JPH01102376A - Apparatus for testing control apparatus - Google Patents

Abstract

PURPOSE:To perform a test in the situation corresponding to the phenomenon of a real system, by imparting arbitrary voltage and a frequency variation pattern and giving the instantaneous value data formed on the basis of the given data to a control apparatus. CONSTITUTION:In a test apparatus TU, voltage V(t) and frequency f(t) to each time are selected from tables T1, T2 storing voltage and the change of frequency to a time and V(t)=V(t)sin{2piintegral f(t)dt} is calculated in a synthesizing part G. This output is given to a control apparatus CU to perform the test of every kind. By this method, the test can be performed in the situation corresponding to the phenomenon of a real system.

Description

[Detailed Description of the Invention] [Industrial Application Field] The present invention creates instantaneous value data from voltage effective value data and frequency data, and performs various control tests based on this data. The present invention relates to a device, and particularly to a device suitable for efficiently creating arbitrary frequency and voltage change patterns.

[Background of the invention]

゛Conventional testing equipment can test various control and protection devices by outputting various frequencies and voltages, as disclosed in Japanese Patent Application Laid-open No. 60-131032, but it is possible to test various control and protection devices. It could not be given in a pattern.

For this reason, it has the disadvantage that it cannot be used when the frequency and voltage are changed over time to match the phenomena of an actual system.

[Problem that the invention seeks to solve]

The above conventional technology does not take into account changes in voltage and frequency in arbitrary patterns, and when testing a control device with various voltage and frequency change patterns, it is necessary to test the target frequency and frequency. There was a problem that a voltage change pattern could not be obtained.

An object of the present invention is to provide a test device that can realize arbitrary voltage and frequency change patterns and test a control device based on instantaneous value information created based on this information. be.

[Means for solving problems]

The above object is achieved by providing an arbitrary voltage and frequency change pattern and providing instantaneous value information created based on this information to the control device.

[Effect]

The above test equipment can create any frequency change pattern, which allows various tests such as control and protection devices to be performed according to actual system conditions, and if a problem occurs, it can be installed in the actual system. Since countermeasures can be taken in advance, malfunctions will not occur when the control device is installed in an actual system.

〔Example〕

An embodiment of the present invention will be described below with reference to FIG. TL and T12 in the figure indicate a table that stores changes in voltage and frequency over time. The voltage V (t) and frequency f (t) for each time are selected from this table, and in the synthesis section G, v (t) = V (t) sin
(2π/ f (t) d t ) ”・(1) is calculated. This part indicates the test device TU.

This output is applied to the control device CU to perform various tests.

FIG. 2 shows the details of the 1-synthesizing section G, in which the frequency f (t) with respect to time is integrated in the integrating section 1o. The integration unit 11 multiplies the output of the block 10 by 2π, the block 12 calculates the sine function of the output of the block 11, and the block 13 multiplies the output of the block 12 by a voltage V (t).
to obtain each instantaneous voltage v (t).

An example of conducting a test using the above test device will be described. The output of the test device illustrated in FIG. 2 can be obtained as an instantaneous voltage value as shown in FIG. Based on this voltage, in a method of detecting one frequency using a method such as ``Frequency Detection Method'' in Japanese Patent Application No. 45-109496, one frequency is calculated as j=□...(2) Δtx+N Δt+Δt2 However, by comparing the input frequency and the calculated value, it is possible to determine whether or not the calculation is being performed normally, and if the calculated values are different.

The frequency detection device will be checked.

〔Effect of the invention〕

According to the present invention, it is possible to create instantaneous voltage values according to any frequency and voltage change pattern, and this data allows tests to be performed under conditions that correspond to phenomena in the actual system, so control and protection suitable for the actual system can be performed. Since it is possible to develop devices, it is possible to increase the stability of the system.

[Brief explanation of the drawing]

FIG. 1 is an explanatory diagram of an embodiment of the present invention, FIG. 2 is an explanatory diagram of the principle of the present invention, and FIG. 3 is an explanatory diagram of the output of the present invention. Tl, T2...Table, G...Composition section, TU...
・Test No. /U! 1 U vote 2 3rd round

Claims (1)

[Claims] 1. A first means for creating instantaneous value data at predetermined intervals from information given in terms of the effective value and frequency of voltage with respect to time; filtering the output of the first means and amplifying the output; A test device for a control device, characterized in that the output is used as input for various control and protection devices.