JPH01162134A - Pretilt angle measurement for liquid crystal cell - Google Patents
Pretilt angle measurement for liquid crystal cellInfo
- Publication number
- JPH01162134A JPH01162134A JP32186887A JP32186887A JPH01162134A JP H01162134 A JPH01162134 A JP H01162134A JP 32186887 A JP32186887 A JP 32186887A JP 32186887 A JP32186887 A JP 32186887A JP H01162134 A JPH01162134 A JP H01162134A
- Authority
- JP
- Japan
- Prior art keywords
- liquid crystal
- pretilt angle
- angle
- crystal cell
- cell
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004973 liquid crystal related substance Substances 0.000 title claims abstract description 50
- 210000002858 crystal cell Anatomy 0.000 title claims abstract description 27
- 238000005259 measurement Methods 0.000 title description 3
- 238000002834 transmittance Methods 0.000 claims description 22
- 238000000034 method Methods 0.000 claims description 12
- 210000004027 cell Anatomy 0.000 abstract description 11
- 230000035699 permeability Effects 0.000 abstract 3
- IAZDPXIOMUYVGZ-UHFFFAOYSA-N Dimethylsulphoxide Chemical compound CS(C)=O IAZDPXIOMUYVGZ-UHFFFAOYSA-N 0.000 abstract 1
- 230000002159 abnormal effect Effects 0.000 abstract 1
- 238000011156 evaluation Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 4
- 239000013078 crystal Substances 0.000 description 3
- 238000000691 measurement method Methods 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 239000004642 Polyimide Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
Abstract
Description
【発明の詳細な説明】
〔概 要〕
本発明は、液晶パネル基板と一定方向に配向された液晶
分子の長軸とがなすプレチルト角の測定方法に関し、
プレチルト角の測定可能範囲の拡大を目的とし、液晶セ
ルの前後に互いに平行な直線偏光板を配置し、これに特
定波長の光を入射し、上記液晶セルを回転させて入射光
の角度に対する透過率特性を測定し、透過率曲線の最大
値または最小値を与える角度をθ、液晶セルの液晶層の
厚みをd、液晶の常屈折率をno、液晶の異常屈折率を
n、、入射光の波長をλ、
k−2π/λ、
N=n、”c o s”αo+na”s i n”αo
1Δn=n・−nils
として次式、
(ここにpは特定自然数である。)
に代入して、プレチルト角α。を決定することを含み構
成する。[Detailed Description of the Invention] [Summary] The present invention relates to a method for measuring a pretilt angle between a liquid crystal panel substrate and the long axis of liquid crystal molecules aligned in a certain direction, and has the purpose of expanding the measurable range of the pretilt angle. Then, linear polarizing plates parallel to each other are arranged before and after the liquid crystal cell, light of a specific wavelength is incident on these, and the liquid crystal cell is rotated to measure the transmittance characteristics with respect to the angle of the incident light, and the transmittance curve is The angle that gives the maximum or minimum value is θ, the thickness of the liquid crystal layer of the liquid crystal cell is d, the ordinary refractive index of the liquid crystal is no, the extraordinary refractive index of the liquid crystal is n, the wavelength of the incident light is λ, k-2π/λ , N=n, “cos”αo+na”s in”αo
Substituting 1Δn=n·-nils into the following formula (where p is a specific natural number), the pretilt angle α is determined. including determining and configuring.
本発明は、液晶パネル基板と一定方向に配向された液晶
分子の長軸とがなすプレチルト角の測定方法に関する。The present invention relates to a method for measuring a pretilt angle between a liquid crystal panel substrate and the long axis of liquid crystal molecules aligned in a certain direction.
液晶においてプレチルト角は液晶パネルの表示特性を決
定する重要なファクターである。従って、液晶表示の最
適化を計る上でプレチルト角の測定は重要である。In liquid crystal, the pretilt angle is an important factor that determines the display characteristics of the liquid crystal panel. Therefore, measuring the pretilt angle is important in optimizing the liquid crystal display.
