JPH01154245A - Automatic display system for trouble area - Google Patents

Abstract

PURPOSE:To facilitate a test job by displaying a hardware state including a trouble area concurrently with occurrence of a trouble. CONSTITUTION:When an error analyzing part 1 analyzes the scan-out data and specifies an error latch, the relevant flag code is stored in an external memory 6 via a FLAG code storing part 3. While a display control part 4 displays the relevant FLAG code at a console display part 7. A scan page retrieving part 2 retrieves a table 8 based on the information on the error latch obtained by the part 1 and delivers the information showing an specific scan page where said error latch is included to a scan page display part 5. The part 5 produces the information where an error latch number 9 and a scan page number 10 set opposite to each other and displays this information on the part 7 via the part 4.

Description

[Detailed Description of the Invention] [Summary] The present invention relates to a method for displaying scan-out information in an information processing device having a scan-in/scan-out function of an internal flip-flop circuit, and relates to a method for displaying scan-out information on a flip-flop in an error state. The purpose of the present invention is to provide a means by which an operator can easily and quickly know which page of the scan-out list the flip-flop circuit is located on, by analyzing the read information related to the state of each flip-flop circuit, Means for detecting a flip-flop circuit whose state lacks normality, and means for identifying which page of a list in which the states of all flip-flop circuits are read out and arranged, the flip-flop circuit belongs to. -, a number of a flip-flop circuit whose state lacks normality, and means for outputting a page number of a list in which state information regarding the flip-flop circuit exists.

[Industrial Field of Application] The present invention relates to searching for failures in main body devices in information processing devices, and in particular, detects failures in flip-flops in an abnormal state inside the device, which is obtained by analyzing scan-out information. The present invention relates to a method capable of automatically selecting and quickly displaying a scan page of an information list in which state information of a loop circuit exists.

[Prior Art] FIG. 4 is a diagram showing an example of the configuration of an information processing device,
1 is a main system device, 52 is a service processor device (described as an SvP device in the figure. The service processor is also referred to as SVP hereinafter), and 53 is a main system device when a failure occurs; AS to analyze the cause
OA(＾automated 5can Out Ana
lysis) program, 54 is a display program, 55
56 represents an external storage device, and 56 represents a console.

In the figure, there are a large number of latches inside the main system device 51, and in certain modes each latch is connected in series through a specially provided gate to facilitate analysis in the event of a failure. By connecting the internal state of the latch to the adjacent latch every clock, the state information is output to the outside one after another (this is called scanout), and the contents of each latch at the time of failure are grasped. It is configured so that it can be done.

Using this function, it is also possible to give arbitrary data to a desired latch and check its operation at that time. (This is called scan-in) The service processor device 52 also provides error information related to various hardware (for example, 1-bit error when reading data from memory, number of retries in input/output operations, etc.) are collected and stored in the external storage device 55 as historical information (error log) related to hardware failures.

When a failure occurs in the main system device 51, the service processor device 52 analyzes the scanout data using the ASOA program 53 to identify the error latch that caused the failure.

At this time, the error log may be referred to to identify the error latch depending on the situation.

[Problems to be Solved by the Invention] When the above-mentioned ASOA program 53 analyzes the scan-out data and identifies the error latch that caused the failure, it notifies the display program 54.

The display program 54 displays this as FLAG code information on the display device of the console 56.

This FLAG code information is also stored in the external storage device 55 at the same time.

FIG. 5 shows a flowchart of such processing by the service processor.

Conventionally, the maintainer of the relevant information processing system has to check the FLA displayed on the display device of the console 56 mentioned above.
Check the error latch by looking at the G code, check which scan page the error latch is on, display the corresponding scan page on the display iff of the console 56, and check the status of the error latch. Based on this knowledge, they took measures to address the problem.

In this kind of work, you have to search the manual to find out which latch is on which scan page, but this requires knowledge and skill regarding hardware, especially when the scale of the hardware is large. In some cases, the number of pages to be scanned becomes very large, so it takes a lot of time to deal with the problem, and it is extremely difficult for an inexperienced person to do so.

