JP2635803B2 - Liquid crystal cell and method for measuring physical properties of liquid crystal and measuring apparatus using the same - Google Patents

Liquid crystal cell and method for measuring physical properties of liquid crystal and measuring apparatus using the same

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Publication number
JP2635803B2
JP2635803B2 JP2193127A JP19312790A JP2635803B2 JP 2635803 B2 JP2635803 B2 JP 2635803B2 JP 2193127 A JP2193127 A JP 2193127A JP 19312790 A JP19312790 A JP 19312790A JP 2635803 B2 JP2635803 B2 JP 2635803B2
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Prior art keywords
liquid crystal
cell
transmission spectrum
crystal cell
measuring
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JPH0480641A (en
Inventor
雅人 庄子
仁 羽藤
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Toshiba Corp
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Toshiba Corp
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  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Description

【発明の詳細な説明】 〔発明の目的〕 (産業上の利用分野) 本発明は液晶セルおよび液晶の物性値測定方法とこれ
を用いた測定装置に係り、特に液晶セルの液晶層の光学
位相差、液晶層の厚みおよび液晶の複屈折率の測定方法
とこれを用いた測定装置に関する。
The present invention relates to a liquid crystal cell, a method for measuring physical properties of a liquid crystal, and a measuring apparatus using the same, and more particularly, to an optical position of a liquid crystal layer of the liquid crystal cell. The present invention relates to a method for measuring a phase difference, a thickness of a liquid crystal layer and a birefringence of a liquid crystal, and a measuring apparatus using the same.

(従来の技術) 液晶素子において、液晶セルの液晶層の光学位相差や
液晶層の厚みd(セル厚)、液晶の複屈折率Δnは重要
なパラメータである。例えば、スーパーツイスト形液晶
表示素子においては、これらのパラメータは表示色や応
答速度、配向の安定性等に密接に関係しており、より高
精度な測定法が求められている。また、これらの値を正
確に知ることはデバイスの設計・評価を行う上でも非常
に重要である。
(Prior Art) In a liquid crystal element, the optical retardation of the liquid crystal layer of the liquid crystal cell, the thickness d (cell thickness) of the liquid crystal layer, and the birefringence Δn of the liquid crystal are important parameters. For example, in a super twist type liquid crystal display device, these parameters are closely related to display color, response speed, alignment stability, and the like, and a more accurate measurement method is required. Knowing these values accurately is also very important in designing and evaluating devices.

従来、液晶セルのセル厚の測定には干渉法が用いられ
てきた。例えば、スプリットビーム方式や光学方式によ
るセル厚測定器が市販されているが、これらはともに干
渉法によるセル厚測定器である。しかし、干渉法によっ
て測定されたセル厚は実際のセル厚より大きくなるとい
う報告(K.H.Yang;J.Appl.Phys.64(9),4780(198
8))もあり、これらの測定器で測ったセル厚が必ずし
も真のセル厚を示しているとは限らない。すなわち、一
般に液相セルはI.T.O.・配向膜・カラーフィルタなど多
層膜からなっており、このため干渉が複雑となり、正し
いセル厚が求まらないという問題があった。
Conventionally, an interference method has been used for measuring the cell thickness of a liquid crystal cell. For example, a cell thickness measuring device using a split beam system or an optical system is commercially available, and these are both cell interferometers. However, it has been reported that the cell thickness measured by the interferometry becomes larger than the actual cell thickness (KH Yang; J. Appl. Phys. 64 (9), 4780 (198
8)), the cell thickness measured by these measuring instruments does not always indicate the true cell thickness. That is, the liquid phase cell is generally formed of a multilayer film such as an ITO film, an alignment film, and a color filter, and therefore, there is a problem that interference is complicated and a correct cell thickness cannot be obtained.

さらに、現在市販されているセル厚測定器では、液晶
の配向状態まで考慮して解折を行うようになっておら
ず、液晶入りセルでの測定精度が低い。その上、今後主
流になって行くであろうカラーフィルタ付きセルの測定
も非常に困難である等の問題があった。
Furthermore, currently commercially available cell thickness measuring instruments do not perform folding in consideration of the alignment state of the liquid crystal, and the measurement accuracy of a cell containing a liquid crystal is low. In addition, there is a problem that it is very difficult to measure a cell with a color filter which will become mainstream in the future.

