JPH01108383A - Pretreatment of ceramics before electroless plating - Google Patents
Pretreatment of ceramics before electroless platingInfo
- Publication number
- JPH01108383A JPH01108383A JP26299487A JP26299487A JPH01108383A JP H01108383 A JPH01108383 A JP H01108383A JP 26299487 A JP26299487 A JP 26299487A JP 26299487 A JP26299487 A JP 26299487A JP H01108383 A JPH01108383 A JP H01108383A
- Authority
- JP
- Japan
- Prior art keywords
- etching
- ceramics
- soln
- electroless plating
- solution
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000919 ceramic Substances 0.000 title claims abstract description 41
- 238000007772 electroless plating Methods 0.000 title claims abstract description 17
- 238000005530 etching Methods 0.000 claims abstract description 52
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 claims abstract description 18
- 239000000243 solution Substances 0.000 claims description 26
- 239000007853 buffer solution Substances 0.000 claims description 12
- 238000002203 pretreatment Methods 0.000 claims description 5
- 229910052751 metal Inorganic materials 0.000 abstract description 12
- 239000002184 metal Substances 0.000 abstract description 12
- 239000000872 buffer Substances 0.000 abstract description 7
- GPRLSGONYQIRFK-UHFFFAOYSA-N hydron Chemical compound [H+] GPRLSGONYQIRFK-UHFFFAOYSA-N 0.000 abstract description 4
- 229910004039 HBF4 Inorganic materials 0.000 abstract 1
- 239000000853 adhesive Substances 0.000 abstract 1
- 230000001070 adhesive effect Effects 0.000 abstract 1
- 230000003139 buffering effect Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 239000007788 liquid Substances 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 239000000203 mixture Substances 0.000 description 4
- 239000002253 acid Substances 0.000 description 3
- RILZRCJGXSFXNE-UHFFFAOYSA-N 2-[4-(trifluoromethoxy)phenyl]ethanol Chemical compound OCCC1=CC=C(OC(F)(F)F)C=C1 RILZRCJGXSFXNE-UHFFFAOYSA-N 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 2
- 238000011282 treatment Methods 0.000 description 2
- 229910021627 Tin(IV) chloride Inorganic materials 0.000 description 1
- 239000003985 ceramic capacitor Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- CUPFNGOKRMWUOO-UHFFFAOYSA-N hydron;difluoride Chemical compound F.F CUPFNGOKRMWUOO-UHFFFAOYSA-N 0.000 description 1
- 239000011259 mixed solution Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- KDLHZDBZIXYQEI-UHFFFAOYSA-N palladium Substances [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 1
- PIBWKRNGBLPSSY-UHFFFAOYSA-L palladium(II) chloride Chemical compound Cl[Pd]Cl PIBWKRNGBLPSSY-UHFFFAOYSA-L 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 238000007788 roughening Methods 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
- HPGGPRDJHPYFRM-UHFFFAOYSA-J tin(iv) chloride Chemical compound Cl[Sn](Cl)(Cl)Cl HPGGPRDJHPYFRM-UHFFFAOYSA-J 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/18—Pretreatment of the material to be coated
- C23C18/1851—Pretreatment of the material to be coated of surfaces of non-metallic or semiconducting in organic material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/18—Pretreatment of the material to be coated
- C23C18/1851—Pretreatment of the material to be coated of surfaces of non-metallic or semiconducting in organic material
- C23C18/1872—Pretreatment of the material to be coated of surfaces of non-metallic or semiconducting in organic material by chemical pretreatment
- C23C18/1886—Multistep pretreatment
- C23C18/1893—Multistep pretreatment with use of organic or inorganic compounds other than metals, first
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Chemically Coating (AREA)
Abstract
Description
【発明の詳細な説明】
(a)産業上の利用分野
この発明はセラミクスに対する無電解メッキの前処理方
法に関する。DETAILED DESCRIPTION OF THE INVENTION (a) Field of Industrial Application This invention relates to a pretreatment method for electroless plating of ceramics.
