JPH01123757A - Thick film type thermal head - Google Patents

Thick film type thermal head

Info

Publication number
JPH01123757A
JPH01123757A JP28265687A JP28265687A JPH01123757A JP H01123757 A JPH01123757 A JP H01123757A JP 28265687 A JP28265687 A JP 28265687A JP 28265687 A JP28265687 A JP 28265687A JP H01123757 A JPH01123757 A JP H01123757A
Authority
JP
Japan
Prior art keywords
resistor
heating resistor
electrode
thermal head
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP28265687A
Other languages
Japanese (ja)
Other versions
JP2569620B2 (en
Inventor
Yoshinori Yamaguchi
義紀 山口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Business Innovation Corp
Original Assignee
Fuji Xerox Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Xerox Co Ltd filed Critical Fuji Xerox Co Ltd
Priority to JP62282656A priority Critical patent/JP2569620B2/en
Publication of JPH01123757A publication Critical patent/JPH01123757A/en
Application granted granted Critical
Publication of JP2569620B2 publication Critical patent/JP2569620B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PURPOSE:To eliminate the abnormal rise of contact resistance of a heat generating resistor with electrodes by forming the section of the resistor for forming a head in a sub-scanning direction in a special trapezoidal shape, and disposing both the edges of the upper side of the resistor at the same line as the ends of a common electrode, discrete electrodes on a substrate or outside. CONSTITUTION:A heat generating resistor 4 is formed in a trapezoidal shape having an upper side substantially parallel to a ceramic substrate 1, the taper angles of the edges E0, E0' of the upper side is theta>=90 deg., and the ends Q1, Q1' of the contacts of electrodes 2, 2' with the resistor 4 are disposed inside the edges E0, E0'. Here, when corresponding point on the substrate 1 is E1, corresponding point of E0' is E1', and the widths of the E1 and Q1, the E1' and the Q1' are W1, W1', the W1, W1' are desirably approx. 1-5mum. If the W is excessively large, the heat generated from the resistor is dissipated through the electrode having good thermal conductivity, and power consumption is increased. Eventually, a wear resistance layer 5 is formed on the resistor 4, and wired by gold wirings 7 with an IC 6 placed on the other electrode on the substrate 1, thereby completing it.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は厚膜型サーマルヘッドに係り、特に印字品質を
向上させ、歩留まりを向上させるために、電極と発熱抵
抗体の接触部を改良した厚膜型サーマルヘッドに関する
[Detailed Description of the Invention] [Field of Industrial Application] The present invention relates to a thick-film thermal head, and in particular, in order to improve printing quality and yield, the contact area between the electrode and the heating resistor is improved. Regarding thick film type thermal head.

〔従来の技術〕[Conventional technology]

従来、各種のプリンタやファクシミリ等における感熱記
録装置として、厚膜型サーマルヘッドが用いられている
。この厚膜型サーマルヘッドは通常、厚膜ペーストをス
クリーン印刷することによって製作されていた。しかし
、この方法で製作したものは発熱抵抗体の線幅や膜厚の
バラツキが大きく、このため抵抗値のバラツキや熱容量
のバラツキがあり、印字品質の劣化の原因となっていた
Conventionally, thick-film thermal heads have been used as thermal recording devices in various printers, facsimile machines, and the like. This thick film type thermal head has usually been manufactured by screen printing a thick film paste. However, in the products manufactured using this method, there are large variations in the line width and film thickness of the heat generating resistor, resulting in variations in resistance value and variation in heat capacity, which causes deterioration in printing quality.

このような欠点を解決するため、電極を形成したセラミ
ック基板上に、発熱抵抗体の形成位置に開口部を有する
感光性レジスト膜を形成し、該開口部に抵抗ペーストを
埋め込んで発熱抵抗体を形成する方法が開発されている
In order to solve these drawbacks, a photosensitive resist film having an opening at the position where the heating resistor is formed is formed on the ceramic substrate on which the electrode is formed, and a resistor paste is embedded in the opening to form the heating resistor. A method has been developed to form

ところがこの方法で製造する際の感光性レジストに設け
られた開口部の側壁は通常テーパ状となるので、この開
口部に抵抗ペーストを埋め込んで形成される発熱抵抗体
の断面は逆テーパ状(逆の台形)となる。
However, when manufacturing with this method, the sidewalls of the openings provided in the photosensitive resist are usually tapered, so the cross section of the heating resistor formed by embedding the resistor paste in the openings is reverse tapered (reversely tapered). ).

