JPH01102376A - Apparatus for testing control apparatus - Google Patents
Apparatus for testing control apparatusInfo
- Publication number
- JPH01102376A JPH01102376A JP62259709A JP25970987A JPH01102376A JP H01102376 A JPH01102376 A JP H01102376A JP 62259709 A JP62259709 A JP 62259709A JP 25970987 A JP25970987 A JP 25970987A JP H01102376 A JPH01102376 A JP H01102376A
- Authority
- JP
- Japan
- Prior art keywords
- frequency
- voltage
- test
- output
- control apparatus
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 23
- 238000001914 filtration Methods 0.000 claims 1
- 238000000034 method Methods 0.000 abstract description 3
- 230000002194 synthesizing effect Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 238000003786 synthesis reaction Methods 0.000 description 1
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Emergency Protection Circuit Devices (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、電圧の実効値データ、及び、周波数のデータ
より瞬時値データを作成し、このデータをもとに、各種
制御の試験を行う装置に係り、特に、任意の周波数及び
電圧の変化パターンを効率よく作成するために好適な装
置に関する。[Detailed Description of the Invention] [Industrial Application Field] The present invention creates instantaneous value data from voltage effective value data and frequency data, and performs various control tests based on this data. The present invention relates to a device, and particularly to a device suitable for efficiently creating arbitrary frequency and voltage change patterns.
゛従来の験験装置は、特開昭60−131032号公報
のように、各種の周波数、電圧を出力して、各種の制御
、保護装置の試験を行うことができるが、時間に対する
任意の変化パターンで与えることはできなかった。゛Conventional testing equipment can test various control and protection devices by outputting various frequencies and voltages, as disclosed in Japanese Patent Application Laid-open No. 60-131032, but it is possible to test various control and protection devices. It could not be given in a pattern.
このため、実系統の現象にあうように、時間の経過と共
に周波数、電圧を変化させるような場合には、利用する
ことができないという欠点があった。For this reason, it has the disadvantage that it cannot be used when the frequency and voltage are changed over time to match the phenomena of an actual system.
上記従来技術は、電圧及び周波数の任意のパターンで変
化することに対しては考慮されておらず、各種の電圧及
び周波数の変化パターンで制御装置の試験を行う場合に
は、目的とする周波数及び電圧の変化パターンを得られ
ないという問題があった。The above conventional technology does not take into account changes in voltage and frequency in arbitrary patterns, and when testing a control device with various voltage and frequency change patterns, it is necessary to test the target frequency and frequency. There was a problem that a voltage change pattern could not be obtained.
本発明の目的は、任意の電圧及び周波数の変化パターン
を実現し、この情報をもとに作成した瞬時値情報をもと
に、制御装置の試験を行うことのできる試験装置を提供
することにある。An object of the present invention is to provide a test device that can realize arbitrary voltage and frequency change patterns and test a control device based on instantaneous value information created based on this information. be.
上記目的は、任意の電圧及び周波数の変化パターンをあ
たえ、この情報をもとに作成した瞬時値情報を制御装置
にあたえることにより達成される。The above object is achieved by providing an arbitrary voltage and frequency change pattern and providing instantaneous value information created based on this information to the control device.
上記試験装置は、任意の周波数の変化パターンを作成で
き、これによって、制御及び保護装置等の各種の試験が
現実の系統条件にあわせてでき、不具合の生じた場合に
は、実系統に設置する前に対応がとれるため、制御装置
を実系統に設置した場合には誤動作の生じることがない
。The above test equipment can create any frequency change pattern, which allows various tests such as control and protection devices to be performed according to actual system conditions, and if a problem occurs, it can be installed in the actual system. Since countermeasures can be taken in advance, malfunctions will not occur when the control device is installed in an actual system.
以下、本発明の一実施例を第1図により説明する。同図
のTL、T12は、電圧及び周波数の時間に対する変化
を記憶しているテーブルを示す。このテーブルより各々
の時刻に対する電圧V (t)及び周波数f (t)を
選択し、合成部Gでは、v(t) =V(t)sin
(2π/ f (t)d t ) ”・(1)を算出
する。この部分が試験装置TUを示す。An embodiment of the present invention will be described below with reference to FIG. TL and T12 in the figure indicate a table that stores changes in voltage and frequency over time. The voltage V (t) and frequency f (t) for each time are selected from this table, and in the synthesis section G, v (t) = V (t) sin
(2π/ f (t) d t ) ”・(1) is calculated. This part indicates the test device TU.
