JPH01160371U - - Google Patents
Info
- Publication number
- JPH01160371U JPH01160371U JP5837288U JP5837288U JPH01160371U JP H01160371 U JPH01160371 U JP H01160371U JP 5837288 U JP5837288 U JP 5837288U JP 5837288 U JP5837288 U JP 5837288U JP H01160371 U JPH01160371 U JP H01160371U
- Authority
- JP
- Japan
- Prior art keywords
- insulator
- heating element
- power
- probe
- generating heating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 4
- 239000012212 insulator Substances 0.000 claims description 3
- 238000010438 heat treatment Methods 0.000 claims 2
- 238000005485 electric heating Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5837288U JPH01160371U (da) | 1988-04-27 | 1988-04-27 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5837288U JPH01160371U (da) | 1988-04-27 | 1988-04-27 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01160371U true JPH01160371U (da) | 1989-11-07 |
Family
ID=31284187
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5837288U Pending JPH01160371U (da) | 1988-04-27 | 1988-04-27 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01160371U (da) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009192309A (ja) * | 2008-02-13 | 2009-08-27 | Shinko Electric Ind Co Ltd | 半導体検査装置 |
-
1988
- 1988-04-27 JP JP5837288U patent/JPH01160371U/ja active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009192309A (ja) * | 2008-02-13 | 2009-08-27 | Shinko Electric Ind Co Ltd | 半導体検査装置 |