JP7242240B2 - 超音波診断装置 - Google Patents

超音波診断装置 Download PDF

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Publication number
JP7242240B2
JP7242240B2 JP2018192533A JP2018192533A JP7242240B2 JP 7242240 B2 JP7242240 B2 JP 7242240B2 JP 2018192533 A JP2018192533 A JP 2018192533A JP 2018192533 A JP2018192533 A JP 2018192533A JP 7242240 B2 JP7242240 B2 JP 7242240B2
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conductor
insulator
oxide semiconductor
oxide
transistor
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JP2020058649A (ja
JP2020058649A5 (https=
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清貴 木村
隆之 池田
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Semiconductor Energy Laboratory Co Ltd
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Semiconductor Energy Laboratory Co Ltd
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JP2018192533A 2018-10-11 2018-10-11 超音波診断装置 Active JP7242240B2 (ja)

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JP2018192533A JP7242240B2 (ja) 2018-10-11 2018-10-11 超音波診断装置

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JP2020058649A JP2020058649A (ja) 2020-04-16
JP2020058649A5 JP2020058649A5 (https=) 2021-11-04
JP7242240B2 true JP7242240B2 (ja) 2023-03-20

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12514567B2 (en) 2022-12-29 2026-01-06 Samsung Medison Co., Ltd. Ultrasound diagnosis apparatus and method of generating pulse for generating ultrasonic signal

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015233130A (ja) 2014-05-16 2015-12-24 株式会社半導体エネルギー研究所 半導体基板および半導体装置の作製方法
WO2017026019A1 (ja) 2015-08-07 2017-02-16 株式会社日立製作所 超音波撮像装置、および、超音波探触子

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015233130A (ja) 2014-05-16 2015-12-24 株式会社半導体エネルギー研究所 半導体基板および半導体装置の作製方法
WO2017026019A1 (ja) 2015-08-07 2017-02-16 株式会社日立製作所 超音波撮像装置、および、超音波探触子

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12514567B2 (en) 2022-12-29 2026-01-06 Samsung Medison Co., Ltd. Ultrasound diagnosis apparatus and method of generating pulse for generating ultrasonic signal

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