また、一般に液晶素子の液晶層の光学位相差はセル厚
と液晶の複屈折率の関数であり、通常はセル厚と液晶の
複屈折率から算出するため、セル厚と同様、正しい値を
求めることは困難だった。
In general, the optical phase difference of the liquid crystal layer of a liquid crystal element is a function of the cell thickness and the birefringence of the liquid crystal, and is usually calculated from the cell thickness and the birefringence of the liquid crystal. That was difficult.

(発明が解決しようとする課題) 従来の液晶セル厚測定法では正確な値を求めることが
難しく、また、I.T.O.・配向膜・カラーフィルタなどが
あるためより一層正確さを欠くという問題が見られた。
さらに、液晶セルに液晶が封入されたときのセル厚や、
光学位相差等を正確に求めることができない問題があ
る。
(Problems to be Solved by the Invention) It is difficult to obtain an accurate value by the conventional liquid crystal cell thickness measurement method, and there is a problem that the accuracy is further reduced due to ITO, an alignment film, a color filter, and the like. Was.
Furthermore, the cell thickness when liquid crystal is sealed in the liquid crystal cell,
There is a problem that the optical phase difference and the like cannot be obtained accurately.

〔発明の構成〕[Configuration of the invention]

(課題を解決するための手段) 上述の課題を達成するために、本発明の液晶セルおよ
び液晶の物性値測定方法は、次の2通りの方法をとって
いる。
(Means for Solving the Problems) In order to achieve the above-described problems, the liquid crystal cell and the method for measuring physical properties of the liquid crystal according to the present invention employ the following two methods.

第1の方法は、基板間に液晶組成物を狭持してなる液
晶セルを第一および第二の偏光子の間に配置したときの
透過スペクトルT(θ,λ)と、この第一、第二の偏光
子の少なくとも一方の偏光子の角度を略90度変えたとき
の透過スペクトルT(θ+π/2,λ)との関係式 TLC={[T(θ,λ)-T(θ+π/2,λ)/[T(θ,λ)+T(θ+π/2,λ)]+1}/2 により示される透過スペクトルTLCからこの液晶セルの
液晶層の光学位相差を求めることを特徴とする液晶セル
および液晶の物性値測定方法である。
The first method is to provide a transmission spectrum T (θ, λ) when a liquid crystal cell having a liquid crystal composition sandwiched between substrates is disposed between first and second polarizers, Relational expression TLC = {[T (θ, λ) -T (θ + π) with the transmission spectrum T (θ + π / 2, λ) when the angle of at least one of the second polarizers is changed by approximately 90 degrees. / 2, λ) / [T (θ, λ) + T (θ + π / 2, λ)] + 1} / 2 to determine the optical phase difference of the liquid crystal layer of the liquid crystal cell from the transmission spectrum TLC. This is a method for measuring physical properties of a liquid crystal cell and a liquid crystal, which is a feature.

また第2の方法は、基板間に液晶組成物を狭持してな
る液晶セルを第一および第二の偏光子の間に配置したと
きの透過スペクトルT(θ,λ)と、この第一、第二の
偏光子の少なくとも一方の偏光子の角度を略90度変えた
ときの透過スペクトルT(θ+π/2,λ)と、第一、第
二の偏光子の直交透過率(TPT 2+PPA 2)および平行透過
率(2TPT×TPA)から、 式TLC(θ,λ) ={[T(θ,λ)-T(θ+π/2,λ)]/[2TPT×TPA-TPT 2-TPA 2]+1}/2 により求められるスペクトルTLC(θ,λ)から液晶セ
ルの液晶層の光学位相差を求めることを特徴とする液晶
セルおよび液晶の物性値測定方法である。
In the second method, a transmission spectrum T (θ, λ) when a liquid crystal cell having a liquid crystal composition sandwiched between substrates is arranged between first and second polarizers, , The transmission spectrum T (θ + π / 2, λ) when the angle of at least one of the second polarizers is changed by approximately 90 degrees, and the orthogonal transmittance (T PT 2 ) of the first and second polarizers. + P PA 2 ) and the parallel transmittance (2T PT × T PA ), the equation T LC (θ, λ) = {[T (θ, λ) -T (θ + π / 2, λ)] / [2T PT × T The liquid crystal cell and the physical properties of the liquid crystal, wherein the optical phase difference of the liquid crystal layer of the liquid crystal cell is obtained from the spectrum T LC (θ, λ) obtained by PA- T PT 2 -T PA 2 ] +1} / 2 It is a measuring method.

