JP7415216B1 - Visual inspection equipment - Google Patents

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JP7415216B1
JP7415216B1 JP2023146841A JP2023146841A JP7415216B1 JP 7415216 B1 JP7415216 B1 JP 7415216B1 JP 2023146841 A JP2023146841 A JP 2023146841A JP 2023146841 A JP2023146841 A JP 2023146841A JP 7415216 B1 JP7415216 B1 JP 7415216B1
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啓順 北田
達也 山口
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ダイトロン株式会社
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Abstract

Figure 0007415216000001

【課題】検査時間の増加を抑えつつ、ワークの鮮明な画像を取得して正確な検査が可能な外観検査装置を提供する。
【解決手段】本発明の外観検査装置は、ピント調整範囲の中でピント位置が異なる複数の撮像画像を撮像し、撮像した複数の撮像画像からから合焦度が最も高い高合焦画像を選定し、選定した高合焦画像のピント位置がピント調整範囲の中間領域及び境界領域いずれの領域にあるのか判定し、中間領域であると判断されると高合焦画像を最適合焦画像に決定し、境界領域であると判断されるとピント調整範囲を再設定し、再設定したピント調整範囲の中でピント位置が異なる複数の再撮像画像を撮像し、撮像した複数の再撮像画像からから合焦度が最も高い高合焦画像を選定する。
【選択図】図2

Figure 0007415216000001

An object of the present invention is to provide an appearance inspection device that can obtain a clear image of a workpiece and perform accurate inspection while suppressing an increase in inspection time.
[Solution] The appearance inspection device of the present invention captures a plurality of captured images with different focus positions within a focus adjustment range, and selects a highly focused image with the highest degree of focus from among the captured multiple captured images. Then, it is determined whether the focus position of the selected high-focus image is in the intermediate region or the border region of the focus adjustment range, and if it is determined that it is in the intermediate region, the high-focus image is determined as the optimally focused image. However, if it is determined that it is a boundary area, the focus adjustment range is reset, multiple re-captured images with different focus positions are taken within the reset focus adjustment range, and the Select the highly focused image with the highest degree of focus.
[Selection diagram] Figure 2

Description

本発明は、検査対象物(ワーク)の外観を撮像する外観検査装置に関する。 The present invention relates to an appearance inspection device that images the appearance of an object to be inspected (work).

従来より、ワークの外観をカメラ等の撮像装置で撮像して取得した画像からワーク形状の異常や異物の付着等がないか確認する外観検査が行われている。 BACKGROUND ART Appearance inspections have conventionally been carried out to check whether there is any abnormality in the shape of the workpiece, adhesion of foreign matter, etc. from an image obtained by capturing an image of the appearance of the workpiece with an imaging device such as a camera.

このような外観検査では、撮像装置が事前に設定された調整範囲内で所定ピッチずつ撮像装置のフォーカス位置を変化させて繰り返し撮像を行い、複数の撮像画像を取得する。そして、取得した複数の撮像画像の中から最も合焦度が高い画像を使用してワークの外観を検査することがある。 In such a visual inspection, the imaging device repeatedly captures images by changing the focus position of the imaging device by a predetermined pitch within a preset adjustment range to obtain a plurality of captured images. Then, the appearance of the workpiece may be inspected using the image with the highest degree of focus from among the plurality of captured images.

特開2018-87708号公報JP2018-87708A

しかし、ワークの寸法公差や撮像環境の温度変化による熱収縮や熱膨張によって、ワークと撮像装置との距離が変化するため、最適なフォーカス位置が調整範囲に存在しないことがある。その場合、不鮮明な画像に基づいて外観検査が行われ正確な検査が困難となる。 However, because the distance between the workpiece and the imaging device changes due to dimensional tolerances of the workpiece and thermal contraction and expansion caused by temperature changes in the imaging environment, the optimal focus position may not exist within the adjustment range. In that case, the visual inspection is performed based on an unclear image, making accurate inspection difficult.

一方、調整範囲を広く設定すると、最適なフォーカス位置にてワークを撮像することができ鮮明な画像を得ることができるが、撮像回数が増加して検査時間が長くなる。 On the other hand, if the adjustment range is set wide, the workpiece can be imaged at the optimal focus position and a clear image can be obtained, but the number of times the image is taken increases and the inspection time becomes longer.

本発明は、上記の点に鑑みてなされたものであり、検査時間の増加を抑えつつ、ワークの鮮明な画像を取得して正確な検査が可能な外観検査装置を提供することを目的とする。 The present invention has been made in view of the above points, and an object of the present invention is to provide an appearance inspection device that can obtain a clear image of a workpiece and perform accurate inspection while suppressing an increase in inspection time. .

本発明は以下に示される実施形態を含む。 The present invention includes the embodiments shown below.

