JP7647073B2 - 検眼システムおよび検眼プログラム - Google Patents

検眼システムおよび検眼プログラム Download PDF

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Publication number
JP7647073B2
JP7647073B2 JP2020199931A JP2020199931A JP7647073B2 JP 7647073 B2 JP7647073 B2 JP 7647073B2 JP 2020199931 A JP2020199931 A JP 2020199931A JP 2020199931 A JP2020199931 A JP 2020199931A JP 7647073 B2 JP7647073 B2 JP 7647073B2
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subject
eye
reaction time
test
guidance information
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Japanese (ja)
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JP2022087765A (ja
JP2022087765A5 (enExample
Inventor
有彩 島崎
妙子 堀野
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Nidek Co Ltd
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Nidek Co Ltd
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Priority to JP2020199931A priority Critical patent/JP7647073B2/ja
Priority to EP21781620.6A priority patent/EP4129155A4/en
Priority to US17/915,356 priority patent/US20230143549A1/en
Priority to PCT/JP2021/012742 priority patent/WO2021200604A1/ja
Publication of JP2022087765A publication Critical patent/JP2022087765A/ja
Publication of JP2022087765A5 publication Critical patent/JP2022087765A5/ja
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JP2020199931A 2020-03-31 2020-12-01 検眼システムおよび検眼プログラム Active JP7647073B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2020199931A JP7647073B2 (ja) 2020-12-01 2020-12-01 検眼システムおよび検眼プログラム
EP21781620.6A EP4129155A4 (en) 2020-03-31 2021-03-25 OPTOMETRY SYSTEM AND OPTOMETRY PROGRAM
US17/915,356 US20230143549A1 (en) 2020-03-31 2021-03-25 Optometry system and non-transitory computer-readable storage medium
PCT/JP2021/012742 WO2021200604A1 (ja) 2020-03-31 2021-03-25 検眼システムおよび検眼プログラム

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2020199931A JP7647073B2 (ja) 2020-12-01 2020-12-01 検眼システムおよび検眼プログラム

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JP2022087765A JP2022087765A (ja) 2022-06-13
JP2022087765A5 JP2022087765A5 (enExample) 2023-11-07
JP7647073B2 true JP7647073B2 (ja) 2025-03-18

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Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN119523406A (zh) * 2024-09-05 2025-02-28 广东省人民医院 一种同时测量双眼视力的方法及系统

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005342042A (ja) 2004-05-31 2005-12-15 Topcon Corp 検眼装置
JP2010005245A (ja) 2008-06-30 2010-01-14 Nidek Co Ltd 視標呈示装置
JP2017136131A (ja) 2016-02-01 2017-08-10 株式会社トプコン 眼科検査システム及び眼科検査管理サーバ

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3969020A (en) * 1973-12-28 1976-07-13 Giles C. Clegg, Jr. Automatic refraction apparatus and method
JPS6096237A (ja) * 1983-10-31 1985-05-29 株式会社島津製作所 自動検査機器システム
JPS61320A (ja) * 1984-06-12 1986-01-06 キヤノン株式会社 自動視力計

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005342042A (ja) 2004-05-31 2005-12-15 Topcon Corp 検眼装置
JP2010005245A (ja) 2008-06-30 2010-01-14 Nidek Co Ltd 視標呈示装置
JP2017136131A (ja) 2016-02-01 2017-08-10 株式会社トプコン 眼科検査システム及び眼科検査管理サーバ

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