(bl従来の技術
例えば、誘電体セラミクスを用いたセラミックコンデン
サなど、一般にセラミクスを用いた電子部品においては
、セラミクス表面を金属化(メタライズ)することが必
要である。無電解メッキにより金属膜を形成する場合、
電気的特性を損なわすにセラミクス表面に対する金属膜
の密着強度をいかに高めるかが重要なポイントである。(bl Conventional Technology) Generally, in electronic components using ceramics, such as ceramic capacitors using dielectric ceramics, it is necessary to metalize the surface of the ceramics.A metal film is formed by electroless plating. If you do,
The important point is how to increase the adhesion strength of the metal film to the ceramic surface without impairing the electrical properties.
従来はセラミクスの表面に無電解メッキを施す前に、金
属膜を形成する箇所を化学エツチングすることによって
セラミクス表面を粗面化している。その際、エツチング
液はエツチング能力に優れたフン酸系溶液が用いられ、
セラミクスの組成に応じて適当なエツチングレートが得
られるように希釈した溶液が用いられる。Conventionally, before electroless plating is applied to a ceramic surface, the surface of the ceramic is roughened by chemically etching the area where a metal film is to be formed. At that time, a hydronic acid solution with excellent etching ability is used as the etching solution.
A diluted solution is used so as to obtain an appropriate etching rate depending on the composition of the ceramic.
(C)発明が解決しようとする問題点
ところが、フッ酸系溶液のように強酸の希薄溶液はエツ
チングの進行にともない溶液のpH(水素イオン指数)
が大きく変動し、エツチング能の再現性に乏しくなる。(C) Problems to be Solved by the Invention However, when using a dilute solution of a strong acid such as a hydrofluoric acid solution, as etching progresses, the pH (hydrogen ion index) of the solution changes.
will vary greatly, resulting in poor reproducibility of etching performance.
このため、セラミクス表面を効率良くかつ安定して粗面
化することができなかった。For this reason, it has not been possible to efficiently and stably roughen the ceramic surface.
この発明の目的は、セラミクスをフッ酸系エツチング液
でエツチングすることにより粗面化する際、セラミクス
表面を効率良くしかも安定してエツチングできるように
した、セラミクスの無電解メッキ前処理方法を提供する
ことにある。An object of the present invention is to provide a pretreatment method for electroless plating of ceramics, which allows the surface of ceramics to be etched efficiently and stably when roughening the surface by etching the ceramics with a hydrofluoric acid etching solution. There is a particular thing.
(d)問題点を解決するための手段
この発明のセラミクスの無電解メッキ前処理方法は、フ
ッ酸系エツチング液に緩衝液を添加し、所定のp Hに
設定した後、セラミクスをエツチングすることを特徴と
している。(d) Means for Solving the Problems The pretreatment method for electroless plating of ceramics according to the present invention includes adding a buffer solution to a hydrofluoric acid etching solution, setting the pH to a predetermined value, and then etching the ceramics. It is characterized by
(01作用
この発明のセラミクスの無電解メッキ前処理方法におい
ては、無電解メッキを施すべきセラミクスをフッ酸系エ
ツチング液でエツチングすることによってその表面が粗
面化されるが、フッ酸系エツチング液には緩衝液が添加
されて所定のp Hに設定されている。このようにエツ
チング液に緩衝液が添加されたことにより、この緩衝液
の緩衝作用により、エツチングの進行にともなう水素イ
オン濃度の変化が抑えられる。このため、エツチング液
は所定のエツチング能が維持されて、セラミクス表面を
効率的に、しかも再現性良く粗面化することができる。(01 Effect) In the electroless plating pretreatment method for ceramics of this invention, the surface of the ceramic to be electrolessly plated is roughened by etching it with a hydrofluoric acid etching solution. A buffer solution is added to the etching solution and the pH is set at a predetermined value.By adding the buffer solution to the etching solution, the hydrogen ion concentration decreases as etching progresses due to the buffering action of this buffer solution. Therefore, the etching solution maintains a predetermined etching ability and can roughen the ceramic surface efficiently and with good reproducibility.
