JP7246090B2 - Tools for transmission electron microscope observation samples - Google Patents

Tools for transmission electron microscope observation samples Download PDF

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JP7246090B2
JP7246090B2 JP2019203033A JP2019203033A JP7246090B2 JP 7246090 B2 JP7246090 B2 JP 7246090B2 JP 2019203033 A JP2019203033 A JP 2019203033A JP 2019203033 A JP2019203033 A JP 2019203033A JP 7246090 B2 JP7246090 B2 JP 7246090B2
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grid
transmission electron
electron microscope
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tool
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JP2021076467A (en
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則行 石井
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National Institute of Advanced Industrial Science and Technology AIST
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    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q

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Description

本発明は、透過型電子顕微鏡観察に用いられるグリッドを取り扱うための工具に関し、特に、グリッド上に観察試料を支持するための支持膜や薄膜状の観察試料などを与えるときに用いられる透過型電子顕微鏡観察試料用工具に関する。 TECHNICAL FIELD The present invention relates to a tool for handling a grid used for transmission electron microscope observation, and more particularly, to a transmission electron microscope used for providing a support film for supporting an observation sample on a grid, a thin film observation sample, and the like. It relates to tools for microscope observation samples.

透過型電子顕微鏡観察において、観察試料を電子線の通過する経路内に支持するために金属製のグリッドが用いられる。一般的なグリッドは、１つ又は複数の貫通孔を設けられ、典型的には、メッシュ状に加工された直径３ｍｍ程度の金属製の円板からなる。観察試料はグリッド上又はグリッド上に与えられた薄い支持膜の上に与えられて観察試料ホルダの所定位置に収容され、鏡筒の内部にセットされる。電子銃からの電子線は観察試料を透過して、更に、グリッドの穴や支持膜を通過（透過）して、下部の各種計測器に導かれるのである。ここで、このような小さなグリッドを用いた観察試料の調製のための各種工具が提案されている。 In transmission electron microscopy, a metal grid is used to support the specimen in the path of the electron beam. A typical grid is provided with one or more through-holes and typically consists of a metal disk with a diameter of about 3 mm processed into a mesh. An observation sample is provided on a grid or on a thin support film provided on the grid, accommodated in a predetermined position of an observation sample holder, and set inside the lens barrel. The electron beam from the electron gun passes through the observation sample, passes through (permeates) the holes in the grid and the support film, and is guided to various measuring instruments below. Here, various tools have been proposed for preparation of observation samples using such small grids.

例えば、特許文献１では、グリッドを水平方向に保持した状態で安定して運搬することを可能とする、いわゆる粘着ピンセットを改良した工具を開示している。２本の平行に突出した針部の先には、粘着性が与えられ、グリッドの周縁端部に貼り付いてこれを保持するとしている。一方、工具からのグリッドの脱離時には、先の細い精密ピンセットを２本の針部の間を介してグリッドを挟み込んで把持できる。ここでは、針部をグリッドの周縁部に沿って配置できるような、リング状の板を半分に切った半円弧形状のものとすることも開示している。 For example, Patent Literature 1 discloses a tool improved from so-called adhesive tweezers that enables stable transportation of grids while holding them horizontally. Adhesiveness is imparted to the tips of the two needles protruding in parallel so that they adhere to and hold the edge of the grid. On the other hand, when the grid is detached from the tool, precision tweezers with fine tips can be held by sandwiching the grid between the two needles. It also discloses that the needles are arranged along the periphery of the grid, and that the ring-shaped plate is cut in half to have a semicircular shape.

また、特許文献２では、グリッド上又はグリッド上の支持膜の上に薄膜状の観察試料を与えるための工具を開示している。持ち手となる柄の先の金属板からなる環状体は、外径をグリッドと同径とし、内径を透過型電子顕微鏡で観察可動範囲の円形孔と同じになるようにしている。その上で、水に浮かべた薄膜状の観察試料を環状体の内部に収めるように水面に沿って環状体を与え、表面張力により観察試料を水ごと持ち上げて、グリッドの上に移動させて与えるとしている。 Also, US Pat. No. 6,200,000 discloses a tool for providing a thin film of observation sample on a grid or on a support film on a grid. The annular body made of a metal plate at the tip of the handle, which serves as a handle, has the same outer diameter as the grid, and has the same inner diameter as the circular hole in the movable range of observation with a transmission electron microscope. On top of that, an annular body is provided along the water surface so that a thin film-like observation sample floating on water is contained inside the annular body, and the observation sample is lifted together with the water by surface tension and moved onto the grid. and