また、本発明の測定装置は、上記記載の測定方法を用
いた測定装置である。
The measuring device of the present invention is a measuring device using the above-described measuring method.

(作用) 一般に、液晶素子に対して垂直入射する波長λの光の
透過率T(λ)は、次式のように表される。
(Operation) In general, the transmittance T (λ) of light having a wavelength λ that is perpendicularly incident on a liquid crystal element is expressed by the following equation.

T(λ)=TPT 2×T0×TLC(λ) +2TPT×TPA×T0×{1−TLC(λ)} +TPA 2×T0×TLC(λ) ここで、TPTおよびTPAは偏光子の透過率であり、それ
ぞれ TPT:偏光子の透過軸に平行な偏光成分に対する透過率 TPA:偏光子の吸収軸に平行な偏光成分に対する透過率 である。
T (λ) = T PT 2 × T 0 × T LC (λ) + 2T PT × T PA × T 0 × {1-T LC (λ)} + T PA 2 × T 0 × T LC (λ) where T PT and T PA is the transmittance of the polarizer, respectively T PT: transmittance T PA on the polarization component parallel to the transmission axis of the polarizer: a transmittance of a polarization component parallel to the absorption axis of the polarizer.

また、T0はガラス・I.T.O.・配向膜・カラーフィルタ
などの吸収および干渉の項、TLC(λ)は理想的な(理
論計算で表される意)液晶素子の透過率である。
T 0 is a term of absorption and interference of glass, ITO, an alignment film, a color filter, and the like, and T LC (λ) is an ideal (expressed by theoretical calculation) transmittance of a liquid crystal element.

偏光子の偏光度が十分高ければ、 TPA=0 であり、透過率T(λ)は T(λ)=TPT 2×T0×TLC(λ) となる。If the degree of polarization of the polarizer is sufficiently high, T PA = 0, and the transmittance T (λ) is T (λ) = T PT 2 × T 0 × T LC (λ).

一方の偏光子の角度が、例えばθのときの透過率T
(θ,λ)と、θ+π/2のときの透過率 T(θ+π/2,λ)はそれぞれ、 T(θ,λ)=TPT 2×T0×TLC(θ,λ) T(θ+π/2,λ)=TPT 2×T0×TLC(θ+π/2,λ) 一方、理想的な液晶素子では、 TLC(θ,λ)=1−TLC(θ+π/2,λ) が成り立つから、 TLC(θ,λ) ={[T(θ,λ)-T(θ+π/2,λ)/[T(θ,λ)+T(θ+π/2,λ)+1}/2 となる。
The transmittance T when the angle of one polarizer is, for example, θ
(Theta, lambda) and the transmittance T (θ + π / 2, λ) when the θ + π / 2, respectively, T (θ, λ) = T PT 2 × T 0 × T LC (θ, λ) T (θ + π / 2, λ) = T PT 2 × T 0 × T LC (θ + π / 2, λ) On the other hand, in an ideal liquid crystal element, T LC (θ, λ) = 1−T LC (θ + π / 2, λ) Holds, T LC (θ, λ) = {[T (θ, λ) -T (θ + π / 2, λ) / [T (θ, λ) + T (θ + π / 2, λ) +1} / It becomes 2.

また、偏光度が高くない場合は、あらがじめ偏光子の
直交透過率(TPT 2+TPA 2)と平行透過率(2TPT×TPA
を測定しておくことにより、次式でTLC(θ,λ)を計
算できる。
When the degree of polarization is not high, the orthogonal transmittance (T PT 2 + T PA 2 ) and the parallel transmittance (2T PT × T PA ) of the polarizer are preliminarily determined.
By measuring, T LC (θ, λ) can be calculated by the following equation.

TLC(θ,λ) ={[T(θ,λ)-T(θ+π/2,λ)]/[2TPT×TPA-TPT 2-TPA 2]+1}/2 よって、一方の偏光子の角度をπ/2ずらした2つの測
定結果より、理想的な液晶素子の、すなわち、ガラス・
I.T.O.・配向膜・カラーフィルタなどの吸収および干渉
の影響が除かれた透過スペクトルが得られる。これは液
晶素子を構成するこれら多層膜の中で液晶層のみが複屈
折性を持つためである。
T LC (θ, λ) = {[T (θ, λ) -T (θ + π / 2, λ)] / [2T PT × T PA -T PT 2 -T PA 2 ] +1} / 2 From the two measurement results obtained by shifting the angle of the polarizer by π / 2, the ideal liquid crystal element,
A transmission spectrum free of the influence of absorption and interference from ITO, alignment films, color filters, etc. can be obtained. This is because only the liquid crystal layer among these multilayer films constituting the liquid crystal element has birefringence.

