JPH01114191A - Cathode-ray tube check device - Google Patents

Abstract

PURPOSE:To check and confirm the forming state of an index patterns simply by displaying a pattern image of the entire arrangement of the index pattern of a tube to be tested onto a monitor. CONSTITUTION:Pattern parts 3A, 3B of an index pattern 3 provided to the surface of a shadow mask 1 of the tube 14 to be tested emit detection light repetitively every time an electron beam is crossed and pulse signals 14A, 14B are sent from a photodetector 15 as an index pattern detection signal 14 alternately. Thus, every time the signals 14A, 14B are sent to the display screen 17A of the monitor 17, a pattern video displayed with a large brightness is obtained. Since the raster scanning of the monitor 17 is synchronized with the raster scan of the electron beam of the tube 14, the position coordinate on the screen 2 obtained for the signals 14A, 14B of the tube 14 and the position coordinate on the screen 17A of the monitor 17 with the signals 14A, 14B displayed thereupon are made nearly coincident. As a result, the video image of the entire arrangement formed on the mask 1 on the screen 17A is generated as it is.

Description

DETAILED DESCRIPTION OF THE INVENTION A. Field of Industrial Application The present invention relates to a cathode ray tube inspection device, and is particularly suitable for use in adjusting a cathode ray tube of an automatic convergence adjustment type.

By displaying a pattern image representing the inspection result on the monitor based on the detection signal obtained from the index pattern summarized in Invention B, it is possible to easily inspect the formation state of the index pattern on the entire screen.

C. Prior Art Conventionally, as a cathode ray tube of automatic convergence adjustment type, one in which an index pattern is provided in a shadow mask has been proposed (Japanese Patent Application Laid-Open No. 58-24186).

That is, as shown in FIG. 2, by attaching a fluorescent material to the surface of the shadow mask 1 on the electron gun side, a position detection pattern (this is called an index pattern) representing the position of each part over the entire surface of the screen 2 is created. When the electron beam 4 scans the screen 2 along the scanning line through the shadow mask 1, the electron beam 4 irradiates the index pattern 3 to emit detection light, and this detection The deflection position of the electron beam is automatically adjusted by converting the light into a detection signal by a photodetection element provided in the cone portion, for example, and adjusting the convergence circuit using this detection signal.

Here, each index pattern 3 has a shape called a so-called lambda pattern, and as shown in FIG. 3A, and a second pattern portion 3B extending obliquely in the form of a band at an angle of, for example, 30° with respect to the horizontal direction at a position spaced apart by a predetermined distance in the horizontal direction so as to face the second pattern portion 3A. They are arranged in a matrix at predetermined intervals in the horizontal and vertical directions.

In this way, the electron beam 4 hits the first and second pattern portions 3A.
When the approximately central position in the vertical direction of 3B is scanned in the horizontal direction (FIG. 3(A)), a pulse signal 514A rises sharply when the electron beam 4 reaches the position where it starts irradiating the pattern parts 3A and 3B. and 514B (third
(B)) can be sequentially obtained from the photodetecting elements.

However, since the first pattern portion 3A extends in the vertical direction, the rising point of the pulse signal 514A is on the screen 2.
represents the horizontal position of index pattern 3 with respect to . On the other hand, since the second pattern portion 3B extends diagonally, the time from the rising edge of the pulse signal 514A to the rising edge of the pulse signal 514B represents the vertical position of the index pattern 3.

Therefore, if the rising time of the pulse signals 514A and 5L4B for the vertical synchronization signal and the horizontal synchronization signal deviates from the standard timing, the amount and direction of the deviation will be the same as when the electron beam 4 lands on the screen 2 via the shadow mask 1. This represents the displacement amount and direction of the landing position.

Therefore, by correcting and controlling the convergence circuit of the electron beam 4 using the pulse signals 514A and 314B as the index pattern detection signal 314, the landing position of the electron beam 4 can be automatically adjusted to the standard position.

By the way, when manufacturing this type of cathode ray tube, for example, in the process of forming the index pattern, the index pattern 3 may have defective parts such as partial missing parts, unclear outline parts, and getter adhesion parts. If this occurs, there is a risk that errors will occur in the detection timing of the detection light and the luminance, making it impossible to perform the desired convergence adjustment, so it is necessary to detect it.

Conventionally, a method for inspecting the formation state of the index pattern 3 is to visually observe a predetermined number of index patterns 3 using an oscilloscope based on a detection signal obtained from a cathode ray tube to be inspected (this is called a test tube). is generally known.

D Problems to be Solved by the Invention However, when trying to inspect the index pattern 3 on the entire scanning plane of the electron beam 4 using an oscilloscope, it is difficult to determine which part of the scanning plane the index pattern detection signal S14 under observation belongs to. In addition, in order to observe the entire scanning surface, it is necessary to repeatedly inspect a portion of the index pattern 3 many times, which is a complicated process.

The present invention has been made in consideration of the above points, and aims to propose an inspection device that eliminates the conventional complicated operations at once and makes it possible to inspect the condition of index patterns with simple operations. be.

E Means for Solving the Problem In order to solve this problem, in the present invention, a test tube 14 made of a cathode ray tube of an automatic convergence adjustment type in which an index pattern 3 is provided on a shadow mask 1 can be inspected. In the cathode ray tube inspection apparatus 11, a signal generator 12 generates an inspection video signal Sll and a synchronization signal S12, and a signal generator 12 generates an inspection video signal Sll and a synchronization signal S12, and a synchronization signal 31 generates an inspection video signal Sll.
2, a detection signal processing circuit 16 that forms an index pattern video signal based on an index pattern detection signal S14 obtained from the test tube 14, and an index pattern video signal By displaying S15 in synchronization with the synchronization signal S12, the monitor 17 generates a pattern image representing the test results for the entire array of index patterns 3 provided on the test tube 14.

