JPH01110380U - - Google Patents
Info
- Publication number
- JPH01110380U JPH01110380U JP625688U JP625688U JPH01110380U JP H01110380 U JPH01110380 U JP H01110380U JP 625688 U JP625688 U JP 625688U JP 625688 U JP625688 U JP 625688U JP H01110380 U JPH01110380 U JP H01110380U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor device
- bonding pad
- package
- wire
- utility
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims 2
- 239000002184 metal Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP625688U JPH01110380U (it) | 1988-01-20 | 1988-01-20 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP625688U JPH01110380U (it) | 1988-01-20 | 1988-01-20 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH01110380U true JPH01110380U (it) | 1989-07-25 |
Family
ID=31210333
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP625688U Pending JPH01110380U (it) | 1988-01-20 | 1988-01-20 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01110380U (it) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011047733A (ja) * | 2009-08-26 | 2011-03-10 | Nec Corp | 劣化検出回路、劣化検出システム及び劣化検出方法 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS50113764A (it) * | 1974-02-20 | 1975-09-06 |
-
1988
- 1988-01-20 JP JP625688U patent/JPH01110380U/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS50113764A (it) * | 1974-02-20 | 1975-09-06 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011047733A (ja) * | 2009-08-26 | 2011-03-10 | Nec Corp | 劣化検出回路、劣化検出システム及び劣化検出方法 |