この様にして得られた透過スペクトルを解析すること
により、液晶セルの液晶層の光学位相差、液晶層の厚
み、液晶の複屈折率を精度良く求めることができる。
By analyzing the transmission spectrum thus obtained, the optical retardation of the liquid crystal layer of the liquid crystal cell, the thickness of the liquid crystal layer, and the birefringence of the liquid crystal can be accurately determined.

透過スペクトルとこれらの値との関係を表す理論式は
いくつか知られているが、例えば、通常のTNやST(スー
パーツイスト)のセルについて解析する場合は、計算が
簡単なレインズ(Raynes)によって報告された近似式
(E.P.Raynes,Mol.Cryst.Liq.Cyrst.Lett.10,2−4(19
74))をチルト角を考慮できるように拡張して用いても
良い。ツイスト角φ、チルト角θのST(あるいはTN)セ
ルの透過率Tは次式で与えられる。
Some theoretical formulas are known to express the relationship between the transmission spectrum and these values. For example, when analyzing a normal TN or ST (super twist) cell, it is necessary to use Raynes, which is easy to calculate. The reported approximate expression (EPRaynes, Mol. Cryst. Liq. Cyrst. Lett. 10, 2-4 (19
74)) may be extended so that the tilt angle can be considered. The transmittance T of an ST (or TN) cell having a twist angle φ and a tilt angle θ is given by the following equation.

T={cosβcos(φ−Pf+Pr)+(1+α−1/2・sinβsin(φ−Pf+Pr)}
+α2/(1+α)Sin2βcos2(φ−Pf−Pr) ここで、 α=π・p・d/φλ β=φ・(1+α1/2 p=ne・(1+ωsin2θ)−1/2+no ω=(ne/no−1 λ:光の波長 d:セル厚 ne:異常光に対する液晶の屈折率 no:常光に対する液晶の屈折率 であり、また、角度の定義は次のおりである。すべての
角度はリア基板のラビング方向20を基準として、反時計
回りを正に定義しており、第2図において、第1の偏光
子角度Pfはリア基板のラビング方向20に対して第1の偏
光子の偏光軸22のなす角度、第2の偏光子角度Prはリア
基板のラビング方向20に対して第2の偏光子の偏光軸23
のなす角度、ツイスト角φはリア基板のラビング方向20
に対してフロント基板のラビング方向21のなす角度であ
る。
T = {cosβcos (φ−Pf + Pr) + (1 + α 2 ) −1 / 2 · sinβsin (φ−Pf + Pr)}
2 + α 2 / (1 + α 2 ) Sin 2 βcos 2 (φ−Pf−Pr) where α = π · p · d / φλ β = φ · (1 + α 2 ) 1/2 p = ne · (1 + ωsin 2 θ ) -1/2 + n o ω = ( n e / n o) 2 -1 λ: wavelength of the light d: cell thickness n e: refractive index of the liquid crystal with respect to extraordinary light n o: a refractive index of the liquid crystal with respect to ordinary light, The definition of the angle is as follows. All angles are positively defined counterclockwise with respect to the rubbing direction 20 of the rear substrate. In FIG. 2, the first polarizer angle Pf is the first angle relative to the rubbing direction 20 of the rear substrate. The angle between the polarization axis 22 of the polarizer and the second polarizer angle Pr is different from the rubbing direction 20 of the rear substrate with respect to the polarization axis 23 of the second polarizer.
Angle, twist angle φ is the rubbing direction of the rear substrate 20
With respect to the rubbing direction 21 of the front substrate.

