JP7889719B2 - イメージング質量分析を用いた解析方法 - Google Patents

イメージング質量分析を用いた解析方法

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Publication number
JP7889719B2
JP7889719B2 JP2025505092A JP2025505092A JP7889719B2 JP 7889719 B2 JP7889719 B2 JP 7889719B2 JP 2025505092 A JP2025505092 A JP 2025505092A JP 2025505092 A JP2025505092 A JP 2025505092A JP 7889719 B2 JP7889719 B2 JP 7889719B2
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Japan
Prior art keywords
analysis
mass spectrometry
region
matrix
imaging
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JP2025505092A
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English (en)
Japanese (ja)
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JPWO2024185286A1 (cg-RX-API-DMAC7.html
Inventor
晃士 奥田
真一 山口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
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Shimadzu Corp
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Publication of JPWO2024185286A1 publication Critical patent/JPWO2024185286A1/ja
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Publication of JP7889719B2 publication Critical patent/JP7889719B2/ja
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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0004—Imaging particle spectrometry
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H01J49/164—Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI]

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2025505092A 2023-03-07 2024-01-11 イメージング質量分析を用いた解析方法 Active JP7889719B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2023034857 2023-03-07
JP2023034857 2023-03-07
PCT/JP2024/000366 WO2024185286A1 (ja) 2023-03-07 2024-01-11 イメージング質量分析を用いた解析方法

Publications (2)

Publication Number Publication Date
JPWO2024185286A1 JPWO2024185286A1 (cg-RX-API-DMAC7.html) 2024-09-12
JP7889719B2 true JP7889719B2 (ja) 2026-07-14

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ID=92674800

Family Applications (1)

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JP2025505092A Active JP7889719B2 (ja) 2023-03-07 2024-01-11 イメージング質量分析を用いた解析方法

Country Status (4)

Country Link
EP (1) EP4679078A4 (cg-RX-API-DMAC7.html)
JP (1) JP7889719B2 (cg-RX-API-DMAC7.html)
CN (1) CN120604118A (cg-RX-API-DMAC7.html)
WO (1) WO2024185286A1 (cg-RX-API-DMAC7.html)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20160005578A1 (en) 2013-01-28 2016-01-07 Westfaelische Wilhelms-Universitaet Muenster Parallel elemental and molecular mass spectrometry analysis with laser ablation sampling
WO2020217334A1 (ja) 2019-04-24 2020-10-29 株式会社島津製作所 イメージング質量分析装置
JP2022517827A (ja) 2019-01-22 2022-03-10 イマビオテク 生物学的サンプル中の分子効果に関連する分子変化を評価するための方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019190841A (ja) 2018-04-18 2019-10-31 株式会社島津製作所 分析方法、分析装置およびプログラム

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20160005578A1 (en) 2013-01-28 2016-01-07 Westfaelische Wilhelms-Universitaet Muenster Parallel elemental and molecular mass spectrometry analysis with laser ablation sampling
JP2022517827A (ja) 2019-01-22 2022-03-10 イマビオテク 生物学的サンプル中の分子効果に関連する分子変化を評価するための方法
WO2020217334A1 (ja) 2019-04-24 2020-10-29 株式会社島津製作所 イメージング質量分析装置

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
BIANGA, Juliusz et al.，COMMUNICATION Complementarity of MALDI and LA ICP mass spectrometry for platinum anticancer imaging，Metallomics，2014年，Vol. 6 ，1382-1386，www.rsc.org/metallomics，DOI: 10.1039/c4mt00131a
HOLZLECHNER, Matthias et al.，Multisensor Imaging―From Sample Preparation to Integrated Multimodal Interpretation of LA-ICPMS and，Analytical Chemistry，2018年06月30日，90，8831-8837，DOI: 10.1021/acs.analchem.8b00816

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Publication number Publication date
JPWO2024185286A1 (cg-RX-API-DMAC7.html) 2024-09-12
EP4679078A4 (en) 2026-07-22
CN120604118A (zh) 2025-09-05
WO2024185286A1 (ja) 2024-09-12
EP4679078A1 (en) 2026-01-14

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