第4図及び第5図によりこれを説明する。This will be explained with reference to FIGS. 4 and 5.

第4図は個別対向型厚膜サーマルヘッドの上面図であり
、第5図は上記従来法で形成したサーマルヘッドの副走
査方向の断面図である(例えば第4図のa−a’線に沿
った断面図)。
FIG. 4 is a top view of the individually opposed thick-film thermal head, and FIG. 5 is a cross-sectional view in the sub-scanning direction of the thermal head formed by the above-mentioned conventional method (for example, along line a-a' in FIG. cross-sectional view).

第5図から明らかな如く、発熱抵抗体40における、基
板1と反対側で上部の左右に存在するテーパ角がθ<9
0”となる、従って、この部分で左右にエツジE、E’
が外方へ突出した形状となる。
As is clear from FIG. 5, the taper angle of the heating resistor 40 on the left and right sides of the upper part on the side opposite to the substrate 1 is θ<9.
0'', therefore, there are edges E and E' on the left and right in this part.
has a shape that protrudes outward.

このような形状では発熱抵抗体40上に耐摩耗層を形成
してもエツジE、E’が突出することになり、用紙が破
損したりするなど印字品質の低下を招く。このエツジを
完全に覆うために耐摩耗層を厚塗りすると、発熱体系の
熱容量が大き、くなり、消費電力が増大する。
In such a shape, even if a wear-resistant layer is formed on the heating resistor 40, the edges E and E' will protrude, leading to deterioration in printing quality such as damage to the paper. If a thick wear-resistant layer is applied to completely cover this edge, the heat capacity of the heating system will be large and the power consumption will increase.

これらの問題点を解決するため、開口部を有する感光性
レジストを設ける際、この開口部の側壁が基板面に対し
て鋭角となるように露光し、該開口部に埋め込まれる発
熱抵抗体の断面形状が台形でかつ、上底と斜辺とのなす
角(テーパ角)θがθ〉90°となるようにするサーマ
ルヘッドが提案されている(特願昭62−175686
号参照)。
In order to solve these problems, when providing a photosensitive resist having an opening, the side wall of the opening is exposed to light at an acute angle to the substrate surface, and a cross section of the heating resistor embedded in the opening is exposed. A thermal head has been proposed that is trapezoidal in shape and has an angle (taper angle) between the upper base and the oblique side of θ>90° (Japanese Patent Application No. 175,686/1986).
(see issue).

即ち、第6図にこの厚膜サーマルヘッドの副走査方向の
断面図を示すと、発熱抵抗体41の形状はほぼ台形であ
り、上辺のエツジEo 、EO’のテーパ角θがθ>9
0”になり、耐摩耗層からエツジE6 、EO’が突出
することを防止できる。
That is, when FIG. 6 shows a cross-sectional view of this thick-film thermal head in the sub-scanning direction, the shape of the heating resistor 41 is approximately trapezoidal, and the taper angle θ of the upper edges Eo and EO' is θ>9.
0'', thereby preventing the edges E6 and EO' from protruding from the wear-resistant layer.

(発明が解決しようとする問題点〕 ところが、第6図において、発熱抵抗体41の断面が台
形となり、その上辺のエツジ(EO、E。′)のテーパ
角θが90″以上になると、しばしばエツジEO、EO
’が、基板上の電極2.2′の先端Q、Q’より内側に
入り込むようになる。
(Problems to be Solved by the Invention) However, as shown in FIG. 6, when the heating resistor 41 has a trapezoidal cross section and the taper angle θ of the upper edge (EO, E.') is 90'' or more, Etsuji EO, EO
' comes to enter inside the tips Q and Q' of the electrodes 2.2' on the substrate.

