JP7400827B2 - 検出方法、検出プログラムおよび情報処理装置 - Google Patents

検出方法、検出プログラムおよび情報処理装置 Download PDF

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JP7400827B2
JP7400827B2 JP2021553229A JP2021553229A JP7400827B2 JP 7400827 B2 JP7400827 B2 JP 7400827B2 JP 2021553229 A JP2021553229 A JP 2021553229A JP 2021553229 A JP2021553229 A JP 2021553229A JP 7400827 B2 JP7400827 B2 JP 7400827B2
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寛彰 金月
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    • G06F18/21—Design or setup of recognition systems or techniques; Extraction of features in feature space; Blind source separation
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    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/285—Selection of pattern recognition techniques, e.g. of classifiers in a multi-classifier system
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JP2021553229A 2019-10-24 2019-10-24 検出方法、検出プログラムおよび情報処理装置 Active JP7400827B2 (ja)

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JP7306468B2 (ja) * 2019-10-24 2023-07-11 富士通株式会社 検出方法、検出プログラムおよび情報処理装置
CN111797893B (zh) * 2020-05-26 2021-09-14 华为技术有限公司 一种神经网络的训练方法、图像分类系统及相关设备
US20240289691A1 (en) * 2021-06-29 2024-08-29 Nec Corporation Machine learning model improvement measure presenting apparatus
US20240096063A1 (en) * 2022-09-21 2024-03-21 Microsoft Technology Licensing, Llc Integrating model reuse with model retraining for video analytics
WO2024247048A1 (ja) * 2023-05-29 2024-12-05 日本電信電話株式会社 逆像推定装置、逆像推定方法及びプログラム

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WO2016152053A1 (ja) 2015-03-23 2016-09-29 日本電気株式会社 精度推定モデル生成システムおよび精度推定システム
JP2019164774A (ja) 2018-03-15 2019-09-26 富士通株式会社 学習装置、検査装置、学習検査方法、学習プログラムおよび検査プログラム

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US20180268292A1 (en) * 2017-03-17 2018-09-20 Nec Laboratories America, Inc. Learning efficient object detection models with knowledge distillation
US11410029B2 (en) * 2018-01-02 2022-08-09 International Business Machines Corporation Soft label generation for knowledge distillation
US11487997B2 (en) * 2018-10-04 2022-11-01 Visa International Service Association Method, system, and computer program product for local approximation of a predictive model
CN113614738B (zh) * 2019-03-22 2024-12-17 国际商业机器公司 使用蒸馏的具有个体目标类别的多个模型的统一

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Publication number Priority date Publication date Assignee Title
WO2016152053A1 (ja) 2015-03-23 2016-09-29 日本電気株式会社 精度推定モデル生成システムおよび精度推定システム
JP2019164774A (ja) 2018-03-15 2019-09-26 富士通株式会社 学習装置、検査装置、学習検査方法、学習プログラムおよび検査プログラム

Non-Patent Citations (1)

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Title
ROMERO, Adriana ほか，FitNets: Hints for Thin Deep Nets，arXiv[online]，2015年03月27日，pp.1-13，[retrieved on 2019.12.19], Retrieved from the Internet: <URL: https://arxiv.org/pdf/1412.6550v4>

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