特開２０１５－４０７１２号公報JP 2015-40712 A 特許第５６２６６１５号公報Japanese Patent No. 5626615

観察試料を支持するための支持膜や薄膜状の観察試料などをグリッド上に与える場合、簡便には、先の細い精密ピンセットでグリッドの端部を保持し、水に浮かせた支持膜や薄膜状の観察試料をすくい取り、又は、その上に載せてから水から取り出すなどの方法が採用されている。このとき、不意な力がグリッドに加わると、グリッドを曲げてしまい、観察試料ホルダに収まらなくなるなど、電子顕微鏡観察に支障をきたすことがある。そこで、工具でグリッドの広い面積を保持し、支持膜や薄膜状の観察試料などをグリッド上に与えることが考慮できる。 When providing a support film or a thin film of observation sample on the grid, it is convenient to hold the edge of the grid with fine-tipped precision tweezers and place the support film or thin film floating on water. The observation sample is scooped up or placed on it and then removed from the water. At this time, if an unexpected force is applied to the grid, the grid may be bent and may not fit in the observation sample holder, thereby interfering with electron microscope observation. Therefore, it is conceivable to hold a large area of the grid with a tool and apply a supporting film, a thin film observation sample, or the like on the grid.

一方、一旦、工具で保持されたグリッドを観察試料ホルダの所定位置に収容するときなどに、再度、先の細い精密ピンセットでグリッドの端部を保持することになるが、このときも、同様に、不意な力がグリッドに加わることを防止する必要がある。そこで、操作性に優れ、取り扱いの確実性に優れた工具が求められる。 On the other hand, when the grid once held by the tool is housed in a predetermined position of the observation sample holder, the edge of the grid is again held by fine-tipped precision tweezers. , it is necessary to prevent accidental forces from being applied to the grid. Therefore, there is a demand for a tool that is excellent in operability and reliability in handling.

本発明は、以上のような状況に鑑みてなされたものであって、その目的とするところは、透過型電子顕微鏡観察に用いられるグリッド上に観察試料を支持するための支持膜や薄膜状の観察試料などを与えるときに用いられ、操作性に優れ、取り扱いの確実性に優れた透過型電子顕微鏡観察試料用工具を提供することにある。 The present invention has been made in view of the above circumstances, and an object of the present invention is to provide a support film or a thin film for supporting an observation sample on a grid used for transmission electron microscope observation. To provide a tool for a transmission electron microscope observation sample which is used when giving an observation sample, etc., is excellent in operability, and is excellent in reliability of handling.

本発明による透過型電子顕微鏡観察試料用工具は、透過型電子顕微鏡観察に用いられるグリッドを取り扱うための工具であって、前記グリッドを環状内部に配置され得る環状片の一部に欠損部を与えられており、前記欠損部を補間するように前記欠損部の両端部から中央部へ向けた弾性片をそれぞれ延在させていることを特徴とする。 A tool for a sample for transmission electron microscope observation according to the present invention is a tool for handling a grid used for transmission electron microscope observation, wherein the grid is provided with a cutout portion in a part of an annular piece that can be arranged inside the ring. and elastic pieces extending from both end portions of the missing portion toward the central portion so as to interpolate the missing portion.

かかる特徴によれば、支持膜や薄膜状観察試料を環状片ですくい取って環状内部を閉塞するように与え得てこの上にグリッドを配置することでグリッドを有する透過型電子顕微鏡観察試料を簡便に作成できる。そして、この透過型電子顕微鏡観察試料について欠損部を介してピンセットで簡単に保持し、確実に取り出せるのである。 According to this feature, the supporting film or the thin-film observation sample can be scooped up by the annular piece and given so as to block the annular inside, and the grid is arranged on this, whereby the transmission electron microscope observation sample having the grid can be easily obtained. can be created in Then, the transmission electron microscope observation sample can be easily held with tweezers through the defective portion and can be reliably taken out.

上記した発明において、前記環状内部に主面を平行に合わせて配置された前記グリッドを厚さ方向に挟み込んだピンセットの先端部について、前記弾性片の間で通過可能とすることを特徴としてもよい。かかる特徴によれば、操作性に優れるとともに、透過型電子顕微鏡観察試料の取り扱いの確実性にも優れるのである。 In the above-described invention, it may be characterized in that the tip of the tweezers sandwiching the grid arranged in the annular interior with the main surfaces parallel to each other in the thickness direction can pass between the elastic pieces. . According to such features, the operability is excellent, and the handling reliability of the transmission electron microscope observation sample is also excellent.

上記した発明において、前記環状片から延びる柄部を有することを特徴としてもよい。かかる特徴によれば、より操作性に優れるとともに、透過型電子顕微鏡観察試料の取り扱いの確実性にも優れるのである。 The invention described above may be characterized by having a handle portion extending from the annular piece. According to such features, the operability is more excellent, and the reliability of handling of the transmission electron microscope observation sample is also excellent.

上記した発明において、前記環状片の環状外周部には薄膜切断手段を設けられていることを特徴としてもよい。また、前記薄膜切断手段は鋸歯部からなることを特徴としてもよい。かかる特徴によれば、支持膜や薄膜状観察試料の大きさを簡単且つ確実に調整できて、操作性に優れるとともに、透過型電子顕微鏡観察試料の取り扱いの確実性にも優れるのである。 In the above-described invention, a thin film cutting means may be provided on the annular outer peripheral portion of the annular piece. Further, the thin film cutting means may be characterized by a serrated portion. According to such features, the sizes of the support film and the thin-film observation sample can be easily and reliably adjusted, and the operability is excellent, and the transmission electron microscope observation sample is also handled reliably.

本発明による透過型電子顕微鏡観察試料用工具を示す斜視図である。1 is a perspective view showing a tool for a transmission electron microscope observation sample according to the present invention; FIG. 本発明による透過型電子顕微鏡観察試料用工具の使用方法を示す斜視図である。1 is a perspective view showing how to use a tool for a transmission electron microscope observation sample according to the present invention; FIG.

本発明による透過型電子顕微鏡観察試料用工具について、図１を用いて説明する。 A transmission electron microscope observation sample tool according to the present invention will be described with reference to FIG.

透過型電子顕微鏡観察に用いられるグリッド１０を取り扱うための工具１は、柄部３の先端部に欠損部５を有する環状片７を一体成形された金属製の金魚すくいの「ぽい」のような形状の工具である。欠損部５には、先端部を閉じるように弾性片６が与えられている。後述するように、工具１は、水などの液体の上に浮かべた支持膜３０（図２参照）を環状片７ですくい取って、環状内部８を閉塞するように与えて、この上にグリッド１０を与えて透過型電子顕微鏡観察試料とする工具である。 A tool 1 for handling a grid 10 used for transmission electron microscopy is like a metal goldfish scoop "poi" integrally formed with an annular piece 7 having a cutout 5 at the tip of a handle 3. Shaped tools. The missing portion 5 is provided with an elastic piece 6 so as to close the tip portion. As will be described later, the tool 1 scoops a support film 30 (see FIG. 2) floating on a liquid such as water with the annular piece 7 to provide a closed annular interior 8 and a grid thereon. It is a tool that gives 10 and uses it as a transmission electron microscope observation sample.

環状片７は、耐食性を有するステンレス鋼などからなる金属製の板材からなり、柄部３の先端部に一体に加工されている。環状片７は、後述するように、グリッド１０よりも大なる環状内径を有し、グリッド１０をその環状内部８に配置させ得る（図２（ｃ）参照）。なお、形状としては、典型的には、円環状であるが、適宜用途に応じて、多角形の環状としてもよい。 The annular piece 7 is made of a metal plate material such as stainless steel having corrosion resistance, and is processed integrally with the tip portion of the handle portion 3 . The annular piece 7 has a larger annular inner diameter than the grid 10, allowing the grid 10 to be placed in its annular interior 8 (see FIG. 2(c)), as will be described later. Although the shape is typically circular, it may be a polygonal ring depending on the application.

環状片７における柄部３の延長線上、つまり、先端部には環状の一部を取り去って欠損部５が設けられる。欠損部５は、精密ピンセットの先端部を環状内部８にアクセスさせ、環状片７の主面を上下に往復動できるようにする間隙としての大きさで与えられる。また、欠損部５は、先端部に限定されず、側部など、環状内部８にピンセットの先端部をアクセスさせる各種用途に応じた位置に設けられ得る。 A cutout portion 5 is provided on the extended line of the handle portion 3 in the annular piece 7, that is, at the tip portion by removing a part of the annular shape. The cutout 5 is sized as a gap to allow the tip of the precision tweezers to access the annular interior 8 and reciprocate up and down the major surfaces of the annular piece 7 . Moreover, the cutout portion 5 is not limited to the tip portion, and can be provided at a position such as a side portion according to various uses for allowing the tip portion of the tweezers to access the annular interior 8 .

欠損部５の両端部から中央部へ向けて、欠損部５を補間するように、弾性片６ａ及び６ｂがそれぞれ延在している。弾性片６は、ゴムや樹脂製の帯体であって、一端部を欠損部５の外周面に貼り付けられている。若しくは、環状片７の主面側に貼り付けられていても良い。つまり、精密ピンセットの先端部が環状片７の主面を上下に往復動するときに、弾性片６ａ及び６ｂの間を通過可能なのである。弾性片６の形状は、欠損部５の曲線形状を補間するように曲面で構成されていることが好ましいが、平面上の略長方形の板状薄片でもよい。また、弾性片６は、後述するような使用の経年劣化により、弾性を失い、又は、汚染された場合には除去されて、更新され得るよう着脱自在であることが好ましい。 Elastic pieces 6a and 6b extend from both ends of the missing portion 5 toward the central portion so as to interpolate the missing portion 5. As shown in FIG. The elastic piece 6 is a band made of rubber or resin, and has one end attached to the outer peripheral surface of the cutout portion 5 . Alternatively, it may be attached to the main surface side of the annular piece 7 . That is, when the tip of the precision tweezers reciprocates up and down on the main surface of the annular piece 7, it can pass between the elastic pieces 6a and 6b. The shape of the elastic piece 6 is preferably configured with a curved surface so as to interpolate the curved shape of the missing portion 5, but it may be a substantially rectangular plate-like thin piece on a plane. Also, the elastic piece 6 is preferably detachable so that it can be removed and renewed if it loses its elasticity or becomes contaminated due to deterioration over time, as will be described later.

環状片７の環状外周部には、押し当てて支持膜３０を切断するための薄膜切断手段、典型的には、凹凸からなる鋸歯部７ａを設けることが好ましい。薄膜切断手段は比較的鋭利なカッター様の刃部であってもよい。 It is preferable to provide a thin film cutting means for cutting the supporting film 30 by pressing against the annular outer peripheral portion of the annular piece 7, typically a sawtooth portion 7a having unevenness. The thin film cutting means may be a relatively sharp cutter-like blade.

次に、上記した工具１の使用方法について、図２を用いて説明する。 Next, how to use the tool 1 described above will be described with reference to FIG.

図２（ａ）に示すように、シャーレ２０に水を入れ、支持膜３０を浮かべる。工具１の環状片７から延びる柄部３を把持し、環状片７を支持膜３０の側方から水中に差し込み、支持膜３０をそっとすくい取る。このとき、欠損部５には、弾性片６があるため、環状片７の上の支持膜３０が下方へ垂れることなく環状内部８を閉塞するように覆うのである。 As shown in FIG. 2(a), a petri dish 20 is filled with water and a support film 30 is floated thereon. The handle 3 extending from the annular piece 7 of the tool 1 is gripped, the annular piece 7 is inserted into the water from the side of the support film 30, and the support film 30 is gently scooped. At this time, since the elastic piece 6 is present in the missing portion 5, the support film 30 on the annular piece 7 does not hang down and covers the annular inside 8 so as to block it.

図２（ｂ）に示すように、先の細い精密ピンセット２１でグリッド１０の周縁端部を把持し、工具１の環状片７の上を覆った支持膜３０の上にそっと配置する。グリッド１０で支持膜３０をすくい上げるのではなく、グリッド１０を配置するだけであるから、グリッド１０に不意な力を掛け曲げてしまうようなこともない。 As shown in FIG. 2(b), fine-tipped precision tweezers 21 are used to grasp the peripheral edge of the grid 10 and gently place it on the supporting membrane 30 overlying the annular piece 7 of the tool 1. As shown in FIG. Since the support film 30 is not scooped up by the grid 10 but simply placed, the grid 10 is not subjected to an unexpected force and bent.

図２（ｃ）に示すように、精密ピンセット２１の先でグリッド１０及び支持膜３０を上下から挟み込むように且つ欠損部５の間を介して保持する。環状内部８に主面を平行に合わせて配置されたグリッド１０を厚さ方向に挟み込んだ精密ピンセット２１の先端部を弾性片６の間を通過させることで、支持膜３０を与えられたグリッド１０を得ることができる。 As shown in FIG. 2(c), the grid 10 and the support film 30 are sandwiched from above and below with the tips of the precision tweezers 21 and held between the missing portions 5. As shown in FIG. The grid 10 provided with the support film 30 is obtained by passing the tip of the precision tweezers 21 sandwiching the grid 10 in the thickness direction between the elastic pieces 6. can be obtained.

なお、図２（ｄ）に示すように、精密ピンセット２１での保持に先立って、環状片７の外周部の鋸歯部７ａに支持膜３０を押し当てて、支持膜３０をほぼ環状片７の上だけに存在するようにしておくこともできる。 In addition, as shown in FIG. 2(d), prior to holding by the precision tweezers 21, the supporting film 30 is pressed against the sawtooth portion 7a of the outer peripheral portion of the annular piece 7, so that the supporting film 30 is substantially aligned with the annular piece 7. It is also possible to make it exist only on the top.

ここで、支持膜３０が薄膜状試料であれば、グリッド１０に観察試料を直接与えることとなるし、支持膜３０の上に、薄片上の観察試料を与えておいて、上記操作を行うことで、試料グリッドを直接作製することもできる。 Here, if the support film 30 is a thin-film sample, the observation sample is directly applied to the grid 10, and the observation sample in the form of a thin piece is provided on the support film 30 before performing the above operation. , the sample grid can also be produced directly.

上記したように、精密ピンセット等で保持したグリッド１０に対して、カーボンなどの支持膜３０等を上下運動で通過させることにより、直接、支持膜３０を確実且つ簡便に与えることができる。これによれば、単体のグリッド１０に個別に施工が可能であって、実験条件等の検討の効率化に寄与する。 As described above, the support film 30 made of carbon or the like is vertically moved through the grid 10 held by precision tweezers or the like, so that the support film 30 can be directly provided reliably and easily. According to this, it is possible to construct the grid 10 individually, which contributes to the efficiency of examination of experimental conditions and the like.

また、例えば、アモルファスカーボンからなる支持膜３０で観察試料を上下からサンドイッチするように与えることも容易に出来て、電子線照射によるダメージの軽減や、無染色クライオ電顕用試料グリッド作製などの目的を簡便に達成し得る。更に、先端径の細いピペット等で吸引した場合、構造が壊れてしまうようなデリケートなナノ構造体を溶液中からすくい上げてグリッド１０の上に載せ、試料グリッドとして試料を破壊することなく作製することも容易となる。 In addition, for example, the support film 30 made of amorphous carbon can easily sandwich the observation sample from above and below. can be easily achieved. Furthermore, a delicate nanostructure whose structure would be broken when aspirated by a pipette with a fine tip diameter is scooped up from the solution and placed on the grid 10 to prepare a sample grid without destroying the sample. is also easier.

以上、本発明による代表的な実施例及びこれに伴う変形例について述べたが、本発明は必ずしもこれに限定されるものではなく、適宜、当業者によって変更され得る。すなわち、当業者であれば、添付した特許請求の範囲を逸脱することなく、種々の代替実施例及び改変例を見出すことができるであろう。 Although representative embodiments according to the present invention and variations associated therewith have been described above, the present invention is not necessarily limited to these, and can be modified as appropriate by those skilled in the art. That is, those skilled in the art will be able to find various alternatives and modifications without departing from the scope of the appended claims.