これにより、発熱抵抗体41と電極2.2′の接触部近
傍の抵抗体の量が少ないため、即ち、電極2.2′の先
端Q、Q’近傍の発熱抵抗体41の抵抗値が局所的に上
昇し、結果的にそのビット(発熱抵抗体)の抵抗値が異
常に上昇して、基板内の各発熱抵抗体の抵抗値のバラツ
キを増大させるという問題点を生じる。
As a result, since the amount of the resistor near the contact portion between the heating resistor 41 and the electrode 2.2' is small, the resistance value of the heating resistor 41 near the tips Q and Q' of the electrode 2.2' is localized. As a result, the resistance value of the bit (heating resistor) increases abnormally, resulting in a problem that the variation in the resistance value of each heating resistor in the board increases.

従って、本発明の目的は各発熱抵抗体と電極との接触を
安定化し、各発熱抵抗体の抵抗値のバラツキを減少させ
るサーマルヘッドの構造を提供するものである。
Therefore, an object of the present invention is to provide a structure of a thermal head that stabilizes the contact between each heating resistor and an electrode and reduces variations in the resistance value of each heating resistor.

〔問題点を解決するための手段および作用〕上記の目的
を達成するため、本発明は厚膜サーマルヘッドを構成す
る発熱抵抗体の副走査方向の断面形状をそ゛の上辺のエ
ツジのテーパ角θが900≦θとなるような台形にする
とともに、該発熱抵抗体の上辺の両エツジが、基板上の
共通電極、個別電極の先端と同一線上か外側に配置され
るように構成するものである。
[Means and effects for solving the problem] In order to achieve the above object, the present invention has a cross-sectional shape in the sub-scanning direction of a heating resistor constituting a thick-film thermal head such that the taper angle θ of the upper edge The heating resistor is formed into a trapezoid shape such that 900≦θ, and both edges of the upper side of the heating resistor are arranged on the same line as or outside the tips of the common electrode and individual electrodes on the substrate. .

このような構造にすることにより、本発明のサーマルヘ
ッドの発熱抵抗体は電極とのコンタクトが十分と、なり
、電極と発熱抵抗体の接触部における抵抗値の異常上昇
を防ぐことができる。
By adopting such a structure, the heating resistor of the thermal head of the present invention has sufficient contact with the electrode, and an abnormal increase in the resistance value at the contact portion between the electrode and the heating resistor can be prevented.

〔実施例〕〔Example〕

本発明の実施例を第1図〜第3図について説明する。第
1図は零発咀の一実施例の構成説明図、第2図はその製
造工程説明図、第3図は本発明の他の実施例の構成説明
図である。
Embodiments of the present invention will be described with reference to FIGS. 1 to 3. FIG. 1 is an explanatory diagram of the configuration of one embodiment of the zero-blow-up device, FIG. 2 is an explanatory diagram of its manufacturing process, and FIG. 3 is an explanatory diagram of the configuration of another embodiment of the present invention.

これらの各図において、1はグレーズドセラミック基板
、2.2′は電極、3は感光性レジスト、4は発熱抵抗
体、5は耐摩耗層、6はrc、7は金ワイヤを示す。
In each of these figures, 1 is a glazed ceramic substrate, 2 and 2' are electrodes, 3 is a photosensitive resist, 4 is a heating resistor, 5 is a wear-resistant layer, 6 is an rc, and 7 is a gold wire.

第1図から明らかな如く、本実施例においては、発熱抵
抗体4の形状が、基板1とほぼ平行な上辺を有する台形
であるとともに、該上辺のエツジE。、E6′のテーパ
角がθ≧90°であり、各電極2.2′の発熱抵抗体4
との接触部の先端QI、QI′が上記エツジEll 、
E11’の内側に位置している。なお、この場合、発熱
抵抗体の大きさは変えずに電極の先端Q+ 、Q1’を
近ずけることにより上記のように形成することができる
。その後、第1図では図示省略した耐摩耗層を形成すれ
ばよい。
As is clear from FIG. 1, in this embodiment, the heat generating resistor 4 has a trapezoidal shape with an upper side substantially parallel to the substrate 1, and an edge E of the upper side. , the taper angle of E6' is θ≧90°, and the heating resistor 4 of each electrode 2.2'
The tips QI and QI' of the contact parts with the above-mentioned edges Ell,
It is located inside E11'. In this case, the heating resistor can be formed as described above by moving the tips Q+ and Q1' of the electrodes closer to each other without changing the size of the heating resistor. Thereafter, a wear-resistant layer (not shown in FIG. 1) may be formed.