プレチルト角の測定方法には、結晶回転法、磁界容量零
位法、容量−電圧法の三方法があるが、なかでも結晶回
転法が測定装置が小規模なうえ測定時間が短くてすむの
で、おもに使用されている。There are three methods for measuring the pretilt angle: the crystal rotation method, the magnetic field capacitance zero method, and the capacitance-voltage method.Among them, the crystal rotation method requires a small measuring device and requires a short measurement time. Mainly used.
この結晶回転法について説明すると、液晶セルの前後に
互いに平行な直線偏光板を配置し、特定波長の光を入射
してさらに液晶セルを回転させることにより、液晶セル
の光の入射角に対する透過率特性を測定する。第4図に
透過率曲線の一例を示す、同図において、(萄、(b)
、(C)はプレチルト角がそれぞれ0°、10°、30
mの液晶セルの透過率曲線である。このように一般に透
過率曲線はOまたは1の極値を複数個持ち、Oでない極
小値をひとつ持つ、従来は、このただひとつの0でない
極小値を与える角度に注目してプレチルト角を決定して
いた。このOでない極値を与える角度をφ。、液晶セル
の液晶層の厚みをd、液晶の常屈折率をn0、液晶の異
常屈折率をno、入射光の波長をλとし、
k−2π/λ、
N−no”cos”α6+n@”s i n”αo1Δ
n=n・−nos
を用いて次式、
に代入してプレチルト角α。を決定していた。To explain this crystal rotation method, linear polarizing plates are placed in parallel to each other before and after the liquid crystal cell, and by injecting light of a specific wavelength and further rotating the liquid crystal cell, the transmittance of the liquid crystal cell depending on the angle of incidence of light is Measure properties. Figure 4 shows an example of the transmittance curve.
, (C) have pretilt angles of 0°, 10°, and 30°, respectively.
It is a transmittance curve of a liquid crystal cell of m. In this way, a transmittance curve generally has multiple extreme values of O or 1 and one minimum value that is not O. Conventionally, the pretilt angle was determined by focusing on the angle that gives this only one minimum value that is not 0. was. The angle that gives this extreme value other than O is φ. , the thickness of the liquid crystal layer of the liquid crystal cell is d, the ordinary refractive index of the liquid crystal is n0, the extraordinary refractive index of the liquid crystal is no, the wavelength of the incident light is λ, k-2π/λ, N-no"cos"α6+n@" s i n”αo1Δ
Using n=n・-nos, substitute into the following equation to obtain the pretilt angle α. had decided.
または、α。がα。≦20°のとき、上式の代わりに以
下の近似式、
を使用するかして、プレチルト角α。を求めていた。Or α. is α. When ≦20°, use the following approximate formula instead of the above formula to calculate the pretilt angle α. was looking for.
現在の大多数の液晶デバイスは、液晶分子を90°ねじ
った状態で使用しているが、これでは大型な画面が作れ
ない、液晶パネルの大型化を実現するには、液晶分子を
180@以上ねじる必要があり、理想的には270.”
ねじるのが望ましい。The majority of current liquid crystal devices use liquid crystal molecules twisted by 90 degrees, but this does not allow for the production of large screens. It needs to be twisted, ideally 270. ”
Preferably twisted.
液晶分子を180°以上ねじるには、プレチルト角を5
°以上に大きくしないと安定にねじれない。To twist the liquid crystal molecules by more than 180°, set the pretilt angle to 5
If it is not larger than °, it will not twist stably.
しかし、光の入射角度に対する透過率特性を測定した場
合、プレチルト角が15°以上になると第4図の(C)
に見られるようにφ。が現れなくなる。However, when measuring the transmittance characteristics with respect to the incident angle of light, when the pretilt angle is 15° or more, (C) in Figure 4.
As seen in φ. will no longer appear.
従って、従来の方法ではプレチルト角が15°を越える
液晶セルに対しては、プレチルト角の測定が不可能とな
る。Therefore, with the conventional method, it is impossible to measure the pretilt angle of a liquid crystal cell whose pretilt angle exceeds 15°.
そこで本発明は、プレチルト角の測定可能範囲の拡大を
目的とする。Therefore, an object of the present invention is to expand the measurable range of pretilt angles.