この出力を制御装置CUにあたえて、各種試験を行う。This output is applied to the control device CU to perform various tests.
第2図は1合成部Gの詳細を示したものであり、時間に
対する周波数f (t)を積分部1oで積分する。積算
部11では、ブロック10の出力に2πを乗じ、ブロッ
ク12では、ブロック11の出力の正弦関数を求め、ブ
ロック13では、ブロック12の出力に電圧V (t)
を乗じ、各瞬時の電圧v (t) を得る。FIG. 2 shows the details of the 1-synthesizing section G, in which the frequency f (t) with respect to time is integrated in the integrating section 1o. The integration unit 11 multiplies the output of the block 10 by 2π, the block 12 calculates the sine function of the output of the block 11, and the block 13 multiplies the output of the block 12 by a voltage V (t).
to obtain each instantaneous voltage v (t).
以上の試験装置を用いて、試験を行う例について説明す
る。第2図に説明した試験装置の出力は、第3図のよう
な電圧の瞬時値として得ることができる。この電圧をも
とに、たとえば、特願昭45−109496号「周波数
検出方式」等の方式により1周波数を検出する方式では
、
j=□ ・・・(2)
Δtx+N会Δt+Δt2
として1周波数を算出し、入力の周波数と算出値を比較
し、正常に算出しているか否かの判定を行うことができ
、算出値が異なっている場合には。An example of conducting a test using the above test device will be described. The output of the test device illustrated in FIG. 2 can be obtained as an instantaneous voltage value as shown in FIG. Based on this voltage, in a method of detecting one frequency using a method such as ``Frequency Detection Method'' in Japanese Patent Application No. 45-109496, one frequency is calculated as j=□...(2) Δtx+N Δt+Δt2 However, by comparing the input frequency and the calculated value, it is possible to determine whether or not the calculation is being performed normally, and if the calculated values are different.
周波数検出装置のチエツクを行うことになる。The frequency detection device will be checked.
本発明によれば、任意の周波数、電圧の変化パターンに
応じた電圧瞬時値を作成でき、このデータにより、実系
統の現象に応じた状況で試験ができるため、実系統に適
した制御及び保護装置を開発できるため、系統の安定度
を増すことができる。According to the present invention, it is possible to create instantaneous voltage values according to any frequency and voltage change pattern, and this data allows tests to be performed under conditions that correspond to phenomena in the actual system, so control and protection suitable for the actual system can be performed. Since it is possible to develop devices, it is possible to increase the stability of the system.
第1図は本発明の一実施例の説明図、第2図は本発明の
原理説明図、第3図は本発明の出力説明図である。
Tl、T2・・・テーブル、G・・・合成部、TU・・
・試験第 /U!1
U
票 2 記
第 3 圓FIG. 1 is an explanatory diagram of an embodiment of the present invention, FIG. 2 is an explanatory diagram of the principle of the present invention, and FIG. 3 is an explanatory diagram of the output of the present invention. Tl, T2...Table, G...Composition section, TU...
・Test No. /U! 1 U vote 2 3rd round
Claims (1)
よりあらかじめ定めた間隔毎の瞬時値データを作成する
第一の手段、前記第一の手段の出力にフィルタ処理を施
こし、その出力を増幅する第二の手段よりなり、この出
力をもとに各種の制御、保護装置の入力とすることを特
徴とする制御装置の試験装置。1. A first means for creating instantaneous value data at predetermined intervals from information given in terms of the effective value and frequency of voltage with respect to time; filtering the output of the first means and amplifying the output; A test device for a control device, characterized in that the output is used as input for various control and protection devices.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62259709A JPH01102376A (en) | 1987-10-16 | 1987-10-16 | Apparatus for testing control apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62259709A JPH01102376A (en) | 1987-10-16 | 1987-10-16 | Apparatus for testing control apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01102376A true JPH01102376A (en) | 1989-04-20 |
Family
ID=17337848
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62259709A Pending JPH01102376A (en) | 1987-10-16 | 1987-10-16 | Apparatus for testing control apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01102376A (en) |
-
1987
- 1987-10-16 JP JP62259709A patent/JPH01102376A/en active Pending
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