JP7413383B2 - 情報表示装置、方法及びプログラム - Google Patents

情報表示装置、方法及びプログラム Download PDF

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JP7413383B2
JP7413383B2 JP2021532715A JP2021532715A JP7413383B2 JP 7413383 B2 JP7413383 B2 JP 7413383B2 JP 2021532715 A JP2021532715 A JP 2021532715A JP 2021532715 A JP2021532715 A JP 2021532715A JP 7413383 B2 JP7413383 B2 JP 7413383B2
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display
dimensional model
information
unit
management
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Japanese (ja)
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JPWO2021010038A1 (https=
Inventor
誠 與那覇
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Fujifilm Corp
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Fujifilm Corp
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Priority to JP2023189514A priority Critical patent/JP7557600B2/ja
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T19/00—Manipulating three-dimensional [3D] models or images for computer graphics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/048—Interaction techniques based on graphical user interfaces [GUI]
    • G06F3/0484—Interaction techniques based on graphical user interfaces [GUI] for the control of specific functions or operations, e.g. selecting or manipulating an object, an image or a displayed text element, setting a parameter value or selecting a range
    • G06F3/04845—Interaction techniques based on graphical user interfaces [GUI] for the control of specific functions or operations, e.g. selecting or manipulating an object, an image or a displayed text element, setting a parameter value or selecting a range for image manipulation, e.g. dragging, rotation, expansion or change of colour
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T15/00—Three-dimensional [3D] image rendering
    • G06T15/04—Texture mapping
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T19/00—Manipulating three-dimensional [3D] models or images for computer graphics
    • G06T19/20—Editing of three-dimensional [3D] images, e.g. changing shapes or colours, aligning objects or positioning parts
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2200/00—Indexing scheme for image data processing or generation, in general
    • G06T2200/24—Indexing scheme for image data processing or generation, in general involving graphical user interfaces [GUIs]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2219/00—Indexing scheme for manipulating 3D models or images for computer graphics
    • G06T2219/20—Indexing scheme for editing of 3D models
    • G06T2219/2016—Rotation, translation, scaling

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Computer Graphics (AREA)
  • Computer Hardware Design (AREA)
  • Software Systems (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Quality & Reliability (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Signal Processing (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Architecture (AREA)
  • Human Computer Interaction (AREA)
  • Processing Or Creating Images (AREA)
  • Bridges Or Land Bridges (AREA)
  • User Interface Of Digital Computer (AREA)
JP2021532715A 2019-07-18 2020-06-01 情報表示装置、方法及びプログラム Active JP7413383B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2023189514A JP7557600B2 (ja) 2019-07-18 2023-11-06 情報表示装置、方法及びプログラム

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019132789 2019-07-18
JP2019132789 2019-07-18
PCT/JP2020/021598 WO2021010038A1 (ja) 2019-07-18 2020-06-01 情報表示装置、方法及びプログラム

Related Child Applications (1)

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JP2023189514A Division JP7557600B2 (ja) 2019-07-18 2023-11-06 情報表示装置、方法及びプログラム

Publications (2)

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JPWO2021010038A1 JPWO2021010038A1 (https=) 2021-01-21
JP7413383B2 true JP7413383B2 (ja) 2024-01-15

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JP2021532715A Active JP7413383B2 (ja) 2019-07-18 2020-06-01 情報表示装置、方法及びプログラム
JP2023189514A Active JP7557600B2 (ja) 2019-07-18 2023-11-06 情報表示装置、方法及びプログラム

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US (1) US12283035B2 (https=)
JP (2) JP7413383B2 (https=)
WO (1) WO2021010038A1 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE112021008360T5 (de) * 2021-10-11 2024-08-01 Fuji Corporation Verwaltungseinrichtung und Verwaltungsverfahren
CN115062393B (zh) * 2022-07-19 2023-01-06 北京云庐科技有限公司 一种桥梁施工监测方法、装置、电子设备及介质
JP7752370B1 (ja) * 2025-03-14 2025-10-10 西部マリン・サービス株式会社 水上点検装置及び水上点検方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017168077A (ja) 2016-03-09 2017-09-21 株式会社リコー 画像処理方法、表示装置および点検システム
JP2017182695A (ja) 2016-03-31 2017-10-05 富士通株式会社 情報処理プログラム、情報処理方法および情報処理装置
JP2018151964A (ja) 2017-03-14 2018-09-27 朝日航洋株式会社 桟橋上部工下面の検査装置、桟橋上部工下面の検査システムおよび桟橋上部工下面の検査方法
JP2019049951A (ja) 2017-09-12 2019-03-28 西日本旅客鉄道株式会社 構造物管理装置、構造物管理方法、及び構造物管理プログラム

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6905956B2 (ja) 2018-06-01 2021-07-21 富士フイルム株式会社 ひび割れ変化判定装置および方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017168077A (ja) 2016-03-09 2017-09-21 株式会社リコー 画像処理方法、表示装置および点検システム
JP2017182695A (ja) 2016-03-31 2017-10-05 富士通株式会社 情報処理プログラム、情報処理方法および情報処理装置
JP2018151964A (ja) 2017-03-14 2018-09-27 朝日航洋株式会社 桟橋上部工下面の検査装置、桟橋上部工下面の検査システムおよび桟橋上部工下面の検査方法
JP2019049951A (ja) 2017-09-12 2019-03-28 西日本旅客鉄道株式会社 構造物管理装置、構造物管理方法、及び構造物管理プログラム

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Publication number Publication date
US12283035B2 (en) 2025-04-22
JP2024012527A (ja) 2024-01-30
US20220130030A1 (en) 2022-04-28
JP7557600B2 (ja) 2024-09-27
JPWO2021010038A1 (https=) 2021-01-21
WO2021010038A1 (ja) 2021-01-21

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