したがって、その後無電解メッキ工程によってセラミク
ス表面に金属膜がメッキされる際、粗面化されたセラミ
クス表面に密着強度が高く、所要の電気的特性が得られ
る金属膜が析出される。Therefore, when a metal film is subsequently plated on the ceramic surface by an electroless plating process, a metal film with high adhesion strength and desired electrical characteristics is deposited on the roughened ceramic surface.
(f)実施例
セラミクスに無電解メッキを施す場合の処理工程を第5
図に示す、先ずセラミクスを水洗し、界面活性剤などに
よって脱脂する。その後、フッ化水素酸(フン酸)やフ
ルオロホウ酸く環フッ酸)などのフ・7酸系エツチング
液に緩衝液を添加して所定のpHに設定したエツチング
液によってセラミクス表面をエツチングする。エツチン
グ終了後セラミクスを洗浄し、続いてSnの溶液(塩化
第1スズ)やPdの溶液(塩化パラジウム)などにゼ°
ラミクスを浸漬し、セラミクス表面に感受性化したのち
セラミクス表面を活性化する。その後、無電解メッキ液
にセラミクスを浸漬してCuやNiなどの所定の金属膜
を析出させる。(f) Processing step when applying electroless plating to example ceramics
As shown in the figure, ceramics are first washed with water and degreased with a surfactant or the like. Thereafter, the ceramic surface is etched using an etching solution set to a predetermined pH by adding a buffer to a hydrofluoric acid-based etching solution such as hydrofluoric acid (hydrofluoric acid) or fluoroboric acid (fluoroboric acid). After etching, the ceramics are washed and then soaked in a solution of Sn (stannic chloride) or Pd (palladium chloride).
The ceramic surface is sensitized by dipping the lamics, and then the ceramic surface is activated. Thereafter, the ceramic is immersed in an electroless plating solution to deposit a predetermined metal film such as Cu or Ni.
く第1の実施例〉
セラミクス組成
MgTKOs−CaTi()+系
エツチング液
エツチング剤 HB F 4 (0,042w t%
)緩衝液 KCZ−H1l!
pi(i、 5
液温度 50℃
時間 10分
以上の条件でエツチング処理を行なった。また、比較の
ため緩衝液を用いずにHBF40.42wt%のエツチ
ング液を用いた例についてそれぞれ複数個のサンプルを
形成し、各サンプルにCuの無電解メッキ膜を形成し、
その膜強度を測定した。膜強度の測定にあたって具体的
には、先ずセラミクス表面の全面にCuの無電解メッキ
膜を形成し、そのメッキ膜のうち4mm”の領域のみ残
し、他の領域を研磨により除去することによって単位面
積(4mm”)の電極を形成し、この電極にリード線を
垂直に半田付けする。その後、リード線に引っ張り荷重
を加えて電極が剥がれる荷重を測定した。また、これと
ともにQ値の測定も行った。First Example> Ceramic composition MgTKOs-CaTi()+ Etching liquid Etching agent HB F 4 (0,042 wt%
) Buffer solution KCZ-H1l! Etching treatment was carried out under the conditions of pi (i, 5 solution temperature 50°C time 10 minutes or more. Also, for comparison, multiple samples were each used in an example in which an etching solution containing HBF40.42 wt% was used without using a buffer solution. and form an electroless plating film of Cu on each sample,
The film strength was measured. Specifically, to measure the film strength, we first form an electroless plating film of Cu on the entire surface of the ceramic, leave only a 4mm" area of the plating film, and remove the other area by polishing. (4 mm”) electrode is formed, and a lead wire is vertically soldered to this electrode. Thereafter, a tensile load was applied to the lead wire, and the load at which the electrode peeled off was measured. In addition, the Q value was also measured.
