JP7456512B2 - 学習装置、学習方法および学習プログラム - Google Patents

学習装置、学習方法および学習プログラム Download PDF

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JP7456512B2
JP7456512B2 JP2022545247A JP2022545247A JP7456512B2 JP 7456512 B2 JP7456512 B2 JP 7456512B2 JP 2022545247 A JP2022545247 A JP 2022545247A JP 2022545247 A JP2022545247 A JP 2022545247A JP 7456512 B2 JP7456512 B2 JP 7456512B2
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力 江藤
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NEC Corp
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    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
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    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N3/00—Computing arrangements based on biological models
    • G06N3/02—Neural networks
    • G06N3/08—Learning methods
    • G06N3/092—Reinforcement learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N5/00—Computing arrangements using knowledge-based models
    • G06N5/04—Inference or reasoning models
    • G06N5/045—Explanation of inference; Explainable artificial intelligence [XAI]; Interpretable artificial intelligence

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JP2022545247A 2020-08-31 2020-08-31 学習装置、学習方法および学習プログラム Active JP7456512B2 (ja)

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JPWO2022044315A1 JPWO2022044315A1 (https=) 2022-03-03
JPWO2022044315A5 JPWO2022044315A5 (https=) 2023-04-28
JP7456512B2 true JP7456512B2 (ja) 2024-03-27

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CN120322763A (zh) * 2022-12-09 2025-07-15 三菱电机株式会社 基于条件域自适应的异常检测方法
TWI912128B (zh) * 2025-02-04 2026-01-11 中華電信股份有限公司 用於資料分類的電子裝置及方法

Citations (2)

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Publication number Priority date Publication date Assignee Title
KR102132375B1 (ko) 2019-07-05 2020-07-09 한국과학기술원 딥 러닝 모델을 활용한 영상 진단 장치 및 그 방법
WO2020158609A1 (ja) 2019-01-31 2020-08-06 国立大学法人東京工業大学 立体構造判定装置、立体構造判定方法、立体構造の判別器学習装置、立体構造の判別器学習方法及びプログラム

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020158609A1 (ja) 2019-01-31 2020-08-06 国立大学法人東京工業大学 立体構造判定装置、立体構造判定方法、立体構造の判別器学習装置、立体構造の判別器学習方法及びプログラム
KR102132375B1 (ko) 2019-07-05 2020-07-09 한국과학기술원 딥 러닝 모델을 활용한 영상 진단 장치 및 그 방법

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
今井 拓司，「専門家の意図が分かる模倣学習を逆強化学習でＮＥＣが単発の意思決定問題から実用へ」，ＮＩＫＫＥＩ Ｒｏｂｏｔｉｃｓ，日経ＢＰ，2019年09月10日，第51号，pp.22-26，ISSN 2189-5783

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