次に第2図にその製造工程を示す。まずグレーズドセラ
ミック基板1上に導電層を全面に形成し、フォトリソエ
ツチングにより、個別に対向した複数の電極2.2′を
形成する。電極の膜厚は0.4〜4.0μm程度である
(第2図(a)参照)。
Next, FIG. 2 shows the manufacturing process. First, a conductive layer is formed on the entire surface of the glazed ceramic substrate 1, and a plurality of individually facing electrodes 2.2' are formed by photolithography. The film thickness of the electrode is about 0.4 to 4.0 μm (see FIG. 2(a)).

この電極2.2′を含むグレーズドセラミック基板1上
にネガ型の感光性レジスト3をスピンコード法、ロール
コート法、デイツプ法、スプレー法等を用いて一様に塗
布し、乾燥する。この後、所定のマスクを用いて発熱抵
抗体を設けるべき位置が開口するように露光・現像を行
う。この時の開口部は1ビツト毎に分離した開口部とし
、レジストの膜厚は10〜25μm程度である。この時
に使用した感光性レジストは露光量を調節することによ
って、レジストパターンの側壁形状を制御できるもので
あり、−例をあげると、東京応化工業株式会社製のネガ
型感光性しジス)PMERN−HC,600(商品名)
を用いた。
A negative type photosensitive resist 3 is uniformly applied onto the glazed ceramic substrate 1 including the electrodes 2.2' using a spin code method, a roll coating method, a dip method, a spray method, etc., and is dried. Thereafter, exposure and development are performed using a predetermined mask so that the position where the heating resistor is to be provided is opened. The openings at this time are separated for each bit, and the resist film thickness is about 10 to 25 μm. The photosensitive resist used at this time can control the sidewall shape of the resist pattern by adjusting the exposure amount. HC,600 (product name)
was used.

このフォトレジストのパターンの側壁形状は、露光量が
200〜300mJ/cm”で垂直、これより多い30
0〜8001IJ/cll!でテーパ形状、一方、10
0〜200mJ/cm”では逆テーパ形状となる。
The sidewall shape of this photoresist pattern is vertical when the exposure dose is 200 to 300 mJ/cm", and 30 mJ/cm" when the exposure dose is higher than this.
0~8001IJ/cll! tapered shape, while 10
0 to 200 mJ/cm'', it has a reverse tapered shape.

本実施例では上記フォトレジスト3を100〜300m
J/c+w″程度で露光し、現像して、側壁部分の形状
が逆テーパ形状のものを得る(第2図(b)参照)。
In this example, the photoresist 3 is coated with a length of 100 to 300 m.
It is exposed to light at about J/c+w'' and developed to obtain a side wall with an inversely tapered shape (see FIG. 2(b)).

次にこの開口部にドクターブレード法やスクリーン印刷
を用いて抵抗体ペースト4′を埋め込み、例えば130
℃程度の温度で乾燥する。なお、開口部以外にはみ出し
た抵抗体ペーストはラッピングシートなどで除去するが
、抵抗体は乾燥状態なので、除去は容易である(第2図
(c)参照)。
Next, a resistor paste 4' is embedded in this opening using a doctor blade method or screen printing, and a resistor paste 4', for example, 130
Dry at a temperature of about ℃. Note that the resistor paste that protrudes outside the opening is removed using a wrapping sheet or the like, but since the resistor is in a dry state, removal is easy (see FIG. 2(c)).

