JPH01142877U - - Google Patents

Info

Publication number
JPH01142877U
JPH01142877U JP4014788U JP4014788U JPH01142877U JP H01142877 U JPH01142877 U JP H01142877U JP 4014788 U JP4014788 U JP 4014788U JP 4014788 U JP4014788 U JP 4014788U JP H01142877 U JPH01142877 U JP H01142877U
Authority
JP
Japan
Prior art keywords
semiconductor
resin molded
lead
electrode
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4014788U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4014788U priority Critical patent/JPH01142877U/ja
Publication of JPH01142877U publication Critical patent/JPH01142877U/ja
Pending legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例にかかる半導体検査
装置の分解斜視図、第2図は同実施例の―断
面図、第3図は従来の半導体検査装置の分解斜視
図である。 1……半導体装置、1a……樹脂モールド部、
2,3,4……リード、2a,3a,4a……折
曲部、2a,3b,4b……根本部、5……溝部
、6……カバー、7……電極、8……電極、9,
9……電極。
FIG. 1 is an exploded perspective view of a semiconductor testing device according to an embodiment of the present invention, FIG. 2 is a sectional view of the same embodiment, and FIG. 3 is an exploded perspective view of a conventional semiconductor testing device. 1...Semiconductor device, 1a...Resin mold part,
2, 3, 4... Lead, 2a, 3a, 4a... Bent part, 2a, 3b, 4b... Root part, 5... Groove, 6... Cover, 7... Electrode, 8... Electrode, 9,
9...Electrode.

Claims (1)

【実用新案登録請求の範囲】 樹脂モールド型半導体装置の各リードを介して
電気的特性検査を行う半導体検査装置において、 少なくとも上記半導体装置の樹脂モールド部か
ら延びる各リードの根本部に接触する電極を具備
してなる半導体検査装置。
[Claims for Utility Model Registration] A semiconductor testing device that tests electrical characteristics through each lead of a resin molded semiconductor device, at least an electrode that contacts the base of each lead extending from the resin molded portion of the semiconductor device. A semiconductor inspection device comprising:
JP4014788U 1988-03-25 1988-03-25 Pending JPH01142877U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4014788U JPH01142877U (en) 1988-03-25 1988-03-25

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4014788U JPH01142877U (en) 1988-03-25 1988-03-25

Publications (1)

Publication Number Publication Date
JPH01142877U true JPH01142877U (en) 1989-09-29

Family

ID=31266622

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4014788U Pending JPH01142877U (en) 1988-03-25 1988-03-25

Country Status (1)

Country Link
JP (1) JPH01142877U (en)

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