この式では液晶層の実効的な光学位相差はp・dであ
り、透過率Tに含まれる他のパラメータはツイスト角や
偏光子角度であり容易に知ることができるので、p・d
は透過率Tから求められる。また、複屈折率pかセル厚
dの一方が求められていれば、もう一方も求められるこ
とになる。pはチルト角の影響を含んだ実効的な複屈折
率であり、チルト角θ=0゜ならばp=Δn(=ne
no)となる。チルト角は配向膜の性質によって、ほぼ決
定されることが多いので、あらかじめ用いる配向膜と液
晶とについて、チルト角を磁場印加法等で調べておけば
良い。
In this equation, the effective optical phase difference of the liquid crystal layer is p · d, and the other parameters included in the transmittance T are the twist angle and the polarizer angle, which can be easily known.
Is determined from the transmittance T. If one of the birefringence p and the cell thickness d is determined, the other is also determined. p is the effective birefringence, including the influence of the tilt angle, if the tilt angle theta = 0 ° p = Δn (= n e -
n o ). Since the tilt angle is almost always determined by the properties of the alignment film, the tilt angle of the alignment film and the liquid crystal to be used may be determined in advance by a magnetic field application method or the like.

ここではST形液晶素子の例について説明したが、本発
明の測定方法は表示モードや解析法についてなんら限定
するものではなく、他の表示モードについても本発明の
測定方法に従って得られた通過スペクトルデータに対
し、それぞれの表示モードに適した解析を行えば良い。
Although the example of the ST type liquid crystal element has been described here, the measurement method of the present invention does not limit the display mode and the analysis method at all, and the transmission spectrum data obtained according to the measurement method of the present invention is also applicable to other display modes. However, analysis suitable for each display mode may be performed.

(実施例) 以下、本発明の実施例を図面を用いて説明する。(Example) Hereinafter, an example of the present invention will be described with reference to the drawings.

第1図は本発明による測定装置の1実施例の概略図で
ある。測定試料1を支持する試料ステージ2の前後に第
1、第2の偏光子3,4が配置されており、さらにその外
側に光源5が、また、光源5の反対側に分光測定器6と
して例えばスペクトラスーキャンPR−702AM(PHOTO RE
SEACH社製)が配置されており、光源5からでた光は偏
光子3、測定試料1、偏光子4を経て、分光測定器6に
入射する。第1,第2の偏光子3,4はそれぞれステッピン
グモータ13,14により回転するようになっており、コン
トローラボックス7がこれらのステッピングモータを制
御している。また、これらの測定系の傍らにパーソナル
コンピュータ8としてJ−3100GX(東芝製)が設置して
あり、コントローラボックス7および分光測定器6をGP
IBを介して制御している。パーソナルコンピュータ8は
測定モードになると、まずコントローラボックス7に制
御信号を送り、第1,第2の偏光子3,4を指定の角度に回
転させる。次にパーソナルコンピュータ8は分光測定器
6に制御信号を送り、1回目の透過スペクトルの測定が
開始される。透過スペクトルの測定が終了すると、分光
測定器6からパーソナルコンピュータ8へ1回目の透過
スペクトルが送信される。次いで、パーソナルコンピュ
ータ8は再びコントローラボックス7に制御信号を送
り、第2の偏光子4を90度回転させる。そして、パーソ
ナルコンピュータ8は分光測定器6に制御信号を送り、
2回目の透過スペクトルの測定が開始される。分光測定
器6からパーソナルコンピュータ8へ2回目の透過スペ
クトルが送信されると引き続き、解析モードとなる。
FIG. 1 is a schematic view of one embodiment of a measuring device according to the present invention. First and second polarizers 3 and 4 are arranged before and after a sample stage 2 that supports a measurement sample 1, and a light source 5 is further provided outside the first and second polarizers 3 and 4, and a spectrometer 6 is provided on the opposite side of the light source 5. For example, Spectra Sucan PR-702AM (PHOTO RE
(Manufactured by SEACH), and the light emitted from the light source 5 passes through the polarizer 3, the measurement sample 1, and the polarizer 4, and then enters the spectrometer 6. The first and second polarizers 3 and 4 are rotated by stepping motors 13 and 14, respectively, and the controller box 7 controls these stepping motors. A J-3100GX (manufactured by Toshiba) is installed as a personal computer 8 beside these measurement systems, and the controller box 7 and the spectrometer 6 are connected to a GP.
Controlled via IB. When the personal computer 8 enters the measurement mode, it first sends a control signal to the controller box 7 to rotate the first and second polarizers 3 and 4 to a specified angle. Next, the personal computer 8 sends a control signal to the spectrometer 6 to start the first measurement of the transmission spectrum. When the measurement of the transmission spectrum is completed, the first transmission spectrum is transmitted from the spectrometer 6 to the personal computer 8. Next, the personal computer 8 sends a control signal to the controller box 7 again to rotate the second polarizer 4 by 90 degrees. Then, the personal computer 8 sends a control signal to the spectrometer 6 and
The second measurement of the transmission spectrum is started. When the second transmission spectrum is transmitted from the spectrometer 6 to the personal computer 8, the analysis mode is set.

