JP7443831B2 - 検眼システム、検眼用コントローラ、および検眼プログラム - Google Patents

検眼システム、検眼用コントローラ、および検眼プログラム Download PDF

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JP7443831B2
JP7443831B2 JP2020037081A JP2020037081A JP7443831B2 JP 7443831 B2 JP7443831 B2 JP 7443831B2 JP 2020037081 A JP2020037081 A JP 2020037081A JP 2020037081 A JP2020037081 A JP 2020037081A JP 7443831 B2 JP7443831 B2 JP 7443831B2
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image
eye
examined
optometry
display
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JP2021137293A (ja
JP2021137293A5 (https=
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妙子 堀野
尋久 寺部
有彩 島崎
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Nidek Co Ltd
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Nidek Co Ltd
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JP2020037081A 2020-03-04 2020-03-04 検眼システム、検眼用コントローラ、および検眼プログラム Active JP7443831B2 (ja)

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JP2020037081A JP7443831B2 (ja) 2020-03-04 2020-03-04 検眼システム、検眼用コントローラ、および検眼プログラム

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JP2020037081A JP7443831B2 (ja) 2020-03-04 2020-03-04 検眼システム、検眼用コントローラ、および検眼プログラム

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JP2021137293A5 JP2021137293A5 (https=) 2023-02-15
JP7443831B2 true JP7443831B2 (ja) 2024-03-06

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004229769A (ja) 2003-01-29 2004-08-19 Nidek Co Ltd 検眼装置
US20130076884A1 (en) 2010-03-19 2013-03-28 Fittingbox Method and device for measuring an interpupillary distance
JP2015097931A (ja) 2012-07-04 2015-05-28 株式会社ニデック 検眼装置用コントローラ、検眼システム、検眼装置用プログラムを記憶する記憶媒体
JP2018089078A (ja) 2016-12-01 2018-06-14 株式会社ニデック 自覚式検眼装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004229769A (ja) 2003-01-29 2004-08-19 Nidek Co Ltd 検眼装置
US20130076884A1 (en) 2010-03-19 2013-03-28 Fittingbox Method and device for measuring an interpupillary distance
JP2015097931A (ja) 2012-07-04 2015-05-28 株式会社ニデック 検眼装置用コントローラ、検眼システム、検眼装置用プログラムを記憶する記憶媒体
JP2018089078A (ja) 2016-12-01 2018-06-14 株式会社ニデック 自覚式検眼装置

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