上記問題点は、液晶セルの前後に互いに平行な直線偏光
板を配置し、これに特定波長の光を入射し、上記液晶セ
ルを回転させて入射光の角度に対する透過率特性を測定
し、透過率曲線の最大値または最小値を与える角度をθ
、液晶セルの液晶層の厚みをd、液晶の常屈折率をn’
、液晶の異常屈折率をno、入射光の波長をλ、
k=2π/λ、
N=no”c o s”αo+n*”s i n”αo
5ΔQ=n、 j16゜
として次式、
(ここにPは特定自然数である。)
に代入して、プレチルト角α。を決定することを特徴と
する液晶セルのプレチルト角測定法により解決される。The above problem can be solved by placing linear polarizing plates parallel to each other in front and behind the liquid crystal cell, injecting light of a specific wavelength into the liquid crystal cell, and measuring the transmittance characteristics with respect to the angle of the incident light by rotating the liquid crystal cell. The angle that gives the maximum or minimum value of the rate curve is θ
, the thickness of the liquid crystal layer of the liquid crystal cell is d, and the ordinary refractive index of the liquid crystal is n'
, the extraordinary refractive index of the liquid crystal is no, the wavelength of the incident light is λ, k=2π/λ, N=no"cos"αo+n*"s in"αo
Assuming 5ΔQ=n and j16°, substitute it into the following formula (where P is a specific natural number) to obtain the pretilt angle α. This problem is solved by a method of measuring the pretilt angle of a liquid crystal cell, which is characterized by determining the .
また、α。がα。≦20°のとき、上式の代わりに以下
の近似式、
a
・・・(1)、
を使用しても90%以上の精度でプレチルト角α0が求
まる。Also, α. is α. When ≦20°, the pretilt angle α0 can be determined with an accuracy of 90% or more even if the following approximate formula, a...(1), is used instead of the above formula.
本発明の液晶セルのプレチルト角測定法は、光の入射角
に対する透過率曲線において、複数個ある1または0の
極値を与える角度を求める。この角度はプレチルト角が
大きくなった場合でも必ず現れる。従って、プレチルト
角が大きい場合でもこれらの角度から液晶セルのプレチ
ルト角を求めることが可能になる。The method for measuring the pretilt angle of a liquid crystal cell according to the present invention determines an angle that gives a plurality of extreme values of 1 or 0 in a transmittance curve with respect to the incident angle of light. This angle always appears even when the pretilt angle becomes large. Therefore, even if the pretilt angle is large, it is possible to determine the pretilt angle of the liquid crystal cell from these angles.
本発明のプレチルト角測定法を評価用セルに対し実施す
る。用意したセルはラビング法によるポリミドの配向膜
で、セル厚d−20μm、常屈折率n=1.50、異常
屈折率n=1.635である。The pretilt angle measurement method of the present invention is performed on an evaluation cell. The prepared cell was a polyimide alignment film formed by rubbing, and had a cell thickness of d-20 μm, an ordinary refractive index of n=1.50, and an extraordinary refractive index of n=1.635.
第1図は、液晶セルの透過率を測定する装置の配置構成
図である。同図において、■および3は直線偏向板、2
は評価用セルである。同図に示すように、評価用セル2
の前後に直線偏光板1および3を互いに平行に配置する
。直線偏光板1および3の偏光方向は共に水平軸に対し
45°である。FIG. 1 is a layout diagram of an apparatus for measuring the transmittance of a liquid crystal cell. In the same figure, ■ and 3 are linear deflection plates, 2
is an evaluation cell. As shown in the figure, evaluation cell 2
Linear polarizing plates 1 and 3 are arranged in parallel to each other before and after. The polarization directions of linear polarizers 1 and 3 are both 45° with respect to the horizontal axis.
これに波長λ−632,8nm、の光を水平に入射し、
評価用セルを鉛直軸まわりに回転させて、評価用セル2
の角度に対する透過率特性を調べる。Light with a wavelength of λ-632.8 nm is incident horizontally on this,
Rotate the evaluation cell around the vertical axis to create evaluation cell 2.
Examine the transmittance characteristics with respect to the angle.
次いで評価用セル2の表裏をかえて、もう−度透過率特
性を調べる。Next, the evaluation cell 2 is turned over and its transmittance characteristics are examined again.
