JPH01112133A - Low-temperature device for sample - Google Patents
Low-temperature device for sampleInfo
- Publication number
- JPH01112133A JPH01112133A JP62269328A JP26932887A JPH01112133A JP H01112133 A JPH01112133 A JP H01112133A JP 62269328 A JP62269328 A JP 62269328A JP 26932887 A JP26932887 A JP 26932887A JP H01112133 A JPH01112133 A JP H01112133A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- liquefied gas
- valve
- conduit
- temperature
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 229910001285 shape-memory alloy Inorganic materials 0.000 claims abstract description 9
- 239000007789 gas Substances 0.000 abstract description 27
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 abstract description 6
- 238000002441 X-ray diffraction Methods 0.000 abstract description 3
- 229910045601 alloy Inorganic materials 0.000 abstract description 3
- 239000000956 alloy Substances 0.000 abstract description 3
- 229910052757 nitrogen Inorganic materials 0.000 abstract description 3
- 239000007788 liquid Substances 0.000 abstract description 2
- 239000000843 powder Substances 0.000 abstract description 2
- 238000010438 heat treatment Methods 0.000 description 3
- 230000007423 decrease Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000004809 Teflon Substances 0.000 description 1
- 229920006362 Teflon® Polymers 0.000 description 1
- 230000004323 axial length Effects 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は試料の低温における物性、例えば光線の反射特
性、X線の回折特性等を観測する場合において、その試
料を液化気体で所望の温度に冷却するための装置にかん
する。Detailed Description of the Invention The present invention provides an apparatus for cooling a sample to a desired temperature with liquefied gas when observing the physical properties of the sample at low temperatures, such as light reflection characteristics, X-ray diffraction characteristics, etc. Concerning.
このような装置において、従来は例えば液化窒素その他
適宜の液化気体容器に連結した導管の先端に試料取付部
を形成して、その導管に流入する液化気体で試料を冷却
すると共に温度制御に際しては、例えばテフロン等で形
成した断熱棒を前記導管中に挿入して液化気体の流入を
阻止し、この状態で試料部分を電熱器で加熱して所望の
温度に保持することにより、液化気体の損耗を防止する
手段等がとられていた。しかしこのような装置は操作が
煩雑で、自動温度制御等は極めて困難であった。従って
本発明は試料温度の自動制御を容易に行い得ると共に構
造が簡単で、かつ液化気体の損耗も極めて少ない装置を
提供するものである。In such an apparatus, conventionally, a sample attachment part is formed at the tip of a conduit connected to a container of liquefied nitrogen or other suitable liquefied gas, and the sample is cooled by the liquefied gas flowing into the conduit, and the temperature is controlled by: For example, by inserting a heat insulating rod made of Teflon or the like into the conduit to prevent the inflow of liquefied gas, and in this state heating the sample part with an electric heater to maintain it at a desired temperature, loss of the liquefied gas can be prevented. Measures were taken to prevent this. However, such devices are complicated to operate, and automatic temperature control is extremely difficult. Therefore, the present invention provides an apparatus that can easily control the sample temperature automatically, has a simple structure, and causes extremely little loss of liquefied gas.
本発明の試料低温装置は液化気体を試料部分に導く導管
の途中に開閉弁を設けて、その開閉制御体を形状記憶合
金で形成すると共にこの制御体の近傍に電熱器を設けて
、上記合金の温度制御により弁の開閉を行うようにした
ものである。従って試料の温度が所定の値以下に低下し
た時、上述の電熱器に加熱電流が加わるようにすると、
形状記憶合金の変形によって前記開閉弁が閉じるから、
試料部分に対する液化気体の補給が遮断されて、試料の
温度が次第に上昇する。またこの温度が許容範囲の上限
を越したとき、前記電熱器が遮断されるように構成する
と、合金の形状が復1日して弁が開放し、試料部分に液
化気体が補給されるからその温度が低下する。従って自
動的に所定の温度を保持することが出来ると共に温度の
プログラム制御も、これを容易に行い得る。The sample cryogenic apparatus of the present invention is provided with an on-off valve in the middle of a conduit that guides liquefied gas to a sample part, whose on-off control body is made of a shape memory alloy, and an electric heater is provided near this control body, and an electric heater is provided in the vicinity of this control body. The valve is opened and closed by temperature control. Therefore, when the temperature of the sample falls below a predetermined value, if a heating current is applied to the electric heater described above,
Since the on-off valve closes due to the deformation of the shape memory alloy,
The supply of liquefied gas to the sample portion is cut off, and the temperature of the sample gradually increases. In addition, if the electric heater is configured to be shut off when the temperature exceeds the upper limit of the allowable range, the shape of the alloy will change one day later, the valve will open, and liquefied gas will be replenished into the sample area. Temperature decreases. Therefore, it is possible to automatically maintain a predetermined temperature, and the temperature can be easily controlled by program.
