JP7242456B2 - Inspection device and ceiling inspection method - Google Patents

Description

TECHNICAL FIELD The present invention relates to an inspection device and a ceiling inspection method, and more particularly to an inspection device and a ceiling inspection method suitable for three-dimensional measurement of the ceiling.

In the renewal work of a building, etc., the inside of the ceiling is inspected before starting the construction work. For example, the ceiling inspection device shown in Patent Document 1 is a ceiling inspection device that combines a lifting rod, a tripod, a light, a television camera, and an image reproducing device, and the television camera is installed by extending the lifting rod from an inspection opening in the ceiling. It was to insert and image the state of the ceiling. Further, in recent years, a technique has been adopted in which three-dimensional measurement is performed using a three-dimensional laser scanner or the like, and three-dimensional modeling is performed using a computer to visualize the state inside the ceiling in more detail.

However, conventional stationary three-dimensional scanners used at construction sites and the like are very heavy and have large main bodies. In addition, cables for connection with an external battery and computer equipment for operation were required, and handling was not good. On the other hand, in recent years, a compact and lightweight three-dimensional scanner as shown in Non-Patent Document 1 has been developed. The scanner of Non-Patent Document 1 is small and lightweight with a diameter of 100 mm, a height of 165 mm, and a weight of about 1 kg, and is capable of 3D modeling by high-speed laser scanning.

Japanese Utility Model Laid-Open No. 06-016621

Leica Geosystems AG - Part of Hexagon, ``Leica BLK360 Imaging Laser Scanner'', [online], [searched on July 4, 2019], Internet <URL: https://leica-geosystems.com/en-jp/ products/laser-scanners/scanners/blk360>

However, the scanner shown in Non-Patent Document 1 does not come with sufficient lighting to illuminate the dark ceiling. In order to perform 3D modeling from point cloud data acquired by a 3D laser scanner, it is essential to obtain a visible image with good visibility. there is For example, it is desirable to be able to achieve brightness similar to that of balloon lighting used at construction sites and the like even in ceilings, but balloon lighting is large in size and may itself obstruct the field of view. There are also problems in terms of power supply and handling. In particular, many of the items in the ceiling are metal objects with a metallic luster, and ordinary lighting fixtures are reflected by the metallic luster, and a decrease in visibility is foreseen.

SUMMARY OF THE INVENTION It is an object of the present invention to provide an inspection device and a method for inspecting inside a ceiling, which have good visibility and easy handling when inspecting inside the ceiling.

A first invention for solving the above-mentioned problems includes a vertically extendable support, a lighting unit attached to the upper end of the support to illuminate the surroundings, and a three-dimensional lighting unit attached to the top of the lighting unit to illuminate the surroundings. An inspection device comprising: a three-dimensional scanner for measuring a structure; and an interface section for transmitting measurement data from the three-dimensional scanner to an image processing device , wherein the lighting section is composed of a combination of a plurality of small light sources. is.

According to the inspection device of the first invention, the lighting unit is attached to the upper end of the extendable column, and the three-dimensional scanner is attached to the upper part of the lighting unit. It is possible to perform omnidirectional measurement with a three-dimensional scanner with good visibility. In addition, since the strut is extendable, it is possible not only to measure the inside of the ceiling while walking, but also to freely adjust the vertical position of the three-dimensional scanner, thereby expanding the measurement range of the three-dimensional scanner. Also, the amount of light can be freely adjusted. Therefore, it is possible to provide an inspection device that has suitable visibility and maneuverability for inspection in the ceiling.

A second aspect of the present invention includes a vertically extendable support, an illumination unit attached to the upper end of the support to illuminate the surroundings, and a three-dimensional scanner attached to the top of the illumination unit to measure the surrounding three-dimensional structure. , and an interface unit that transmits measurement data from the three-dimensional scanner to an image processing device, wherein the maximum diameter of the inspection device is less than the diameter of the downlight embedding hole. It is an inspection device. According to the inspection device of the second invention, the lighting unit is attached to the upper end of the extendable column, and the three-dimensional scanner is attached to the upper part of the lighting unit. It is possible to perform omnidirectional measurement with a three-dimensional scanner with good visibility. In addition, since the strut is extendable, it is possible not only to measure the inside of the ceiling while walking, but also to freely adjust the vertical position of the three-dimensional scanner, thereby expanding the measurement range of the three-dimensional scanner. Also, even if an inspection opening is not installed in advance in the ceiling, it is possible to inspect the inside of the ceiling by inserting the inspection device from the downlight embedding hole. Therefore, it is possible to provide an inspection device that has suitable visibility and maneuverability for inspection in the ceiling.