１ 工具
３ 柄部
５ 欠損部
６ 弾性片
７ 環状片
８ 環状内部
１０ グリッド
２０ シャーレ
３０ 支持膜

Reference Signs List 1 Tool 3 Handle 5 Defect 6 Elastic piece 7 Annular piece 8 Annular inner part 10 Grid 20 Petri dish 30 Support film

Claims (5)

透過型電子顕微鏡観察に用いられるグリッド上に薄膜を与えるための工具であって、
環状片を有し前記環状片の一部に欠損部を与えられており、前記欠損部を補間するように前記欠損部の両端部から中央部へ向けた弾性片をそれぞれ延在させて、前記環状片の上に環状内部を閉塞するように前記薄膜を与え更にこの上にグリッドを前記環状内部に配置させるように与えて用いられることを特徴とする透過型電子顕微鏡観察試料用工具。 A tool for applying thin films on grids used for transmission electron microscopy, comprising:
It has an annular piece and a missing portion is given to a part of the annular piece, and elastic pieces are extended from both ends of the missing portion toward the central portion so as to fill the missing portion . A tool for a transmission electron microscope observation sample, wherein the thin film is provided on the annular piece so as to close the annular interior, and the grid is provided on the thin film so as to be arranged in the annular interior. 前記環状内部に主面を平行に合わせて配置された前記薄膜及び前記グリッドを厚さ方向にピンセットの先端部にて挟み込んで前記ピンセットの前記先端部を前記弾性片の間で通過可能とすることを特徴とする請求項１記載の透過型電子顕微鏡観察試料用工具。 The thin film and the grid, which are arranged in the annular interior with their main surfaces parallel to each other , are sandwiched in the thickness direction by the tips of the tweezers so that the tips of the tweezers can pass between the elastic pieces. 2. The tool for transmission electron microscope observation specimen according to claim 1. 前記環状片から延びる柄部を有することを特徴とする請求項１又は２に記載の透過型電子顕微鏡観察試料用工具。 3. The tool for transmission electron microscope observation specimen according to claim 1, further comprising a handle extending from said annular piece. 前記環状片の環状外周部には前記環状片の上に与えた前記薄膜を押し当てて切断させる薄膜切断手段を設けられていることを特徴とする請求項１乃至３のうちの１つに記載の透過型電子顕微鏡観察試料用工具。 4. The method according to claim 1, wherein the annular outer peripheral portion of the annular piece is provided with thin film cutting means for pressing and cutting the thin film provided on the annular piece. tools for transmission electron microscope observation samples. 前記薄膜切断手段は鋸歯部からなることを特徴とする請求項４記載の透過型電子顕微鏡観察試料用工具。 5. A tool for a transmission electron microscope observation sample according to claim 4, wherein said thin film cutting means comprises a serrated portion.
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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001148228A (en) 2000-12-20 2001-05-29 Shigeo Kita Device for putting on grid ultra-thinly sliced piece of specimen for electron microscope
US20110027486A1 (en) 2009-07-31 2011-02-03 Tsinghua University Method for preparing transmission electron microscope sample
JP5626615B1 (en) 2014-04-28 2014-11-19 重夫 北 Loading device for ultra-thin sections of electron microscope specimens
JP2015040712A (en) 2013-08-20 2015-03-02 凸版印刷株式会社 Tool for collection/conveyance of grid for electronic microscope sample
WO2019013633A1 (en) 2017-07-14 2019-01-17 Hennyz B.V. Cryotransfer system

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Publication number Priority date Publication date Assignee Title
US4954712A (en) * 1989-10-16 1990-09-04 Wilcox Harry P Specimen retaining ring system for an electron microscope

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001148228A (en) 2000-12-20 2001-05-29 Shigeo Kita Device for putting on grid ultra-thinly sliced piece of specimen for electron microscope
US20110027486A1 (en) 2009-07-31 2011-02-03 Tsinghua University Method for preparing transmission electron microscope sample
JP2015040712A (en) 2013-08-20 2015-03-02 凸版印刷株式会社 Tool for collection/conveyance of grid for electronic microscope sample
JP5626615B1 (en) 2014-04-28 2014-11-19 重夫 北 Loading device for ultra-thin sections of electron microscope specimens
WO2019013633A1 (en) 2017-07-14 2019-01-17 Hennyz B.V. Cryotransfer system

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