これをグラフにしたのが、第2図である。同図において
、T1(φ)は−回目の測定の透過率曲線、T2(φ)
は表裏をかえて測定した二回目の透過率曲線である。0
でない極小値を与える角度φ。、とφ。2の中点を真の
0°とし、T1(φ)とT2(−φ)相加平均を取り、
これを平均透過率とする。これを第3図に示す。同図か
ら極大値、極小値を与える角度θは、−5°、19°、
42.5@、62°と読み取れる。このときのpの値を
同図に示すようにそれぞれ8.7.6.5を選択する。Figure 2 is a graph of this. In the same figure, T1 (φ) is the transmittance curve of the -th measurement, T2 (φ)
is the second transmittance curve measured with the front and back sides changed. 0
Angle φ that gives a local minimum value that is not. , and φ. Let the midpoint of 2 be the true 0°, and take the arithmetic average of T1 (φ) and T2 (-φ),
This is taken as the average transmittance. This is shown in FIG. From the figure, the angles θ that give the maximum and minimum values are -5°, 19°,
It can be read as 42.5@, 62°. At this time, the values of p are selected as 8, 7, and 6.5, respectively, as shown in the figure.
また、このときのφ。の値は一41#である。これらの
データを式(1)および(2)に代入して、プレチルト
角α。を算出する。第3図のφ。Also, φ at this time. The value is -41#. By substituting these data into equations (1) and (2), the pretilt angle α can be calculated. Calculate. φ in Figure 3.
第1表
らプレチルト角α。を求めて平均をとった方が、従来の
単一のφ。の値からα。を求めるよりも確度が高くなる
。Table 1 shows pretilt angle α. It is better to calculate and average the conventional single φ. α from the value of . The accuracy is higher than that obtained by calculating .
本発明の液晶のプレチルト角測定法によれば、液晶セル
の光の入射角度に対する透過率特性を調べ、このとき得
られた透過率曲線には1または0の極値を与える角度が
必ず複数個存在し、この角度の値からプレチルト角を決
定するので、プレチルト角が大きい場合でも液晶セルの
プレチルト角を求めることが可能になる。According to the liquid crystal pretilt angle measurement method of the present invention, the transmittance characteristics of the liquid crystal cell with respect to the incident angle of light are investigated, and the transmittance curve obtained at this time always has a plurality of angles that give an extreme value of 1 or 0. Since the pretilt angle is determined from the value of this angle, it is possible to determine the pretilt angle of the liquid crystal cell even if the pretilt angle is large.
また、1またはOの極値を与える角度θの値から求めた
複数のプレチルト角α。の平均をとってプレチルト角を
決定するので、従来のただひとつのデータφ。の値から
プレチルト角α。を求めるのに比べて精度が向上する。Also, a plurality of pretilt angles α obtained from the value of the angle θ that gives an extreme value of 1 or O. Since the pretilt angle is determined by taking the average of φ, the only conventional data is φ. Pretilt angle α from the value of . The accuracy is improved compared to calculating .
第1図は、液晶セルの透過率を測定する装置の配置構成
図、
第2図は、透過率曲線図、
第3図は、平均透過率曲線図、
第4図は、従来例を説明するための透過率曲線図である
。
(符号の説明)
1.3・・・直線偏光板、
2・・・評価用セル。Figure 1 is a layout diagram of an apparatus for measuring the transmittance of a liquid crystal cell, Figure 2 is a transmittance curve diagram, Figure 3 is an average transmittance curve diagram, and Figure 4 explains a conventional example. FIG. (Explanation of symbols) 1.3...Linear polarizing plate, 2...Evaluation cell.
