JP7226542B2 - 時系列データ処理方法、時系列データ処理装置、プログラム - Google Patents

時系列データ処理方法、時系列データ処理装置、プログラム Download PDF

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JP7226542B2
JP7226542B2 JP2021524600A JP2021524600A JP7226542B2 JP 7226542 B2 JP7226542 B2 JP 7226542B2 JP 2021524600 A JP2021524600 A JP 2021524600A JP 2021524600 A JP2021524600 A JP 2021524600A JP 7226542 B2 JP7226542 B2 JP 7226542B2
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遼介 外川
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NEC Corp
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    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
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    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F16/00—Information retrieval; Database structures therefor; File system structures therefor
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    • G06F16/284—Relational databases
    • G06F16/285—Clustering or classification
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
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    • G05B23/02—Electric testing or monitoring

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JP2021524600A 2019-06-06 2019-06-06 時系列データ処理方法、時系列データ処理装置、プログラム Active JP7226542B2 (ja)

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JP7226542B2 true JP7226542B2 (ja) 2023-02-21

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JP7504772B2 (ja) * 2020-11-05 2024-06-24 株式会社東芝 異常判定装置、学習装置及び異常判定方法
JP2022136708A (ja) * 2021-03-08 2022-09-21 富士通株式会社 情報処理方法、および情報処理プログラム
KR102864346B1 (ko) * 2022-02-24 2025-09-24 주식회사 히타치하이테크 진단 장치 및 진단 방법 및 반도체 제조 장치 시스템 및 반도체 장치 제조 시스템
CN114860802B (zh) * 2022-04-26 2024-08-02 上海分泽时代软件技术有限公司 时序人流量数据和标量标签数的融合方法及系统
JPWO2024176390A1 (https=) * 2023-02-22 2024-08-29

Citations (2)

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Publication number Priority date Publication date Assignee Title
WO2018142704A1 (ja) 2017-02-02 2018-08-09 日本電信電話株式会社 特徴量生成装置、特徴量生成方法及びプログラム
JP2019049889A (ja) 2017-09-11 2019-03-28 株式会社日立製作所 学習装置、および学習方法

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JP5301310B2 (ja) 2009-02-17 2013-09-25 株式会社日立製作所 異常検知方法及び異常検知システム
EP2752722B1 (en) * 2011-08-31 2019-11-06 Hitachi Power Solutions Co., Ltd. Facility state monitoring method and device for same
JP6057786B2 (ja) * 2013-03-13 2017-01-11 ヤフー株式会社 時系列データ解析装置、時系列データ解析方法、およびプログラム
JP6854151B2 (ja) 2017-02-24 2021-04-07 エヌ・ティ・ティ・コミュニケーションズ株式会社 異常予測方法、異常予測装置、異常予測システムおよび異常予測プログラム
US12468951B2 (en) * 2018-06-12 2025-11-11 Ciena Corporation Unsupervised outlier detection in time-series data
US11620528B2 (en) * 2018-06-12 2023-04-04 Ciena Corporation Pattern detection in time-series data

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018142704A1 (ja) 2017-02-02 2018-08-09 日本電信電話株式会社 特徴量生成装置、特徴量生成方法及びプログラム
JP2019049889A (ja) 2017-09-11 2019-03-28 株式会社日立製作所 学習装置、および学習方法

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WO2020245980A1 (ja) 2020-12-10
JPWO2020245980A1 (https=) 2020-12-10
US11954131B2 (en) 2024-04-09

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