さらに800〜900℃の高温で焼成し、発熱抵抗体を
焼成すると同時に、感光性レジスト3を焼成・気化させ
て、発熱抵抗体4を形成する。この時発熱抵抗体4は、
感光性レジスト3の側壁の形状に応じて、多少テーパを
持つ台形となる(第2図(d)参照)。
Further, baking is performed at a high temperature of 800 to 900° C., and at the same time as the heating resistor is baked, the photosensitive resist 3 is fired and vaporized to form the heating resistor 4. At this time, the heating resistor 4 is
Depending on the shape of the side wall of the photosensitive resist 3, it becomes a trapezoid with a slight taper (see FIG. 2(d)).

ここで第2図(d)に示す如く、発熱抵抗体4の上辺の
エツジEll 、EO’は電極2.2′の先端Ql、Q
l’より外側に位置するように開口部の設計を行う。
Here, as shown in FIG. 2(d), the edges Ell and EO' on the upper side of the heating resistor 4 are the tips Ql and Q of the electrodes 2.2'.
The opening is designed to be located outside l'.

本発明では、第1図に示すようにエツジE0のセラミッ
ク基板1上の対応点をEl 、EO’の同じく対応点を
EI′、ElとQl、El’とQl’との幅をW、%W
、’とすると、w、、w、’は1〜5μm程度が望まし
い。これは、Wが大きすぎると発熱抵抗体から発生する
熱が、熱伝導率のよい電極を通して放散してしまい、消
費電力が増大してしまうためである。
In the present invention, as shown in FIG. 1, the corresponding point of edge E0 on the ceramic substrate 1 is El, the corresponding point of EO' is EI', the width of El and Ql, and the width of El' and Ql' is W,%. W
, ', w, , w, ' is preferably about 1 to 5 μm. This is because if W is too large, the heat generated from the heating resistor will be dissipated through the electrode with good thermal conductivity, resulting in increased power consumption.

最後に発熱抵抗体4上に耐摩耗層5を形成し、基板上の
他の電極上に搭載したIC6と金ワイヤ7により配線し
て厚膜サーマルヘッドを完成する(第2図(+3)参照
)。
Finally, a wear-resistant layer 5 is formed on the heating resistor 4, and the IC 6 mounted on the other electrode on the substrate is connected to the gold wire 7 to complete the thick film thermal head (see Figure 2 (+3)). ).

本発明の他の実施例を第3図に示す。この実施例では対
向する電極32.32′の間隔を従来のものと同じにし
、フォトレジストの開口部の副走査方向の、長さを大き
くすることによって上記の要件を満足するように構成す
ることができる。
Another embodiment of the invention is shown in FIG. In this embodiment, the spacing between the opposing electrodes 32, 32' is the same as in the conventional one, and the length of the opening in the photoresist in the sub-scanning direction is increased to satisfy the above requirements. Can be done.

この構成によっても前記第1の実施例と同様の効果を得
ることができる。
With this configuration as well, the same effects as in the first embodiment can be obtained.

なお、これらの実施例では発熱抵抗体のエツジのテーパ
角θがθ〉90°の台形について説明したがθ−90″
の矩形の場合も同様の効果を得ることができるのは言う
までもない。
In addition, in these embodiments, a trapezoid in which the taper angle θ of the edge of the heat generating resistor is θ>90° has been described, but it is also possible to
Needless to say, a similar effect can be obtained with a rectangle.