その結果を第1図に示す。図に示すように緩衝液を添加
しない従来例1では新しいエツチング液によるエツチン
グ開始当初は高いエツチング能を備えているが、エツチ
ングの進行に伴い水素イオン濃度が低下するため、数回
のエツチング処理によりエツチング能が息激に低下する
。その結果、セラミクス表面の粗面化が十分になされず
、金属膜の密着強度が低く、密着強度のばらつきが大き
くなる。これに対し実施例1では6〜7 k g /
4mm”と高い密着強度が得られ、しかも各サンプルに
おける密着強度のばらつきが小さくなっている。さらに
、電気的特性のQ値が増大し、そのばらつきも小さくな
る。The results are shown in FIG. As shown in the figure, Conventional Example 1 without adding a buffer has high etching performance at the beginning of etching with a new etching solution, but as the etching progresses, the hydrogen ion concentration decreases, so after several etching treatments. Etching ability is drastically reduced. As a result, the surface of the ceramic is not sufficiently roughened, and the adhesion strength of the metal film is low, resulting in large variations in the adhesion strength. On the other hand, in Example 1, 6 to 7 kg/
A high adhesion strength of 4 mm'' was obtained, and the variation in adhesion strength among the samples was reduced.Furthermore, the Q value of the electrical characteristics increased and the variation was also reduced.
上記実施例ではエツチング液のp Hを最適値として1
.5に設定したが、pH=1.0〜2.2の範囲で良好
なエンチングを行うことができる。In the above example, the pH of the etching solution was set to 1 as the optimum value.
.. 5, but good enching can be performed within the pH range of 1.0 to 2.2.
また、液温度とエツチング時間については30〜50℃
、1〜60分の範囲で設定することができる。In addition, the liquid temperature and etching time are 30 to 50℃.
, can be set in the range of 1 to 60 minutes.
なお、上記実施例における緩衝液の組成と緩衝作用を示
すp Hとの関係は第3図に示す通りである。このよう
に酸と塩の比を変えることよって緩衝作用を示すpHの
値を設定することができる。Incidentally, the relationship between the composition of the buffer solution and the pH showing the buffering effect in the above examples is as shown in FIG. By changing the ratio of acid and salt in this way, the pH value that exhibits a buffering effect can be set.
〈第2の実施例〉
セラミクス組成
りaTiO=系
エツチング液
エツチング剤 HB F 4 (Q、042 wt/
%)緩衝液 CHa COON a−HC1pH1
,7
液温度 40℃
時間 10分
以上の条件によりエツチングを行った。また第1の実施
例と同様に比較のために緩衝液を添加しないでpHを調
整したエツチング液を用いた例について、それぞれ複数
個のサンプルを形成した。<Second Example> Ceramics composition aTiO=based etching liquid Etching agent HB F 4 (Q, 042 wt/
%) Buffer CHa COON a-HC1pH1
, 7 Etching was carried out under the conditions of a liquid temperature of 40° C. and a time of 10 minutes or more. Further, as in the first example, for comparison purposes, a plurality of samples were prepared using an etching solution whose pH was adjusted without adding a buffer solution.
その結果を第2図に示す、ここではtanδとそのばら
つきを測定した。図に示すように緩衝液の作用により金
属膜の高い密着強度が得られ、その密着強度のばらつき
も抑えられる。また、これとともにセラミクス表面に対
する金属膜の密着性が向上することにより、tanδと
そのばらつきが改善される。The results are shown in FIG. 2. Here, tan δ and its variation were measured. As shown in the figure, high adhesion strength of the metal film can be obtained due to the action of the buffer solution, and variations in the adhesion strength can also be suppressed. Additionally, since the adhesion of the metal film to the ceramic surface is improved, tan δ and its variation are improved.