A third aspect of the present invention includes a vertically extendable support, an illumination unit attached to the upper end of the support to illuminate the surroundings, and a three-dimensional scanner attached to the top of the illumination unit to measure the surrounding three-dimensional structure. and an interface section for transmitting measurement data obtained by the three-dimensional scanner to an image processing device, wherein the color temperature of the lighting section is set to a daylight white color of about 4500K. According to the inspection device of the third aspect of the invention, the lighting unit is attached to the upper end of the extendable column, and the three-dimensional scanner is attached to the upper part of the lighting unit. It is possible to perform omnidirectional measurement with a three-dimensional scanner with good visibility. In addition, since the strut is extendable, it is possible not only to measure the inside of the ceiling while walking, but also to freely adjust the vertical position of the three-dimensional scanner, thereby expanding the measurement range of the three-dimensional scanner. In addition, from the viewpoint of the degree of reflection, color reproducibility, etc., the visibility in the ceiling is improved compared to incandescent colors and daylight colors. Therefore, it is possible to provide an inspection device that has suitable visibility and maneuverability for inspection in the ceiling.

Moreover, it is preferable that the lighting unit is arranged close to the support column. As a result, handling performance is improved, and since the illumination unit is out of the field of view of the three-dimensional scanner, it is possible to prevent backlight due to illumination and perform all-around measurement with the three-dimensional scanner with good visibility.

The three-dimensional scanner is preferably a laser scanner for obtaining point cloud data having three-dimensional coordinate values. This makes it possible to measure the three-dimensional structure inside the ceiling. Furthermore, the three-dimensional scanner preferably has an image scanner for obtaining image data. As a result, it becomes possible to generate a three-dimensional model by synthesizing the point cloud data and the image data, thereby improving the visibility of the structure in the ceiling.

The three-dimensional scanner is preferably capable of scanning in directions around a vertical axis and in directions around a horizontal axis. As a result, it is possible to measure the whole circumference at one point, and it is possible to efficiently inspect the inside of the ceiling.

It is preferable that the interface section performs wireless communication with the image processing apparatus. As a result, handling of the inspection device is improved as compared with the case where the interface section is wired. Moreover, it becomes possible to immediately send the measurement data to the image processing apparatus.

A fourth aspect of the present invention includes the steps of performing a radar survey of the ceiling base, drilling a small hole in the ceiling, checking the rolling wiring in the ceiling with a fiber scope, and drilling an inspection hole in the ceiling. , a step of inserting an inspection device from the inspection hole, a step of performing measurement with the inspection device, and a step of attaching a cover plate to the inspection hole after the measurement is completed, an illuminating unit attached to the upper end of the pillar to illuminate the surroundings; a 3D scanner attached to the upper part of the illuminating unit to measure the surrounding 3D structure; and measurement data from the 3D scanner. to an image processing device.

According to the method for inspecting the inside of the ceiling of the fourth invention, a radar survey is performed on the ceiling base, a small hole is drilled in the ceiling, the rolling wiring in the ceiling is confirmed with a fiber scope, and an inspection hole is drilled in the ceiling. The ceiling can be inspected by inserting the inspection device of the first invention through the inspection hole, performing measurement with the inspection device, and attaching the cover plate to the inspection hole after the measurement is completed. As a result, even if there is no inspection opening in the ceiling, drilling of the ceiling, measurement using the inspection device of the first invention, and recovery can be performed in this procedure, and measurement inside the ceiling can be performed efficiently. becomes.

A fifth invention includes a step of inserting an inspection device from a downlight embedding hole, and a step of performing measurement by the inspection device, wherein the inspection device includes a vertically extendable support and a support for the support. an illumination unit attached to the upper end to illuminate the surroundings, a three-dimensional scanner attached to the top of the illumination unit to measure the three-dimensional structure of the surroundings, and an interface unit for transmitting measurement data from the three-dimensional scanner to an image processing device A ceiling inspection method characterized by comprising:

According to the ceiling interior inspection method of the fifth invention, it is possible to insert the inspection device of the first invention from the downlight embedding hole and perform measurement with the inspection device. As a result, even if there is no inspection opening in the ceiling, it is possible to inspect the inside of the ceiling using the downlight embedding hole.

ADVANTAGE OF THE INVENTION By this invention, it becomes possible to provide the inspection apparatus and the inspection method in a ceiling which have suitable visibility and maneuverability in the inspection in a ceiling.