[1] ワークを撮像する撮像装置と、前記撮像装置を制御する制御部とを備え、最適合焦画像に基づき前記ワークの外観検査を行う外観検査装置であって、前記制御部は、前記撮像装置のピント位置をピント調整範囲の中で変化させ、各々のピント位置において前記撮像装置に前記ワークを撮像させて複数の撮像画像を生成させる撮像処理と、前記撮像処理で生成された複数の前記撮像画像について、合焦度を算出し、合焦度が最も高い高合焦画像を選定する選定処理と、前記ピント調整範囲の境界から所定範囲内の領域を境界領域、前記ピント調整範囲の前記境界領域以外の領域を中間領域とすると、前記選定処理において選定した前記高合焦画像が、前記中間領域のピント位置で撮像された画像であるか、前記境界領域のピント位置で撮像された画像であるかを判定する判定処理と、前記判定処理において前記高合焦画像が前記中間領域のピント位置で撮像された画像であると判断されたことを条件として、前記高合焦画像を最適合焦画像に決定する決定処理と、前記判定処理において前記高合焦画像が前記境界領域のピント位置で撮像された画像であると判断されたことを条件として、当該境界領域を外側に越えた新たなピント調整範囲を設定する再設定処理と、前記新たなピント調整範囲の中で前記撮像装置のピント位置を変化させ、各々のピント位置において前記撮像装置に前記ワークを撮像させて複数の再撮像画像を生成させる再撮像処理と、前記再撮像処理において生成された複数の前記再撮像画像について、合焦度を算出し、合焦度が最も高い高合焦画像を選定する再選定処理を実行し、前記最適合焦画像が撮像されたピント位置に基づいて、次回以降の前記撮像処理における前記ピント調整範囲を設定する外観検査装置。 [1] An appearance inspection device that includes an imaging device that images a workpiece and a control unit that controls the imaging device , and performs an appearance inspection of the workpiece based on an optimally focused image , wherein the control unit Imaging processing that changes the focus position of the device within a focus adjustment range and causes the imaging device to image the workpiece at each focus position to generate a plurality of captured images; A selection process that calculates the degree of focus for the captured image and selects a high-focus image with the highest degree of focus, and defines an area within a predetermined range from the boundary of the focus adjustment range as a boundary area If an area other than the boundary area is an intermediate area, the high-focus image selected in the selection process is an image captured at the focus position of the intermediate area, or an image imaged at the focus position of the boundary area. a determination process for determining whether the high-focus image is an image taken at a focus position in the intermediate area, and a determination process for determining whether the high-focus image is optimally focused, on the condition that it is determined in the determination process that the high-focus image is an image captured at a focus position in the intermediate area. A determination process for determining the in-focus image, and a new image beyond the boundary area on the condition that the high-focus image is determined to be an image taken at the focus position of the boundary area in the determination process. a resetting process for setting a focus adjustment range, and changing the focus position of the imaging device within the new focus adjustment range, causing the imaging device to image the workpiece at each focus position, and re-imaging a plurality of times. re-imaging processing that generates an image; and re-selection processing that calculates the degree of focus for the plurality of re-imaging images generated in the re-imaging processing and selects a highly focused image with the highest degree of focus. and an external appearance inspection device that sets the focus adjustment range in the image capturing process from the next time onwards based on the focus position at which the optimally focused image was captured .

[2] 前記制御部は、前記再選定処理において選定された高合焦画像に対して、前記判定処理、前記決定処理、前記再設定処理、前記再撮像処理、及び前記再選定処理を実行する上記[1]に記載の外観検査装置。 [2] The control unit executes the determination process, the determination process, the resetting process, the reimaging process, and the reselection process on the high-focus image selected in the reselection process. The appearance inspection device according to [1] above.

[3] 前記制御部は、前記選定処理で選定された前記高合焦画像と前記再選定処理で選定された前記高合焦画像のうち、合焦度が最も高い前記高合焦画像を前記最適合焦画像に決定する上記[1]又は[2]に記載の外観検査装置。 [3] The control unit selects the high-focus image with the highest degree of focus from among the high-focus image selected in the selection process and the high-focus image selected in the re-selection process. The visual inspection device according to [1] or [2] above, which determines the optimally focused image.

] 前記再撮像処理において前記撮像装置のピント位置を変化させるピッチが、前記撮像処理において前記撮像装置のピント位置を変化させるピッチより小さい、上記[1]~[]のいずれか1つに記載の外観検査装置。 [ 4 ] Any one of [1] to [ 3 ] above, wherein the pitch at which the focus position of the imaging device is changed in the re-imaging process is smaller than the pitch at which the focus position of the imaging device is changed in the imaging process. The appearance inspection device described in .

]前記制御部は、前記再設定処理が連続して閾値回数続いた場合、前記再撮像処理を中止してエラーを報知する報知処理を実行する、上記[2]に記載の外観検査装置。 [ 5 ] The visual inspection device according to [2] above, wherein the control unit executes a notification process for canceling the re-imaging process and notifying an error if the resetting process continues for a threshold number of times. .

]前記制御部は、前記選定処理で選定された前記高合焦画像の合焦度が閾値より低
い場合、前記判定処理を実行せずにエラーを報知する報知処理を実行する、上記[1]~
]のいずれか1つに記載の外観検査装置。
[ 6 ] The control unit executes a notification process for notifying an error without executing the determination process when the degree of focus of the highly focused image selected in the selection process is lower than a threshold value. 1]~
The appearance inspection device according to any one of [ 5 ].

本発明によれば、検査時間の増加を抑えつつ、ワークの鮮明な画像を取得して正確な検査を行うことができる。 According to the present invention, it is possible to acquire a clear image of a workpiece and perform accurate inspection while suppressing an increase in inspection time.

本発明の一実施形態にかかる外観検査装置の概略構成を示す図A diagram showing a schematic configuration of an appearance inspection device according to an embodiment of the present invention 外観検査装置によるワークWの外観検査方法を示すフローチャートFlowchart showing a method for visually inspecting a workpiece W using a visual inspection device 撮像画像のピント位置と合焦度の関係を例示するグラフであって、(a)は高合焦画像が境界領域のピント位置で撮像された画像の場合を示し、(b)は高合焦画像が中間領域のピント位置で撮像された画像の場合を示す。2 is a graph illustrating the relationship between the focus position of a captured image and the degree of focus, in which (a) shows a case where a high focus image is an image captured at a focus position in a boundary area, and (b) shows a case where a high focus image is an image captured at a focus position in a boundary area. A case is shown in which the image is captured at a focus position in the intermediate region.

以下、本発明の一実施形態について図面を参照して説明する。 Hereinafter, one embodiment of the present invention will be described with reference to the drawings.

(1)外観検査装置1の構成
まず、本実施形態の外観検査装置1の構成について図1に基づいて説明する。外観検査装置1は、ステージ2と、撮像装置3と、制御装置5とを備え、ステージ2に載置されたワークWを撮像装置3が撮影し、撮影して得られた撮像画像に基づいてワークWを検査する装置である。
(1) Configuration of visual inspection device 1 First, the configuration of visual inspection device 1 of this embodiment will be described based on FIG. 1. The appearance inspection device 1 includes a stage 2, an imaging device 3, and a control device 5, and the imaging device 3 photographs a workpiece W placed on the stage 2, and based on the captured image obtained by photographing. This is a device for inspecting a workpiece W.