第1図は本発明実施例の縦断面図、第2図は第1図にお
ける要部の拡大縦断面図、第3図は第2図のA−A断面
の拡大図である。すなわち排気管1によって真空に保た
れる容器2の内部に液化気体容器3を設けて、例えば液
体窒素のような適宜の液化気体4を収容しである。この
容器3の底部に液化気体導管5を連結して、その下部に
有底円筒状の試料取付部6を形成し、第2図のように内
部に設けた試料台7の四部に粉末試料8を充填しである
。なおこの試料取付部6および前記容器2にはX線窓9
.IOを形成して、上記試料にX線を入射させると共に
その回折X線を取り出して、例えばX線回折角の測定を
行う。また試料取付部6には孔11を設けると共に試料
の背後にその温度の微調整用電熱器12を設けである。FIG. 1 is a longitudinal sectional view of an embodiment of the present invention, FIG. 2 is an enlarged longitudinal sectional view of the main part in FIG. 1, and FIG. 3 is an enlarged view of the AA cross section in FIG. 2. That is, a liquefied gas container 3 is provided inside a container 2 kept in a vacuum by an exhaust pipe 1, and contains a suitable liquefied gas 4 such as liquid nitrogen. A liquefied gas conduit 5 is connected to the bottom of this container 3, a bottomed cylindrical sample attachment part 6 is formed at the bottom, and a powder sample 8 is attached to four parts of a sample stage 7 provided inside as shown in FIG. It is filled with. Note that this sample attachment part 6 and the container 2 are provided with an X-ray window 9.
.. By forming an IO, X-rays are made incident on the sample, and the diffracted X-rays are taken out to measure, for example, the X-ray diffraction angle. In addition, a hole 11 is provided in the sample mounting portion 6, and an electric heater 12 is provided behind the sample for finely adjusting the temperature thereof.
更に前記導管5の内部には孔13を有する弁座I4を形
成して、その下部に弁15を配置し、この弁15を形状
記憶合金で形成したコイルばねよりなる開閉制御体16
で押圧することにより、弁座14に圧接させである。な
おこの制御体I6における両端は弁15および試料取付
部6に固着されているが、その弁15には、周縁に液化
気体通路17.17・・・を形成すると共に中心に小孔
18を設けて、この孔により図の下方から上方に向かう
気体を流通させる逆止弁I9を下端部に配置しである。Furthermore, a valve seat I4 having a hole 13 is formed inside the conduit 5, and a valve 15 is arranged below the valve seat I4, and this valve 15 is connected to an opening/closing control body 16 made of a coil spring made of a shape memory alloy.
The valve seat 14 is brought into pressure contact with the valve seat 14 by pressing. Both ends of this control body I6 are fixed to a valve 15 and a sample attachment part 6, and the valve 15 has liquefied gas passages 17, 17, etc. formed on its periphery and a small hole 18 in its center. A check valve I9 is disposed at the lower end to allow gas to flow from the bottom to the top in the figure through this hole.
かつ前記導管5の外側には制御体16と対向するように
電熱器20を設けである。また第4図は開閉制御体I6
の他の例で、帯状の形状記憶合金を蛇行状に形成した記
憶部21の一端に任意のばね材よりなるコイルばね22
を連結したものである。Further, an electric heater 20 is provided outside the conduit 5 so as to face the control body 16 . Also, Fig. 4 shows the opening/closing control body I6.
In another example, a coil spring 22 made of an arbitrary spring material is attached to one end of a memory portion 21 formed of a band-shaped shape memory alloy in a meandering shape.
It is a concatenation of.
上記装置において、図示してないが試料8またはその近
傍に取り付けた熱電対接点で試料の温度を監視し、その
温度が所定値以下になると、電熱器20に加熱電流が加
わり、また−上記温度以」−になると、この電流が遮断
される。従って試料温度が所定の値より高くなると、第
2図に示した形状記憶合金の制御体16における軸方向
の長さが縮小して弁15が開放し、電熱器20の内側に
液化気体4が流入するから試料取付部6の温度が低下し
て、試料8が所定の温度に冷却される。またこの温度が
所定値以下に低下すると、電熱器20で制御体I6が加
熱されてこれが伸長するから、弁15が閉じて液化気体
4の補給が断たれる。かつ導管5における弁15より下
の部分の液化気体は徐々に気化し、逆止弁19を通って
逸出するから、試料8の温度は徐々に上昇する。前述の
ようにこの温度が所定の値を越すと電熱器20の電流は
遮断されるが、試料8の温度は導管5の下部における液
化気体の欠乏によって徐々に上昇し、その温度が所定の
値を越すと、前述のように制御体16の縮小により弁1
5が開放する。In the above apparatus, the temperature of the sample is monitored by a thermocouple contact (not shown) attached to the sample 8 or its vicinity, and when the temperature falls below a predetermined value, a heating current is applied to the electric heater 20, and - the above-mentioned temperature When the current is reached, this current is cut off. Therefore, when the sample temperature becomes higher than a predetermined value, the axial length of the shape memory alloy control body 16 shown in FIG. Because of the inflow, the temperature of the sample mounting portion 6 decreases, and the sample 8 is cooled to a predetermined temperature. Further, when this temperature falls below a predetermined value, the control body I6 is heated by the electric heater 20 and expands, so that the valve 15 is closed and the supply of the liquefied gas 4 is cut off. In addition, since the liquefied gas in the conduit 5 below the valve 15 gradually vaporizes and escapes through the check valve 19, the temperature of the sample 8 gradually increases. As mentioned above, when this temperature exceeds a predetermined value, the electric current of the electric heater 20 is cut off, but the temperature of the sample 8 gradually rises due to the lack of liquefied gas in the lower part of the conduit 5, until the temperature reaches the predetermined value. If the value exceeds 1, the control body 16 contracts as described above, causing the valve 1 to close.