なお、第2の実施例ではエツチング液のpHを0.65
〜2.72の範囲内で設定することによって良好なエツ
チングを行うことができる。第4図はこの第2の実施例
における緩衝液の緩衝作用を示す所定のpHを得るため
の混合溶液の比率の例を示している。In addition, in the second example, the pH of the etching solution was set to 0.65.
Good etching can be achieved by setting the value within the range of ~2.72. FIG. 4 shows an example of the ratio of the mixed solution to obtain a predetermined pH showing the buffering effect of the buffer solution in this second embodiment.
(g)発明の効果
以上のようにこの発明によれば、フッ酸系エツチング液
によってエツチングを行うため難エツチング性のセラミ
クスであっても、その表面を効率良く粗面化することが
できるが、エツチング液に緩衝液を添加したことにより
、エツチングの進行にともなうエツチング液のp t+
の変動が抑えられ、その後の無電解メッキ処理により密
着強度の高い金属膜を再現性良く形成することが可能と
なり、また良好な電気的特性が再現性よ(得られる。(g) Effects of the Invention As described above, according to the present invention, since etching is performed using a hydrofluoric acid etching solution, the surface of even difficult-to-etch ceramics can be efficiently roughened. By adding a buffer to the etching solution, the pt+ of the etching solution increases as etching progresses.
This suppresses variations in the electroless plating process, making it possible to form a metal film with high adhesion strength with good reproducibility through the subsequent electroless plating process, and also providing good electrical characteristics with good reproducibility.
第1図はこの発明の第1の実施例によるサンプルの金属
膜の密着強度などの特性を従来例と比較して表した図、
第2図はこの発明の第2の実施例により得られたサンプ
ルの特性を従来例と比較して表した図である。第3図と
第4図はそれぞれ異なる種類の緩衝液の成分比と緩衝作
用を示すpHとの関係を表す図である。第5図は一般的
なセラミクスの無電解メッキ処理工程を表す図である。FIG. 1 is a diagram showing characteristics such as adhesion strength of a metal film of a sample according to a first embodiment of the present invention in comparison with a conventional example;
FIG. 2 is a diagram illustrating the characteristics of a sample obtained according to a second embodiment of the present invention in comparison with a conventional example. FIG. 3 and FIG. 4 are diagrams showing the relationship between the component ratio of different types of buffer solutions and the pH showing the buffering action, respectively. FIG. 5 is a diagram showing a general electroless plating process for ceramics.
Claims (1)
pHに設定した後、セラミクスをエッチングすることを
特徴とするセラミクスの無電解メッキ前処理方法。(1) A pretreatment method for electroless plating of ceramics, which comprises adding a buffer solution to a hydrofluoric acid etching solution, setting the pH to a predetermined value, and then etching the ceramics.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26299487A JPH01108383A (en) | 1987-10-19 | 1987-10-19 | Pretreatment of ceramics before electroless plating |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26299487A JPH01108383A (en) | 1987-10-19 | 1987-10-19 | Pretreatment of ceramics before electroless plating |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01108383A true JPH01108383A (en) | 1989-04-25 |
Family
ID=17383423
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP26299487A Pending JPH01108383A (en) | 1987-10-19 | 1987-10-19 | Pretreatment of ceramics before electroless plating |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01108383A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110204358A (en) * | 2019-06-26 | 2019-09-06 | 匡云叶 | A kind of ceramics pretreatment fluid and preprocess method |
JP2022034528A (en) * | 2020-08-18 | 2022-03-03 | 北京科技大学 | High heat conduction/thermal expansion adjustable copper-based composite material, and method of manufacturing the same |
-
1987
- 1987-10-19 JP JP26299487A patent/JPH01108383A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110204358A (en) * | 2019-06-26 | 2019-09-06 | 匡云叶 | A kind of ceramics pretreatment fluid and preprocess method |
JP2022034528A (en) * | 2020-08-18 | 2022-03-03 | 北京科技大学 | High heat conduction/thermal expansion adjustable copper-based composite material, and method of manufacturing the same |
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