ステージ2は、検査対象のワークWが載置される。ステージ2の上に載置されたワークWの上方に撮像装置3が設けられている。 On the stage 2, a workpiece W to be inspected is placed. An imaging device 3 is provided above a workpiece W placed on a stage 2.

撮像装置3は、撮像センサ31が設けられた筐体32と、検査レンズ33を保持するレンズ鏡筒34と、検査レンズ33のピント位置を動かす光学系駆動装置35とを備える。 The imaging device 3 includes a housing 32 in which an imaging sensor 31 is provided, a lens barrel 34 that holds an inspection lens 33, and an optical system drive device 35 that moves the focus position of the inspection lens 33.

撮像装置3では、検査レンズ33がステージ2の上に載置されたワークWの上面と上下方向に対向するように配置されている。光学系駆動装置35は検査レンズ33を光軸と平行な方向へ移動して撮像センサ31に結像する像のピントを調整する。これにより、撮像装置3は、ステージ2の上に載置されたワークWの上面を光学系である検査レンズ33で拡大して撮像センサ31で撮像するようになっている。 In the imaging device 3, the inspection lens 33 is arranged to face the upper surface of the workpiece W placed on the stage 2 in the vertical direction. The optical system driving device 35 moves the inspection lens 33 in a direction parallel to the optical axis to adjust the focus of the image formed on the image sensor 31. Thereby, the imaging device 3 magnifies the upper surface of the workpiece W placed on the stage 2 with the inspection lens 33, which is an optical system, and images it with the imaging sensor 31.

制御装置5は、コンピュータからなる処理装置51と、メモリーなどの記憶装置52とを有しており、記憶装置52に記憶されているプログラムを処理装置51が読み込んで実行することにより、撮像処理部53、データ取得部54、選定処理部55、判定処理部56、決定処理部57、再設定処理部58、再撮像処理部59、再選定処理部60、及び評価部61として機能する。 The control device 5 includes a processing device 51 consisting of a computer and a storage device 52 such as a memory, and when the processing device 51 reads and executes a program stored in the storage device 52, the imaging processing unit 53, functions as a data acquisition section 54, a selection processing section 55, a determination processing section 56, a determination processing section 57, a resetting processing section 58, a reimaging processing section 59, a reselection processing section 60, and an evaluation section 61.

撮像処理部53は、撮像装置3の撮像センサ31と光学系駆動装置35とを制御して撮像処理を行う。撮像処理部53は、ピント位置を開始位置から終了位置まで変化させるとともに、ピント位置が所定量だけ変化する毎に撮像装置3にワークWを撮像させて、ピント位置の異なる複数の撮像画像を生成させる。 The imaging processing unit 53 controls the imaging sensor 31 and the optical system driving device 35 of the imaging device 3 to perform imaging processing. The imaging processing unit 53 changes the focus position from the start position to the end position, and causes the imaging device 3 to image the work W every time the focus position changes by a predetermined amount, thereby generating a plurality of captured images with different focus positions. let

つまり、撮像処理部53は、ピント位置を変化させる範囲(ピント調整範囲)Rpと、隣接する撮像画像間のピント位置の変化量(フォーカスピッチ)Δfとを設定し、ピント調整範囲Rp内でピント位置がフォーカスピッチΔfずつ異なる複数の撮像画像Pを撮像装置3に生成させる。 That is, the imaging processing unit 53 sets the range (focus adjustment range) Rp in which the focus position is changed and the amount of change (focus pitch) Δf in the focus position between adjacent captured images, and focuses within the focus adjustment range Rp. The imaging device 3 is caused to generate a plurality of captured images P whose positions differ by a focus pitch Δf.

なお、以下の説明において、開始位置において撮像した画像を1番目の撮像画像P1といい、終了位置において撮像した画像をn番目の撮像画像Pnといい、1~n番目の撮像画像P1~Pnを総称して撮像画像Pという。 In the following description, the image captured at the start position is referred to as the first captured image P1, the image captured at the end position is referred to as the n-th captured image Pn, and the 1st to nth captured images P1 to Pn are referred to as the first captured image P1. These are collectively referred to as captured images P.

データ取得部54は、撮像装置3で生成された複数の撮像画像Pのデータを取得する。データ取得部54では、取得した撮像画像Pのデータと、その撮像画像Pが何番目の撮像画像であるのか(つまり、撮像画像Pの順序数)とが紐付けられる。データ取得部54において紐付けられたデータは記憶装置52に記憶される。 The data acquisition unit 54 acquires data of a plurality of captured images P generated by the imaging device 3. The data acquisition unit 54 associates the data of the acquired captured image P with the number of the captured image P (that is, the ordinal number of the captured image P). The data linked in the data acquisition unit 54 is stored in the storage device 52.

選定処理部55は、撮像処理で生成された複数の撮像画像Pから高合焦画像を選定する選定処理を行う。 The selection processing unit 55 performs a selection process of selecting a highly focused image from a plurality of captured images P generated in the imaging process.

具体的には、選定処理部55は、撮像装置3で生成された複数の撮像画像Pを記憶装置52から読み込み、複数の撮像画像Pのそれぞれの合焦度を算出する。合焦度を算出する方法として、種々の方法を採用することができ、例えば、選定処理部55は撮像画像P毎にシャープネス値を算出し、シャープネス値が大きい撮像画像ほど合焦度が高い画像と評価する。 Specifically, the selection processing unit 55 reads the plurality of captured images P generated by the imaging device 3 from the storage device 52, and calculates the degree of focus of each of the plurality of captured images P. Various methods can be adopted as a method for calculating the degree of focus. For example, the selection processing unit 55 calculates a sharpness value for each captured image P, and a captured image with a larger sharpness value is an image with a higher degree of focus. I evaluate it as.

そして、選定処理部55は、算出した合焦度のうち最も合焦度が高い撮像画像Pを高合焦画像に選定し、その結果を記憶装置52に記憶させる。 Then, the selection processing unit 55 selects the captured image P with the highest degree of focus among the calculated degrees of focus as the high-focus image, and stores the result in the storage device 52.

