JPH01107962U - - Google Patents

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Publication number
JPH01107962U
JPH01107962U JP173988U JP173988U JPH01107962U JP H01107962 U JPH01107962 U JP H01107962U JP 173988 U JP173988 U JP 173988U JP 173988 U JP173988 U JP 173988U JP H01107962 U JPH01107962 U JP H01107962U
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JP
Japan
Prior art keywords
sample
plate
mask plate
base plate
mask
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP173988U
Other languages
English (en)
Japanese (ja)
Other versions
JPH06756Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP173988U priority Critical patent/JPH06756Y2/ja
Publication of JPH01107962U publication Critical patent/JPH01107962U/ja
Application granted granted Critical
Publication of JPH06756Y2 publication Critical patent/JPH06756Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)
JP173988U 1988-01-12 1988-01-12 蛍光ｘ線分析用試料ホルダー Expired - Lifetime JPH06756Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP173988U JPH06756Y2 (ja) 1988-01-12 1988-01-12 蛍光ｘ線分析用試料ホルダー

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP173988U JPH06756Y2 (ja) 1988-01-12 1988-01-12 蛍光ｘ線分析用試料ホルダー

Publications (2)

Publication Number Publication Date
JPH01107962U true JPH01107962U (enrdf_load_stackoverflow) 1989-07-20
JPH06756Y2 JPH06756Y2 (ja) 1994-01-05

Family

ID=31201888

Family Applications (1)

Application Number Title Priority Date Filing Date
JP173988U Expired - Lifetime JPH06756Y2 (ja) 1988-01-12 1988-01-12 蛍光ｘ線分析用試料ホルダー

Country Status (1)

Country Link
JP (1) JPH06756Y2 (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0630754U (ja) * 1992-09-24 1994-04-22 理学電機工業株式会社 Ｘ線分析用の試料ホルダ

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0630754U (ja) * 1992-09-24 1994-04-22 理学電機工業株式会社 Ｘ線分析用の試料ホルダ

Also Published As

Publication number Publication date
JPH06756Y2 (ja) 1994-01-05

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