F action By supplying the index pattern video signal S15 obtained from the test tube 14 to the monitor 17 in synchronization with the synchronization signal S12, the formation state of the index pattern 3 of the test tube 14 can be monitored all at once over the entire surface of the test tube 14. can be displayed.

6G Embodiment Hereinafter, an embodiment of the present invention will be described in detail with reference to the drawings.

In FIG. 1, reference numeral 11 indicates a cathode ray tube testing device as a whole, and a test video signal Sll and a synchronization signal S12 generated in a signal generating device 12 are supplied to a test tube driving device 13, and the driving output S13 is used for automatic convergence. It is designed to drive a test tube 14 which is a regulated cathode ray tube.

The test tube drive device 13 is configured to be able to sequentially and selectively generate three electron beams corresponding to the primary color signals R, G, and B in the test tube 14 in response to an operator's operation, thereby achieving convergence for each primary color signal. can be inspected.

As the electron beam with a predetermined intensity scans the shadow mask 1 placed behind the screen 2 of the test tube 14, the detection light emitted from the index pattern 3 formed on the surface of the shadow mask l is detected. It is converted into an index pattern detection signal S14 by a photodetector 15 provided in the cone portion. This index pattern detection signal S14 is subjected to processing such as amplification in a detection signal processing circuit 16, and then supplied to a video input terminal of a monitor 17.

The synchronizing signal S12 generated by the signal generator 12 is supplied to the synchronizing signal terminal of the monitor 17, and thus a rask signal is displayed on the display screen 17A of the monitor 17 in synchronization with the rask scan scanning of the electron beam in the test tube 14. A pattern image is generated by scanning.

In the above configuration, the pattern parts 3A and 3B of the index pattern 3 provided on the surface of the shadow mask 1 of the test tube 14 are repeatedly detected by the detected light every time the electron beam crosses, as described above with reference to FIGS. 2 and 3. As a result, the pulse signals 514A and 5L4B (FIG. 3(B)) alternately become the index pattern detection signal 514.
It is sent out from the photodetector 15 as a signal.

Therefore, a pulse signal 51 appears on the display screen 17A of the monitor 17.
A pattern image displayed with high brightness is obtained every time 4ASS14B is transmitted.

Here, the rusk scan of the monitor 17 is applied to the test tube 14.
The pulse signal 514A is generated in the test tube 14 by being synchronized with the Rusk scan scanning of the electron beam in the
, 314B on the screen 2 and the monitor 1 on which the pulse signals 514A and 514B are displayed.
7 on the display screen 17A practically coincide with each other. As a result, a pattern image of the entire array of index patterns 3 formed on the shadow mask l of the test tube 14 is generated as is on the display screen 17A of the monitor 17.

According to the above configuration, the index pattern 3 can be simultaneously displayed on the display screen 17A of the monitor 17 over the entire array, so that the operator can check the formation state of the index pattern 3 while looking at the pattern image on the display screen 17A. It is possible to easily inspect whether the material is good or defective by visually checking for the presence or absence of, for example, partial missingness, unclear contours, adhesion of getter, etc.

In the above-described embodiment, the index pattern is visually inspected, but instead of this, the index pattern detection signal is evaluated using a reference signal obtained from a passing product to determine whether the index pattern is good or not. Alternatively, defects may be automatically searched.

Further, in the above-described embodiment, the index pattern 3 has a shape in which the second pattern portion 3B is inclined by 30" with respect to the horizontal direction. However, the index pattern 3 is not limited to this. A similar effect can be obtained even when a pattern is provided.

Furthermore, in the above embodiment, the detection signal processing circuit 16
Although the index pattern detection signal S14 is provided with a function to amplify the index pattern detection signal S14, the present invention is not limited to this, and the present invention is not limited to this, but is also provided with a comparator function that outputs a signal higher than a predetermined level, or changes the display color on the monitor 17 according to the signal level. By processing the signal as follows, index pattern 3
It is possible to apply devices with various functions, such as making it easier to read defects.

Effects of the Invention As described above, according to the present invention, a pattern image of the entire array of index patterns of a test tube is displayed on a monitor, thereby providing an inspection apparatus that can easily inspect and confirm the formation state of index patterns. can be easily realized.

[Brief explanation of the drawing]

FIG. 1 is a line system diagram showing an embodiment of the cathode ray tube inspection device according to the present invention, and FIG. 2 is a line front view showing the arrangement of index patterns of test tubes as seen from the display screen side. FIG. 3 is a route map showing index patterns and corresponding detection signals. 1... Shadow mask, 2... Screen, 3.3A, 3B... Index pattern, 4... Electron beam, 11... Cathode ray tube inspection device, 12... Signal generator, 13.
... Drive device, 14 ... Test tube, 15.
. . . Photodetector, 16 . . . Detection signal processing circuit, 17 . . . Monitor.

Claims (1)

[Scope of Claim] In a cathode ray tube inspection device capable of inspecting a test tube made of a cathode ray tube of an automatic convergence adjustment type with an index pattern provided on a shadow mask, a signal generation for generating a video signal for inspection and a synchronization signal is provided. a test tube drive device that supplies the test video signal to the test tube while synchronizing the test video signal with the synchronization signal; and a detection signal that forms an index pattern video signal based on an index pattern detection signal obtained from the test tube. a processing circuit; and a monitor that displays the index pattern video signal in synchronization with the synchronization signal to generate a pattern video representing an inspection result for the entire array of index patterns provided on the test tube. A cathode ray tube inspection device featuring: