JPH01136469U - - Google Patents

Info

Publication number
JPH01136469U
JPH01136469U JP3277988U JP3277988U JPH01136469U JP H01136469 U JPH01136469 U JP H01136469U JP 3277988 U JP3277988 U JP 3277988U JP 3277988 U JP3277988 U JP 3277988U JP H01136469 U JPH01136469 U JP H01136469U
Authority
JP
Japan
Prior art keywords
pellet
tested
electrodes
apply
electrical signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3277988U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3277988U priority Critical patent/JPH01136469U/ja
Publication of JPH01136469U publication Critical patent/JPH01136469U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP3277988U 1988-03-11 1988-03-11 Pending JPH01136469U (enrdf_load_html_response)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3277988U JPH01136469U (enrdf_load_html_response) 1988-03-11 1988-03-11

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3277988U JPH01136469U (enrdf_load_html_response) 1988-03-11 1988-03-11

Publications (1)

Publication Number Publication Date
JPH01136469U true JPH01136469U (enrdf_load_html_response) 1989-09-19

Family

ID=31259352

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3277988U Pending JPH01136469U (enrdf_load_html_response) 1988-03-11 1988-03-11

Country Status (1)

Country Link
JP (1) JPH01136469U (enrdf_load_html_response)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6193966A (ja) * 1984-10-15 1986-05-12 Sharp Corp 半導体素子の試験方法
JPS6274590A (ja) * 1985-09-24 1987-04-06 株式会社トーキン 電磁式ピツチ開閉機構

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6193966A (ja) * 1984-10-15 1986-05-12 Sharp Corp 半導体素子の試験方法
JPS6274590A (ja) * 1985-09-24 1987-04-06 株式会社トーキン 電磁式ピツチ開閉機構

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