5 opens.
なお、上記実施例は形状記憶合金によって形成した螺旋
ばねを用いたものであるが、弁の開放時(a)および閉
鎖時(b)を第4図に示したように、例えば帯状の形状
記憶合金を蛇行状に屈曲させた記憶部21と通常のばね
材料によるコイルばね22とによって形成することもで
きる。また」二足説明は試料の温度を一定に保持する場
合について説明したが、熱電対の出力と比較する基準電
圧を変化することにより、プログラム制御を行うことも
勿論可能である。The above embodiment uses a helical spring made of a shape memory alloy, but as shown in FIG. It can also be formed by the memory portion 21 made of an alloy bent in a serpentine shape and the coil spring 22 made of a normal spring material. Furthermore, although the two-legged explanation has been given for the case where the temperature of the sample is held constant, it is of course possible to perform program control by changing the reference voltage to which the output of the thermocouple is compared.
上述のように、本発明の装置は液化気体の流通制御によ
って試料温度の調整を行うから、その液化気体の消費量
を極めて少なくすることができると共に可動部の機構が
極めて簡単である。As described above, since the apparatus of the present invention adjusts the sample temperature by controlling the flow of liquefied gas, the amount of liquefied gas consumed can be extremely reduced, and the mechanism of the movable part is extremely simple.
第1図は本発明実施例の縦断面図、第2図は第1図の一
部の拡大断面図、第3図は第2図のΔ−A断面図、第4
図は制御体の他の例である。なお、図において、3は液
化気体容器、5は液化気体導管、6は試料取付部、15
は開閉弁、16は開閉制御体、20は電熱器である。FIG. 1 is a longitudinal sectional view of an embodiment of the present invention, FIG. 2 is an enlarged sectional view of a part of FIG. 1, FIG. 3 is a Δ-A sectional view of FIG.
The figure shows another example of the control body. In the figure, 3 is a liquefied gas container, 5 is a liquefied gas conduit, 6 is a sample attachment part, and 15 is a liquefied gas conduit.
1 is an on-off valve, 16 is an on-off control body, and 20 is an electric heater.
Claims (1)
試料取付部を形成して、上記導管の途中に開閉弁を設け
ると共にこの弁の開閉制御体を形状記憶合金で形成し、
かつ上記開閉制御体の近傍にその形状を変化させて弁の
開閉制御を行う電熱器を設けたことを特徴とする試料低
温装置forming a sample attachment part at the lower end of a liquefied gas conduit connected to the bottom of the liquefied gas container, providing an on-off valve in the middle of the conduit, and forming an opening/closing control body for this valve from a shape memory alloy;
and a sample cryogenic device, characterized in that an electric heater is provided near the opening/closing control body for controlling the opening/closing of the valve by changing its shape.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62269328A JP2562622B2 (en) | 1987-10-27 | 1987-10-27 | Sample cryostat |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62269328A JP2562622B2 (en) | 1987-10-27 | 1987-10-27 | Sample cryostat |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH01112133A true JPH01112133A (en) | 1989-04-28 |
JP2562622B2 JP2562622B2 (en) | 1996-12-11 |
Family
ID=17470829
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62269328A Expired - Lifetime JP2562622B2 (en) | 1987-10-27 | 1987-10-27 | Sample cryostat |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2562622B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011069831A (en) * | 2010-11-05 | 2011-04-07 | Hitachi Ltd | Optical detection device, analyzing apparatus, and droplet mixing method |
-
1987
- 1987-10-27 JP JP62269328A patent/JP2562622B2/en not_active Expired - Lifetime
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011069831A (en) * | 2010-11-05 | 2011-04-07 | Hitachi Ltd | Optical detection device, analyzing apparatus, and droplet mixing method |
Also Published As
Publication number | Publication date |
---|---|
JP2562622B2 (en) | 1996-12-11 |
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