判定処理部56は、選定処理部55が選定した高合焦画像や再選定処理部60が選定した高合焦画像が、ピント調整範囲Rpの境界領域のピント位置で撮像された画像であるのか、ピント調整範囲Rpの中間領域のピント位置で撮像された画像であるのかを判定する判定処理を行う。 The determination processing unit 56 determines whether the high focus image selected by the selection processing unit 55 or the high focus image selected by the reselection processing unit 60 is an image captured at a focus position in the boundary area of the focus adjustment range Rp. , a determination process is performed to determine whether the image is captured at a focus position in the middle area of the focus adjustment range Rp.

ここで、ピント調整範囲Rpの境界領域とは、ピント調整範囲Rpの開始位置及び終了位置から所定範囲内の領域である。また、中間領域とは、開始位置側及び終了位置側の境界領域をそれぞれ除いた領域である。 Here, the boundary area of the focus adjustment range Rp is an area within a predetermined range from the start position and end position of the focus adjustment range Rp. Further, the intermediate area is an area excluding the boundary areas on the start position side and the end position side.

例えば、ピント調整範囲Rpの中でピント位置を変化させて50個の撮像画像Pを撮像する場合、境界領域とは、ピント調整範囲Rpの開始位置及び終了位置からフォーカスピッチΔfの2倍だけ離れたピント位置までの領域とすることができる。この時、1番目から3番目までの撮像画像P1~P3、及び、48番目から50番目までの撮像画像P48~P50が、ピント調整範囲Rpの境界領域のピント位置で撮像された画像であり、4番目から47番目までの撮像画像P4~P47が、ピント調整範囲Rpの中間領域のピント位置で撮像された画像である。 For example, when 50 captured images P are captured by changing the focus position within the focus adjustment range Rp, the boundary area is twice the focus pitch Δf from the start and end positions of the focus adjustment range Rp. This can be the area up to the focused position. At this time, the first to third captured images P1 to P3 and the 48th to 50th captured images P48 to P50 are images captured at the focus position of the boundary area of the focus adjustment range Rp, The fourth to forty-seventh captured images P4 to P47 are images captured at focus positions in the middle region of the focus adjustment range Rp.

決定処理部57は、判定処理部56において中間領域のピント位置で撮像された画像であると判定された高合焦画像を最適合焦画像に決定する決定処理を行う。 The determination processing unit 57 performs determination processing to determine the highly focused image determined by the determination processing unit 56 to be an image captured at a focus position in the intermediate region as the optimally focused image.

一方、判定処理部56において高合焦画像が境界領域のピント位置で撮像された画像であると判定された場合、再設定処理部58は、高合焦画像が撮像された境界領域を外側に超える新たなピント調整範囲Rp’を設定する再設定処理を行う。 On the other hand, if the determination processing unit 56 determines that the highly focused image is an image captured at the focus position of the boundary area, the resetting processing unit 58 moves the boundary area where the highly focused image was captured to the outside. A resetting process is performed to set a new focus adjustment range Rp' that exceeds the range Rp'.

新たなピント調整範囲Rp’の設定にあたり、再設定処理部58は、元のピント調整範囲Rpにおいて高合焦画像が撮像された境界領域と重複するように新たなピント調整範囲Rp’を設定する。 In setting the new focus adjustment range Rp', the resetting processing unit 58 sets the new focus adjustment range Rp' so that it overlaps with the boundary area where the highly focused image was captured in the original focus adjustment range Rp. .

例えば、複数の撮像画像Pのピント位置と合焦度との関係が図3(a)に示すようになり、判定処理部56において、高合焦画像が終了位置側の境界領域のピント位置で撮像された画像であると判断されると、再設定処理部58は、元のピント調整範囲Rpの境界領域を含むようにピント調整範囲Rpを終了位置側へシフトさせた範囲を新たなピント調整範囲Rp’に設定する(図3(b)参照)。 For example, the relationship between the focus position and the focus degree of the plurality of captured images P becomes as shown in FIG. When it is determined that the image is a captured image, the resetting processing unit 58 performs a new focus adjustment on a range in which the focus adjustment range Rp is shifted toward the end position so as to include the boundary area of the original focus adjustment range Rp. The range Rp' is set (see FIG. 3(b)).

より具体的には、開始位置から終了位置に向けてワークWの奥から手前にピント位置が変化するようにピント調整範囲Rpが設定されている場合に、終了位置側の境界領域のピント位置で撮像された画像が高合焦画像に選定されると、再設定処理部58は、開始位置及び終了位置をワークWの手前側へシフトさせた範囲を新たなピント調整範囲Rp’に設定する。その際、新たなピント調整範囲Rp’の開始位置は、元のピント調整範囲Rpの終了位置側の境界領域よりワークWの奥側に配され、新たなピント調整範囲Rp’が元のピント調整範囲Rpの終了位置側の境界領域と重複している。 More specifically, when the focus adjustment range Rp is set so that the focus position changes from the back to the front of the workpiece W from the start position to the end position, the focus position in the boundary area on the end position side When the captured image is selected as a highly focused image, the reset processing unit 58 sets a range in which the start position and end position are shifted toward the front side of the workpiece W as a new focus adjustment range Rp'. At that time, the start position of the new focus adjustment range Rp' is arranged further back of the workpiece W than the boundary area on the end position side of the original focus adjustment range Rp, and the new focus adjustment range Rp' is set to the original focus adjustment range Rp'. It overlaps with the boundary area on the end position side of the range Rp.

再撮像処理部59は、再設定処理部58において設定された新たなピント調整範囲Rp’内でピント位置がフォーカスピッチΔf’ずつ異なる複数の撮像画像(この撮像画像を「再撮像画像」ということもある)P’を撮像装置3に生成させる再撮像処理を行う。 The re-imaging processing unit 59 processes a plurality of captured images whose focus positions differ by a focus pitch Δf′ within the new focus adjustment range Rp′ set in the re-setting processing unit 58 (these captured images are referred to as “re-imaging images”). re-imaging processing that causes the imaging device 3 to generate P' is performed.

撮像装置3で生成された複数の再撮像画像P’のデータは、その順序数(開始位置で撮像した再撮像画像から何番目の再撮像画像であるのかを示す数)がデータ取得部54において紐付けられ、記憶装置52に記憶される。 The data of the plurality of re-imaged images P' generated by the imaging device 3 is determined by the data acquisition unit 54 according to its ordinal number (the number indicating the number of the re-imaged image from the re-imaged image taken at the starting position). The information is linked and stored in the storage device 52.

なお、再撮像処理部59において設定されるフォーカスピッチΔf’は、撮像処理部53において設定されたフォーカスピッチΔfと同じ大きさであってもよく、また、撮像処理部53において設定されたフォーカスピッチΔfよりも小さくてもよい。 Note that the focus pitch Δf′ set in the re-imaging processing unit 59 may be the same size as the focus pitch Δf set in the imaging processing unit 53, or may be the same size as the focus pitch Δf set in the imaging processing unit 53. It may be smaller than Δf.

再選定処理部60は、再撮像処理で生成された複数の再撮像画像P’から高合焦画像を選定する再選定処理を行う。 The reselection processing unit 60 performs reselection processing to select a highly focused image from a plurality of reimaging images P' generated in the reimaging processing.

具体的には、再選定処理部60は、再撮像処理部59によって生成された複数の再撮像画像P’を記憶装置52から読み込み、複数の再撮像画像P’のそれぞれの合焦度を算出する。そして、再選定処理部60は、算出した合焦度のうち最も合焦度が高い再撮像画像P’を高合焦画像に選定し、その結果を記憶装置52に記憶させる。 Specifically, the reselection processing unit 60 reads the plurality of re-imaging images P' generated by the re-imaging processing unit 59 from the storage device 52, and calculates the degree of focus for each of the plurality of re-imaging images P'. do. Then, the re-selection processing unit 60 selects the re-captured image P' having the highest degree of focus among the calculated degrees of focus as the high-focus image, and stores the result in the storage device 52.

再選定処理部60において合焦度を算出する方法は、選定処理部55において合焦度を算出する方法と同様、種々の方法を採用することができ、例えば、再撮像画像P’毎にシャープネス値を算出し、シャープネス値が大きい再撮像画像P’ほど合焦度が高い画像と評価する。 The method of calculating the degree of focus in the reselection processing section 60 can be the same as the method of calculating the degree of focus in the selection processing section 55, and various methods can be adopted, for example, sharpness The re-captured image P' with a larger sharpness value is evaluated as having a higher degree of focus.

そして、評価部61は、決定処理部57が最適合焦画像に決定した撮像画像Pに基づいて、ワークWの外観検査を行う。 The evaluation unit 61 then performs an external appearance inspection of the workpiece W based on the captured image P determined as the optimally focused image by the determination processing unit 57.

(2)外観検査装置1による検査方法
上記した外観検査装置1によるワークWの外観検査方法について、図2及び図3を参照して説明する。
(2) Inspection method using the appearance inspection apparatus 1 The appearance inspection method of the workpiece W using the above-mentioned appearance inspection apparatus 1 will be explained with reference to FIGS. 2 and 3.

まず、撮像処理部53は、ピント位置を開始位置から終了位置までピント調整範囲Rp内でフォーカスピッチΔfずつ変化させながらステージ2に載置されたワークWを撮像装置3で撮像する撮像処理を行う。これにより、ピント位置がフォーカスピッチΔfずつ異なる複数の撮像画像Pを生成する(ステップS1)。 First, the imaging processing unit 53 performs imaging processing in which the workpiece W placed on the stage 2 is imaged by the imaging device 3 while changing the focus position from the start position to the end position by the focus pitch Δf within the focus adjustment range Rp. . As a result, a plurality of captured images P whose focus positions differ by a focus pitch Δf are generated (step S1).

次いで、制御装置5は、選定処理部55において、撮像装置3が生成した複数の撮像画像Pのそれぞれの合焦度を算出するとともに、算出した合焦度のうち最も合焦度が高い撮像画像Pを高合焦画像に選定する選定処理を行う(ステップS2)。 Next, in the selection processing unit 55, the control device 5 calculates the degree of focus of each of the plurality of captured images P generated by the imaging device 3, and selects the captured image with the highest degree of focus among the calculated degrees of focus. A selection process is performed to select P as a highly focused image (step S2).

次いで、制御装置5は、判定処理部56において、ステップS2及び後述するステップS6で高合焦画像に選定あるいは再選定した撮像画像が、ピント調整範囲Rpの中間領域のピント位置で撮像された画像であるか否か判定する判定処理を行う(ステップS3)。 Next, in the determination processing unit 56, the control device 5 determines whether the captured image selected or reselected as a high-focus image in step S2 and step S6, which will be described later, is an image captured at a focus position in an intermediate region of the focus adjustment range Rp. A determination process is performed to determine whether or not (step S3).

複数の撮像画像Pのピント位置と合焦度との関係が図3(a)に例示するようになり、高合焦画像に選定した撮像画像がピント調整範囲Rpの境界領域で撮像された画像である場合(ステップS3のNo)、ステップS4へ進む。 The relationship between the focus position and the degree of focus of the plurality of captured images P is illustrated in FIG. 3(a), and the captured image selected as the highly focused image is an image captured in the boundary area of the focus adjustment range Rp. If so (No in step S3), the process advances to step S4.

ステップS4において、再設定処理部58が、高合焦画像が撮像された境界領域を外側に超える新たなピント調整範囲Rp’を設定する再設定処理を行う。例えば、図3(a)に示すように、高合焦画像に選定された撮像画像が、終了位置側の境界領域のピント位置で撮像された画像の場合、図3(b)に示すように、終了位置側の境界領域を外側に超えるように新たなピント調整範囲Rp’を設定する。 In step S4, the resetting processing unit 58 performs resetting processing to set a new focus adjustment range Rp' that extends outside the boundary area where the highly focused image is captured. For example, as shown in FIG. 3(a), if the captured image selected as the high-focus image is an image captured at the focus position of the boundary area on the end position side, as shown in FIG. 3(b), , a new focus adjustment range Rp' is set so as to extend outward beyond the boundary area on the end position side.

次いで、再撮像処理部59は、新たなピント調整範囲Rp’内でピント位置をフォーカスピッチΔf’ずつ変化させながらステージ2に載置されたワークWを撮像装置3で撮像して再撮像画像を生成する。これにより、ピント位置がフォーカスピッチΔf’ずつ異なる複数の再撮像画像P’を生成する再撮影処理を行う(ステップS5)。 Next, the re-imaging processing unit 59 images the workpiece W placed on the stage 2 with the imaging device 3 while changing the focus position by the focus pitch Δf' within the new focus adjustment range Rp' to obtain a re-imaging image. generate. Thereby, re-imaging processing is performed to generate a plurality of re-imaging images P' in which the focus positions differ by the focus pitch Δf' (step S5).

次いで、制御装置5は、再選定処理部60において、撮像装置3が生成した複数の再撮像画像P’のそれぞれの合焦度を算出するとともに、算出した合焦度のうち最も合焦度が高い再撮像画像P’を高合焦画像に再選定する再選定処理を行う(ステップS6)。 Next, in the reselection processing unit 60, the control device 5 calculates the focus degree of each of the plurality of re-imaging images P' generated by the imaging device 3, and selects the focus degree that is the highest among the calculated focus degrees. A reselection process is performed to reselect the highly re-captured image P' as a highly focused image (step S6).

高合焦画像を再選定した後、ステップS3に戻り、高合焦画像に再選定した撮像画像がピント調整範囲Rp’の中間領域のピント位置で撮像されるまで、新たなピント調整範囲Rp’を設定する再設定処理(ステップS4)と、再撮像画像P’を生成する再撮像処理(ステップS5)と、高合焦画像を再選定する再選定処理(ステップS6を)とを繰り返し行う。 After re-selecting the high-focus image, the process returns to step S3 and the new focus adjustment range Rp' is continued until the captured image re-selected as the high-focus image is captured at a focus position in the middle area of the focus adjustment range Rp'. A resetting process (step S4) for setting a re-imaged image P' (step S5), and a reselection process (step S6) for reselecting a highly focused image are repeatedly performed.

一方、図3(b)に示すように、ステップS2及びステップS6で高合焦画像に選定あるいは再選定した撮像画像が、ピント調整範囲Rpの中間領域で撮像された画像である場合、(ステップS3のYes)ステップS7へ進む。そして、決定処理部57は、高合焦画像に選定した撮像画像を最適合焦画像に決定する決定処理を行い(ステップS7)、評価部61が最適合焦画像に決定した撮像画像Pに基づいてワークWの外観検査を行う(ステップS8)。 On the other hand, as shown in FIG. 3(b), if the captured image selected or reselected as a high-focus image in step S2 and step S6 is an image captured in the middle region of the focus adjustment range Rp, (step (Yes in S3) Proceed to step S7. Then, the determination processing unit 57 performs a determination process to determine the captured image selected as the highly focused image as the optimally focused image (step S7), and based on the captured image P determined as the optimally focused image by the evaluation unit 61. The appearance of the workpiece W is inspected (step S8).

(3)効果
本実施形態の外観検査装置1では、高合焦画像が境界領域のピント位置で撮像されると、ピント調整範囲Rpを変更して再撮像画像P’の生成及び高合焦画像の再選定を行うため、より合焦度の高い撮像画像が得られるピント位置がピント調整範囲Rpの外側に存在しても、最適なピント位置でワークWを撮像した鮮明な撮像画像が得られる。
(3) Effect In the visual inspection apparatus 1 of this embodiment, when a highly focused image is captured at the focus position of the boundary area, the focus adjustment range Rp is changed to generate a re-captured image P' and a highly focused image. Even if the focus position is outside the focus adjustment range Rp, a clear image of the workpiece W can be obtained at the optimal focus position. .

また、本実施形態の外観検査装置1では、高合焦画像が中間領域のピント位置で撮像されると、ピント調整範囲を変更せずに当該高合焦画像に基づいてワークWの外観検査を行うため、不必要に広い範囲をわたってピント位置を変化させながら撮像画像を生成することがなく、検査時間の増加を抑えることができる。 In addition, in the appearance inspection apparatus 1 of this embodiment, when a highly focused image is captured at a focus position in the intermediate region, the appearance inspection of the workpiece W is performed based on the highly focused image without changing the focus adjustment range. Therefore, a captured image is not generated while changing the focus position over an unnecessarily wide range, and an increase in inspection time can be suppressed.

(4)変更例
以上、本発明の実施形態を説明したが、これらの実施形態は例として提示したものであり、発明の範囲を限定することを意図していない。これらの実施形態は、その他の様々な形態で実施されることが可能であり、発明の趣旨を逸脱しない範囲で、種々の省略、置き換え、変更を行うことができる。これらの実施形態やその変形は、発明の範囲や要旨に含まれると同様に、特許請求の範囲に記載された発明とその均等の範囲に含まれるものである。以下に変更例を説明する。なお、上記の実施形態に対して、以下に説明する複数の変更例のうちいずれか1つを適用しても良いし、以下に説明する変更例のうちいずれか2つ以上を組み合わせて適用しても良い。なお、以下の変更例の他にも様々な変更が可能である。
(4) Modification Examples The embodiments of the present invention have been described above, but these embodiments are presented as examples and are not intended to limit the scope of the invention. These embodiments can be implemented in various other forms, and various omissions, substitutions, and changes can be made without departing from the spirit of the invention. These embodiments and their modifications are included within the scope and gist of the invention as well as within the scope of the invention described in the claims and its equivalents. An example of the change will be explained below. Note that any one of the plurality of modification examples described below may be applied to the above embodiment, or any two or more of the modification examples described below may be applied in combination. It's okay. Note that various changes are possible in addition to the following example of change.