The figure which shows the external appearance of the inspection apparatus 1 A diagram for explaining the measurable range of the three-dimensional scanner 5. The figure which compares about the visibility in a ceiling. (a) In-ceiling image when the light source is installed at a position away from the inspection device 1, (b) In-ceiling image when the light source is installed in the non-measurable range of the inspection device 1 (a) Example of compact light source 41 used in illumination unit 4, (b) Perspective view showing an example of arrangement of compact light source 41, (c) Top view of (b) 4A and 4B are diagrams for comparing the visibility according to the color temperature of the illumination unit 4; FIG. (a-1) Visible image at color temperature of 3000K (light bulb color), (a-2) Point cloud image at color temperature of 3000K (light bulb color), (b-1) Color temperature of 4500K (neutral white) (b-2) Point cloud image with color temperature 4500 K (daylight white), (c-1) Visible image with color temperature 5700 K (daylight), (c-2) Color temperature 5700 K ( daylight color) point cloud image A diagram for explaining the measurable range of the inspection device 1 of the present invention. Block diagram showing the functional configuration and data flow of the three-dimensional scanner 5 Flowchart showing the procedure for inspecting the inside of the ceiling using the ceiling inspection opening Diagram for explaining each step of the flowchart shown in FIG. Flowchart showing the procedure of the inspection method in the ceiling using the downlight embedding hole Diagram for explaining each step of the flowchart shown in FIG. Flowchart showing the procedure for inspecting the inside of the ceiling when installing a new inspection hole Diagram for explaining each step of the inspection method in the ceiling of FIG. 4A and 4B are diagrams showing variations of arrangement of the compact light source 41. FIG. (a) In case of 2-level installation, (b) In case of 3-level installation FIG. 4 is a diagram showing an arrangement example of a compact light source 41; (a) 1-tier installation, (b) 2-tier installation FIG. 4 is a diagram showing an arrangement example of a compact light source 41; (a) 1-tier installation, (b) 2-tier installation FIG. 4 is a diagram showing an arrangement example of a compact light source 41; (a) 1-tier installation, (b) 2-tier installation A diagram showing an arrangement example of the compact light source 41 A diagram showing an installation example of the small light source 41 A diagram showing an installation example of the small light source 41 The figure which shows the external appearance of the inspection apparatus 1A which installed the wheel 21 on the tripod 2A. The figure which shows the external appearance of the inspection apparatus 1B using the three-dimensional scanner 5B.

Preferred embodiments of the present invention will be described in detail below with reference to the drawings.

[First embodiment]
First, a first embodiment of the present invention will be described.
FIG. 1 is a diagram showing the external configuration of an inspection device 1 according to the first embodiment. As shown in FIG. 1, the inspection device 1 includes a support 3 that can be expanded and contracted in the vertical direction, a lighting unit 4 that is attached to the upper end of the support 3 and illuminates the surroundings, and a three-dimensional light that is attached to the upper part of the lighting unit 4. a three-dimensional scanner 5 for measuring the structure. The pillar 3 is supported vertically by the tripod 2 .

The three-dimensional scanner 5 has a laser scanner 54 that measures the distance to surrounding objects. A laser scanner 54 obtains point cloud data having three-dimensional coordinate values. Moreover, it is desirable that the three-dimensional scanner 5 further includes an image scanner 55 for obtaining image data. The three-dimensional scanner 5 uses, for example, one capable of scanning in the direction around the vertical axis (that is, within the horizontal plane) and scanning in the direction around the horizontal axis (that is, within the vertical plane). Specifically, for example, when the BLK360 of Leica Corporation is adopted, as shown in FIG. ) can be measured.

From the viewpoint of enabling measurement in a narrow space and improving handling, the three-dimensional scanner 5 is desirably a small three-dimensional scanner that fits in the palm of the hand. In the case of the BLK360 manufactured by Leica, the diameter is 100 [mm], the height is 165 [mm], and the mass is 1 [kg], which is suitable. In addition, this size is a preferable example, and the present invention is not limited to this example. However, as will be described later, in order to use the inspection device 1 by inserting it into the ceiling through the hole for embedding the downlight, the size must be smaller than the diameter of the hole for embedding the downlight.

The illumination unit 4 is a light source for illuminating the inside of the ceiling, and is provided below the three-dimensional scanner 5 as shown in FIG. This is to prevent backlight caused by lighting. If the light source (illumination) is placed within the field of view (within the measurement range) of the three-dimensional scanner 5, it will be backlit as shown in FIG. However, if the light source is installed outside the field of view (unmeasurable range) of the three-dimensional scanner 5, the light becomes front light as shown in FIG. As shown in FIG. 2, since the area immediately below the three-dimensional scanner 5 is a non-measurable area, providing the illumination unit 4 below the three-dimensional scanner 5 prevents backlight and improves visibility.

It is desirable that the illumination unit 4 is configured by combining a plurality of small light sources 41 as shown in FIG. 4(a). 4A and 4B are diagrams for explaining the illumination unit 4. FIG. 4A is a diagram showing an example of the compact light source 41 used in the illumination unit 4, and FIG. Figure, (c) is a top view of (b).

A small light source 41 shown in FIG. 4A is a surface light source in which a plurality of LED lamps are arranged vertically and horizontally. As a suitable specific example, for example, "LUMENA2" can be used. In this case, the maximum illuminance is 1500 lumens, the color temperature is 3000K (bulb color) / 4500K (neutral white) / 5700K (daylight), and the size is 129 [mm] x 175 [mm] x 22.7 [mm]. ], weighing 280 g. The above example is just an example, and the present invention is not limited to this example.