解析モードでは、パーソナルコンピュータ8は2つの
透過スペクトルから作用の項で述べたように理想的な液
晶素子の透過スペクトルを計算し、グラフ化する。ま
た、パーソナルコンピュータ8にあらかじめ測定してお
いた屈折率の値を入力し、セル厚dをパラメータとして
レインズ(Raynes)の近似式による計算を行う。こうし
て、計算値と上記の実測値の比較をしずれが最小となる
ときのセル厚dを求める。
In the analysis mode, the personal computer 8 calculates the ideal transmission spectrum of the liquid crystal element from the two transmission spectra and graphs the transmission spectrum as described in the section of operation. Further, a value of the refractive index measured in advance is input to the personal computer 8, and the calculation is performed by the approximate expression of Raynes using the cell thickness d as a parameter. In this way, the calculated value is compared with the actually measured value to determine the cell thickness d at which the deviation is minimized.

第3図乃至第7図は、ST形液晶セルを測定試料1とし
て、実測の透過スペクトルとセル厚dを変えてレインズ
(Raynes)の近似式により計算した透過スペクトルとを
比較した例である。セル厚6.51μmとしたときの計算結
果が実測と最も良く一致しており、セル厚は6.51μmと
求められる。なお、実線は実測であり、点線は計算結果
である。
FIGS. 3 to 7 show an example in which an ST-type liquid crystal cell is used as a measurement sample 1 and an actually measured transmission spectrum is compared with a transmission spectrum calculated by the approximate formula of Raynes by changing the cell thickness d. The calculation result when the cell thickness is 6.51 μm is most consistent with the actual measurement, and the cell thickness is determined to be 6.51 μm. The solid line is the actual measurement, and the dotted line is the calculation result.

〔発明の効果〕〔The invention's effect〕

本発明は、液晶の複屈折性を利用することにより、液
晶入りセルの光学位相差やセル厚、液晶の複屈折率が正
確に得られる。また、本発明により、ガラス・I.T.O.・
カラーフィルタなどの吸収および干渉に影響されず、複
屈折位相差やセル厚の精度の良い測定が行える。
In the present invention, by utilizing the birefringence of the liquid crystal, the optical phase difference and cell thickness of the cell containing the liquid crystal and the birefringence of the liquid crystal can be accurately obtained. In addition, according to the present invention, glass, ITO,
Accurate measurement of birefringence phase difference and cell thickness can be performed without being affected by absorption and interference of a color filter or the like.

さらに、本発明は基板上にTFTやMIM等のアクティブ素
子があっても適用でき、ST形液晶表示素子のみならず各
種のモードの液晶素子に適用できることは言うまでもな
い。
Further, the present invention can be applied even when an active element such as TFT or MIM is provided on the substrate, and it goes without saying that the present invention can be applied to liquid crystal elements of various modes as well as ST type liquid crystal display elements.

【図面の簡単な説明】[Brief description of the drawings]

第1図は本発明による測定装置の1実施例を示す概略
図、第2図は液晶セルのラビング方向と偏光子の角度の
定義を示す図、第3図乃至第7図はST形液晶セルについ
て実測の透過スペクトルとセル厚dを変えてシミュレー
ション計算した透過スペクトルとを比較した説明図であ
る。 1……測定試料、2……試料ステージ 3……第1の偏光子、4……第2の偏光子 5……光源、6……分光測定器 7……コントローラボックス 8……パーソナルコンピュータ 13,14……ステッピングモータ 20……リア基板のラビング方向 21……フロント基板のラビング方向 22……第1の偏光子の偏光軸 23……第2の偏光子の偏光軸
FIG. 1 is a schematic diagram showing one embodiment of a measuring device according to the present invention, FIG. 2 is a diagram showing a definition of a rubbing direction of a liquid crystal cell and an angle of a polarizer, and FIGS. 3 to 7 are ST type liquid crystal cells. FIG. 4 is an explanatory diagram comparing a measured transmission spectrum with a transmission spectrum calculated by simulation with changing the cell thickness d. DESCRIPTION OF SYMBOLS 1 ... Measurement sample, 2 ... Sample stage 3 ... First polarizer, 4 ... Second polarizer 5 ... Light source, 6 ... Spectrometer 7 ... Control box 8 ... Personal computer 13 , 14 stepping motor 20 rubbing direction of rear substrate 21 rubbing direction of front substrate 22 polarization axis of first polarizer 23 polarization axis of second polarizer