SUMMARY OF THE INVENTION In view of these conventional problems, it is an object of the present invention to provide a means for automatically and quickly displaying a scanned page in which an error latch exists.

[Means for Solving the Problems] According to the present invention, the above objects are achieved by the means described in the claims. That is, the present invention connects 79717071 circuits in a device in series, and sets arbitrary data in each flip-flop circuit by sequentially transferring the state of each flip-flop circuit to an adjacent flip-flop circuit every clock. Or,
In an information processing device equipped with a function capable of reading the state of each flip-flop circuit, the read information regarding the state of each flip-flop circuit is analyzed to detect a flip-flop circuit whose state lacks normality. means for identifying which page of a list in which the states of all flip-flop circuits are read and organized, and a number of the flip-flop circuit whose state is not normal; This is an automatic fault location display system which is provided with: and means for outputting the page number of the list in which status information regarding the flip-flop circuit exists.

[Embodiment] Fig. 1 is a functional block diagram of an embodiment of the present invention, where 1 is an error analysis section, 2 is a scan/page search section, and 3 is a functional block diagram of an embodiment of the present invention.
4 is a FLAG code storage section, 4 is a display control section, 5 is a scan page display section, 6 is an external storage, 7 is a display device, and 8 is a correspondence table between latch and scan page.

These functions in the figure are realized as operations of the service processor, and when the error analysis unit 1 analyzes the scanout data and identifies an error latch, the FLAG code is stored in the FLAG code storage unit 3.
The data is stored in the external storage 6 by .

On the other hand, the display control unit 4 displays the FLAG code on the display device 7 of the console. The scan page search unit 2 searches the table 8 based on the information regarding the error latch obtained from the error analysis unit 1, and finds information on which scan page the error latch exists in. The scan page display section 5 generates information associating the error latch number 9 with the scan page number 10 as shown in FIG. , displayed on the display device 7.

FIG. 3 shows these controls as a flowchart.

In the figure, when the mode is not the test mode or the check stop mode, the scan page display operation is inhibited so as not to interfere with the normal operation of the service processor.

That is, in this flowchart, when the scan page number corresponding to the error latch is obtained, that value is set to FLAG.
This example shows a case where the page number is included in the code log information, and when the page number is in the test mode and the check stop mode, the scan page display program is called as a parameter.

[Effects of the Invention] Conventionally, during hardware testing, it required considerable skill and time to analyze error log information when a failure was detected and to identify the cause.

However, according to the present invention, the status of the hardware, including the location of the failure, can be displayed on the display almost as soon as a failure occurs, which has the advantage that even unskilled personnel can perform testing tasks quickly. .

[Brief explanation of the drawing]

FIG. 1 is a functional block diagram of an embodiment of the present invention, FIG. 2 is a diagram showing an example of display of correspondence between error latch numbers and scan page numbers, and FIG. 3 is a flowchart showing control of the embodiment.
FIG. 4 is a diagram showing an example of the configuration of an information processing device, and FIG. 5 is a flowchart showing processing of a conventional service processor. 1...Error analysis section, 2...Scan/page search section, 3...FLAG code pattern section, 4...Display control section, 5. ...Scan page display section, 6...External memory, 7...
...Display device, 8...Table, 9...
・Error latch number, 10...Scan page number Function block number 1 of the present invention 2 Fig. 3 is a flowchart for accepting the open side of the service.

Claims (1)

[Claims] By connecting flip-flop circuits in the device in series and transferring the state of each flip-flop circuit to the adjacent flip-flop circuits in sequence for each clock, arbitrary data can be transferred to each flip-flop circuit. An information processing device that has a function that can set or read the state of each flip-flop circuit analyzes the read information regarding the state of each flip-flop circuit, and identifies flip-flops whose state lacks normality. means for detecting a flip-flop circuit; means for identifying which page the flip-flop circuit belongs to in a list of read and organized states of all flip-flop circuits; 1. A fault location automatic display system, comprising means for outputting the number of a flip-flop circuit and the page number of a list in which state information regarding the flip-flop circuit exists.