The illumination unit 4 of the inspection device 1 shown in FIG. 1 is configured by attaching three small rectangular light sources 41 around the post 3, as shown in FIGS. 4(b) and 4(c). By arranging the three small light sources 41 in a triangular shape around the post 3 in this manner, illumination in all directions around the vertical axis is possible, which is suitable for illumination of the three-dimensional scanner 5 that measures the entire circumference. In addition, by arranging the small light source 41 as close to the column 3 as possible, the diameter can be made approximately the same as the diameter of the three-dimensional scanner 5, and installation outside the field of view of the three-dimensional scanner 5 is possible. Also, it becomes possible to insert it into a narrow space. As a result, the visibility and maneuverability of the inspection device 1 are improved. If the amount of light is insufficient, an additional small light source 41 may be installed (FIGS. 14 to 17). By combining the small light source 41, the amount of light can be adjusted.

Also, the change in visibility due to the color temperature of the illumination unit 4 will be described with reference to FIG. In FIG. 5, (a-1) is a visible image when the color temperature is 3000K (light bulb color), (a-2) is a point cloud image when the color temperature is 3000K (light bulb color), and (b-1) is the color temperature. Visible image for 4500K (daylight white), (b-2) is a point cloud image for color temperature 4500K (daylight white), (c-1) is a visible image for color temperature 5700K (daylight), ( c-2) is a point cloud image with a color temperature of 5700K (daylight color).

As shown in FIGS. 5(a-1) and 5(a-2), when a light bulb color with a color temperature of about 3000 K is used, an image with a yellow tint as a whole is obtained, which is different from the actual visual impression. As shown in FIGS. 5(b-1) and 5(b-2), when daylight white with a color temperature of about 4500K is used, the impression is closest to that seen by the naked eye, reflection is somewhat suppressed, and color reproducibility is high. Impression images can be obtained. As shown in FIGS. 5(c-1) and 5(c-2), when a daylight color with a color temperature of about 5700K is used, it feels bright, but the reflection is a little harsh and the contrast is high.

In this way, when the difference in visibility due to the color temperature is compared and examined, it is preferable to use daylight white with a color temperature of about 4500K in the ceiling inspection. Note that this comparison is the result of comparing the three colors that can be adjusted with the above-described "LUMENA2". Therefore, the color temperature of the light source (illumination unit 4) is not limited to 4500K, and it is desirable to adopt a light source with an optimum color temperature from the viewpoint of the degree of reflection, color reproducibility, and the like.

Next, the measurable range in the ceiling by the inspection device 1 of the present invention will be described with reference to FIG. In the ceiling, there are many facilities such as air conditioners and ducts that obstruct laser irradiation and visibility. Therefore, the information that can be obtained from the operation of one-point-one-measurement is limited. Therefore, at the same location, the measurement range can be expanded by extending and contracting the strut 3 to change the scanning height.

FIG. 6(a) is a diagram showing a laser-irradiated range (measurable range) when the three-dimensional scanner 5 is arranged in the lower part of the ceiling. Areas blocked by ducts, etc. are not measured. FIG. 6(b) is a diagram showing the laser irradiation range (measurable range) when the strut 3 is extended at the same location as in FIG. 6(a) and the height of the three-dimensional scanner 5 is changed. The upper part of the duct, etc. can be measured. By changing the scanning height (that is, changing the length of the support 3) in this way, a wider range can be measured as shown in FIG. 6(c).

Next, referring to FIG. 7, the internal configuration and data flow of the inspection device 1 (three-dimensional scanner 5) will be described. As shown in FIG. 7, the three-dimensional scanner 5 (inspection device 1) has a control section 51, a laser scanner 54, an image scanner 55, a storage section 52, a communication I/F section 53, and a battery (not shown).

The control unit 51 includes a CPU (Central Processing Unit), a ROM (Read Only Memory), a RAM (Random Access Memory), and the like. It is called to the area and executed, and drives and controls each part connected via the bus. The ROM permanently holds programs such as a boot program and BIOS, data, and the like. The RAM temporarily holds loaded programs and data, and has a work area used by the control unit 51 to perform various processes.
The control section 51 drives and controls each section of the three-dimensional scanner 5 based on control signals input from the image processing device 7 that is connected to the inspection device 1 for communication.

The storage unit 52 is a storage device such as a flash memory, and stores point cloud data measured by the laser scanner 54, image data measured by the image scanner 55, and the like.

The communication I/F unit 53 has a communication port for a wireless communication unit such as a WiFi antenna, Bluetooth (registered trademark), or a wired communication unit such as LAN, and a communication control device, and is an interface that mediates communication with external devices. is. As shown in FIG. 7, the inspection device 1 communicates with an external device such as an image processing device (computer) 7 and a cloud 6 via a communication I/F unit 53, and measures data (point cloud data and image data). is output to the image processing device (computer) 7, the cloud 6, or the like.

The laser scanner 54 measures the distance to the object by emitting laser light and receiving its reflected light. The measured data are collected as point group data, which are three-dimensional coordinate values around the installation location of the three-dimensional scanner 5 , and stored in the storage unit 52 .