〔発明の効果〕〔Effect of the invention〕

本発明の構成にすることにより、サーマルヘッドの発熱
抵抗体と電極とのコンタクトが十分であるため、この部
分で抵抗値が異常に上昇することがなく、各発熱抵抗体
(ビット)毎の抵抗値のバラツキが低減され、結果とし
て、印字品質が向上し、装置の信頼性も向上する。
By adopting the configuration of the present invention, there is sufficient contact between the heating resistor of the thermal head and the electrode, so the resistance value does not increase abnormally in this part, and the resistance of each heating resistor (bit) Variations in values are reduced, resulting in improved print quality and improved device reliability.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明のサーマルヘッドの−実施例構成説明図
、 第2図は本発明の一実施例の製造工程説明図、第3図は
本発明の他の実施例の構成説明図、第4図は個別対向型
サーマルヘッドの部分構成図、 第5図は従来例のサーマルヘッドの構成説明図、第6図
は他の従来例のサーマルヘッドの構成説明図である。 1−グレーズドセラミック基板、 2.2′・−・電極、  3・−感光性レシスト、4−
・−・発熱抵抗体、   5−・−耐摩4v層、6・−
・IC,7・−命ワイヤ。 特許出願人  富士ゼロらクス株式会社代理人弁理士 
  山 谷 晧 榮 第1図 第2図
FIG. 1 is an explanatory diagram of the configuration of an embodiment of the thermal head of the present invention, FIG. 2 is an explanatory diagram of the manufacturing process of one embodiment of the present invention, and FIG. FIG. 4 is a partial configuration diagram of an individual opposing type thermal head, FIG. 5 is a configuration explanatory diagram of a conventional thermal head, and FIG. 6 is a configuration explanatory diagram of another conventional thermal head. 1-glazed ceramic substrate, 2.2'--electrode, 3--photosensitive resist, 4-
・-・Heating resistor, 5-・-wear-resistant 4V layer, 6・-
・IC, 7・-Life wire. Patent applicant: Fuji Zerolux Co., Ltd. Representative Patent Attorney
Akira Yamatani Figure 1 Figure 2

Claims (2)

【特許請求の範囲】[Claims] (1)共通電極と個別電極とを発熱抵抗体で接続する構
造のサーマルヘッドにおいて、該発熱抵抗体の副走査方
向の断面形状が少なくとも台形をなし、この台形の上辺
のエッジのテーパ角θがθ≧90°であるとともに、こ
のエッジの先端が、各対向する電極の先端と同一線上か
、又は外側に配置することを特徴とする厚膜型サーマル
ヘッド。
(1) In a thermal head having a structure in which a common electrode and individual electrodes are connected by a heating resistor, the cross-sectional shape of the heating resistor in the sub-scanning direction is at least trapezoidal, and the taper angle θ of the upper edge of the trapezoid is A thick-film thermal head characterized in that θ≧90° and the tip of this edge is disposed on the same line as the tip of each opposing electrode or on the outside.
(2)前記発熱抵抗体の断面の上辺の角と共通電極また
は個別電極の先端との幅が1〜5μmであることを特徴
とする特許請求の範囲第1項記載の厚膜型サーマルヘッ
ド。
(2) The thick film type thermal head according to claim 1, wherein the width between the corner of the upper side of the cross section of the heating resistor and the tip of the common electrode or the individual electrode is 1 to 5 μm.
JP62282656A 1987-11-09 1987-11-09 Manufacturing method of thermal head Expired - Fee Related JP2569620B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62282656A JP2569620B2 (en) 1987-11-09 1987-11-09 Manufacturing method of thermal head

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62282656A JP2569620B2 (en) 1987-11-09 1987-11-09 Manufacturing method of thermal head

Publications (2)

Publication Number Publication Date
JPH01123757A true JPH01123757A (en) 1989-05-16
JP2569620B2 JP2569620B2 (en) 1997-01-08

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ID=17655351

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP2569620B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012028405A (en) * 2010-07-20 2012-02-09 Tdk Corp Ceramic electronic component
JP2016038535A (en) * 2014-08-11 2016-03-22 東芝ライテック株式会社 Fixation heater and fixation device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4961699A (en) * 1972-05-05 1974-06-14
JPS56113480A (en) * 1980-02-15 1981-09-07 Ricoh Co Ltd Thermal head

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4961699A (en) * 1972-05-05 1974-06-14
JPS56113480A (en) * 1980-02-15 1981-09-07 Ricoh Co Ltd Thermal head

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012028405A (en) * 2010-07-20 2012-02-09 Tdk Corp Ceramic electronic component
JP2016038535A (en) * 2014-08-11 2016-03-22 東芝ライテック株式会社 Fixation heater and fixation device

Also Published As

Publication number Publication date
JP2569620B2 (en) 1997-01-08

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