Claims (3)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】基板間に液晶組成物を狭持してなる液晶セ
ルを第一および第二の偏光子の間に配置したときの透過
スペクトルT(θ,λ)と、 この第一、第二の偏光子の少なくとも一方の偏光子の角
度を略90度変えたときの透過スペクトルT(θ+π/2,
λ)との関係式 TLC={[T(θ,λ)-T(θ+π/2,λ)/[T(θ,λ)+T(θ+π/2,λ)]+1}/2 により示される透過スペクトルTLCから前記液晶セルの
液晶層の光学位相差を求めることを特徴とする液晶セル
および液晶の物性値測定方法。
1. A transmission spectrum T (θ, λ) when a liquid crystal cell having a liquid crystal composition sandwiched between substrates is disposed between first and second polarizers. Transmission spectrum T (θ + π / 2, when the angle of at least one of the two polarizers is changed by approximately 90 degrees)
λ) and TLC = {[T (θ, λ) -T (θ + π / 2, λ) / [T (θ, λ) + T (θ + π / 2, λ)] + 1} / 2 A method for measuring physical properties of a liquid crystal cell and a liquid crystal, wherein an optical phase difference of a liquid crystal layer of the liquid crystal cell is obtained from a transmission spectrum TLC shown.
【請求項2】基板間に液晶組成物を狭持してなる液晶セ
ルを第一および第二の偏光子の間に配置したときの透過
スペクトルT(θ,λ)と、この第一、第二の偏光子の
少なくとも一方の偏光子の角度を略90度変えたときの透
過スペクトルT(θ+π/2,λ)と、第一、第二の偏光
子の直交透過率(TPT 2+TPA 2)および平行透過率(2TPT
×TPA)から、 式TLC(θ,λ) ={[T(θ,λ)-T(θ+π/2,λ)/[2TPT×TPA-TPT 2-TPA 2]+1}/2 により求められるスペクトルTLC(θ,λ)から液晶セ
ルの液晶層の光学位相差を求めることを特徴とする液晶
セルおよび液晶の物性値測定方法。
2. A transmission spectrum T (θ, λ) when a liquid crystal cell having a liquid crystal composition sandwiched between substrates is disposed between first and second polarizers. The transmission spectrum T (θ + π / 2, λ) when the angle of at least one of the two polarizers is changed by approximately 90 degrees, and the orthogonal transmittance (T PT 2 + T PA ) of the first and second polarizers 2 ) and parallel transmittance (2T PT
× T PA ), the equation T LC (θ, λ) = {[T (θ, λ) -T (θ + π / 2, λ) / [2T PT × T PA -T PT 2 -T PA 2 ] +1 A method for measuring physical properties of a liquid crystal cell and a liquid crystal, wherein an optical phase difference of a liquid crystal layer of the liquid crystal cell is obtained from a spectrum T LC (θ, λ) obtained by} / 2.
【請求項3】請求項1あるいは2に記載の測定方法を用
いた液晶セルおよび液晶の物性値測定装置。
3. A liquid crystal cell and an apparatus for measuring physical properties of liquid crystals using the measuring method according to claim 1.
JP2193127A 1990-07-23 1990-07-23 Liquid crystal cell and method for measuring physical properties of liquid crystal and measuring apparatus using the same Expired - Fee Related JP2635803B2 (en)

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JP2635803B2 true JP2635803B2 (en) 1997-07-30

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW477897B (en) 1999-05-07 2002-03-01 Sharp Kk Liquid crystal display device, method and device to measure cell thickness of liquid crystal display device, and phase difference plate using the method thereof
JP2002071319A (en) * 2000-09-01 2002-03-08 Seiko Epson Corp Detection method and control system for cell thickness, and manufacturing method for liquid crystal device

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