The image scanner 55 is composed of a camera or the like using an imaging device such as a CCD image sensor or a CMOS image sensor, and obtains image data. The obtained image data is stored in the storage unit 52 . As described above, the laser scanner 54 and the image scanner 55 are capable of scanning in the direction around the vertical axis (that is, within the horizontal plane) and scanning in the direction around the horizontal axis (that is, within the vertical plane).

The image processing apparatus 7 is a computer including a control section (CPU, ROM, RAM), a storage section such as a hard disk, an SSD, and a flash memory, a communication section, an input section, a display section, a peripheral device I/F section, and the like. The image processing device 7 generates and outputs a three-dimensional model around the inspection device 1 from the measurement data (point cloud data and image data) acquired from the inspection device 1 (three-dimensional scanner 5). An application program for generating a three-dimensional model from measurement data is stored in the storage unit of the image processing device 7, and the CPU reads out the application program from the storage unit and executes it. The image processing device 7, for example, performs three-dimensional shape recognition from measurement data measured from several locations using the inspection device 1, and combines them into one three-dimensional model. Further, the image processing device 7 generates various images by generating a rendering image from the three-dimensional model, synthesizing the acquired measurement data with the CAD data of the building, and the like. Further, an operation instruction for the three-dimensional scanner 5 can be input via the input section of the image processing device 7 . The image processing device 7 generates a control signal according to the operation input from the input unit and inputs it to the three-dimensional scanner 5 .

Next, a ceiling interior inspection method using the inspection device 1 will be described.
First, a method for inspecting the inside of a ceiling using a previously installed ceiling inspection opening 81 will be described with reference to the flow chart of FIG. 8 and FIG.

As shown in FIG. 9A, when an inspection opening 81 is installed in the ceiling in advance, the operator inserts the inspection device 1 through the ceiling inspection opening 81 (step S101). At this time, the illumination unit 4 of the inspection device 1 is turned on. In the inspection device 1, the telescopic support 3 is connected to the three-dimensional scanner 5. By adjusting the support 3 to an appropriate length, the three-dimensional scanner 5 can be operated even while walking without using a stepladder or the like. It can be inserted into the ceiling inspection opening 81 .

The operator operates the image processing device 7 to start measurement by the inspection device 1 (step S102, FIG. 9(b)). The laser scanner 54 and image scanner 55 of the inspection device 1 are driven according to the control signal from the image processing device 7 to obtain measurement data (point cloud data and image data) in all directions (360 degrees in the horizontal direction and 300 degrees in the vertical direction). . In step S102, a wider range of measurement data can be obtained by measuring a single ceiling inspection opening 81 at a plurality of height positions. The measurement data are stored in the storage unit 52 of the inspection device 1 (three-dimensional scanner 5) and output to the image processing device 7. FIG. Alternatively, the inspection device 1 (three-dimensional scanner 5) may output the measurement data to the cloud 6 for storage.

When the measurement by the three-dimensional scanner 5 is completed, the operator pulls out the inspection device 1 from the ceiling inspection opening 81 and closes the ceiling inspection opening 81 to complete the measurement work.

Next, a ceiling inspection method using the downlight embedding hole 83 will be described with reference to the flow chart of FIG. 10 and FIG. 11 . There are various sizes of the downlight embedding hole 83, but if the downlight embedding hole 83 has a size larger than the maximum diameter of the inspection device 1, the lighting fixture 82 can be removed and used as a hole for measurement. For example, as described above, when Leica's "BLK360" is used as the three-dimensional scanner 5 and "Lumena2" is used as the compact light source 41 in combination as shown in FIG. It becomes less than about [mm]. In this case, if the downlight embedding hole 83 has a diameter of about 120 [mm] or more, the lighting fixture 82 can be removed and used for inspection inside the ceiling.

The operator first removes the downlight (lighting fixture 82) from the ceiling (step S201, FIGS. 11(a) and (b)), and inserts the inspection device 1 from the downlight embedding hole 83 (step S202, FIG. 11). (c)). At this time, the lighting unit 4 is turned on.

The operator operates the image processing device 7 to start measurement by the inspection device 1 (step S203). The laser scanner 54 and image scanner 55 of the inspection device 1 are driven according to the control signal from the image processing device 7 to obtain measurement data (point cloud data and image data) in all directions (360 degrees in the horizontal direction and 300 degrees in the vertical direction). . A wider range of measurement data can be obtained by extending the column 3 and performing measurement at a plurality of height positions for one downlight embedding hole 83 . The measurement data are stored in the storage unit 52 of the inspection device 1 (three-dimensional scanner 5) and output to the image processing device 7. FIG. Alternatively, the inspection device 1 (three-dimensional scanner 5) may output the measurement data to the cloud 6 for storage.

