (cs) | 1989-12-05 |
| JPH0635187Y2 JPH0635187Y2 (ja) | 1994-09-14 |
Family
ID=31294128
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6883188U Expired - Lifetime JPH0635187Y2 (ja) | 1988-05-25 | 1988-05-25 | 冷熱衝撃試験装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0635187Y2 (cs) |
-
1988
- 1988-05-25 JP JP6883188U patent/JPH0635187Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0635187Y2 (ja) | 1994-09-14 |
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