JPH01117053U - - Google Patents
Info
- Publication number
- JPH01117053U JPH01117053U JP1186788U JP1186788U JPH01117053U JP H01117053 U JPH01117053 U JP H01117053U JP 1186788 U JP1186788 U JP 1186788U JP 1186788 U JP1186788 U JP 1186788U JP H01117053 U JPH01117053 U JP H01117053U
- Authority
- JP
- Japan
- Prior art keywords
- coil
- electron microscope
- scanning electron
- wound
- heating coil
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010438 heat treatment Methods 0.000 claims description 6
- 239000004020 conductor Substances 0.000 claims description 2
- 238000004154 testing of material Methods 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Description
第１図は走査型電子顕微鏡の試料室内に設置さ
れた試験片に外挿された加熱コイルを示す斜視図
、第２図ａは本考案に係る加熱コイルによつて確
保される観察領域を示す図、第２図ｂは従来の無
誘導巻き加熱コイルによつて確保される観察領域
を示す図である。
１：走査型電子顕微鏡の鏡筒、２：加熱コイル
、２Ａ：第１のコイル部、２Ｂ：第２のコイル部
、２Ｃ：接続導線、１００：観察部分、２００：
観察領域、ＣＤ１，ＣＤ２：電流の方向、ＭＤ１
，ＭＤ２：磁界の方向、ＴＰ：試験片。
Fig. 1 is a perspective view showing a heating coil extrapolated to a test piece installed in a sample chamber of a scanning electron microscope, and Fig. 2a shows an observation area secured by the heating coil according to the present invention. FIG. 2b is a diagram showing an observation area secured by a conventional non-inductively wound heating coil. DESCRIPTION OF SYMBOLS 1: Lens barrel of scanning electron microscope, 2: Heating coil, 2A: First coil part, 2B: Second coil part, 2C: Connecting conductor, 100: Observation part, 200:
Observation area, CD1, CD2: Direction of current, MD1
, MD2: direction of magnetic field, TP: test piece.
Claims (1)
を加熱しつつ負荷する材料試験機用加熱コイルに
おいて、導線が第１の方向に巻回される第１のコ
イル部と、この第１のコイル部と連なり導線が前
記第１の方向と反対の第２の方向に巻回される第
２のコイル部と、前記走査型電子顕微鏡における
観察領域を確保するように前記両コイル部を離間
させて接続する接続導線とを具備することを特徴
とする材料試験機用加熱コイル。 In a heating coil for a material testing machine that heats and loads a test piece placed in a sample chamber of a scanning electron microscope, a first coil part in which a conductive wire is wound in a first direction; and a second coil part in which a conductive wire is wound in a second direction opposite to the first direction, and both the coil parts are connected at a distance so as to secure an observation area in the scanning electron microscope. 1. A heating coil for a material testing machine, comprising a connecting conductor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1186788U JPH01117053U (en) | 1988-01-30 | 1988-01-30 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1186788U JPH01117053U (en) | 1988-01-30 | 1988-01-30 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH01117053U true JPH01117053U (en) | 1989-08-08 |
Family
ID=31220797
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1186788U Pending JPH01117053U (en) | 1988-01-30 | 1988-01-30 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01117053U (en) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6358747A (en) * | 1986-08-29 | 1988-03-14 | Agency Of Ind Science & Technol | Electron microscope |
-
1988
- 1988-01-30 JP JP1186788U patent/JPH01117053U/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6358747A (en) * | 1986-08-29 | 1988-03-14 | Agency Of Ind Science & Technol | Electron microscope |
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