When the measurement by the three-dimensional scanner 5 is completed, the operator pulls out the inspection device 1 from the downlight embedding hole 83, puts the downlight (lighting fixture 82) back, and completes the measurement work.

Since the inspection device 1 of the present invention is small, it can be inserted through the downlight embedding hole 83, and the ceiling can be inspected even if the inspection opening 81 shown in FIG. 9 is not installed in the ceiling.

Next, with reference to the flow chart of FIG. 12 and FIG. 13, a method of inspecting the interior of the ceiling when newly providing an opening for measurement (inspection hole 97) in the ceiling will be described. If the ceiling inspection opening 81 or the downlight 82 is not installed at the place to be inspected, a hole for measurement (inspection hole 97) is drilled in the ceiling, and the inside of the ceiling can be inspected.

First, the worker searches the ceiling substrate with the radar probe 91 (step S301, FIG. 13(a)). Then, a small hole 93 through which the fiber scope 94 passes is drilled using a drill 92 where there is no base (step S302, FIG. 13(b)). The operator inserts the fiber scope 94 through the small hole 93 opened in step S302, and confirms whether or not there is a rolling wiring 95 behind the ceiling (step S303, FIG. 13(c)).

After confirming that there is no risk of disconnection of the wiring, the main hole (inspection hole 97) is drilled (step S304, FIGS. 13(d) and 13(e)). It is desirable to use a hole saw 96 with a dust-proof cup and an adjustable cutting length to match the thickness of the ceiling board. The diameter of the inspection hole 97 should be equal to or greater than the maximum diameter of the inspection device 1 .

After the inspection hole 97 is drilled in this way, the operator inserts the inspection device 1 through the inspection hole 97 (step S305, FIG. 13(f)). At this time, the lighting unit 4 is turned on.

The operator operates the image processing device 7 at hand to start measurement by the inspection device 1 (step S306). The laser scanner 54 and image scanner 55 of the inspection device 1 are driven according to the control signal from the image processing device 7 to obtain measurement data (point cloud data and image data) in all directions (360 degrees in the horizontal direction and 300 degrees in the vertical direction). . A wider range of measurement data can be obtained by extending the strut 3 and performing measurement at a plurality of height positions for one inspection hole 97 . The measurement data are stored in the storage unit 52 of the inspection device 1 (three-dimensional scanner 5) and output to the image processing device 7. FIG. Alternatively, the inspection device 1 (three-dimensional scanner 5) may output the measurement data to the cloud 6 for storage.

When the measurement by the three-dimensional scanner 5 is completed, the operator removes the inspection device 1 from the inspection hole 97, closes the inspection hole 97 with the cover plate 98, and restores the ceiling (step S307, FIG. 13(g)). This completes the measurement work.

By drilling a new inspection hole 97 in the ceiling in this way, it becomes possible to inspect the inside of the ceiling using the inspection device 1 of the present invention. Since the inspection device 1 of the present invention is small, a relatively small inspection hole 97 is sufficient, and the effect on the appearance can be suppressed. 12, the inspection hole 97 can be provided at an appropriate position in consideration of the ceiling foundation and wiring, and the work of drilling, measurement, and restoration can be carried out in a series of flow. can be done efficiently.

[Second embodiment]
Next, a second embodiment of the invention will be described. In the first embodiment, an example in which the illumination unit 4 of the inspection device 1 is configured using three light sources 41 has been described. good. Hereinafter, aspects of the illumination unit 4 will be described with reference to the drawings.

FIG. 14(a) is a perspective view of an illumination section 4A composed of two stages, and FIG. 14(b) is a perspective view of an illumination section 4B composed of three stages.
As shown in FIG. 14( a ), when the illumination section 4</b>A is configured in two stages, three small light sources 41 are arranged in the lower stage and three small light sources 41 in the upper stage with the column 3 as the center. FIG. 15(a) is a top view of the illumination section 4 configured in one stage, and FIG. 15(b) is a top view of the illumination section 4A configured in two stages. In each stage, the three small light sources 41 are arranged with the pillar 3 as the center so that the irradiation surface faces outward and the long sides of the small light sources 41 are in contact with each other. Further, as shown in FIG. 15(b), the directions of the irradiation surfaces of the small light sources 41 in the upper stage and the lower stage are arranged so as to differ by 60 degrees with the column 3 as the axis.

As shown in FIG. 14(b), when the illumination unit 4B is configured in three stages, three small light sources 41 in the lower stage, three in the middle stage, and three in the upper stage around the post 3 are arranged so that the irradiation surface is outside. are placed in the same direction. In each stage, the long sides of the small light sources 41 are arranged so as to be in contact with each other. The direction of the irradiation surface of each small light source 41 is arranged to differ by 60 degrees around the support 3 between the upper stage and the middle stage, and the direction of the irradiation surface of each small light source 41 between the middle stage and the lower stage is 60 degrees around the support 3 as an axis. arranged differently.