(4-1)変更例1
上記した実施形態では、選定処理部55において選定された高合焦画像が、ピント調整範囲の境界領域のピント位置で撮像された画像であると、中間領域のピント位置で撮像された画像から高合焦画像が選定されるまで、再設定処理、再撮像処理、再選定処理、及び判定処理を繰り返したが、再設定処理、再撮像処理及び再選定処理を1回だけ行い、再選定処理で選定された高合焦画像に基づいてワークWの外観検査を行ってもよい。
(4-1) Change example 1
In the above-described embodiment, if the high-focus image selected by the selection processing unit 55 is an image captured at a focus position in the boundary area of the focus adjustment range, it is higher than the image captured at a focus position in the intermediate area. The resetting process, reimaging process, reselection process, and judgment process were repeated until the focused image was selected, but the resetting process, reimaging process, and reselection process were performed only once, and the reselection process The appearance of the workpiece W may be inspected based on the selected highly focused image.

また、ピント調整範囲の中間領域のピント位置で撮像された画像から高合焦画像が選定されず、再設定処理を連続して所定の閾値回数Dだけ続けて実行した場合、つまり、再設定処理、再撮像処理、再選定処理、及び判定処理を1サイクルとすると所定の閾値サイクル数Dだけ繰り返して各処理を実行すると、処理装置51は、更に再設定処理を行わず、エラーを使用者に報知する報知処理を行ってもよい。 In addition, if a high-focus image is not selected from the images captured at a focus position in the middle area of the focus adjustment range, and the resetting process is continuously executed a predetermined threshold number of times D, that is, the resetting process , re-imaging processing, re-selection processing, and determination processing are taken as one cycle. If each processing is repeated for a predetermined threshold number of cycles D, the processing device 51 does not perform any further resetting processing and does not notify the user of the error. You may perform notification processing to notify.

(4-2)変更例2
上記した実施形態では、判定処理において、選定処理で選定した高合焦画像が記境界領域のピント位置で撮像された画像である判定されると、再設定処理、再撮影処理及び再選定処理を行い、再選定処理において再選定した高合焦画像を最適合焦画像としてワークWの外観検査に用いたが、選定処理で選定された高合焦画像と再選定処理で選定された高合焦画像のうち、合焦度が最も高い高合焦画像を最適合焦画像としてもよい。
(4-2) Change example 2
In the embodiment described above, when it is determined in the determination process that the high-focus image selected in the selection process is an image taken at the focus position of the boundary area, the resetting process, the reshooting process, and the reselection process are performed. The high-focus image selected in the re-selection process was used for the visual inspection of the workpiece W as the optimally focused image. Among the images, a highly focused image with the highest degree of focus may be set as the optimally focused image.

(4-3)変更例3
上記した実施形態において、処理装置51は、最適合焦画像が撮像されたピント位置に基づいて、次回以降の撮像処理におけるピント調整範囲を設定してもよい。
(4-3) Change example 3
In the embodiment described above, the processing device 51 may set the focus adjustment range for subsequent imaging processing based on the focus position where the optimally focused image was captured.

例えば、処理装置51は、決定処理部57が最適合焦画像を決定すると、最適合焦画像が撮像されたピント位置(以下、この位置を「最適ピント位置」という)を記憶装置52に記憶し、次回以降の撮像処理を実行する際に、記憶した最適ピント位置に基づいてピント調整範囲を設定してもよい。 For example, when the determination processing unit 57 determines the optimally focused image, the processing device 51 stores in the storage device 52 the focus position at which the optimally focused image was captured (hereinafter, this position will be referred to as the "optimal focus position"). The focus adjustment range may be set based on the stored optimal focus position when executing the next imaging process.

最適ピント位置に基づいてピント調整範囲を設定する方法としては、例えば、最適ピント位置がピント調整範囲の中心となるようにピント調整範囲を設定することができる。また、ピント調整範囲の設定に用いる最適ピント位置は、直近の検査で得られた最適ピント位置であったり、直近の複数回の検査で得られた最適ピント位置の平均値を用いてピント調整範囲を設定してもよい。 As a method of setting the focus adjustment range based on the optimum focus position, for example, the focus adjustment range can be set such that the optimum focus position is the center of the focus adjustment range. In addition, the optimal focus position used for setting the focus adjustment range may be the optimal focus position obtained in the most recent inspection, or the average value of the optimal focus positions obtained in the most recent multiple inspections. may be set.

(4-4)変更例4
上記した実施形態において、選定処理で選定された高合焦画像の合焦度が閾値より低い場合、処理装置51は判定処理を行わずエラーを使用者に報知する報知処理を行ってもよい。
(4-4) Change example 4
In the embodiment described above, if the degree of focus of the highly focused image selected in the selection process is lower than the threshold value, the processing device 51 may perform a notification process to notify the user of an error without performing the determination process.

1…外観検査装置
2…ステージ
3…撮像装置
5…制御装置
31…撮像センサ
32…筐体
33…検査レンズ
34…レンズ鏡筒
35…光学系駆動部
51…処理装置
52…記憶装置
53…撮像処理部
54…データ取得部
55…選定処理部
56…判定処理部
57…決定処理部
58…再設定処理部
59…再撮像処理部
60…再選定処理部
61…評価部
1... Visual inspection device 2... Stage 3... Imaging device 5... Control device 31... Imaging sensor 32... Housing 33... Inspection lens 34... Lens barrel 35... Optical system drive section 51... Processing device 52... Storage device 53... Imaging Processing unit 54...Data acquisition unit 55...Selection processing unit 56...Determination processing unit 57...Determination processing unit 58...Resetting processing unit 59...Reimaging processing unit 60...Reselection processing unit 61...Evaluation unit

Claims (6)