Claims (2)
し、これに特定波長の光を入射し、上記液晶セルを回転
させて入射光の角度に対する透過率特性を測定し、透過
率曲線の最大値または最小値を与える角度をθ、液晶セ
ルの液晶層の厚みをd、液晶の常屈折率をn_0、液晶
の異常屈折率をn_■、入射光の波長をλ、 k=2π/λ、 N=n_0^2cos^2α_0+n_■^2sin^
2α_0、Δn=n_■−n_0、 として次式、 (n_■^2−n_0^2)/2N^2sin2α_■
sinθ=n_■n_0/N^2N^2−sin^2θ
−n_■^2−sin^2θ−pπ/kd、(ここにp
は特定自然数である。) に代入して、プレチルト角α_0を決定することを特徴
とするプレチルト角測定法。(1) Arrange linear polarizing plates parallel to each other before and after the liquid crystal cell, enter light of a specific wavelength into these, rotate the liquid crystal cell, measure the transmittance characteristics with respect to the angle of the incident light, and calculate the transmittance curve. θ is the angle that gives the maximum or minimum value of λ, N=n_0^2cos^2α_0+n_■^2sin^
2α_0, Δn=n_■-n_0, the following formula, (n_■^2-n_0^2)/2N^2sin2α_■
sinθ=n_■n_0/N^2N^2-sin^2θ
-n_■^2-sin^2θ-pπ/kd, (here p
is a specific natural number. ) to determine the pretilt angle α_0.
りに以下の近似式、 α_0≒n_0/(2+Δn/n_0)sinθ・{√
[1−(sinθ/n_■)^2]−pπ/Δnkd}
を使用する特許請求の範囲第一項記載の液晶セルのプレ
チルト角測定法。(2) When α_0 is α_0≦20°, the following approximate formula is used instead of the above formula, α_0≒n_0/(2+Δn/n_0) sinθ・{√
[1-(sinθ/n_■)^2]-pπ/Δnkd}
A method for measuring a pretilt angle of a liquid crystal cell according to claim 1, using the method.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP32186887A JPH01162134A (en) | 1987-12-18 | 1987-12-18 | Pretilt angle measurement for liquid crystal cell |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP32186887A JPH01162134A (en) | 1987-12-18 | 1987-12-18 | Pretilt angle measurement for liquid crystal cell |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01162134A true JPH01162134A (en) | 1989-06-26 |
Family
ID=18137305
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP32186887A Pending JPH01162134A (en) | 1987-12-18 | 1987-12-18 | Pretilt angle measurement for liquid crystal cell |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01162134A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0450580A2 (en) * | 1990-04-06 | 1991-10-09 | Nokia (Deutschland) GmbH | Method for determining the pretilt angle of liquid crystal molecules in a liquid crystal cell |
US5394245A (en) * | 1992-09-04 | 1995-02-28 | Matsushita Electric Industrial Co., Ltd. | Process and apparatus for measuring pretilt angle of liquid crystals |
US6348966B1 (en) | 1997-12-02 | 2002-02-19 | Nec Corporation | Measuring method of liquid crystal pretilt angle and measuring equipment of liquid crystal pretilt angle |
JP2002267573A (en) * | 2001-03-12 | 2002-09-18 | Shintech Kk | Measuring method and measuring device for orientation parameter of liquid crystal cell |
JP2010204378A (en) * | 2009-03-03 | 2010-09-16 | Otsuka Denshi Co Ltd | Method and apparatus of measuring tilt angle of reflective liquid crystal cell |
-
1987
- 1987-12-18 JP JP32186887A patent/JPH01162134A/en active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0450580A2 (en) * | 1990-04-06 | 1991-10-09 | Nokia (Deutschland) GmbH | Method for determining the pretilt angle of liquid crystal molecules in a liquid crystal cell |
US5172187A (en) * | 1990-04-06 | 1992-12-15 | Nokia Unterhaltungselektronik Gmbh | Method of determining the pretilt angle of liquid crystal molecules |
US5394245A (en) * | 1992-09-04 | 1995-02-28 | Matsushita Electric Industrial Co., Ltd. | Process and apparatus for measuring pretilt angle of liquid crystals |
US6348966B1 (en) | 1997-12-02 | 2002-02-19 | Nec Corporation | Measuring method of liquid crystal pretilt angle and measuring equipment of liquid crystal pretilt angle |
JP2002267573A (en) * | 2001-03-12 | 2002-09-18 | Shintech Kk | Measuring method and measuring device for orientation parameter of liquid crystal cell |
JP2010204378A (en) * | 2009-03-03 | 2010-09-16 | Otsuka Denshi Co Ltd | Method and apparatus of measuring tilt angle of reflective liquid crystal cell |
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