By constructing the lighting section 4 in a plurality of stages like the lighting sections 4A and 4B, the number of the light sources 41 can be easily increased without changing the diameter of the inspection device 1, and the amount of light can be freely adjusted.

[Third embodiment]
Next, a third embodiment of the invention will be described. Four or more compact light sources 41 may be used in the illumination unit 4 . Moreover, it is good also as a structure which provided the small light source 41 of four or more in multiple stages.

FIG. 16(a) is a top view of an illumination unit 4C configured using four small light sources 41, and FIG. 16(b) is an illumination configured by combining the illumination units 4C of FIG. 16(a) in two stages. It is a top view of part 4D.
As shown in FIG. 16(a), the four small light sources 41 of the illumination section 4C are arranged around the support 3 so that the illuminated surface faces outward. The left end of each small light source 41 is arranged so as to be in contact with the right end of the adjacent small light source 41, forming a square when viewed from above. 16(b), in the case of a two-stage configuration, the direction of the irradiation surface of each small light source 41 in the upper stage and the lower stage is arranged to differ by 45 degrees with the column 3 as an axis. be done.

FIG. 17(a) is a top view of an illumination unit 4E configured using six small light sources 41, and FIG. 17(b) is an illumination configured by combining two stages of the illumination units 4E of FIG. 17(a). It is a top view of part 4F.
As shown in FIG. 17(a), the six small light sources 41 are arranged around the column 3 so that the irradiation surface faces outward. The left end of each small light source 41 is arranged so as to be in contact with the right end of the adjacent small light source 41, forming a regular hexagon when viewed from above. As shown in FIG. 17(b), in the case of a two-stage configuration, the direction of the irradiation surface of each small light source 41 in the upper stage and the lower stage is different by 30 degrees with the column 3 as an axis.

FIG. 18 is a top view of an illumination section 4G configured using eight compact light sources 41. FIG. As shown in FIG. 18, the eight small light sources 41 are arranged around the column 3 so that the illuminated surface faces outward. The left end of each small light source 41 is arranged so as to be in contact with the right end of the adjacent small light source 41, forming a regular octagon when viewed from above. Although not shown, the lighting units 4G in FIG. 18 may be combined in two stages.
In this manner, the amount of light can be freely adjusted by changing the number of small light sources 41 in each stage or increasing the number of stages.

Here, how to attach the compact light source 41 will be described with reference to FIG. 19 . FIG. 19 is a top view of an illumination section 4H configured using six small light sources 41. FIG. Six arms 45 are radially provided on the column 3 around the column 3 , and each arm 45 is connected to the back surface of each small light source 41 to support the small light source 41 .

Moreover, as shown in FIG. 20, the connecting portion between the arm 45 attached to the column 3 and the compact light source 41 may be configured to be rotatable about the horizontal axis, as in an illumination portion 4J. As a result, the installation angle of the small light source 41 can be changed upward or downward, and the irradiation range of the illumination unit 4J can be adjusted upward or downward.

[Fourth embodiment]
Next, a fourth embodiment of the invention will be described. The inspection device 1A of the fourth embodiment is supported by a tripod 2A with wheels 21, as shown in FIG. Parts other than the tripod 2A (pillar 3, lighting part 4, 4A to 4J, three-dimensional scanner 5) are the same as those of the inspection device 1 of any one of the first to third embodiments. Also when using the inspection device 1A of the fourth embodiment, the ceiling inspection method using the ceiling inspection opening 81 (FIGS. 8 and 9) and the ceiling inspection method drilling an inspection hole (FIG. 12, Fig. 13) can be applied.

By using the tripod 2A with the wheels 21, the inspection device 1 can be moved without being lifted, and the work can be performed easily.
[Fifth embodiment]
Next, a fifth embodiment of the invention will be described. The inspection device 1B of the fifth embodiment shown in FIG. 22 shows an example using a three-dimensional scanner 5B different from the three-dimensional scanner 5A of the first embodiment.
In the first embodiment, "BLK360" manufactured by Leica Corporation was mentioned as a suitable example of the three-dimensional scanner 5, but the three-dimensional scanner 5 is not limited to this, and other scanners may be used.
For example, Faro's "FOCUS S350" is 230 [mm] x 183 [mm] x 103 [mm] and weighs 4.2 [Kg], which is larger and heavier than Leica's "BLK360". However, it is small and light among stationary scanners. The "FOCUS S350" has a wide scan range of 0.6 to 350 [m] (the "BLK360" has a scan range of 0.6 to 60 [m]). Thus, in the present invention, an appropriate three-dimensional scanner 5B can be adopted according to the size of the building.

In the inspection device 1B of the fifth embodiment, each part (pillar 3, illumination part 4, 4A to 4J, tripod 2, 2A) other than the three-dimensional scanner 5B is any of the first to fourth embodiments. It has the same configuration.

Also when using the inspection device 1B of the fifth embodiment, the ceiling inspection method using the ceiling inspection opening 81 (FIGS. 8 and 9) and the ceiling inspection method drilling an inspection hole (FIG. 12, Fig. 13) can be applied.