ワークを撮像する撮像装置と、前記撮像装置を制御する制御部とを備え、最適合焦画像に基づき前記ワークの外観検査を行う外観検査装置であって、
前記制御部は、
前記撮像装置のピント位置をピント調整範囲の中で変化させ、各々のピント位置において前記撮像装置に前記ワークを撮像させて複数の撮像画像を生成させる撮像処理と、
前記撮像処理で生成された複数の前記撮像画像について、合焦度を算出し、合焦度が最も高い高合焦画像を選定する選定処理と、
前記ピント調整範囲の境界から所定範囲内の領域を境界領域、前記ピント調整範囲の前記境界領域以外の領域を中間領域とすると、前記選定処理において選定した前記高合焦画像が、前記中間領域のピント位置で撮像された画像であるか、前記境界領域のピント位置で撮像された画像であるかを判定する判定処理と、
前記判定処理において前記高合焦画像が前記中間領域のピント位置で撮像された画像であると判断されたことを条件として、前記高合焦画像を最適合焦画像に決定する決定処理と、
前記判定処理において前記高合焦画像が前記境界領域のピント位置で撮像された画像であると判断されたことを条件として、当該境界領域を外側に越えた新たなピント調整範囲を設定する再設定処理と、
前記新たなピント調整範囲の中で前記撮像装置のピント位置を変化させ、各々のピント位置において前記撮像装置に前記ワークを撮像させて複数の再撮像画像を生成させる再撮像処理と、
前記再撮像処理において生成された複数の前記再撮像画像について、合焦度を算出し、合焦度が最も高い高合焦画像を選定する再選定処理を実行し、
前記最適合焦画像が撮像されたピント位置に基づいて、次回以降の前記撮像処理における前記ピント調整範囲を設定する外観検査装置。
A visual inspection device that includes an imaging device that images a workpiece and a control unit that controls the imaging device , and that performs a visual inspection of the workpiece based on an optimally focused image ,
The control unit includes:
Imaging processing that changes the focus position of the imaging device within a focus adjustment range and causes the imaging device to image the workpiece at each focus position to generate a plurality of captured images;
a selection process of calculating a degree of focus for the plurality of captured images generated in the image capturing process and selecting a highly focused image with the highest degree of focus;
If an area within a predetermined range from the boundary of the focus adjustment range is defined as a boundary area, and an area other than the boundary area of the focus adjustment range is defined as an intermediate area, the highly in-focus image selected in the selection process is an area within the intermediate area. determination processing for determining whether the image is an image taken at a focus position or an image taken at a focus position of the boundary area;
a determination process of determining the highly focused image as the optimally focused image on the condition that the highly focused image is determined to be an image captured at a focus position in the intermediate region in the determination process;
Resetting to set a new focus adjustment range outside the boundary area, on the condition that the highly focused image is determined to be an image taken at a focus position in the boundary area in the determination process. processing and
re-imaging processing of changing the focus position of the imaging device within the new focus adjustment range and causing the imaging device to image the workpiece at each focus position to generate a plurality of re-imaging images;
Calculating the degree of focus for the plurality of re-imaging images generated in the re-imaging process, and performing a re-selection process of selecting a highly focused image with the highest degree of focus ;
An appearance inspection device that sets the focus adjustment range in the image capturing process from next time onwards based on the focus position at which the optimally focused image was captured .
前記制御部は、前記再選定処理において選定された高合焦画像に対して、前記判定処理、前記決定処理、前記再設定処理、前記再撮像処理、及び前記再選定処理を実行する請求項1に記載の外観検査装置。 2. The control unit executes the determination process, the determination process, the reset process, the re-imaging process, and the re-selection process on the high-focus image selected in the re-selection process. The appearance inspection device described in . 前記制御部は、前記選定処理で選定された前記高合焦画像と前記再選定処理で選定された前記高合焦画像のうち、合焦度が最も高い前記高合焦画像を前記最適合焦画像に決定する請求項1に記載の外観検査装置。 The control unit brings the high-focus image with the highest degree of focus out of the high-focus image selected in the selection process and the high-focus image selected in the re-selection process into the optimal focus. The appearance inspection device according to claim 1, wherein the appearance inspection device is determined to be an image. 前記再撮像処理において前記撮像装置のピント位置を変化させるピッチが、前記撮像処理において前記撮像装置のピント位置を変化させるピッチより小さい、請求項1に記載の外観検査装置。 The external appearance inspection apparatus according to claim 1, wherein a pitch at which the focus position of the imaging device is changed in the reimaging process is smaller than a pitch at which the focus position of the imaging device is changed in the imaging process. 前記制御部は、前記再設定処理が連続して閾値回数続いた場合、前記再撮像処理を中止してエラーを報知する報知処理を実行する、請求項2に記載の外観検査装置。 The external appearance inspection apparatus according to claim 2, wherein the control unit executes a notification process of canceling the re-imaging process and notifying an error when the resetting process continues a threshold number of times. 前記制御部は、前記選定処理で選定された前記高合焦画像の合焦度が閾値より低い場合、前記判定処理を実行せずにエラーを報知する報知処理を実行する、請求項1に記載の外観検査装置。 The control unit executes a notification process of notifying an error without executing the determination process when the degree of focus of the highly focused image selected in the selection process is lower than a threshold value. Appearance inspection equipment.
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Citations (4)

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Publication number Priority date Publication date Assignee Title
JP2009008787A (en) 2007-06-27 2009-01-15 Nikon Corp Focusing device and microscope device
JP2010008630A (en) 2008-06-26 2010-01-14 Nikon Corp Focusing device and microscope apparatus
JP2015082096A (en) 2013-10-24 2015-04-27 株式会社キーエンス Controller for microscope apparatus, microscope system, control method, and program
JP2020086152A (en) 2018-11-27 2020-06-04 オムロン株式会社 Inspection system, inspection method, and program

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009008787A (en) 2007-06-27 2009-01-15 Nikon Corp Focusing device and microscope device
JP2010008630A (en) 2008-06-26 2010-01-14 Nikon Corp Focusing device and microscope apparatus
JP2015082096A (en) 2013-10-24 2015-04-27 株式会社キーエンス Controller for microscope apparatus, microscope system, control method, and program
JP2020086152A (en) 2018-11-27 2020-06-04 オムロン株式会社 Inspection system, inspection method, and program

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