JP7436987B2 - 解析方法、解析装置及び解析プログラム - Google Patents
解析方法、解析装置及び解析プログラム Download PDFInfo
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Claims (5)
- コンピュータがFDTD法を用いて電磁界解析を行う解析方法において、
前記コンピュータが、
解析対象となる有限領域内から外部へ電磁界を放射させる開口部となる面領域を抽出する抽出工程と、
前記面領域に対し、電界に関する波動方程式における反射を0とする吸収面領域を設定する領域設定工程と、
ブロックごとに定められた媒質定数を記憶する記憶部が記憶している媒質定数、及び前記吸収面領域を用いてブロックごとに電磁界成分を計算する計算工程と
を実行することを特徴とする解析方法。 - 前記領域設定工程では、
前記面領域に対し、前記波動方程式における反射がある反射面領域を前記吸収面領域に重ねて設定すること
を特徴とする請求項1に記載の解析方法。 - FDTD法を用いて電磁界解析を行う解析装置において、
ブロックごとに定められた媒質定数を記憶する記憶部と、
解析対象となる有限領域内から外部へ電磁界を放射させる開口部となる面領域を抽出する抽出部と、
前記面領域に対し、電界に関する波動方程式における反射を0とする吸収面領域を設定する領域設定部と、
前記記憶部が記憶している媒質定数、及び前記吸収面領域を用いてブロックごとに電磁界成分を計算する計算部と
を有することを特徴とする解析装置。 - 前記領域設定部は、
前記面領域に対し、前記波動方程式における反射がある反射面領域を前記吸収面領域に重ねて設定すること
を特徴とする請求項3に記載の解析装置。 - 請求項3又は4に記載の解析装置の各部としてコンピュータを機能させるための解析プログラム。
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Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2004239736A (ja) | 2003-02-05 | 2004-08-26 | Ntt Docomo Inc | 電磁界特性解析方法 |
JP2017011518A (ja) | 2015-06-23 | 2017-01-12 | 日本電信電話株式会社 | 解析装置、解析方法および解析プログラム |
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Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2004239736A (ja) | 2003-02-05 | 2004-08-26 | Ntt Docomo Inc | 電磁界特性解析方法 |
JP2017011518A (ja) | 2015-06-23 | 2017-01-12 | 日本電信電話株式会社 | 解析装置、解析方法および解析プログラム |
Non-Patent Citations (1)
Title |
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竹山弘章 外4名,建物内外における電界強度分布のレイトレース解析,電子情報通信学会技術研究報告,社団法人電子情報通信学会,2011年05月19日,Vol. 111, No. 66,pp. 23-26 |
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