The type of the three-dimensional scanner 5 in the inspection device 1 of the present invention is not limited to the laser irradiation type three-dimensional scanners 5 and 5B shown in the first embodiment (FIG. 1) and FIG. A scanner of a method of photographing and surveying (distance measurement) from the photographed image may be used. For example, a rotating monocular camera, a stereo camera, or the like is applicable. In any case, a scanner equipped with at least one function of laser irradiation measurement or photogrammetry, which has a rotation mechanism for all-round measurement, is the three-dimensional inspection device 1, 1A, 1B of the present invention. It can be used as scanners 5 and 5B.

Although the preferred embodiments of the present invention have been described above with reference to the accompanying drawings, the present invention is not limited to such examples. The sizes, shapes, weights, specs, etc. of the three-dimensional scanner 5 and the compact light source 41 are examples, and other sizes, shapes, weights, specs, etc. may be employed. It is obvious that a person skilled in the art can conceive of various modifications or modifications within the scope of the technical ideas disclosed in the present application, and these also belong to the technical scope of the present invention. Understood.

Reference numerals 1, 1A, 1B... inspection devices 2, 2A... tripods 3... columns 4, 4A to 4J... lighting units 5, 5B... three-dimensional scanners 6... . . . Cloud 7 .. Image processing device 21 .. Wheel 41 .. Small light source 45 .. Arm 46 .. Shaft 51 . Storage unit 53 Communication I/F unit 54 Laser scanner 55 Image scanner 81 Ceiling inspection door 82 Downlight 83 Downlight embedded Insertion hole 91...Metal detector 92...Drill 93...Small hole for fiber scope 94...Fiber scope 95...Ceiling inner rolling wiring 96...Hole saw 97... ... inspection hole 98 ... cover plate

Claims (10)

A support that can be stretched in the vertical direction,
a lighting unit that is attached to the upper end of the support and illuminates the surroundings;
a three-dimensional scanner that is attached to the upper part of the illumination unit and measures the surrounding three-dimensional structure;
an interface unit that transmits measurement data from the three-dimensional scanner to an image processing device;
with
The illumination unit is formed by combining a plurality of small light sources
An inspection device characterized by: A support that can be stretched in the vertical direction,
a lighting unit that is attached to the upper end of the support and illuminates the surroundings;
a three-dimensional scanner that is attached to the upper part of the illumination unit and measures the surrounding three-dimensional structure;
an interface unit that transmits measurement data from the three-dimensional scanner to an image processing device;
An inspection device comprising:
An inspection device, wherein the maximum diameter of the inspection device is smaller than the diameter of the downlight embedding hole. A support that can be stretched in the vertical direction,
a lighting unit that is attached to the upper end of the support and illuminates the surroundings;
a three-dimensional scanner that is attached to the upper part of the illumination unit and measures the surrounding three-dimensional structure;
an interface unit that transmits measurement data from the three-dimensional scanner to an image processing device;
with
The inspection device, wherein the color temperature of the illumination unit is set to a neutral white color of about 4500K. 4. The inspection device according to any one of claims 1 to 3, wherein the illumination unit is arranged close to the column. 5. The inspection apparatus according to claim 1, wherein said three-dimensional scanner is a laser scanner for obtaining point group data having three-dimensional coordinate values. 6. The inspection device according to claim 5, wherein said three-dimensional scanner further comprises an image scanner for obtaining image data. The three-dimensional scanner is
7. The inspection device according to any one of claims 1 to 6 , wherein scanning in a direction around a vertical axis and scanning in a direction around a horizontal axis are possible. 8. The inspection device according to claim 1, wherein the interface section performs wireless communication with the image processing device. performing a radar survey of the ceiling subfloor;
drilling a small hole in the ceiling and checking the rolling wiring in the ceiling with a fiberscope;
drilling an inspection hole in the ceiling;
inserting an inspection device through the inspection hole;
a step of measuring with the inspection device;
a step of attaching a cover plate to the inspection hole after the measurement is completed;
including
The inspection device is
A support that can be stretched in the vertical direction,
a lighting unit that is attached to the upper end of the support and illuminates the surroundings;
a three-dimensional scanner that is attached to the upper part of the illumination unit and measures the surrounding three-dimensional structure;
an interface unit that transmits measurement data from the three-dimensional scanner to an image processing device;
A ceiling inspection method, comprising: inserting the inspection device through the downlight embedding hole;
a step of measuring with the inspection device;
including
The inspection device is
A support that can be stretched in the vertical direction,
a lighting unit that is attached to the upper end of the support and illuminates the surroundings;
a three-dimensional scanner that is attached to the upper part of the illumination unit and measures the surrounding three-dimensional structure;
an interface unit that transmits measurement data from the three-dimensional scanner to an image processing device;
A ceiling inspection method, comprising:

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